TY - JOUR A1 - Stroyuk, O. A1 - Raievska, O. A1 - Barabash, A. A1 - Batentschuk, M. A1 - Osvet, A. A1 - Fiedler, Saskia A1 - Resch-Genger, Ute A1 - Hauch, J. A1 - Brabec, C. J. T1 - “Green” Synthesis of Highly Luminescent Lead-Free Cs2AgxNa1-xBiyIn1-yCl6 Perovskites N2 - A new “green” and mild synthesis of highly stable microcrystalline Cs2AgxNa1-xBiyIn1-yCl6 (CANBIC) perovskites under ambient conditions was developed that is scalable to the multi-gram production. Under UV illumination, the CANBIC perovskites emit intense broadband photoluminescence (PL) with a quantum yield (QY) of 92% observed for x = 0.35 and y = 0.01-0.02. The combination of strong UV absorbance and broadband visible emission, high PL QY, and long PL lifetimes of up to 1.4 μs, along with an outstanding stability makes these CANBICs a promising material class for many optical applications. KW - Fluorescence KW - Perovskites KW - Solar cell KW - Automated synthesis KW - Green synthesis KW - Quantum yield KW - Integrating sphere spectroscopy KW - Absolute fluorescence KW - Quality assurance KW - Nano KW - Particle KW - Application KW - Semiconductor KW - Quantum dot KW - Renewable energy PY - 2022 DO - https://doi.org/10.1039/d2tc02055f SN - 2050-7526 VL - 10 IS - 27 SP - 9938 EP - 9944 PB - Royal Society of Chemistry AN - OPUS4-55453 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Barthel, Mathias A1 - Fiedler, J. A1 - Giacomini, M. A1 - Moriske, H.-J. A1 - Seeger, Stefan A1 - Thurner, J.-U. T1 - Partikelemissionen aus Laserdruckern - Aktueller Sachstand N2 - Partikelemissionen aus Laserdruckern sind seit längerem bekannt und wurden bislang als Feinstaubmasse bei der Prüfwertvergabe für den Blauen Engel begrenzt. Seit einigen Jahren weiß man, dass neben den Feinstaubpartikeln auch ultrafeine Partikel beim Betrieb von Laserdruckern emittiert werden. Diese Emissionen lassen sich nur eingeschränkt bis gar nicht über Nachrüstfilter am Druckgerät minimieren. Das Umweltbundesamt (UBA) hat dies zum Anlass genommen, die Prüfvorgaben für den Blauen Engel im Hinblick auf die Erfassung ultrafeiner Partikel anzupassen und zu verschärfen. UBA hat hierzu einen Forschungsauftrag an die Bundesanstalt für Materialforschung und -prüfung (BAM) vergeben. Testverfahren und Prüfvorgaben sind nunmehr erarbeitet und werden im Beitrag vorgestellt. Die geänderten Prüfbedingungen sollen ab 2013 in die Prüfvorgabe eingeführt werden. Etwa drei Viertel der derzeit am Markt erhältlichen Laserdrucker werden die strengen Prüfvorgaben nicht erfüllen können. N2 - Particle emissions from laser printers are since longer time well-known. The total particulate mass (fine dust) is already limited within the Blue Angel basic criteria. For some years we know that besides fine particles (FP) also the ultrafine particle (UFP) fraction is relevant for health impact assessment. These particles are also emitted by laser printing devices. Particle filter systems, fixed outside the printing device housings, do not provide a general solution to the minimization of UFP emissions. The Federal Environment Agency of Germany (UBA) therefore decided to update the existing test procedure and its basic criteria for the Blue Angel ecolabel by considering also the number of ultra fine particles. For this project, UBA contracted the Federal Institute for Materials Research and Testing (BAM). As an outcome, the draft proposal for the extended test procedure along with particle emission limits is presented here. The changed basic criteria are to be set into force by January 2013. It is expected that approximately three-quarters of the printers currently available on the market will not meet these strict test criteria. KW - Laserdrucker KW - Blauer Engel KW - UFP KW - FP KW - Partikelemissionen PY - 2012 SN - 2190-1120 SN - 2190-1147 VL - 1 SP - 23 EP - 29 PB - BfS CY - Berlin AN - OPUS4-25922 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kautek, Wolfgang A1 - Hertwig, Andreas A1 - Martin, Sven A1 - Krüger, Jörg A1 - Lenzner, Matthias A1 - Spielmann, C. A1 - Lenner, M. A1 - Bunte, J. A1 - Puester, T. A1 - Burmester, T. A1 - Fiedler, A. A1 - Heberer, E. A1 - Brose, M. A1 - Stingl, A. A1 - Kiehl, P. A1 - Hönigsmann, H. A1 - Trautinger, F. A1 - Grabner, G. T1 - Safety in Femtosecond Laser Technology - Recent Results of a European Research Project (406) T2 - International Laser Safety Conference 2003 ; ILSC 2003 CY - Jacksonville, FL, USA DA - 2003-03-10 PY - 2003 SN - 0-912035-38-2 SP - 1(?) EP - 10(?) PB - Laser Institute of America CY - Orlando, Fla. AN - OPUS4-2259 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Brose, M. A1 - Ludwig, Th. A1 - Püster, Th. A1 - Bunte, J. A1 - Fiedler, A. A1 - Fischer, M. A1 - Heberer, E. A1 - Kautek, Wolfgang A1 - Spielmann, Ch. T1 - Ultrakurzpuls-Laser: Anwendungen, Risiken, Sicherheitsmaßnahmen KW - Arbeitsschutz KW - Lasersicherheit KW - Ultrakurzpuls-Laser KW - Femtosekunden-Technologie KW - Laserstrahlung KW - Strahlenschutz PY - 2004 SN - 0947-434X VL - 9 IS - 2 SP - 34 EP - 43 PB - Verl. TÜV Rheinland CY - Köln AN - OPUS4-3586 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krauklis, A. E. A1 - Starovka, O. A1 - Gibhardt, D. A1 - Aouissi, H. A. A1 - Burlakovs, J. A1 - Sabalina, A. A1 - Fiedler, Bodo A1 - Kalinka, Gerhard T1 - Reversible and irreversible effects on the epoxy GFRP fiber-matrix interphase due to hydrothermal aging N2 - Epoxy R-Glass Fiber-Reinforced Polymer (GFRP) composite plates were hydrothermally aged at 60 ◦C for 23, 75, and 133 days. The water content reached 0.97 wt%, 1.45 wt% and 1.63 wt%, respectively. The studied GFRP matrix was inert to hydrolysis or chain scission, allowing for investigation of irreversible changes in the fiber-matrix interphase due to hydrothermal aging upon re-drying. During each period, a subset of the specimens was removed from the water bath and dried in a chamber. The weight loss upon drying was explained with epoxy leaching (impurities), sizing-rich interphase hydrolysis, glass fiber surface hydrolysis, accumulated degradation products escaping, and water changing state from bound to free. The influence of hydrothermal aging on the fiber-matrix interfacial properties was investigated. Lower interfacial strength of hydrothermally aged (wet) samples was attributed to plasticization of the epoxy, plasticization and degradation of the sizing-rich interphase (including formation of hydrolytic flaws), and hydrolytic degradation of the glass fiber surface. The kinetics of epoxy-compatible epoxysilane W2020 sizing-rich interphase hydrolysis provided an estimate of ca. 1.49%, 4.80%, and 8.49% of the total composite interphase degraded after 23, 75, and 133 days, respectively. At these conditions, the interface lost 39%, 48%, and 51% of its strength. Upon re-drying the specimens, a significant part of the interfacial strength was regained. Furthermore, an upward trend was observed, being 13%, 10% and 3% strength, respectively; thus, indicating a possibility of partial recovery of properties. KW - GFRP KW - Hydrothermal Ageging KW - Interphase KW - Water Diffusion KW - Desorption KW - Interfacial Strength PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-581554 DO - https://doi.org/10.1016/j.jcomc.2023.100395 SN - 2666-6820 VL - 12 SP - 1 EP - 9 PB - Elsevier B.V. CY - Amsterdam, Niederlande AN - OPUS4-58155 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -