TY - JOUR A1 - Bunte, J. A1 - Barcikowski, S. A1 - Burmester, T. A1 - Püster, T. A1 - Hertwig, Andreas A1 - Kautek, Wolfgang A1 - Krüger, Jörg A1 - Martin, Sven A1 - Spielmann, C. A1 - Lenner, M. A1 - Brose, M. T1 - Sicherer Umgang mit Ultrakurzpuls-Lasern, Teil 2: Sekundäre Gefährdungen PY - 2005 SN - 0945-8875 IS - 4 SP - 13 EP - 18 PB - Magazin-Verl. CY - Bad Nenndorf AN - OPUS4-11002 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Mikromaterialbearbeitung mit ultrakurzen Laserimpulsen: Vorzüge, Probleme, Sicherheitsaspekte T2 - Seminar "Laser in der Feinbearbeitung" CY - Teltow, Germany DA - 2005-10-22 PY - 2005 AN - OPUS4-10950 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Martin, S. A1 - Kautek, Wolfgang A1 - Krüger, Jörg ED - Maruray, L. T1 - Ultra-short Pulse Laser Safety - a Challenge to Materials Science N2 - In this paper, safety-related experiments with ultra-short laser pulses (down to 30 fs) on various components (goggles, curtains) for laser protection are presented. The damage and failure behaviour of protective devices has been investigated dependent on practical conditions such as pulse duration, laser .uence, pulse number, and repetition rate. The e.ects of laser-irradiation on materials can be roughly divided into transient ones like laserinduced transmission (LIT) or short-lived colour centres and permanent damages like the stable colour centres and ablation. The former e.ects are particularly important for transparent devices like laser goggles. To obtain a complete overview on laser safety issues and the prevention of failure there are two important .elds of investigation: 1. the e.ects of laser radiation on human eyes and skin, and 2. on the possible protection materials. Both .elds have been addressed during the recently .nished German project SAFEST (safety aspects in femtosecond technology). The amount of safety data available in the ultrashort pulse region has been increased remarkably. This allows for a re-evaluation of known laser protection materials for this region of pulse durations and for the evaluation of new designs that promise high protection levels while being light-weight and convenient to use. T2 - Optical design and engineering II CY - Jena, Germany DA - 2005-09-13 PY - 2005 N1 - Serientitel: Proceedings of SPIE – Series title: Proceedings of SPIE IS - 5962 SP - 59622J-1 - 59622J-10 PB - SPIE CY - Bellingham AN - OPUS4-11593 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rudolph, Pascale A1 - Pentzien, Simone A1 - Krüger, Jörg A1 - Kautek, Wolfgang A1 - König, E. T1 - Laserreinigung von Pergament und Papier PY - 1998 SN - 0933-4017 IS - 6 SP - 396 EP - 402 PB - Callwey CY - München AN - OPUS4-11598 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krüger, Jörg A1 - Sorg, N. A1 - Reif, J. A1 - Kautek, Wolfgang T1 - In situ second harmonic generation measurements during the electrodeposition of Ni on n-Si(111) PY - 1993 SN - 0169-4332 SN - 1873-5584 VL - 69 SP - 388 EP - 392 PB - North-Holland CY - Amsterdam AN - OPUS4-11657 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sorg, N. A1 - Krüger, Jörg A1 - Kautek, Wolfgang T1 - SHG Measurements of n-Si(111)/aqueous Solution Interfaces PY - 1993 SN - 0005-9021 VL - 97 IS - 3 SP - 402 EP - 406 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-11658 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kautek, Wolfgang A1 - Mitterer, S. A1 - Krüger, Jörg A1 - Husinsky, W. A1 - Grabner, G. T1 - Femtosecond-Pulse Laser Ablation of Human Corneas N2 - A femtosecond pulse laser in the visible spectral region shows promise as a potentially new powerful corneal sculpting tool. It combines the clinical and technical advantages of visible wavelengths with the high ablation quality observed with nanosecond-pulse excimer lasers at 193 nm. A femtosecond and a nanosecond dye laser with pulse durations of 300 fs and 7 ns, and centre wavelengths at 615 nm and 600 nm, respectively, both focused to an area of the order of 10–5 cm2, have been applied to human corneal ablation. Nanosecond laser pulses caused substantial tissue disruption within a 30–100 m range from the excision edge at all fluences above the ablation threshold of F th60 J cm–2 (I th9 GW cm–2). Completely different excisions are produced by the femtosecond-pulse laser: high quality ablations of the Bowman membrane and the stroma tissue characterised by damage zones of less than 0.5 m were observed at all fluences above ablation threshold of F th1 J cm–2 or I th3 TW cm–2 (3×1012 W cm–2). The transparent cornea material can be forced to absorb ultrashort pulses of extremely high intensity. The fs laser generates its own absorption by a multiphoton absorption process. PY - 1994 DO - https://doi.org/10.1007/BF00332446 SN - 0947-8396 VL - 58 IS - 5 SP - 513 EP - 518 PB - Springer CY - Berlin AN - OPUS4-11659 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kautek, Wolfgang A1 - Sorg, N. A1 - Krüger, Jörg T1 - Femtosecond pulse laser second harmonic generation on semiconductor electrodes KW - Femtosecond pulse laser KW - Second harmonic generation (SHG) KW - Electrochemistry KW - Semiconductor electrode KW - Silicon KW - Silicon oxide KW - Oxide growth PY - 1994 SN - 0013-4686 SN - 1873-3859 VL - 39 IS - 8/9 SP - 1245 EP - 1249 PB - Elsevier Science CY - Kidlington AN - OPUS4-11660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kautek, Wolfgang A1 - Krüger, Jörg ED - Brieger, M. T1 - Femtosecond-pulse laser microstructuring of semiconducting materials T2 - 1st International Symposium on Semiconductor Processing and Characterization with Lasers - Applications in Photovoltaics CY - Stuttgart, Germany DA - 1994-04-18 KW - Femtosecond-Pulse Laser KW - Subpicosecond-Pulse Laser KW - Laser-Ablation KW - Multi-Photon Absorption KW - Microstructuring KW - Dry Etching KW - Semiconductors KW - Silicon PY - 1995 SN - 0-87849-683-1 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum IS - 173/174 SP - 17 EP - 22 PB - Trans Tech Publ. CY - Aedermannsdorf AN - OPUS4-11671 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kautek, Wolfgang A1 - Sorg, N. A1 - Krüger, Jörg ED - Brieger, M. T1 - Optical second-harmonic generation (SHG) on semiconductor electrodes by means of femtosecond and nanosecond-pulse lasers N2 - In situ optical second-harmonic generation (SHG) on centrosymmetric crystalline semiconductor electrodes opens up a new field of in situ investigations of hurried solid state interfaces and metal front contacts relevant to electronic and photovoltaic devices, which are rarely accessible by other methods. Photoelectrochemical nanosecond- and femtosecond-pulse laser investigations of silicon (111) electrodes show that in situ SHG is feasible in such complex interfacial systems. In a p-p polarization configuration, the azimuthal dependence of the SHG from oxide-covered and bare n-Si (111) electrodes, with and without Ni contact deposits, have been studied. Etching and regrowth of silicon oxides as well as burried interfacial electric field distributions were monitored. In situ SHG is shown to be extremely sensitive to trapped interfacial charge, crystal misorientations and surface step arrays. An advantage of femtosecond-pulses is the fact that illumination fluences that are well below the damage threshold, but still with sufficient power density, can be applied. (Author) T2 - 1st International Symposium on Semiconductor Processing and Characterization with Lasers - Applications in Photovoltaics CY - Stuttgart, Germany DA - 1994-04-18 KW - Femtosecond-Pulse Laser KW - Sub-Picosecond-Pulse Laser KW - Semiconductors KW - Silicon KW - Second-Harmonic Generation KW - SHG KW - Nonlinear Electroreflectance KW - Etch Process KW - Oxide KW - Interfacial Electronic States KW - Fermi-Level Pinning KW - MOS Diode PY - 1995 SN - 0-87849-683-1 DO - https://doi.org/10.4028/www.scientific.net/MSF.173-174.285 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum IS - 173/174 SP - 285 EP - 290 PB - Trans Tech Publ. CY - Aedermannsdorf AN - OPUS4-11672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Short pulse laser processing: safety aspects T2 - Bereichsseminar A - Max Born Institut Berlin CY - Berlin, Germany DA - 2006-11-30 PY - 2006 AN - OPUS4-13779 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Sicherheit in der Anwendung der Femtosekunden-Lasertechnologie T2 - Mitgliederversammlung Laserverbund Berlin/Brandenburg CY - Berlin, Germany DA - 2007-01-18 PY - 2007 AN - OPUS4-14455 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wurster, R. A1 - Pentzien, Simone A1 - Conradi, Andrea A1 - Krüger, Jörg T1 - Characterization of laser-generated microparticles by means of a dust monitor and SEM imaging N2 - Nanosecond laser (1064 nm wavelength) cleaning of artificially soiled paper as a model sample simulating a real-world artwork was performed. During the cleaning process, the ejection of particles was monitored in situ by means of a dust monitor (8 size classes, ranging from 0.3 µm to >2 µm) and ex situ using a mini-cascade impactor (MKI, 5 stages). The cleaning result was analyzed by scanning electron microscopy (SEM) considering possible laser-induced damages to the substrate. Size distributions of emitted particles were measured depending on the processing parameters: laser fluence, F, and pulse number per spot, N. High numbers of large (>2 µm) particles were collected by the mini-cascade impactor indicating a gas dynamical liftoff process. Obviously, these particles were not affected by the laser-matter interaction. The different methods (SEM, MKI, and dust monitor) are compared with respect to their usefulness for a proper interpretation of the cleaning results. PY - 2006 DO - https://doi.org/10.1155/2006/31862 SN - 0278-6273 SN - 1476-3516 VL - 2006 IS - Article ID 31862 SP - 1 EP - 5(?) PB - Harwood Academic Publ. CY - London AN - OPUS4-14467 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Laser-Reinigung von Papier, Pergament und Gewebe T2 - OpTecBB-Fokusseminar "Cultural Heritage", PTB CY - Berlin, Germany DA - 2007-05-03 PY - 2007 AN - OPUS4-14761 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Nanosecond laser damage resistance of optical multimode fibers prepared differently T2 - EMRS 2007 Spring Meeting, Symposium P: Laser synthesis and processing of advanced materials CY - Strasbourg, France DA - 2007-05-28 PY - 2007 AN - OPUS4-14762 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Cleaning of artificially soiled paper with 532-nm nanosecond laser radiation T2 - EMRS 2007 Spring Meeting, Symposium S: Science & Technology of Cultural heritage Materials : Art conservation and Restoration CY - Strasbourg, France DA - 2007-05-28 PY - 2007 AN - OPUS4-14763 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hertwig, Andreas A1 - Krüger, Jörg A1 - Weise, Matthias A1 - Beck, Uwe T1 - Hydrogen-Containing Amorphous Carbon Layers as Optical Materials in the Near-IR Spectral Range N2 - Hydrogenated amorphous carbon layers were deposited on various substrates by means of a plasma CVD process with a RF substrate bias as well as an ECR plasma source. The optical properties of the a-C:H layers were obtained via spectroscopic ellipsometry and correlated with their mechanical and chemical properties. The layers from pure RF plasma exhibit a higher absorption constant in the visible spectral range and a higher refractive index. All layers are nearly transparent in the NIR spectral range making them candidates for optical thin layer systems. The laser damage behaviour of the a-C:H layers was investigated with ultrashort pulses. The damage thresholds were consistent with the absorption constants of the layers. Interesting damage morphologies were observed indicating a sensitivity of this experiment to sub-structures in the layer. KW - Kohlenstoffschichten KW - Optische Konstanten KW - Ellipsometrie KW - Laser-Material-Bearbeitung KW - Amorphous KW - Diamond-like carbon KW - Hydrocarbons KW - Laser ablation KW - Optical proper PY - 2007 SN - 1612-8850 SN - 1612-8869 VL - 4 IS - S1 SP - S76 EP - S82 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-14862 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Nanosecond laser-induced surface damage of preforms and optical multimode fibers T2 - COLA 2007, Conference on Laser Ablation, Guia de Isora CY - Tenerife, Spain DA - 2007-09-24 PY - 2007 AN - OPUS4-14956 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Laser-induced damage threshold (LIDT) testing of oxide and metal coatings with sub-30 fs pulses T2 - Workshop on Laser-Induced Damage (LZH Hannover) CY - Hanover, Germany DA - 2007-07-04 PY - 2007 AN - OPUS4-14979 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krüger, Jörg T1 - Laser-Reinigung von Papier, Pergament und Gewebe - Eine Einführung T2 - Fachtagung, Hochschule für Angewandte Wissenschaft und Kunst (HAWK) CY - Hildesheim, Germany DA - 2007-10-01 PY - 2007 AN - OPUS4-15722 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krüger, Jörg A1 - Dufft, Daniela A1 - Koter, Robert A1 - Hertwig, Andreas T1 - Femtosecond laser-induced damage of gold films N2 - Single- and multi-shot ablation thresholds of gold films in the thickness range of 31–1400 nm were determined employing a Ti:sapphire laser delivering pulses of 28 fs duration, 793 nm center wavelength at 1 kHz repetition rate. The gold layers were deposited on BK7 glass by an electron beam evaporation process and characterized by atomic force microscopy and ellipsometry. A linear dependence of the ablation threshold fluence Fth on the layer thickness d was found for d ≤ 180 nm. If a film thickness of about 180 nm was reached, the damage threshold remained constant at its bulk value. For different numbers of pulses per spot (N-on-1), bulk damage thresholds of ~0.7 J cm-2 (1-on-1), 0.5 J cm-2 (10-on-1), 0.4 J cm-2 (100-on-1), 0.25 J cm-2 (1000-on-1), and 0.2 J cm-2 (10000-on-1) were obtained experimentally indicating an incubation behavior. A characteristic layer thickness of Lc ˜ 180 nm can be defined which is a measure for the heat penetration depth within the electron gas before electron–phonon relaxation occurs. Lc is by more than an order of magnitude larger than the optical absorption length of α-1 ˜ 12 nm at 793 nm wavelength. KW - Single- and multi-shot ablation KW - Ti:sapphire laser KW - Gold films PY - 2007 SN - 0169-4332 SN - 1873-5584 VL - 253 IS - 19 SP - 7815 EP - 7819 PB - North-Holland CY - Amsterdam AN - OPUS4-15686 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -