TY - JOUR A1 - Mielke, Johannes A1 - Martınez-Blanco, J. A1 - Peters, M. V. A1 - Hecht, S. A1 - Grill, L. T1 - Observing single-atom diffusion at a molecule-metal interface N2 - The dynamics at the interface between a close-packed porphyrin monolayer and Au(111) is investigated by time-dependent scanning tunneling microscopy, detecting the motion of single-interface adatoms in real space. Imaging sequences reveal predominant switching of the molecular appearance in adjacent molecules, pointing to a spatial correlation that is consistent with adatom diffusion from one molecule to the next. In some cases, the number of switching molecules is drastically increased, indicating collective switching events. In addition to the thermally induced motion of adatoms at the interface, also voltage pulses from the microscope tip can induce the process—revealing different yields in agreement with the model of adatom hopping. KW - STM KW - molecular switch KW - single molecule KW - switching dynamics KW - porphyrin KW - Au(111) PY - 2016 UR - http://journals.aps.org/prb/abstract/10.1103/PhysRevB.94.035416 U6 - https://doi.org/10.1103/PhysRevB.94.035416 VL - 94 IS - 3 SP - 035416-1 EP - 035416-7 PB - American Physical Society AN - OPUS4-37177 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Babick, F. A1 - Mielke, Johannes A1 - Wohlleben, W. A1 - Weigel, St. A1 - Hodoroaba, Vasile-Dan T1 - How reliably can a material be classified as a nanomaterial? Available particle-sizing techniques at work N2 - Currently established and projected regulatory frameworks require the classification of materials (whether nano or non-nano) as specified by respective definitions, most of which are based on the size of the constituent particles. This brings up the question if currently available techniques for particle size determination are capable of reliably classifying materials that potentially fall under these definitions. In this study, a wide variety of characterisation techniques, including counting, fractionating, and spectroscopic techniques, has been applied to the same set of materials under harmonised conditions. The selected materials comprised well-defined Quality control materials (spherical, monodisperse) as well as industrial materials of complex shapes and considerable polydispersity. As a result, each technique could be evaluated with respect to the determination of the number-weighted median size. Recommendations on the most appropriate and efficient use of techniques for different types of material are given. KW - Nanomaterial classification KW - Nanoparticle KW - Number-weighted median size KW - Tiered KW - Particle size analysis KW - Nanometrology KW - Characterisation techniques PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-367922 UR - http://link.springer.com/article/10.1007/s11051-016-3461-7 SN - 1388-0764 SN - 1572-896X VL - 18 IS - 6 SP - Article 158, 1 EP - 40 PB - Springer AN - OPUS4-36792 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mielke, Johannes A1 - Dohányosová, P. A1 - Lopez, S. A1 - Hodoroaba, Vasile-Dan T1 - Electrospray deposition of nanoparticles on TEM grids N2 - The authors have tested the prototype of an electrospray deposition system developed by the company RAMEM under its trademark IONER. To test the prototype and assess its performance, several materials have been sprayed onto TEM grids and the resulting particle distributions were compared to more traditional sample preparation strategies like the “drop on grid” method. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimized. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles, which are much better suited to an automatic image evaluation procedure than the agglomerated particles observed otherwise. The applicability of the technique to a broad range of materials is demonstrated by various examples, but also the influence of the substrate, the choice of the particular TEM grid, on the obtained spatial particle distribution is assessed. KW - Electrspray deposition KW - Electron microscopy KW - Nanoparticles KW - Sample preparation PY - 2016 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/electrospray-deposition-of-nanoparticles-on-tem-grids/459E634B7F74D474A19E15E69DA82E5D U6 - https://doi.org/10.1017/S1431927616010072 SN - 1431-9276 SN - 1435-8115 VL - 22 IS - Suppl 3 SP - 1846 EP - 1847 PB - Cambridge AN - OPUS4-38436 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mielke, Johannes A1 - Babick, F. A1 - Uusimäki, T. A1 - Müller, P. A1 - Verleysen, E. A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of electron microscopy techniques for the purpose of classification of nanomaterials N2 - Electron microscopy techniques such as TEM, STEM, SEM or TSEM (transmission in SEM) are capable of assessing the size of individual nanoparticles accurately. Nevertheless, the challenging aspect is sample preparation from powder or liquid form on the substrate, so that a homogeneous distribution of well-separated (deagglomerated) particles is attained. The systematic study in this work shows examples where the extraction of the critical, smallest particle dimension - as the decisive particle parameter for the classification as a NM - is possible by analysing the sample after ist simple, dry preparation. The consequences of additional typical issues like loss of information due to screening of smaller particles by larger ones or the (in)ability to access the constituent particles in aggregates are discussed. KW - Nanomaterial KW - Electron microscopy KW - Particle size distribution KW - Classification PY - 2016 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/evaluation-of-electron-microscopy-techniques-for-the-purpose-of-classification-of-nanomaterials/0B66A25EA7F7A5A3622C02A359C8304F U6 - https://doi.org/10.1017/S1431927616005523 SN - 1431-9276 SN - 1435-8115 VL - 22 IS - Suppl. 3 SP - 936 EP - 937 PB - Cambridge AN - OPUS4-38445 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Babick, F. A1 - Mielke, Johannes A1 - Hodoroaba, Vasile-Dan A1 - Weigel, St. A1 - Wohlleben, W. T1 - Critical review manuscript with real-world performance data for counting, ensemble and separating methods including in-build mathematical conversion to number distributions submitted for publication N2 - The content of the paper is the assessment of the performance of (conventional) measurement techniques (MTs)with respect to the classification of disperse materials according to the EC recommendation for a definition of nanomaterial. This performance essentially refers to the accurate assessment of the number weighted median of (the constituent) particles. All data and conclusions are based on the analytical study conducted as real-world performance testing. It comprised different types of MTs (imaging, counting, fractionating, spectroscopic and integral) as well as different types of materials. Beside reference materials with well-defined size distribution the study also included several commercial powders (variation of particle composition, morphology, coating, size range and polydispersity). In order to ensure comparability of measurement results, the participants were guided to use uniform protocols in sample preparation, conducting measurements, data analysis and in reporting results. Corresponding documents have been made public, in order to support the reviewing process of the paper, respectively to ensure the reproducibility of data by other users under the same conditions. The scientific paper relies on a comprehensive set of revised measurement data reported in uniform templates, completely describes the experimental procedures and discusses the MTs’ performance for selected materials in detail. Even more, the study is summarised and evaluated, which leads to recommendations for the use of MTs within a tiered approach of NM characterisation. In addition, the paper critically examines the factors that may affect the outcome of such a comparison among different MTs. KW - Nanomaterial KW - Measurement techniques KW - EC definition of nanomaterial KW - Nanoparticles PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-389646 UR - http://www.nanodefine.eu/index.php/downloads/nanodefine-technical-reports UR - http://www.nanodefine.eu/publications/reports/NanoDefine_TechnicalReport_D3.3.pdf SP - D3.3, 1 EP - 72 PB - The NanoDefine Consortium CY - Wageningen, The Netherlands AN - OPUS4-38964 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Saywell, A. A1 - Bakker, A. A1 - Mielke, Johannes A1 - Kumagai, T. A1 - Wolf, M. A1 - García-López, V. A1 - Chiang, P.-T. A1 - Tour, J. M. A1 - Grill, L. T1 - Light-Induced Translation of Motorized Molecules on a Surface N2 - Molecular machines are a key component in the vision of molecular nanotechnology and have the potential to transport molecular species and cargo on surfaces. The motion of such machines should be triggered remotely, ultimately allowing a large number of molecules to be propelled by a single source, with light being an attractive stimulus. Here, we report upon the photoinduced translation of molecular machines across a surface by characterizing single molecules before and after illumination. Illumination of molecules containing a motor unit results in an enhancement in the diffusion of the molecules. The effect vanishes if an incompatible photon energy is used or if the motor unit is removed from the molecule, revealing that the enhanced motion is due to the presence of the wavelength-sensitive motor in each molecule. KW - Diffusion KW - Molecular devices KW - Molecular motor KW - Scanning probe microscopy KW - Photoexcitation KW - Photochemistry KW - Molecular machines PY - 2016 UR - http://pubs.acs.org/doi/abs/10.1021/acsnano.6b05650 U6 - https://doi.org/10.1021/acsnano.6b05650 VL - 10 IS - 12 SP - 10945 EP - 10952 PB - ACS Publications AN - OPUS4-39095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mielke, Johannes A1 - Babick, F. A1 - Uusimäki, T. A1 - Müller, P. A1 - Verleysen, E. A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of electron microscopy techniques for the purpose of classification of nanomaterials N2 - One current and much-debated topic in the characterization of nanomaterials (NM) is the implementation of the recently introduced recommendation on a definition of a nanomaterial by the European Commission. All currently available sizing techniques able to address nanoparticles were systematically evaluated. It was demonstrated that particle sizing techniques like: analytical centrifugation, particle tracking analysis, single-particle inductively coupled plasma mass-spectrometry, differential electrical mobility analysis, dynamic light scattering, small angle X-ray scattering, ultrasonic attenuation spectrometry, but also gas Adsorption analysis based on the BET-method can be applied for a screening classification. However, the quality of the results depends on the individual material to be classified. For well-dispersed, nearly spherical (nano)particles most of the sizing techniques can be applied in a quick and reliable way. In contrast, the classification of most real-world materials is a challenging task, mainly due to non-spherical particle shape, large polydispersity or strong agglomeration/ aggregation of the particles. In the present study it was shown that these issues can be resolved in most cases by electron microscopy as a confirmatory classification technique. Electron microscopy techniques such as TEM, STEM, SEM or TSEM transmission in SEM) are capable of assessing the size of individual nanoparticles accurately (see Figures 1 and 2). Nevertheless the challenging aspect is sample preparation from powder or liquid form on the substrate, so that a homogeneous distribution of well-separated (deagglomerated) particles is attained. The systematic study in this work shows examples where the extraction of the critical, smallest particle dimension - as the decisive particle parameter for the classification as a NM - is possible by analysing the sample after its simple, dry preparation. The consequences of additional typical issues like loss of information due to Screening of smaller particles by larger ones or the (in)ability to access the constituent particles in aggregates are discussed. T2 - European Microscopy Congress emc 2016 CY - Lyon, France DA - 28.08.2016 KW - Nanomaterial classification KW - Nanoparticles KW - Electron microscopy PY - 2016 SN - 9783527808465 U6 - https://doi.org/10.1002/9783527808465.EMC2016.5767 SP - 13 EP - 14 PB - Wiley-VCH AN - OPUS4-44087 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Salge, T. A1 - Mielke, Johannes A1 - Ortel, Erik A1 - Schmidt, R. T1 - Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode N2 - Advances in scanning electron microscopy (SEM) enable the high-resolution imaging of single nanoparticles (NPs) with sizes well below 10 nm. The SEM analysis in transmission mode (T-SEM) of NPs on thin film supports has many benefits when compared to the analysis of NPs on bulk substrates. The enhanced material (mass – thickness) contrast of the T-SEM imaging mode is well suited for in-depth and, particularly valuable, to very accurate, traceable, lateral dimensional measurements of NPs. Compared to samples prepared on bulk substrates, T-SEM with energy dispersive X-ray spectroscopy (EDS) achieves a drastically improved spatial resolution of the emitted X-rays. The poor signal-to-noise ratio of the X-ray spectra emitted by a single nanoparticle (NP) can be improved by the use of high-sensitivity (high collection solid angle) silicon drift (SDD), energy-dispersive X-ray spectrometers (EDS). The EDS spectral imaging of a single NP with a spatial resolution below 10 nm has become possible. This is demonstrated by means of various examples of nanostructures. Advanced data processing of T-SEM/EDS results sets the stage for the automated classification of NPs by feature analysis. This method combines the detection of morphological structures of interest by image processing of T-SEM micrographs with the chemical classification by EDS. T2 - European Microbeam Analysis Society’s 14th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2015) CY - Portorož, Slovenia DA - 03.05.2015 KW - High-resolution KW - SEM KW - T-SEM KW - EDX KW - Nanoparticles PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-355628 UR - http://iopscience.iop.org/article/10.1088/1757-899X/109/1/012006 SN - 1757-899X VL - 109 SP - 012006-1 EP - 012006-12 PB - IOP Publishing Ltd CY - Bristol, UK AN - OPUS4-35562 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mielke, Johannes A1 - Hodoroaba, Vasile-Dan A1 - Babick, F. A1 - Ullmann, C. T1 - Evaluation of particle sizing techniques for the implementation of the EC definition of a nanomaterial N2 - What is a nanomaterial? Beyond a pure academic interest, this question has substantial im-plications for consumer protection and regulatory purposes. The European Commission has recommended a definition of nanomaterial (2011/696/EU), which states that a given material is considered a nanomaterial if more than 50 % of the particles in the number size distribution have a smallest dimension between 1 and 100 nm. Although several well established particle sizing techniques exist, the implementation of this definition for any particulate material remains a metrological challenge. The European research project NanoDefine (http://www.nanodefine.eu) has the aim of pro-viding help for the implementation of the definition. One central task is the performance evaluation of the available particle sizing techniques. For this purpose, a wide variety of real world materials has been selected. All available sizing techniques, including imaging, mobility-based and static scattering techniques, independent whether being counting, fractionating, spectroscopic or integrally sizing, will be applied to all of the projects materials to test the techniques performance and to establish their ranges of applicability. Because most of the techniques do not measure in number metrics as required in the nanomaterial definition, the quality of the conversion to the number based particle size distribution is assessed as well. Special care is taken on suitable sample preparation procedures as one of the most chal-lenging issues towards reaching a highly accurate result. Within this contribution, first results of the performance testing of state of the art characterisation techniques on the unique set of NanoDefine real world materials are going to be presented. From these results, first conclu-sions about the material dependent ranges of applicability for the considered particle sizing techniques can be drawn. The technique specific advantages and shortcomings with respect to the application of the EC definition as well as the analytical challenges encountered will be highlighted. Acknowledgements: The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement n° 604347. T2 - PARTEC CY - Nürnberg, Germany DA - 19.04.2016 KW - Nanomaterial PY - 2016 AN - OPUS4-35802 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Böckmann, H. A1 - Liu, S. A1 - Mielke, Johannes A1 - Gawinkowski, S. A1 - Walluk, J. A1 - Grill, L. A1 - Wolf, M. A1 - Kumagai, T. T1 - Direct observation of photoinduced tautomerization in single molecules at a metal surface N2 - Molecular switches are of fundamental importance in nature, and light is an important stimulus to selectively drive the switching process. However, the local dynamics of a conformational change in these molecules remain far from being completely understood at the single-molecule level. Here, we report the direct observation of photoinduced tautomerization in single porphycene molecules on a Cu(111) surface by using a combination of low-temperature scanning tunneling microscopy and laser excitation in the near-infrared to ultraviolet regime. It is found that the thermodynamically stable trans configuration of porphycene can be converted to the metastable cis configuration in a unidirectional fashion by photoirradiation. The wavelength dependence of the tautomerization cross section exhibits a steep increase around 2 eV and demonstrates that excitation of the Cu d-band electrons and the resulting hot carriers play a dominant role in the photochemical process. Additionally, a pronounced isotope effect in the cross section (∼100) is observed when the transferred hydrogen atoms are substituted with deuterium, indicating a significant contribution of zero-point energy in the reaction. Combined with the study of inelastic tunneling electron-induced tautomerization with the STM, we propose that tautomerization occurs via excitation of molecular vibrations after photoexcitation. Interestingly, the observed cross section of ∼10–19 cm2 in the visible–ultraviolet region is much higher than that of previously studied molecular switches on a metal surface, for example, azobenzene derivatives (10–23–10–22 cm2). Furthermore, we examined a local environmental impact on the photoinduced tautomerization by varying molecular density on the surface and find substantial changes in the cross section and quenching of the process due to the intermolecular interaction at high density. KW - STM KW - Pophycene PY - 2016 U6 - https://doi.org/10.1021/acs.nanolett.5b04092 SN - 1530-6984 SN - 1530-6992 VL - 16 IS - 2 SP - 1034 EP - 1041 PB - ACS AN - OPUS4-35803 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -