TY - JOUR A1 - van de Kreeke, Johannes T1 - EPTIS update PY - 2003 SN - 0949-1775 SN - 1432-0517 VL - 8 IS - 6 PB - Springer CY - Berlin AN - OPUS4-4394 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - EPTIS for the new Member States T2 - IRMM Workshop CY - Budapest, Hungary DA - 2004-10-13 PY - 2004 AN - OPUS4-4958 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - EPTIS for Latin America T2 - IAAC Workshop CY - São Paulo, Brazil DA - 2004-09-21 PY - 2004 AN - OPUS4-4959 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Örnemark, U. A1 - Fostel, H. A1 - Straub, R. A1 - van de Kreeke, Johannes T1 - Policies, requirements and surveys concerning frequency for participation in proficiency testing schemes N2 - This paper focuses on policies and requirements concerning the frequency for participation in proficiency testing (PT) and provides an overview of the frequency for which PT activities are offered in 25 testing fields. Recent international surveys are summarised. KW - Proficiency testing KW - External quality assessment KW - Frequency KW - Accreditation KW - Policy documents KW - Eptis PY - 2004 DO - https://doi.org/10.1007/s00769-004-0858-2 SN - 0949-1775 SN - 1432-0517 IS - 9 SP - 729 EP - 732 PB - Springer CY - Berlin AN - OPUS4-5198 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - van de Kreeke, Johannes T1 - EPTIS und COEPT - European Initiatives with Worldwide Relevance PY - 2006 IS - February SP - 7 EP - 8 CY - Jerusalem, Israel AN - OPUS4-12260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - How does EPTIS develop and why T2 - ILAC PT Consultative Group ILAC Accreditation Issues Committee CY - Montreux, Switzerland DA - 2011-04-13 PY - 2011 AN - OPUS4-24081 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - Statistics for ILCs with few participants -some differences- T2 - EQALM-Workshop CY - Copenhagen, Denmark DA - 2012-10-25 PY - 2012 AN - OPUS4-27381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - DIN EN ISO/IEC 17043:2010 Konformitätsbewertung - Allgemeine Anforderungen an Eigungsprüfungen T2 - Jahrestagung VUP CY - Neckarsulm, Germany DA - 2012-09-13 PY - 2012 AN - OPUS4-27382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes T1 - EPTIS T2 - 1st GCC Conference for Laboratory PT CY - Dubai, UAE DA - 2013-03-13 PY - 2013 AN - OPUS4-28794 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van de Kreeke, Johannes A1 - Melzer, Michael T1 - The Digital RM Document (DRMD) N2 - The Digital Reference Material Document (DRMD) is a machine-readable replacement of the usual PDF Certificate. We have developed a fully functional beta version that is already in use for selected BAM materials and publicly available from the COMAR database, which showcases its feasibility. T2 - Deutsche Marktüberwachungskonferenz 2025 CY - Berlin, Germany DA - 17.09.2025 KW - Reference materials KW - Certified reference materials KW - Digital zertificates KW - QI-Digital PY - 2025 AN - OPUS4-64148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -