TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - How to develop Key Comparisons for Electron Probe Microanalysis (incl. EDX/WDX) T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2008-04-01 PY - 2008 AN - OPUS4-17382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Determination of the real transmission jof an x-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra KW - X-ray optics KW - Transmission KW - Micro-focus-XRF KW - SEM PY - 2009 DO - https://doi.org/10.1002/xrs.1151 SN - 0049-8246 VL - 38 IS - 3 SP - 216 EP - 221 PB - Wiley CY - Chichester AN - OPUS4-19352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A basic physical Model of X-Ray Scattering for improved X-Ray Fluoescence Analysis - Polychromatic X-Ray Tube Excitation T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19534 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19535 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to a SEM T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19442 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - X-Ray Scattering and its Benefit for X-Ray Spectrometry at the SEM T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 37 - Quantitative Microstructural Analysis & Liaison with ISO/TC 202 Microbeam Analysis, Liaison with ISO N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. Further, a short overview of the VAMAS areas of activities is given where Germany is involved. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 46th Steering Committee Meeting CY - Online meeting DA - 08.09.2021 KW - VAMAS KW - Nanoparticles KW - Standardisation KW - Inter-laboratory comparison KW - ISO/TC 202 KW - ISO/TC 229 KW - ISO/TC 201 KW - Microstructure KW - EBSD PY - 2021 UR - http://www.vamas.org/twa/ AN - OPUS4-53237 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fagan, J. T1 - Contributors invited for two studies on concentration of bimodal silica nanoparticle and bipyramidal titania N2 - International standardisation network VAMAS is calling for participants in two studies on the measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension and the measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension. KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - TiO2 KW - SiO2 PY - 2021 UR - https://www.iom3.org/resource/contributors-invited-for-two-studies-on-concentration-of-bimodal-silica-nanoparticle-and-bipyramidal-titania.html SP - 1 EP - 2 PB - Institute of Materials, Minerals and Mining (IOM3) CY - London, UK AN - OPUS4-54410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - EDS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - EDS spectra of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided. KW - EDS KW - Titania nanoparticles KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.4986420 PB - Zenodo CY - Geneva AN - OPUS4-52833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bennet, Francesca A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - SEM raw data for the particles size distribution of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - SEM raw images of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided together with the particle size distribution of the minimum Feret Diameter extracted from the given images. KW - SEM KW - Titania nanoparticles KW - Particle size distribution KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.5007367 PB - Zenodo CY - Geneva AN - OPUS4-52836 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Röntgenspektroskopie am Rasterelektronenmikroskop in der AG "Schicht- und Oberflächenanalytik" 2002 - 2008 T2 - Kolloquium "Energiedispersive Elektronenstrahl- und Röntgenfluoeszenz-Mikrobereichsanalyse am REM" CY - Berlin, Germany DA - 2008-05-27 PY - 2008 AN - OPUS4-17603 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and chemical analysis of mesoporous mixed IrOx-TiOy thin films as electrode materials N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - Mesoporous KW - Thin films KW - Iridium oxide KW - Titanium oxide KW - Thin film analysis KW - Porosity KW - SIMS KW - Auger electron spectroscopy PY - 2024 AN - OPUS4-60185 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Chemical Nanoscale Analysis of Mesoporous Mixed IrOx-TiOx Thin Films N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach. Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Thin films KW - Mesoporous KW - IR oxide KW - Ti oxide KW - Porosity PY - 2024 AN - OPUS4-60452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Pellegrino, Francesco A1 - Hodoroaba, Vasile-Dan T1 - STEM-in-SEM versus SE-InLens-type-SEM as a Reliable Analytical Pair-Tool for Measurement of Nanoparticle Size and Shape Distribution N2 - Following points are addressed in this contribution: Advantages of correlative analysis in electron microscopy; Measurement principle of the different electron microscopy modes used; Presentation of the nanomaterials used for this study; Role of sample preparation; and, with particular description, the Sequence kV-variation with InLens SE & transmission SEM detection of the same field-of-view. KW - Nanoparticles KW - Electron microscopy KW - Metrology KW - Particle size distribution PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.308 VL - 30 IS - Supplement_1 SP - 650 EP - 651 PB - Oxford University Press (OUP) AN - OPUS4-61042 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Heilmann, Maria A1 - Pellegrino, Francesco A1 - Durand, Bénédicte A1 - Taché, Olivier A1 - Zurutuza, Amaia A1 - Hodoroaba, Vasile-Dan T1 - Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS N2 - An overview with the basics of size and shape measurement of particles and 2D structures according to established methodologies (and popular imaging processing software packages) with imaging techniques is given. Main descriptors are explained based on case studies with ongoing interlaboratory comparisons under the pre-standardisation platform of VAMAS. KW - VAMAS KW - Interlaboratory comparison KW - Imaging KW - Size distribution KW - Particle concentration KW - 2D materials PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.319 VL - 30 IS - Supplement 1 SP - 669 EP - 670 PB - Oxford University Press (OUP) AN - OPUS4-61183 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report VAMAS/TWA 37 "Quantitative Microstructural Analysis" & Liaison with ISO/TC 202 "Microbeam Analysis" N2 - The progress in activities on Quantitative MicroStructural Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 Microbeam Analysis is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing projects "Development of guidelines for reproducible TEM specimen preparation by FIB processing", "Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)", "Repeatability of high angular resolution electron backscatter diffraction (HR-EBSD) analysis for elastic strain measurements", and "Measurement of grain size and distribution of nanocrystalline nickel by using Transmission Kikuchi Diffraction (TKD) in SEM" are presented in detail. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Interlaboratory comparison KW - Microbeam Analysis KW - FIB KW - SEM KW - TEM KW - Sample preparation PY - 2024 UR - www.vamas.org/twa37/index.html AN - OPUS4-61388 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis and other TWAs since the last Annual Meeting of ISO/TC 202 is reported. The VAMAS/TWA 37 projects initiated in the last year and the new ones in the planing phase are highlighted with technical and organisational details. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - Microbeam Analysis KW - Interlaboratory comparison KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-61513 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges in Correlative imaging of Advanced Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Online meeting DA - 18.11.2024 KW - Imaging KW - Advanced materials KW - Correlative imaging KW - Nanomaterials KW - Electron microscopy KW - ToF-SIMS PY - 2024 UR - https://macrame-project.eu/macrame-meetings-workshops/2nd-joint-online-workshop-harmonisation-standardisation-of-test-methods-for-nano-and-advanced-materials/ AN - OPUS4-61858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fernandez-Poulussen, D. A1 - Hodoroaba, Vasile-Dan T1 - Holistic, reliable and practical Characterization Framework for Graphene Family Materials, a correlated approach including Imaging based techniques N2 - ACCORDs is an Horizon Europe project working in the development of an imaging-based characterization framework (ACCORDs framework) for the holistic correlative assessment of Graphene Family Materials (GFMs) as a representative of 2D nanomaterials (NMs) to assess and predict 2D NMs health and environmental risks. The ACCORDs framework will operationalise safe and sustainable by design (SSbD) strategies proposed in past or ongoing H2020 projects or within OECD by correlating low-, medium-, and high-resolution physico-chemical-biological imaging-based methods with non-imaging methods in a tiered approach. ACCORDs will deliver the ACCORDs framework and user guidance, new imaging-based characterisation methods, reference in vitro tests, new reference 2D NMs for different matrices, a new minimum information reporting guideline for FAIR data sharing and reuse of images as well as an atlas with reference images for diagnostics of compromised safety of GFMs/GFM products. The new guidelines and standard proposals will be submitted to standardisation bodies to allow creation of regulatory ready products. The novelty of ACCORDs is in translating the principles of medical imaging-based diagnostics to 2D material hazard diagnostics. ACCORDs will accelerate industrial sectors in the area of aviation, marine construction, drone production, flexible electronics, photovoltaics, photocatalytics and print inks-based sensors. The value ACCORDs proposes to the graphene industry are practical, easy, imaging-based tools for GFM quality monitoring next to the production line with a possibility to be correlated with advanced highresolution imaging characterization methods in case hazard i.e. deviation from controls (benchmark values) are diagnosed. The ACCORDs framework and tools will contribute to the European Green Deal by addressing the topic: “Graphene: Europe in the lead” and to a new European strategy on standardization, released on 2nd February, 2022 T2 - Joint Regulatory Risk Assessors Summit – Advancing Safety & Sustainability Assessments of Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Graphene-related 2D materials (GR2M) KW - Imaging KW - SSbD KW - ACCORDs PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda AN - OPUS4-63660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, Jeffrey A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA Nanoparticle Populations Projects 15 and 16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Nanoparticles KW - Nanoparticle size and shape distribution KW - Particle number concentration KW - Interlaboratory comparison KW - Standardisation PY - 2024 UR - http://www.vamas.org/twa34/index.html AN - OPUS4-61422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, J. A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 34 Nanoparticle Populations Combined Projects P15 and P16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. - Discussion of sample preparation issues - Publication of the results in 2026 T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Particle size and shape distribution KW - Particle number concentration KW - Standardisation PY - 2025 UR - https://www.vamas.org/twa34/index.html AN - OPUS4-64234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Advanced Materials Germany 2025 N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Advanced Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Advanced materials KW - Standardisation PY - 2025 AN - OPUS4-64232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33248 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - A test material and a quick procedure for the performance check of X-ray spectrometers attached to the SEM PY - 2009 DO - https://doi.org/10.1017/S143192760909432X SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1120 EP - 1121 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19793 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Performance check of a wavelength dispersive X-ray spectrometer (WDS) attached to the SEM PY - 2009 DO - https://doi.org/10.1017/S1431927609094112 SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1118 EP - 1119 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Spezielles iMOXS für die Spektroskopie leichter Elemente T2 - iMOXS Anwendertreffen, BAM CY - Berlin, Germany DA - 2009-10-01 PY - 2009 AN - OPUS4-20042 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM T2 - Microscopy & Microanalysis CY - Portland, OR, USA DA - 2010-08-01 PY - 2010 AN - OPUS4-20909 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A joint NIST/BAM Pilot Study for EPMA (WD & ED) - A Proposal T2 - "Surface Analysis Working Group" (SAWG) Meeting, CCQM CY - Paris, France DA - 2010-04-14 PY - 2010 AN - OPUS4-21170 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance check of EDS X-ray spectrometers; extension to high count rates T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis CY - Angers, France DA - 2011-05-15 PY - 2011 AN - OPUS4-23550 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Elemental Analysis with ED-EPMA, WE-EPMA and µ-XRF at a SEM T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23778 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of the performance of energy dispersive X-ray spectrometers - ISO 15632 and more T2 - IUMAS, 5th International Union of Microbeam Analysis Society CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23776 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - CCQM-P130: A Joint NIST/BAM Pilot Study for ED- and WD-EPMA T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2011-04-12 PY - 2011 AN - OPUS4-23567 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der ED-Röntgenspektrometer-Eigenschaften mit dem BAM-Testmaterial EDS-TM001 T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of EDS X-Ray Spectrometers - Extension to high Count Rates T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Nachweisgrenzen der µ-RFA mit REM/EDS für RoHS-Elemente T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension N2 - The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration • electron microscopy (SEM, TEM) and atomic force microscopy (AFM) • two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - SiO2 KW - Electron microscopy KW - AFM PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study T2 - Microscopy and Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Reference materials for the performance check and specification of energy dispersive X-ray spectrometers (EDS) in electron probe microanalysis (EPMA) T2 - European Conference on X-Ray Spectrometry CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26119 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Reference Materials for the Performance Check and Specification of Energy Dispersive X-Ray Spectrometers in Electron Probe Microanalysis T2 - European Conference on X-Ray Spectrometry EXRS 2012 CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26143 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan T1 - Oberflächlich betrachtet - Spektroskopie analysiert Werkstoffe KW - Mikrobereichsanalyse KW - Metalle KW - Ringversuch KW - Messunsicherheit PY - 2012 UR - http://www.laborpraxis.vogel.de/analytik/spektroskopie-und-photometrie/roentgenstrukturanalyse/articles/356924 SN - 0344-1733 SN - 1610-8256 IS - März SP - 20 EP - 21 PB - Vogel CY - Würzburg AN - OPUS4-25745 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26307 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Modeling of X-Ray Scattering for an improved XRF-Analysis T2 - European Conference on X-Ray Spectrometry CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26121 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan T1 - Instrumental performance parameters for specification and check of energy dispersive X-ray spectrometers as in the international standard ISO 15632 N2 - Simple procedures for specifying and checking the performance of energy dispersive X-ray spectrometers (EDS) have been since 2002 available in form of the international standard ISO 15632:2002 [1]. When specifying their spectrometers all major EDS manufacturers refer meanwhile to this standard. Main spectrometer parameters such as energy resolution can be determined as recommended in there. Just several years ago the Si-Li detector has been the mostly widespread type of detector. Since four-five years, silicon drift detector (SDD) EDS providing comparable (in many cases even better) energy resolutions at much higher count rates than the conventional Si-Li’s have got the breakthrough on the market. KW - ED-EPMA KW - WD-EPMA KW - (mu-)XRF KW - EDX PY - 2011 DO - https://doi.org/10.1017/S1431927611003941 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - Suppl. 2 SP - 614 EP - 615 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26750 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - WD- & ED-Electron Probe Microanalysis on Au-Cu alloys - Report on progress with CCQM-P130 and how to design a Key Comparison based thereon T2 - CCQM/SAWG (Surface and Micro/Nano Analysis Working Group) Meeting 2013 CY - Sèvres, France DA - 2013-04-16 PY - 2013 AN - OPUS4-28148 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery by Means of SEM/EDX - Hints about the Manufacturing Process T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28509 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Procop, M. A1 - Hodoroaba, Vasile-Dan T1 - Characterization of polycapillary X-ray semilenses with SEM/EDX KW - Polycapillary X-ray optics KW - Semi-lens KW - Parallelising mode KW - SEM KW - EDS KW - Acceptance area KW - FWHM KW - Transmission KW - Focal distance KW - XRF PY - 2010 DO - https://doi.org/10.1017/S1431927610054280 SN - 1431-9276 SN - 1435-8115 VL - 16 IS - Suppl 2 SP - 932 EP - 933 PB - Cambridge University Press CY - New York, NY AN - OPUS4-27219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Welcoming elemental analysis of nanoparticles by EDX in combination with high-resolution electron microscopy in transmission mode T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -