TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Website T2 - 9. Deutsches Anwendertreffen "Analytische GDS" CY - Berlin, Germany DA - 2002-09-09 PY - 2002 AN - OPUS4-6239 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - Promotionsverteidigung an der Technischen Universität Dresden CY - Dresden, Germany DA - 2002-10-15 PY - 2002 AN - OPUS4-6247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Hydrogen effect in GDS - Foe or friend? T2 - BNASS11 CY - Loughborough, England DA - 2002-07-08 PY - 2002 AN - OPUS4-6215 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - BAM - Fachgruppenseminar VIII.2 CY - Berlin, Germany DA - 2002-11-05 PY - 2002 AN - OPUS4-6250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Coating technology of high strength steels without hydrogen embrittlement T2 - Super-high strength steels : 1st international conference CY - Milan, Italy DA - 2005-11-02 KW - High strength steel KW - Electroplating KW - Corrosion protection KW - Hydrogen embrittlement KW - Glow discharge optical emission spectroscopy KW - GDOES PY - 2005 SN - 88-85298-56-7 SP - 1 EP - 6(?) PB - AIM CY - Mailand AN - OPUS4-11974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement T2 - 2006 Winter Conference on Plasma Spectrochemistry CY - Tucson, AZ, USA DA - 2006-01-08 PY - 2006 AN - OPUS4-11990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Quantitative and localized Hydrogen Analysis of electroplated Material KW - Hydrogen KW - GD-OES depth profiling KW - Electroplating KW - Certified reference materials (CRM) KW - Certified reference coatings (CRC) KW - Quantification KW - Embrittlement PY - 2004 SP - 63 EP - 70 PB - American Electroplaters and Surface Finishers Society (AESF) CY - Orlando AN - OPUS4-6977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Riedel, J.-U. A1 - Paatsch, Wolfgang T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement KW - GD-OES KW - GDS KW - Hydrogen KW - Embrittlement PY - 2006 SN - 0161-6951 VL - 31 SP - 354 EP - 356 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-11935 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Berechnung von Röntgenröhrenspektren auf der Grundlage experimenteller Röntgenausbeuten T2 - Forschungsseminar "Ausgewählte analytische Methoden der Physik" CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12453 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Simulation der Spektren von Röntgenröhren des Typs MCBM 50 im REM T2 - Fachtagung Prozessnahe Röntgenanalytik (PRORA 2005) CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11325 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison report from VAMAS with ISO/TC 202 Microbeam Analysis N2 - The progress in the activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects/inter-laboratory comparisons. The recently started project FIB sample processing for TEM is presented. Next projects in the pipeline involving EBSD and TKD are shortly announced. The need of more promotion for the engagement of more experts from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. T2 - 29th Annual Meeting of ISO/TC 202 Microbeam Analysis CY - Online meeting DA - 28.11.2022 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - EBSD KW - Electron microscopy KW - Thin films PY - 2022 AN - OPUS4-56424 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of elemental composition of Fe1-xNix and Si1-xGex alloy thin films by EMPA and µ-XRF N2 - It was demonstrated in the past that the electron probe microanalysis (EPMA) can be applied to determine accurately both elemental composition and thickness of thin films by using the dedicated software package for thin film analysis Stratagem. A relatively small number of film materials such as pure metallic films of platinum and nickel, binary alloys of Fe-Ni, and Pt-Ni-Co ternary alloy films has been reported in literature as working successfully. Further, the software can be applied ‘inversely’, i.e., by feeding it with the thickness of the film and using the determined mass coating, one can easily calculate the film density, which for porous layers leads us to the true film porosity. The present study repeats measurements on an already tested system of Fe-Ni thin films on silicon and reports for the first-time results of analysis on Si-Ge thin films deposited on a non-conductive aluminium oxide substrate. Standard-based and standardless EPMA (with EDS) results were used in combination with Stratagem for the quantification. Further, X-ray fluorescence analysis (XRF) can be used for the determination of elemental composition and thickness of such films as well. In this case, XRF with a μ-focus X-ray source (μ-XRF) attached to a SEM was applied. For quantification, a fundamental parameter (FP) approach has been used to calculate standard-based and standardless results. Compared to EPMA, XRF has a larger information depth and a higher elemental sensitivity because of a generally lower background. Both thin film systems have been chosen as samples of an international round robin test (RRT) organised in the frame of standardisation technical committee ISO/TC 201 ‘Surface chemical analysis’, under the lead of KRISS. The main objective of the RRT is to compare the results of atomic fractions of Fe1-xNix and Si1-xGex alloy films obtained by different surface Analysis techniques, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) applied in the depth-profiling operation mode. Five samples of different atomic fractions of each thin film system, i.e., Fe1-xNix and Si1-xGex, have been grown by ion beam sputter deposition on silicon and Al2O3 wafers, respectively. Reference FeNi and SiGe films with well-known elemental composition and thickness have been also supplied for standard-based analysis. The atomic fractions of all the samples including the references have been certified by RBS (Rutherford backscattering spectrometry) and ICP-AES (inductively coupled plasma atomic emission spectroscopy). T2 - EMAS 2019 - 16th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Trondheim, Norway DA - 19.05.2019 KW - EPMA KW - FeNi KW - SiGe KW - Thin film analysis KW - µ-XRF PY - 2019 AN - OPUS4-48113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - About Interlaboratory Comparisons (ILCs) and VAMAS N2 - Advanced materials, such as nanomaterials, 2D materials, or thin films, play a crucial role in driving economic development and addressing major challenges in the coming years. These challenges include mitigating the impact of climate change, advancing lightweight engineering, enhancing catalysis, and improving medical applications. To comprehend the performance of these materials and ensure their acceptance across various sectors as safe and sustainable for both humans and the environment, the availability of reference procedures, materials, and data is essential. One versatile tool for establishing such references and evaluating the proficiency of individual laboratories and their competencies is through (international) interlaboratory comparisons (ILC). Notably, initiatives like the Versailles Project on Advanced Materials and Standards (VAMAS) provide a platform for conducting ILCs. This webinar will showcase various examples of interlaboratory comparisons, illustrating their impact on the development of reference products. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Interlaboratory comparison KW - Reference products KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-60096 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphology Analysis of Graphene Oxide Flakes with SEM - Preparation of an Inter-Laboratory Comparison @VAMAS N2 - Experience gained at BAM within the European project ISGScope on the accurate measureemnt of graphene oxide flakes by electron microscopy is presented. Particularly, factors such as the type of solvent, substrate temperature, but also proper, gentle measurement parameters and image analysis conditions towards automation are highlighted. The measurement procedures in develeopment are being prepared to launch an inter-laboratory comparison under VAMAS (TWA41) as preparatory guidance for future standardisation at ISO. T2 - ISO/TC 229 Nanotechnologies Plenary Meeting - Graphene Standardisation CY - Teddington, UK DA - 14.11.2022 KW - Graphene oxide flakes KW - SEM KW - Morphology KW - VAMAS KW - Standardisation KW - Sample preparation KW - ISOGScope PY - 2022 AN - OPUS4-56300 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of Lateral Size of Graphene Oxide Flakes by SEM - An Update of the VAMAS TWA 41 Project P13 N2 - The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are highlighted. The implementation of the results into the corresponding ISO technical specification AWI/TS 23879 is also discussed and planned, in relation with the AFM part. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - VAMAS KW - ISO/TC 229 Nanotechnologies KW - Interlaboratory comparison KW - Graphene oxide flakes KW - SEM PY - 2023 AN - OPUS4-58813 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33249 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS N2 - Traceable morphological and chemical characterization of nanomaterials with respect to the various possible sizes, size distributions, shapes, and concentrations of real-world nanoparticles (NPs) is a challenging task. Particularly for the nonspherical, non-monodisperse nanoparticles – as typically for most of the commercial particles, including their strong tendency to agglomerate, there is a lack of standard operation procedures providing accurate nanoparticle characterisation. In the framework of the pre-standardisation framework of VAMAS (Versailles Project on Advanced Materials and Standards, www.vamas.org) two interlaboratory comparison (ILC) studies are being carried out under the Technical Working Area (TWA) 34 “Nanoparticle Populations”:i) Project #15 addresses the analysis of the size and shape distribution of TiO2 bipyramidal NPs by traceable imaging methods such as TEM, SEM, STEM-in-SEM, AFM as well as with SAXS as an ensemble method. This ILC is thought as the next level development of the case studies exemplified in the published ISO standards ISO 21363 and ISO 19749. It was agreed to complete the first ILC with the NPs already prepared according to the same procedure on a TEM grid, and, at a later stage, to carry out second ILCs with the same NPs distributed to the participants as liquid suspensions together with protocols for the uniform NP deposition on suited substrates - as developed and optimized within the European project nPSize. Once having good deposition protocols available, the door for automated image analysis gets opened. Corresponding image analysis protocols and reporting templates have been distributed to the ILC participants, too. ii) Project #16: two spherical SiO2 NP samples with bi-modal size distributions in two nominal relative number concentrations were prepared and distributed also as liquid suspensions accompanied by sample preparation, measurement, and image analysis protocols and reporting templates. Here, the NP concentration is the primary parameter to be measured. For the imaging methods it is targeted to measure the relative nanoparticle concentrations (relative populations of the two modes). The results of all the participating laboratories, in both ILCs, compiled in comparative representations will be shown and discussed for the first time. The reduction of the measurement uncertainties associated to the size, shape and number-concentration results induced by the significant improvement of the sample preparation on substrates (as single particles with a high-density coverage), combined with well-defined image analysis procedures will be highlighted. Finally, a very recent 3rd ILC an the determination of lateral size of Graphene Oxide flakes by SEM is presented as project P13 under VAMAS TWA41 Graphene and Related 2D. T2 - Microscopy and Microanalysis 2024 CY - Cleveland, OH, USA DA - 28.07.2024 KW - VAMAS KW - Interlaboratory comparison KW - Imaging KW - Nanoparticles KW - Electron microscopy KW - Graphene oxide KW - Particle size distribution PY - 2024 AN - OPUS4-60875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Physical-chemical Characterization of Graphene-Related 2D Materials: Development of Approaches for Reliable Quantification N2 - An accurate characterisation of the morphological, structural, and chemical properties of nano and advanced materials is key for the understanding of the material functionality and constitutes the basis for future optimisation or even prediction of the product performance. Further, the correlation of the physical-chemical properties with results from biological testing leads to an understanding of the potential toxicological effects so that a minimisation of the materials risks becomes possible. The presentation will highlight with examples the importance of the selection of the relevant parameters/descriptors and particularly their measurement for the reliable characterisation of the morphology, structure, and chemistry of graphene-related 2D-materials (GR2M’s) [1-3]. One crucial aspect is also one of most challenging ones in the characterisation chain: the proper sample preparation, which shall be tailored to the accurate measurement of the defined analytical parameter. Practical examples of measurement of morphological descriptors of GR2M’s, such as equivalent circular diameter (ECD), minimum and maximum Feret, and aspect ratio with electron microscopy, or of the thickness with atomic force microscopy (AFM) will be showed, together with quantitative chemical characterisation with X-ray photoelectron spectroscopy (XPS) and, newly, with energy-dispersive X-ray spectroscopy with a scanning electron microscope (SEM/EDX) [4] by evaluating accurately the elemental content as the ratio of O/C and the composition of impurities. Another relevant, but challenging part of the characterisation of GR2M’s, particularly as the final products containing mostly low amounts of GR2M’s, is the analysis of homogeneity of the chemical composition by sensitive imaging methods. Examples of successful analysis with secondary ion mass spectrometry (SIMS), even if not quantitative, will be showed. T2 - SaferWorldbyDesign Webinars CY - Online meeting DA - 25.03.2025 KW - Graphene-related 2D materials KW - Standardisation KW - Interlaboratory comparison KW - Physico-chemical characterisation PY - 2025 UR - https://saferworldbydesign.com/webinars/ AN - OPUS4-62791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quantitative EDS analysis on graphene related 2D materials N2 - The elemental analysis of solid matter by means of the Energy-Dispersive X-Ray Spectrometry (EDS) is meanwhile posible as a quick (seconds!) and more and more accurate analysis via standardsless (instantaneous) quantification. The sensitivity & quantification accuracy for light elements (C, O,..) has significantly increased in the recent years. The availability via table-top SEMs with incorporated EDS is also enhanced. Further, the EDS analysis at an SEM is well-standardized, see ISO/TC 202 Microbeam Analysis & VAMAS/ TWA 37 Quantitative Microstructural Analysis in good liaisonships with ISO/TC 229 Nanotechnologies. It is demostrated that key parameters such as oxygen-to-carbon atomic-% ratio and impurities can be realibly measured, with XPS as a reference method. Various EDS spectrometers and analysis conditions are tested and the validity of the EDS quantification of an ionic liquid of well-defined chemical composition is demonstrated. Next steps are to launch a corresponding VAMAS interlaboratory comparison and to discuss within ISO/TC 229 towards inclusion of EDS as a routine method for the elemental analysis of GR2M into the ISO/TS 23359 Nanotechnologies — Chemical characterization of GR2Ms in powders and suspensions. T2 - Annual Microscopy Community Meeting for the National Research Council in Canada CY - Online meeting DA - 18.11.2025 KW - Graphene-related 2D materials (GR2M) KW - Elemental analysis KW - Light elements KW - SEM/EDS KW - Standardisation PY - 2025 AN - OPUS4-64766 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges for an accurate Reference-free quantitative Analysis with µ-XRF at a SEM/EDS T2 - European Conference on X-Ray Spectrometry CY - Figueira da Foz, Portugal DA - 2010-06-20 PY - 2010 AN - OPUS4-23568 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of Lateral Dimensions of Particles & Flakes (2D) by Imaging Methods N2 - An overview with the basics of size and shape measurement of particles and 2D structures according to established methodologies (and popular imaging processing software packages) with imaging techniques is given. Main descriptors are explained based on practical cases are determined interactively at the flipchart. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Nanoparticles KW - 2D materials KW - Lateral dimensions KW - ISO KW - Imaging PY - 2024 AN - OPUS4-60454 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - WD- & ED- Electron Probe Microanalysis on Au-Cu alloys - A CCQM/SAWG Pilot Study (P130) T2 - Training course on Quality Assurance for Traceable Energy Dispersive Electron Probe Microanalysis (ED-EPMA) CY - Berlin, Germany DA - 2014-03-28 PY - 2014 AN - OPUS4-30584 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Correlative Morphological-Chemical Imaging of Nanostructured Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Conference on Applied Surface and Solid Material Analysis AOFKA 2023 CY - Zurich, Switzerland DA - 11.09.2023 KW - Correlative imaging KW - Electron microscopy KW - X-ray spectroscopy KW - Nanostructures PY - 2023 UR - https://aofka23.scg.ch/ AN - OPUS4-58338 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Correlative imaging analysis of non-spherical nanoparticles N2 - It sounds like being a simple analytical task, it is definitely not. The way toward accurate measurement of the size distribution of nanoparticles (NPs) with complex shape, having a broad size polydispersity, with inhomogeneous chemistry, and with a high degree of agglomeration/aggregation is very challenging for all available analytical methods. Particularly for the NPs with complex shape, the access to the smallest dimension (as e.g. required for regulatory purposes) can be enabled only by using imaging techniques with spatial resolution at the nanoscale. Moreover, the full 3D-chacterisation of the NP shape can be provided either by advanced characterization techniques like 3D-TEM tomography or by correlative analysis, i. e. synergetic/complementary measurement of the same field-of-view of the sample with different probes. Examples of the latter type of analysis are: i) electron microscopy for the lateral dimensions and AFM for the height of the NPs, ii) SEM with STEM-in-SEM (also called T-SEM), iii) Electron Microscopy with TKD (Transmission Kikuchi Diffraction) for determination of the geometrical orientation of crystalline NPs, iv) Raman and SEM for e.g. thickness of graphen flakes, or v) Electron Microscopy for descriptive NP shape and SAXS for the NP concentration, the latter as a NP property able to be measured with higher and higher accuracy. For all these types of measurement, reference NPs are necessary for the validation of the measured size. Particularly non-spherical reference NPs are still missing. Examples of such new reference NPs as characterized by the correlative analyses enumerated above will be presented in detail in the contribution. T2 - 2021 Fall Meeting of the European Materials Research Society (E-MRS) CY - Online meeting DA - 20.9.2021 KW - Nanoparticles KW - Transmission Kikuchi Diffraction (TKD) KW - Correlative imaging KW - Electron microscopy KW - AFM KW - TiO2 KW - VAMAS PY - 2021 UR - https://www.european-mrs.com/meetings/2021-fall-meeting AN - OPUS4-53367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ghasem Zadeh Khorasani, Media A1 - Elert, Anna Maria A1 - Hodoroaba, Vasile-Dan A1 - Agudo Jácome, Leonardo A1 - Altmann, Korinna A1 - Silbernagl, Dorothee A1 - Sturm, Heinz T1 - Short- and long-range mechanical and chemical interphases caused by interaction of Boehmite (γ-AlOOH) with anhydride-cured epoxy resins N2 - Understanding the interaction between boehmite and epoxy and the formation of their interphases with different mechanical and chemical structures is crucial to predict and optimize the properties of epoxy-boehmite nanocomposites. Probing the interfacial properties with atomic force microscopy (AFM)-based methods, especially particle-matrix long-range interactions, is challenging. This is due to size limitations of various analytical methods in resolving nanoparticles and their interphases, the overlap of interphases, and the effect of buried particles that prevent the accurate interphase property measurement. Here, we develop a layered model system in which the epoxy is cured in contact with a thin layer of hydrothermally synthesized boehmite. Different microscopy methods are employed to evaluate the interfacial properties. With intermodulation atomic force microscopy (ImAFM) and amplitude dependence force spectroscopy (ADFS), which contain information about stiffness, electrostatic, and van der Waals forces, a soft interphase was detected between the epoxy and boehmite. Surface potential maps obtained by scanning Kelvin probe microscopy (SKPM) revealed another interphase about one order of magnitude larger than the mechanical interphase. The AFM-infrared spectroscopy (AFM-IR) technique reveals that the soft interphase consists of unreacted curing agent. The long-range electrical interphase is attributed to the chemical alteration of the bulk epoxy and the formation of new absorption bands. KW - Nanocomposites KW - Interphase KW - Intermodulation AFM KW - Electron microscopy KW - Infrared nano AFM PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-483672 UR - https://www.mdpi.com/2079-4991/9/6/853/htm DO - https://doi.org/10.3390/nano9060853 SN - 2079-4991 VL - 9 IS - 6 SP - 853, 1 EP - 20 PB - MDPI AN - OPUS4-48367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Karafiludis, Stephanos A1 - de Oliveira Guilherme Buzanich, Ana A1 - Heinekamp, Christian A1 - Smales, Glen Jacob A1 - Hodoroaba, Vasile-Dan A1 - ten Elshof, J. E. A1 - Emmerling, Franziska A1 - Stawski, Tomasz T1 - Template-free synthesis of mesoporous, amorphous transition metal phosphate materials N2 - We present how mesoporosity can be engineered in transition metal phosphate (TMPs) materials in a template-free manner. The method involves a transformation of a precursor metal phosphate phase, called M-struvite (NH4MPO4·6H2O, M = Mg2+, Ni2+, Co2+, NixCo1-x2+). It relies on the thermal decomposition of crystalline M-struvite precursors to an amorphous and simultaneously mesoporous phase, which forms while degassing of NH3 and H2O. The temporal evolution of mesoporous frameworks and the response of the metal coordination environment were followed with in-situ and ex-situ scattering and diffraction, as well as X -ray spectroscopy. Despite sharing the same precursor struvite structure, different amorphous and mesoporous structures were obtained depending on the involved transition metal. We highlight the systematic differences in absolute surface area, pore shape, pore size, and phase transitions depending on a metal cation present in the analogous M-struvites. The amorphous structures of thermally decomposed Mg-, Ni- and NixCo1-x-struvites exhibit high surface areas and pore volumes (240 m²g-1 and 0.32 cm-3 g-1 for Mg and 90 m²g-1 and 0.13 cm-3 g-1 for Ni). We propose that the low-cost, environmentally friendly M-struvites could be obtained as recycling products from industrial and agricultural wastewaters. These waste products could be then upcycled into mesoporous TMPs through a simple thermal treatment for further applications, for instance, in (electro)catalysis. KW - Struvite KW - Pphosphates KW - Transition metal KW - In-situ SAXS/WAXS KW - Mesoporosity PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-569503 DO - https://doi.org/10.1039/D2NR05630E SN - 2040-3364 SP - 1 EP - 15 PB - Royal Society of Chemistry (RSC) AN - OPUS4-56950 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -