TY - GEN A1 - Bleeker, E. A1 - Visser, M. A1 - Groenewold, M. A1 - Blab, G. A1 - Brouwer, D. A1 - Sultan, Y. A1 - Gagnon, C. A1 - Wilkinson, K. A1 - Doa, M. A1 - Boyes, W. A1 - Kiyota, Y. A1 - Yanase, K. A1 - Holmqvist, J. A1 - Rasmussen, K. A1 - Sumrein, A. A1 - Clancy, S. A1 - Brown, S. A1 - Carlander, D. A1 - Murphy, L. A1 - Bresch, Harald A1 - Hund-Rinke, K. A1 - Igarashi, T. A1 - Riego-Sintes, J. A1 - Tentschert, J. T1 - Physical-chemical properties of nanomaterials: Evaluation of methods applied in the OECD-WPMN Testing Programme T2 - Series on the Safety of Manufactured Nanomaterials N2 - The Sponsorship Programme for the Testing of Manufactured Nanomaterials (further referred to as “the Testing Programme”) was concluded in March 2013, and the publication of the dossiers via the OECD website (www.oecd.org/science/nanosafety) started in June 2015. As indicated in the “Guidance manual for the testing of manufactured nanomaterials: OECD’s sponsorship programme”, after conclusion of the Testing Programme a next step is to consider “the status, need for, and coordination of further test development”. Parallel to concluding the final stages of the Testing Programme, a series of workshops have taken place, in which for different topics the applicability of existing OECD test guidelines for nanomaterials was discussed and the need for new ones analysed. One workshop focussed on physico-chemical methods, addressing in detail the relevance of each physico-chemical endpoint proposed in the Testing Programme for the regulation of nanomaterials. The methods were discussed in more general terms. However, as most of the proposed endpoints are new to the OECD Test Guidelines Programme, a much more detailed evaluation of the applied methods would be highly relevant. To this extent,the Netherlands volunteered to lead an initial detailed evaluation of the applicability of the test methods applied to determine the physico-chemical properties of different types of nanomaterials in the Testing Programme. This initial focus on physico-chemical properties was prompted by the essential need for an adequate and complete characterisation of nanomaterials to enable a further evaluation of their (toxicological) properties. A number of experts from several delegations volunteered to review and evaluate the methods applied to determine the physico-chemical properties of the nanomaterials in the Testing Programme. KW - Nanomaterialien KW - Nano KW - Nanopartikel KW - Charakterisierung KW - OECD KW - Nanomaterials PY - 2016 UR - http://www.oecd.org/env/ehs/nanosafety/publications-series-safety-manufactured-nanomaterials.htm IS - 65 SP - 1 EP - 43 CY - Paris AN - OPUS4-38495 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert A1 - Vespucci, S. A1 - Gunsekar, N.-K. A1 - Trager-Cowan, C. A1 - Vilalta-Clemente, A. A1 - Wilkinson, A. J. A1 - Voss, M. T1 - Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications JF - Journal of Microscopy N2 - We analyse the signal formation process for scanning electron microscopic imaging applications on crystalline specimens. In accordance with previous investigations, we find nontrivial effects of incident beam diffraction on the backscattered electron distribution in energy and momentum. Specifically, incident beam diffraction causes angular changes of the backscattered electron distribution which we identify as the dominant mechanism underlying pseudocolour orientation imaging using multiple, angle-resolving detectors. Consequently, diffraction effects of the incident beam and their impact on the subsequent coherent and incoherent electron transport need to be taken into account for an in-depth theoretical modelling of the energy- and momentum distribution of electrons backscattered from crystalline sample regions. Our findings have implications for the level of theoretical detail that can be necessary for the interpretation of complex imaging modalities such as electron channelling contrast imaging (ECCI) of defects in crystals. If the solid angle of detection is limited to specific regions of the backscattered electron momentum distribution, the image contrast that is observed in ECCI and similar applications can be strongly affected by incident beam diffraction and topographic effects from the sample surface. As an application, we demonstrate characteristic changes in the resulting images if different properties of the backscattered electron distribution are used for the analysis of a GaN thin film sample containing dislocations. KW - EBSD KW - Channeling-in KW - Background processing KW - Center of mass KW - Backscattered electrons PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-422063 DO - https://doi.org/10.1111/jmi.12571 SN - 0022-2720 VL - 267 IS - 3 SP - 330 EP - 346 PB - Wiley & Sons, Ltd. AN - OPUS4-42206 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -