TY - JOUR A1 - Merchel, Silke A1 - Ott, U. A1 - Altmaier, M. A1 - Herpers, U. A1 - Kuhnhenn, J. A1 - Michel, R. A1 - Mohapatra, R. K. T1 - Update on recoil loss of spallation products from presolar grains T2 - 64th Annual Meeting of the Meteoritical Society CY - Vatican City DA - 2001-09-10 PY - 2001 UR - http://adsabs.harvard.edu/abs/2001M&PSA..36Q.155O VL - 36 IS - 9, Suppl. SP - A155 EP - A156 PB - Allen Press CY - Lawrence, Kan. AN - OPUS4-1173 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ott, U. A1 - Altmaier, M. A1 - Herpers, U. A1 - Kuhnhenn, J. A1 - Merchel, Silke A1 - Michel, R. A1 - Mohapatra, R.K. T1 - Spallation recoil II: Xenon evidence for young SiC grains KW - Presolar grains KW - Spallation KW - Exposure age KW - SiC PY - 2005 SN - 1086-9379 SN - 0026-1114 VL - 40 IS - 11 SP - 1635 EP - 1652 PB - Allen Press CY - Lawrence, Kan. AN - OPUS4-11694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Henschel, H. A1 - Hoeffgen, S.K. A1 - Krebber, Katerina A1 - Kuhnhenn, J. A1 - Weinand, U. T1 - Influence of Fiber Composition and Grating Fabrication on the Radiation Sensitivity of Fiber Bragg Gratings N2 - The radiation-induced Bragg wavelength shift (BWS) was measured with type I gratings made of 12 fibers with very different composition, i.e., of fibers with an extremely different radiation-induced attenuation. With two of the fibers fabrication parameters like laser intensity, hydrogen loading, and annealing conditions after grating inscription were varied. With another fiber type I and type II gratings were made by a completely different process. With gratings made under identical conditions of the 12 fibers the radiation-induced BWS only varied by about a factor of three. Varying the fabrication parameters led to BWS differences up to nearly a factor of ten. KW - Fiber Bragg gratings KW - Gamma radiation KW - Optical fiber sensor KW - Radiation effects PY - 2008 DO - https://doi.org/10.1109/TNS.2008.2001039 SN - 0018-9499 SN - 1558-1578 VL - 55 IS - 4 SP - 2235 EP - 2242 PB - Institute of Electrical and Electronics Engineers (IEEE) CY - New York, NY, USA AN - OPUS4-18570 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -