TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Schulz, H. A1 - Scheibe, H.-J. A1 - Treu, Dieter A1 - Matsubayashi, N. T1 - Analysis of carbon materials by XPS T2 - Materials Week 2002 ; European Congress on Advanced Materials, their Processes and Applications ; 6th International Conference on Joining Ceramics, Glass and Metal CY - Munich, Germany DA - 2002-09-30 PY - 2002 SN - 3-88355-314-X PB - Werkstoff-Informationsges. AN - OPUS4-1734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Treu, Dieter A1 - Schulz, H. A1 - Scheibe, H.-J. A1 - Matsubayashi, N. T1 - Analysis of Carbon Materials by XPS T2 - Materials Week 2002 CY - Munich, Germany DA - 2002-09-30 PY - 2002 AN - OPUS4-3289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris T1 - DLC and nanoparticle analysis by XPS T2 - Kolloquium Sony Inc. CY - Yokohama, Japan DA - 2002-06-03 PY - 2002 AN - OPUS4-6252 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -