TY - CONF A1 - Ecker, Klaus A1 - Dudzus, Thomas A1 - Merchel, Silke A1 - Kipphardt, Heinrich T1 - Oxygen determination in BaF2 and CaF2 by Charged Particle Activation Analysis T2 - 16th International Conference on Ion Beam Analysis T2 - 16th International Conference on Ion Beam Analysis CY - Albuquerque, NM, USA DA - 2003-06-29 PY - 2003 AN - OPUS4-4900 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -