TY - JOUR A1 - Baer, D. R. A1 - Karakoti, A. S. A1 - Clifford, C. A. A1 - Minelli, C. A1 - Unger, Wolfgang T1 - Importance of sample preparation on reliable surface characterisation of nano‐objects: ISO standard 20579‐4 JF - Surface and Interface Analysis N2 - The international ISO Standard 20579‐4, dealing with the history and preparation of nano‐objects for surface analysis, has been developed to help address some of the replication and reproducibility issues caused by the fundamental nature of nanoobjects. Although all types of samples requiring surface analysis need thoughtful preparation, nano‐objects, for which many properties are controlled by their surfaces, present additional challenges in order to avoid variations and artefacts due to the handling and preparation of materials prior to analysis. This international standard is part of a series of standards related to preparation of samples for surface chemical analysis. Parts 1 and 2 of ISO Standard series 20579 address general issues that apply to many samples. Part 3, which is still in development, will focus on biomaterials. Part 4 specifically considers issues that arise due to the inherent nature of nano‐objects. Because of sensitivity to their environment, the standard indicates the minimum Information that needs to be reported about the handling and preparation of nano‐objects prior to surface analysis. This information should become part of sample provenance information that helps assure the reliability and usefulness of data obtained from surface‐analysis in the context of the synthesis, processing, and analysis history of a batch of material. Application of this standard can help address reproducibility and traceability issues associated with synthesis, processing, and characterization of nano‐objects in research and commercial applications. KW - Nano‐object characterization KW - Nanoparticle characterization KW - Provenance information KW - Sample preparation KW - Surface analysis PY - 2018 DO - https://doi.org/10.1002/sia.6490 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 9 SP - 902 EP - 906 PB - John Wiley & Sons, Ltd. AN - OPUS4-45830 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -