TY - JOUR A1 - Hoffmann, Katrin A1 - Behnke, Thomas A1 - Drescher, Daniela A1 - Kneipp, Janina A1 - Resch-Genger, Ute T1 - Lifetime-based discrimination between spectrally matching vis and NIR emitting particle labels and probes N2 - Increasing the information content from bioassays which requires robust and efficient strategies for the detection of multiple analytes or targets in a single measurement is an important field of research, especially in the context of meeting current security and health concerns. An attractive alternative to spectral multiplexing, which relies on fluorescent labels excitable at the same wavelength, yet sufficiently differing in their emission spectra or color presents lifetime multiplexing. For this purpose, we recently introduced a new strategy based on 'pattern-matching' in the lifetime domain, which was exemplary exploited for the discrimination between organic dyes and quantum dot labels revealing multi-exponential decay kinetics and allowed quantification of these labels. Meanwhile, we have succeeded in extending this lifetime multiplexing approach to nanometer-sized particle labels and probes absorbing and emitting in the visible (vis) and near-infrared (NIR) spectral region. Here, we present a first proof-of-principle of this approach for a pair of NIR-fluorescent particles. Each particle is loaded with a single organic dye chosen to display very similar absorption and emission spectra, yet different fluorescence decay kinetics. Examples for the lifetime-based distinction between pairs of these fluorescent nanoparticles in solution and in cells are presented. The results underline the potential of fluorescenc lifetime multiplexing in life science and bioanalysis. KW - Fluorescence KW - Fluorescence lifetime imaging microscopy KW - FLIM KW - Lifetime Multiplexing KW - Particle Label KW - Near-infrared KW - NIR KW - Cell imaging KW - Nanoparticles PY - 2011 U6 - https://doi.org/10.1117/12.881442 SN - 1605-7422 VL - 7905 SP - 79051F-1 EP - 79051F-9 PB - SPIE, The International Society for Optical Engineering CY - Bellingham, Wash. AN - OPUS4-23637 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -