TY - JOUR A1 - Dang, Thi Thuy Hanh A1 - Seeburg, Dominik A1 - Radnik, Jörg A1 - Kreyenschulte, Carsten A1 - Atia, Hanan A1 - Vu, Thi Thu Ha A1 - Wohlrab, Sebastian T1 - Influence of V-sources on the catalytic performance of VMCM-41 in the selective oxidation of methane to formaldehyde N2 - VMCM-41 catalysts from two different tetravalent Vanadium sources, hydrothermally synthesized after a mild gelation step at room temperature, were used as catalysts for the selective oxidation of methane to formaldehyde. Vanadyl acetylacetonate as VMCM-41 precursor, facilitates highest VOx density with predominance of monomeric and a small portion of low-oligomeric VOx species. It produces CH2O in high yield and the highest space time yield (STYCH2O) reaches 5.3 kgCH2O·kgcat −1·h−1 at 600 °C (rate of formation, rCH2O of 363 h−1). VMCM-41 synthesized from vanadyl sulfate hydrate precursor contains a more significant portion of low-oligomeric species. With a lower V loading, these VOx species are significantly less active resulting in a Maximum STYCH2O of 2.7 kgCH2O·kgcat −1·h−1 at 625 °C (rCH2O of 243 h−1). KW - VOx catalyst KW - Methane KW - Formaldehyde PY - 2018 DO - https://doi.org/10.1016/j.catcom.2017.09.004 SN - 1566-7367 VL - 103 SP - 56 EP - 59 PB - Elsevier Science AN - OPUS4-42820 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Elemental Composition and Thickness Determination of Thin Films by Electron Probe Microanalysis (EPMA) N2 - microscopy (AFM), or X-ray reflectometry. For the additional determination of thin film composition, techniques like X-ray photoelectron spectroscopy (XPS) or mass spectrometry-based techniques can be used. An alternative non-destructive technique is electron probe microanalysis (EPMA). This method assumes a sample of homogenous (bulk) chemical composition, so that it cannot be usually applied to thin film samples. However, in combination with the thin film software StrataGEM, the thickness as well as the composition of such films on a substrate can be determined. This has been demonstrated for FeNi on Si and SiGe on Al2O3 film systems. For both systems five samples with different elemental composition and a reference were produced and characterised by Korean research institute KRISS using inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM). These samples were used for an international round robin test. In 2021, a new and open-source thin film evaluation programme called BadgerFilm has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios). In this contribution, we re-evaluated the data acquired for the FeNi and SiGe systems using the BadgerFilm software package and compared the resulting composition and thickness with the results of the established StrataGEM software and other reference methods. With the current evaluation, the BadgerFilm software shows good agreement with the composition and thickness calculated by StrataGEM and as the reference values provided by the KRISS. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - Thin films KW - Electron Probe Microanalysis KW - Interlaboratory Comparisons PY - 2022 AN - OPUS4-54963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - The role of Critical Raw Materials in Advanced Materials for the Energy Transition N2 - The energy transition needs advanced materials, especially for batteries, solar cells, and fuel cells. Therefore, critical raw materials are necessary. In this presentation the use of critcal raw materials and strategies for the optimisation of their use are discussed. T2 - Critical Raw Material Workshop during VAMAS Annual Meeting CY - Teddington, United Kingdom DA - 17.09.2025 KW - Advanced solar cells KW - Iridium oxide KW - Aerogels KW - Advanced carbon materials PY - 2025 AN - OPUS4-64290 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Radnik, Jörg ED - Wandelt, K. T1 - X-ray photoelectron spectroscopy for investigation of heterogeneous catalytic process N2 - Heterogeneous catalysis is a key technology in modern industrial societies. The main steps of a catalytic process take place at the surfaces of complex materials. For the investigations of these surfaces X-ray photoelectron spectroscopy is widely used and fits ideally. At some suitable examples, it will be explained how XPS can help to understand such catalysts better. The focus is on selective oxidation catalysts, one of the main challenges of present research. Here it will illustrate, how changes in the near surface region influence the catalyst performance and, herewith the different stages (activation, maximum performance and deactivation) in the life of catalysts. Additionally, it will be stressed out how important information at different depth regions (surface, near-surface region, bulk) can be useful for comprehensive understanding of the material. Another important subject is nanostructured catalysts with molecular sieves as supports or defined complexes as precursors. Finally, the combination of XPS with other methods used in the analysis of catalysts, e.g. electron microscopy, X-ray absorption spectroscopy and low energy ion scattering will be discussed. KW - X-ray photoelectron spectroscopy KW - Depth information KW - Heterogeneous catalysis KW - Structure-properties relationships PY - 2018 SN - 978-0-12-809739-7 VL - 1 SP - 607 EP - 614 PB - Elsevier AN - OPUS4-44876 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mrkwitschka, Paul A1 - Mühlbauer, Michaela A1 - Rossi, Andrea A1 - Pellegrino, Francesco A1 - Zurutuza, Amaia A1 - Radnik, Jörg A1 - Meier, Florian A1 - Hodoroaba, Vasile-Dan T1 - Morphological Analysis of Graphene Oxide by Scanning Electron Microscopy and Correlative Field-flow Fractionation Coupled with Multi-angle Light Scattering N2 - In this paper graphene related 2D materials (GR2M) arre investigated by centrifugal field flow fractioning (CF3) and SEM. Three materials were selected as case studies (CS): graphene „HD-G (CS I), graphene oxide UniTo“ (CS II), and graphene oxide „Graphenea“ (CS III). For CS I particles were evaluated as constituent particles in agglomerates, for the other two materials only isolated (non aggregated/agglomerated) flakes were considered for determination of the area equivalent circular diameter (ECD). Size analysis of all three materials was carried out by CF3 coupled with MALS (Multi-Angle Light Scattering). For evaluation, it was found that the data obtained was best suited to a disc model. Results are in good agreement when compared to the sizes obtained before CF3 analysis. CS II material is too heterogenous to accurately determine flake size by imaging. CF3 coupled with MALS enables to assess fractions within the highly heterogenous material of CS II. Imaging of the material in CS III after CF3 measurement indicates that the procedure is non-destructive. This could not be verified for the CS‘s I & II As a next step we plan to analyse the fractionated samples by imaging them within a SEM wet-cell. KW - 2D Materials KW - SEM KW - Centrifugal field flow fractionation (CF3) KW - Imaging KW - Size distribution PY - 2025 DO - https://doi.org/10.1093/mam/ozaf048.222 VL - 31 IS - 7 SP - 442 EP - 443 PB - Oxford Academic AN - OPUS4-63804 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Methodologies implemented to measure key properties of graphene and other 2D materials N2 - The key properties and suitable measurement methods for the characterization of graphene-related 2D materials are presented. A case study will be discussed about the chemical characterisation of functionalised graphene used in inks along the production chain. T2 - European-African Graphene Workshop CY - Parys, South Africa DA - 26.11.2025 KW - X-ray photoelectron spectroscoyp KW - Raman spectroscopy KW - Defects KW - Surface Chemistry PY - 2025 AN - OPUS4-64959 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Reliable Chemical Characterization Protocols for Industrial Graphene-Related Materials N2 - Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material. In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition. For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy. T2 - nanoSAFE 2023 CY - Grenoble, France DA - 05.06.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Deep Insights into Functionalised Nanoparticles with Photoelectron Spectroscopy N2 - Modern instrumentation X-ray photoelectron instrumentation combines soft and hard X-rays. Additonally, in the last years methods were developed for the analysis of the measurement data to elucidate the composition and thickness of coatings of nanoparticles. In this presentation four examples will be presented: quantum dots, silica-coated iron-oxide nanoparticles, mixed Fe-Ni-O nanoparticles and amine-functionalized silica nanoparticles. These different nanoparticles are used for displays, for biomedicine, for water splitting, and as additives and fillers. T2 - United Kingdom Surface Analysis Forum Meeting 2025 CY - Teddington, UK DA - 15.07.2025 KW - Simulation KW - Oxygen evolution reaction KW - Transmission electron microscopy KW - Quantitative nuclear magnetic resonance (qNMR) PY - 2025 AN - OPUS4-63733 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - VAMAS Project A33: Chemical composition of functionalized graphene with X ray photoelectron spectroscopy (XPS) N2 - The results of the interlaboratory comparison about the chemical composition of functionalized graphene are presented. T2 - DIN Meeting NA 062-08-16 AA CY - Berlin, Germany DA - 25.05.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gatla, S. A1 - Mathon, O. A1 - Rogalev, A. A1 - Pascarelli, S. A1 - Radnik, Jörg A1 - Pohl, M.-M. A1 - Brückner, A. T1 - Influence of Sb on the structure and performance of Pd-based catalysts: An X-ray spectroscopic study N2 - Combined X-ray photoelectron and absorption fine spectroscopy (XAFS) investigations on 10 wt % Pd–16 wt % Sb/TiO2 catalyst allow new insight into the impact of the co-component Sb on the active Pd species, which catalyzes the gas-phase acetoxylation of toluene to benzyl acetate. Ex situ Pd 3d XPS and Pd L-edge XANES studies indicate the presence of an excess electron charge on metallic Pd species (more 4d electrons than in Pd metal) formed after several hours of stream. This observation was explained by the electron transfer from metallic Sb incorporated into the Pd bulk to the neighboring Pd atoms. TEM-EDX analysis confirms the presence of intermixed Pd–Sb particles with an atomic ratio of between 5 and 6 in the most active catalysts and of 3 in deactivated samples. In situ Sb-K-edge XAFS investigations provide evidence that the Pd–Sb interaction is more pronounced under reaction feed than in the ex situ samples. KW - X-ray spectroscopy KW - Catalysis KW - Alloying / Intermixing PY - 2017 DO - https://doi.org/10.1021/acs.jpcc.6b10932 SN - 1932-7447 VL - 121 IS - 7 SP - 3854 EP - 3861 PB - American Chemical Society AN - OPUS4-39231 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized Ce0.5Zr0.5O2 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized Ce0.5Zr0.5O2 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - XPS KW - HAXPES KW - SEM KW - NanoSolveIT KW - Ce0.5Zr0.5O2 nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7965445 PB - Zenodo CY - Geneva AN - OPUS4-57670 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Analysis of Nanoparticles N2 - The determination of the thickness and composition of the coating is crucial for the understanding of the properties of nanoparticles. Four different approaches will be presented: (i) numerical methods, (ii) descriptive formulae, (iii) the simulation of spectra with Monte-Carlo methods, and (iv) inelastic background analysis. The advantages and limits of these methods will be discussed. T2 - XPS Workshop CY - Teddington, United Kingdom DA - 14.07.2025 KW - Numerical simulation KW - Emperical formulae KW - Simulation KW - Inelastic background analysis PY - 2025 AN - OPUS4-63732 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Correlating HR-TEM and XPS to elucidate the core-shell structure of ultrabright CdSE/CdS semiconductor quantum dots N2 - Controlling the thickness and tightness of surface passivation shells is crucial for many applications of core-shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the application-relevant functionality like a high photoluminescence (PL) quantum yield. This calls for a whole nanoobject approach. Moreover, the thickness of the organic coating remains often unclear. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. The results of the different methods match very well within the different measurement uncertainties. Additionally, results obtained with energy-resolved XPS using excitation energies between 200 eV and 800 eV are discussed with respect to a potential core/shell intermixing. Moreover, the future application potential of this approach correlating different sizing and structural methods is discussed considering the method-inherent uncertainties and other core/multi-shell nanostructures. T2 - E-MRS Fall Meeting CY - Online meeting DA - 20.09.2021 KW - Core-shell nanoparticles KW - Quantum dots KW - High-resolution transmission electron microscopy KW - X-ray Photoelectron Spectroscopy PY - 2021 AN - OPUS4-53365 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -