TY - GEN A1 - Langenberg, K. J. A1 - Marklein, R. A1 - Mayer, K. A1 - Krylow, T. A1 - Ampha, P. A1 - Streicher, Doreen A1 - Krause, Martin ED - Pinto, I. M. T1 - Wavefield inversion in nondestructive testing T2 - Workshop/Minisymposium on "Electromagnetics in a Complex World: Challenges and Perspectives" CY - Benevento, Italy DA - 2003-02-20 PY - 2003 SN - 3-540-20235-8 SN - 0930-8989 N1 - Serientitel: Springer proceedings in physics – Series title: Springer proceedings in physics IS - 96 SP - 1 EP - 10(?) PB - Springer CY - Berlin AN - OPUS4-2357 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -