TY - JOUR A1 - Jungnickel, R. A1 - Mirabella, Francesca A1 - Stockmann, Jörg Manfred A1 - Radnik, Jörg A1 - Balasubramanian, K. T1 - Graphene‑on‑gold surface plasmon resonance sensors resilient to high‑temperature annealing N2 - Gold films coated with a graphene sheet are being widely used as sensors for the detection of label-free binding interactions using surface plasmon resonance (SPR). During the preparation of such sensors, it is often essential to subject the sensor chips to a high-temperature treatment in order to ensure a clean graphene surface. However, sensor chips used currently, which often use chromium as an adhesion promoter, cannot be subjected to temperatures above 250 °C, because under such conditions, chromium is found to reorganize and diffuse to the surface, where it is easily oxidized, impairing the quality of SPR spectra. Here we present an optimized preparation strategy involving a three-cycle tempering coupled with chromium (oxide) etching, which allows the graphene-coated SPR chips to be annealed up to 500 °C with little deterioration of the surface morphology. In addition, the treatment delivers a surface that shows a clear enhancement in spectral response together with a good refractive index sensitivity. We demonstrate the applicability of our sensors by studying the kinetics of avidin–biotin binding at different pH repeatedly on the same chip. The possibility to anneal can be exploited to recover the original surface after sensing trials, which allowed us to reuse the sensor for at least six cycles of biomolecule adsorption. KW - Surface plasmon resonance KW - Graphene KW - Sensing KW - Surface regeneration PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-564585 DO - https://doi.org/10.1007/s00216-022-04450-4 SN - 1618-2642 SP - 1 EP - 7 PB - Springer AN - OPUS4-56458 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fortes Martin, R. A1 - Thünemann, Andreas A1 - Stockmann, Jörg Manfred A1 - Radnik, Jörg A1 - Koetz, J. T1 - From Nanoparticle Heteroclusters to Filament Networks by Self-Assembly at the Water–Oil Interface of Reverse Microemulsions N2 - Surface self-assembly of spherical nanoparticles of sizes below 10 nm into hierarchical heterostructures is under arising development despite the inherent difficulties of obtaining complex ordering patterns on a larger scale. Due to template-mediated interactions between oil-dispersible superparamagnetic nanoparticles (MNPs) and polyethylenimine-stabilized gold nanoparticles (Au(PEI)NPs) at the water–oil interface of microemulsions, complex nanostructured films can be formed. Characterization of the reverse microemulsion phase by UV–vis absorption revealed the formation of heteroclusters from Winsor type II phases (WPII) using Aerosol-OT (AOT) as the surfactant. SAXS measurements verify the mechanism of initial nanoparticle clustering in defined dimensions. XPS suggested an influence of AOT at the MNP surface. Further, cryo-SEM and TEM visualization demonstrated the elongation of the reverse microemulsions into cylindrical, wormlike structures, which subsequently build up larger nanoparticle superstructure arrangements. Such WPII phases are thus proven to be a new form of soft template, mediating the self-assembly of different nanoparticles in hierarchical network-like filaments over a substrate during solvent evaporation. KW - Small-angle X-ray scattering KW - SAXS KW - Nanoparticle KW - Nano structure PY - 2021 DO - https://doi.org/10.1021/acs.langmuir.1c01348 VL - 37 IS - 29 SP - 8876 EP - 8885 PB - American Chemical Society AN - OPUS4-53034 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Stockmann, Jörg Manfred A1 - Radnik, Jörg A1 - Bütefisch, Sebastian A1 - Weimann, Thomas A1 - Hodoroaba, Vasile-Dan T1 - A New XPS Test Material for More Reliable Analysis of Microstructures N2 - A reference material is required for small‐area XPS because it has been used more frequently for surface control in recent years and many operators use incorrect field of views. To address this problem, we developed a test material starting in 2019. We optimised this XPS test material dedicated to the control of analysis position on the sample, with respect to the following factors: type of XPS instruments available on the market, the manufacturing process and sample handling. Test structures are now aligned along lines instead of on a circle radius, so that the individual structures can be accessed more quickly and easily. In addition, a larger test structure of 300 μm and another one in an intermediate size of 18 μm were added. Smaller test structures under 50 μm have been annotated with finder grids/arrows around them so that they are easier to find. Further, the manufacturing process was changed from e‐beam lithography to a mask process to be able to offer the test material at a favourable price. The use of masks also had to be adapted for the new manufacturing process so that the smallest square structures are also realised as such and do not show any distortion of the structure boundaries. The quality control using a metrological SEM confirmed a very reproducible manufacturing process. It is demonstrated that the test material can be successfully employed to find the most suitable beam size of the XPS system used for the analysis of small (μm range) surface features. KW - Small-area measurements KW - Test material KW - XPS KW - XPS imaging PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-616577 DO - https://doi.org/10.1002/sia.7367 SP - 1 EP - 6 PB - Wiley AN - OPUS4-61657 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pu, Y. A1 - Celorrio, V. A1 - Stockmann, Jörg Manfred A1 - Sobol, Oded A1 - Sun, Z. A1 - Wang, W. A1 - Lawrence, M. J. A1 - Radnik, Jörg A1 - Russel, A. E. A1 - Hodoroaba, Vasile-Dan A1 - Huang, L. A1 - Rodriguez, P. T1 - Surface galvanic formation of Co-OH on Birnessite and its catalytic activity for the oxygen evolution reaction N2 - Low-cost, high-efficient catalysts for water splitting can be potentially fulfilled by developing earthabundant metal oxides. In this work, surface galvanic formation of Co-OH on K0.45MnO2 (KMO) was achieved via the redox reaction of hydrated Co2+ with crystalline Mn4+. The synthesis method takes place at ambient temperature without using any surfactant agent or organic solvent, providing a clean, green route for the design of highly efficient catalysts. The redox reaction resulted in the formation of ultrathin Co-OH nanoflakes with high electrochemical surface area. X-ray absorption spectroscopy (XAS) and X-ray photoelectron spectroscopy (XPS) analysis confirmed the changes in the oxidation state of the bulk and surface species on the Co-OH nanoflakes supported on the KMO. The effect of the anions, such as chloride, nitrate and sulfate, on the preparation of the catalyst was evaluated by electrochemical and spectrochemical means. XPS and Time of flight secondary ion mass spectrometry (ToF-SIMS) analysis demonstrated that the layer of CoOxHy deposited on the KMO and its electronic structure strongly depend on the anion of the precursor used during the synthesis of the catalyst. In particular, it was found that Cl- favors the formation of Co-OH, changing the rate-determining step of the reaction, which enhances the catalytic activity towards the OER, producing the most active OER catalyst in alkaline media. KW - Nanoparticles KW - Oxygen evolution reaction (OER) KW - Catalysis KW - ToF-SIMS KW - XPS KW - K-rich Birnessite (K0.45MnO2) PY - 2021 DO - https://doi.org/10.1016/j.jcat.2021.02.025 VL - 396 SP - 304 EP - 314 PB - Elsevier Inc. AN - OPUS4-52328 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Madbouly, Loay Akmal A1 - Mrkwitschka, Paul A1 - Stockmann, Jörg Manfred A1 - Jones, Elliot A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Comparative Elemental Analysis of Commercial Functionalized Graphene Nanoplatelets Along the Production Chain With X‐Ray Photoelectron and Energy‐Dispersive X‐Ray Spectroscopy N2 - Graphene has been commercialized for over a decade, primarily in the form of suspensions and inks. In this study, we investigate the properties of graphene nanoplatelets (GNPs) and their functionalized derivatives, incorporating fluorine or nitrogen as functional groups (FG). The analysis was conducted on three forms, that is, powders, suspensions, and inks, using X‐ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) with energy‐dispersive X‐ray spectroscopy (EDX). The objective of this work is to establish a rapid and comprehensive systematic approach for elemental analysis of commercial functionalized graphene, which can be used for quality control. Functionalization is employed to tailor the material's physical and chemical properties. In our study, graphene samples, functionalized with fluorine or ammonia in a plasma reactor, were investigated. Both XPS and EDX were applicable for all three forms and showed, in general, similar trends between the three forms, so that both XPS and EDX can be used for quality control of GNPs along the production chain. KW - Commercial graphene KW - Functionalized graphene KW - Graphene inks KW - SEM/EDS KW - XPS PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-625752 DO - https://doi.org/10.1002/sia.7386 SN - 1096-9918 SP - 1 EP - 7 PB - Wiley AN - OPUS4-62575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - John, Elisabeth A1 - Weise, Matthias A1 - Radnik, Jörg A1 - Stockmann, Jörg Manfred A1 - Lange, Thorid A1 - Sahre, Mario A1 - Hodoroaba, Vasile-Dan T1 - Towards a New Reference Material—Analytical Challenges in Examining High-Entropy Alloy Thin Films N2 - A new high-entropy alloy (HEA) consisting of titanium, chromium, manganese, iron, and nickel was deposited as a thin-film on silicon substrates using magnetron sputtering from a novel segmented target composed of metal stripes. This material was explored with the goal to create a new reference material for surface analysis and evaluation of complex composite materials. The film's morphology was initially characterized by scanning electron microscopy (SEM), followed by crystallographic analysis using X-ray diffraction (XRD) and selected area electron diffraction (SAED). The two-dimensional compositional homogeneity was assessed using a combination of scanning and transmission electron microscopy (TEM) with energy-dispersive spectroscopy (EDS), X-ray fluorescence (XRF), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and X-ray photoelectron spectroscopy (XPS). The in-depth chemical composition was further analysed using ToF-SIMS and Auger electron spectroscopy (AES). Our findings demonstrate that it is possible to produce thin HEA films with a homogeneous in-depth composition from a segmented target. Notably, despite the fixed composition of the target, we were able to vary the HEA's composition by exploiting inhomogeneities within the magnetrons sputter plasma. Additionally, we successfully created HEA films with significant compositional gradients. T2 - ECASIA CY - Gothenburg, Sweden DA - 10.06.2024 KW - Reference material KW - High-entropy alloy KW - Thin-films PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-625777 DO - https://doi.org/10.1002/sia.7387 SN - 1096-9918 SP - 1 EP - 8 PB - Wiley AN - OPUS4-62577 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, M. A1 - Stockmann, Jörg Manfred A1 - Fernandez, V. A1 - Fairley, N. A1 - Passiu, C. A1 - Spencer, N. D. A1 - Rossi, A. T1 - Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis - Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS) N2 - ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres revises ISO 18516:2006 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution. It implements three different methods delivering parameters useful to express the lateral resolution: (1) the straight edge method, (2) the narrow line method and (3) the grating method. The theoretical background of these methods is introduced in ISO/TR 19319:2013 Surface chemical analysis—Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods. The revised International Standard ISO 18516 delivers standardized procedures for the determination of the (1) effective lateral resolution by imaging of square-wave gratings, the (2) lateral resolution expressed as the parameter D12–88 characterizing the steepness of the sigmoidal edge spread function (ESF) determined by imaging a straight edge and (3) the lateral resolution expressed as the full width of half maximum of the line spread function (LSF), wLSF, determined by imaging a narrow line. The last method also delivers information on the shape of the LSF, which characterizes an individual imaging instrument. Finally, the implementation of all three standardized methods in the field of imaging laboratory X-ray photoelectron spectroscopy (XPS) is shortly presented. This part of the letter is based on the use of a new test sample developed at ETH Zurich, Switzerland. This test sample displays a micrometre scaled pattern motivated by the resolving power of recent imaging XPS instruments. KW - Grating method KW - Imaging AES KW - Imaging SIMS KW - Imaging XPS KW - Lateral resolution KW - Narrow line method KW - Noise in image KW - Resolution criterion KW - Straight edge method PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-536330 DO - https://doi.org/10.1002/sia.7025 SN - 1096-9918 VL - 54 IS - 4 SP - 320 EP - 327 PB - Wiley CY - Chichester AN - OPUS4-53633 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Baier, Jennifa A1 - Fischer, Daniel A1 - Griepentrog, Michael A1 - Hertwig, Andreas A1 - Hielscher-Hofinger, Stefan A1 - Stockmann, Jörg Manfred A1 - Weise, Matthias T1 - Mapping und Imaging modifizierter Oberflächen: Generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit N2 - Der Vortrag widmet sich dem Mapping und Imaging modifizierter Oberflächen: generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit. Es werden Untersuchungsmethoden zu ihrer Prüfung dargestellt. T2 - 37. ak-adp 2021 CY - Jena, Germany DA - 16.06.2021 KW - Qualitätssicherung KW - Mapping modifizierter Oberflächen KW - Imaging modifizierter Oberflächen KW - Generische Kenngrößen KW - Haftfestigkeit KW - Klebfestigkeit PY - 2021 SP - 1 EP - 10 AN - OPUS4-52893 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fink, Friedrich A1 - Stawski, Tomasz M. A1 - Stockmann, Jörg Manfred A1 - Emmerling, Franziska A1 - Falkenhagen, Jana T1 - Surface Modification of Kraft Lignin by Mechanochemical Processing with Sodium Percarbonate N2 - In this article, we present a novel one-pot mechanochemical reaction for the surface activation of lignin. The process involves environmentally friendly oxidation with hydrogen peroxide, depolymerization of fractions with high molecular mass, and introduction of new carbonyl functions into the lignin backbone. Kraft lignin was ground with sodium percarbonate and sodium hydroxide in a ball mill at different time intervals. Analyses by infrared spectroscopy (IR), nuclear magnetic resonance spectroscopy (NMR), size exclusion chromatography (SEC), dynamic vapor sorption (DVS), and small-angle X-ray scattering (SAXS) showed significant improvements. After only 5 min of reaction, there was a 47% reduction in mass-average molecular weight and an increase in carboxyl functionalities. Chemical activation resulted in an approximately 2.8-fold increase in water adsorption. Principal component analysis (PCA) provided further insight into the correlations between IR spectra and SAXS parameters KW - Kraft Lignin KW - Mechanochemical oxidation KW - SEC KW - FTIR KW - SAXS KW - PCA PY - 2023 DO - https://doi.org/10.1021/acs.biomac.3c00584 SN - 1525-7797 SP - 1 EP - 11 PB - American Chemical Society AN - OPUS4-58074 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Stockmann, Jörg Manfred T1 - A new XPS test material for more reliable surface analysis of microstructures N2 - Small-area XPS analysis is one of the most popular and powerful methods for analysing the surface of features in the micro-range. When measuring microstructures, the ques-tion arises whether the measuring point is really located at the point intended to be ana-lysed. Information in a measured spectrum might originate within the field of view (FoV) on the surface of the sample, from outside the FoV, or even from inherent contamination. To ensure that small structures can be measured correctly regardless of user and instru-ment, certain instrument and sample settings must be known and selected correctly: beam and aperture size as well as the aperture settings and the approximate dimensions of the structure to be analysed. This is the only way to ensure that the information in the spectrum originates only from the FoV on the analysed structure. To test the performance of the XPS instruments, a dedicated test material was developed that consists of a gold surface on which 8 circles and 8 squares of chrome are incorpo-rated using a masking process, so that the Au substrate and the Cr structure surfaces are in the same surface plane. In order to be able to test as many as possible instruments from different manufacturers, the structures have been designed with a size ranging from 300 µm down to 7 µm. The layout of the test material has been optimised in regard of the handling. The structures are arranged along lines instead of a circumference, marking arrows around the smaller structures (≤50 µm) are added, and the lithography mask is optimised regarding edge and diffraction effects. Furthermore, the manufacturing process was changed from electron-beam deposition to mask lithography due to costs reasons. The structures on the test material were measured with a metrological SEM to determine their accurate dimensions and check the repeatability of the manufacturing process. XPS investigations with a Kratos AXIS Ultra DLD and an ULVAC-Phi Quantes demonstrates the suitability of this new test material for measuring the analysed area. T2 - ECASIA 2024 CY - Gothenburg, Sweden DA - 09.06.2024 KW - Small-area XPS KW - Test material KW - Field of view KW - Imaging PY - 2024 AN - OPUS4-60539 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -