TY - JOUR A1 - Madbouly, Loay Akmal A1 - Mrkwitschka, Paul A1 - Stockmann, Jörg Manfred A1 - Jones, Elliot A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Comparative Elemental Analysis of Commercial Functionalized Graphene Nanoplatelets Along the Production Chain With X‐Ray Photoelectron and Energy‐Dispersive X‐Ray Spectroscopy N2 - Graphene has been commercialized for over a decade, primarily in the form of suspensions and inks. In this study, we investigate the properties of graphene nanoplatelets (GNPs) and their functionalized derivatives, incorporating fluorine or nitrogen as functional groups (FG). The analysis was conducted on three forms, that is, powders, suspensions, and inks, using X‐ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) with energy‐dispersive X‐ray spectroscopy (EDX). The objective of this work is to establish a rapid and comprehensive systematic approach for elemental analysis of commercial functionalized graphene, which can be used for quality control. Functionalization is employed to tailor the material's physical and chemical properties. In our study, graphene samples, functionalized with fluorine or ammonia in a plasma reactor, were investigated. Both XPS and EDX were applicable for all three forms and showed, in general, similar trends between the three forms, so that both XPS and EDX can be used for quality control of GNPs along the production chain. KW - Commercial graphene KW - Functionalized graphene KW - Graphene inks KW - SEM/EDS KW - XPS PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-625752 DO - https://doi.org/10.1002/sia.7386 SN - 1096-9918 SP - 1 EP - 7 PB - Wiley AN - OPUS4-62575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - John, Elisabeth A1 - Weise, Matthias A1 - Radnik, Jörg A1 - Stockmann, Jörg Manfred A1 - Lange, Thorid A1 - Sahre, Mario A1 - Hodoroaba, Vasile-Dan T1 - Towards a New Reference Material—Analytical Challenges in Examining High-Entropy Alloy Thin Films N2 - A new high-entropy alloy (HEA) consisting of titanium, chromium, manganese, iron, and nickel was deposited as a thin-film on silicon substrates using magnetron sputtering from a novel segmented target composed of metal stripes. This material was explored with the goal to create a new reference material for surface analysis and evaluation of complex composite materials. The film's morphology was initially characterized by scanning electron microscopy (SEM), followed by crystallographic analysis using X-ray diffraction (XRD) and selected area electron diffraction (SAED). The two-dimensional compositional homogeneity was assessed using a combination of scanning and transmission electron microscopy (TEM) with energy-dispersive spectroscopy (EDS), X-ray fluorescence (XRF), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and X-ray photoelectron spectroscopy (XPS). The in-depth chemical composition was further analysed using ToF-SIMS and Auger electron spectroscopy (AES). Our findings demonstrate that it is possible to produce thin HEA films with a homogeneous in-depth composition from a segmented target. Notably, despite the fixed composition of the target, we were able to vary the HEA's composition by exploiting inhomogeneities within the magnetrons sputter plasma. Additionally, we successfully created HEA films with significant compositional gradients. T2 - ECASIA CY - Gothenburg, Sweden DA - 10.06.2024 KW - Reference material KW - High-entropy alloy KW - Thin-films PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-625777 DO - https://doi.org/10.1002/sia.7387 SN - 1096-9918 SP - 1 EP - 8 PB - Wiley AN - OPUS4-62577 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profilling of layered samples by Glow Discharge Optical Emission Spectroscopy (GD-OES) T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4325 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Survey on the Suitability of Coatings Containing Hydrogen as Lyared CRM for GDS T2 - Colloquium Spectroscopicum Internationale (CSI XXXIII) CY - Granada, Spain DA - 2003-09-07 PY - 2003 AN - OPUS4-5005 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Procop, M. A1 - Bjeoumikhova, S. A1 - Panne, Ulrich A1 - Hodoroaba, Vasile-Dan T1 - A routine procedure for the characterisation of polycapillary X-ray semi-lenses in prallelising mode with SEM/EDS N2 - The accurate knowledge of the properties of polycapillary X-ray semi-lenses has a significant influence on the quantitative results in a widespread field of applications involving microfocus X-ray beams. A routine procedure for the characterisation of a polycapillary X-ray semi-lens with a scanning electron microscope (SEM) having attached an energy dispersive spectrometer (EDS) is presented in this paper. A key issue of the procedure consists of fitting the semi-lens in front of the EDS for spectra acquisition. Relevant semi-lens parameters such as focal distance, full width at half maximum (FWHM) of the acceptance area, and transmission are determined in parallelising mode of the semi-lens. Special attention has been paid to the calculation of the transmission. KW - Polycapillary X-ray optics KW - Semi-lens KW - Parallelising mode KW - SEM KW - EDS KW - Acceptance area KW - FWHM KW - Transmission KW - Focal distance KW - XRF PY - 2011 DO - https://doi.org/10.1039/c0ja00135j SN - 0267-9477 SN - 1364-5544 VL - 26 IS - 3 SP - 499 EP - 504 PB - Royal Society of Chemistry CY - London AN - OPUS4-23555 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan A1 - Ortel, Erik A1 - Wirth, Thomas A1 - Borghetti, P. A1 - Garcia, S. A1 - Gómez, E. A1 - Blanco, M. A1 - Alberto, Gabriele A1 - Martra, G. T1 - Organic surface modification and analysis of titania nanoparticles for self-assembly in multiple layers N2 - Parameters of TiO2 coatings can greatly influence their final performance in largescale applications such as photocatalytic measurements, orthopedic and/or dental prostheses, cell cultures, and dye-sensitized solar cells. From different film deposition procedures, self-assembly of TiO2 NPs in multiple layers was selected for systematic characterization. EDX, AES and ToF-SIMS analysis have been carried out in order to evaluate the functionalization of several types of TiO2 NPs differing in size, shape and surface area. KW - TiO2 KW - Nanoparticles KW - Surface modification KW - Functionalization PY - 2017 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/organic-surface-modification-and-analysis-of-titania-nanoparticles-for-selfassembly-in-multiple-layers/66776A4CA7FD059CE39041A99A922D90 DO - https://doi.org/10.1017/S1431927617010029 SN - 1431-9276 SN - 1435-8115 VL - 23 IS - S1 (July) SP - 1872 EP - 1873 PB - Cambridge University Press CY - New York, NY, U.S.A. AN - OPUS4-42457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Wedell, R. A1 - Warrikhoff, A. T1 - Improvements of the low-energy performance of a micro-focus x-ray source for XRF analysis with the SEM N2 - X-ray Fluorescence (XRF) with a scanning electron microscope (SEM) is a valuable completion of the analytical capabilities of SEMs. Small and compact micro-focus x-ray sources are mounted to the microscope chamber, and the x-ray spectra are monitored with conventional EDS systems. Up to now the x-ray tubes used for the micro-focus x-ray sources are equipped with beryllium windows about 100 µm thick. The poly-capillary x-ray lenses have their transmission maximum at photon energies around 10 keV. It drops down in both low- and high-energy ranges. Hence, L-radiation from an Mo or Rh target will be strongly attenuated, and the excitation of fluorescence in the soft x-ray range becomes very ineffective. A new micro-focus x-ray source was developed. It is characterised by a lower self-absorption in the tube target, thin beryllium windows and an x-ray optics having a large distance between its foci and the maximum of transmission at about 5 keV. Thus K line fluorescence of light elements becomes effectively excited by the L-radiation from Mo or Rh tube targets. The detection limit for sodium oxide in glass was found to be below 1 mass%. KW - Micro-focus-XRF KW - X-ray tube KW - X-ray optics KW - SEM PY - 2009 DO - https://doi.org/10.1002/xrs.1159 SN - 0049-8246 VL - 38 IS - 4 SP - 308 EP - 311 PB - Wiley CY - Chichester AN - OPUS4-19583 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan A1 - Falke, M. A1 - Käppel, A. T1 - On the characterization of the geometrical collection efficiency of modern EDS systems N2 - To compare the performance of different energy dispersive X-ray spectrometers (EDS), it is important to define characteristic spectrometer parameters. The ISO 15632 standard defines parameters like energy resolution as FWHM for the Kα lines of carbon, fluorine and manganese. The quantum efficiency, which is the ratio of the detected photons divided by the number of incoming photons for different energies, is another significant spectrometer property. It is important for the light element and low energy line detection sensitivity as well as for higher photon energies above 10 keV. A striking EDS feature, provided and marketed by many manufactures, is the active area of the detector, although actually, the solid angle available for photon collection is the more relevant geometrical parameter. It is defined as: Ω = A /r2 with A being the active area of a spherical detector and r being the distance between the point of the radiation origin and the center of the surface of the active detector chip. A more accurate calculation should be used for large flat detector areas. One should note that the solid angle Ω is not an intrinsic spectrometer property. It can only be defined for a specific detector in combination with a specific system (e.g. SEM, EPMA or TEM). Thus, the minimal possible distance r is determined by the particular geometry e.g. a possible interference with the pole piece or other detectors/components in the chamber of a microscope. New EDS technologies use e.g. integrated SDD chips or inclined chips in thinner detector fingers which can be placed closer to the sample with the final result of larger real solid angles. Therefore, the knowledge of the real solid angle is one of the crucial parameters of an EDS microscope combination. A straightforward way to estimate the real solid angle is to simply determine A and r. If respective data are not provided by the manufacturer, this approach can be difficult. KW - EDS KW - EDX KW - Geometrical collection efficiency KW - Solid angle PY - 2014 DO - https://doi.org/10.1017/S1431927614007454 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 1144 EP - 1145 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31388 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Uncertainties in Secondary Fluorescence Correction in EPMA N2 - Secondary fluorescence is an inevitable effect that has to be taken into account in any algorithm for quantitative electron probe microanalysis (EPMA) as an additional correction. Moreover, secondary fluorescence worsens spatial resolution of EPMA, as discussed once more in two recent papers. Secondary fluorescence is excited both by characteristic radiation and by the X-ray continuum. In most cases the correction is small. There are, however, cases, e.g. the determination of low heavy metal concentration in a light matrix, where the contribution of secondary fluorescence exceeds 10% of the measured X-ray line intensity. For secondary fluorescence correction the measured X-ray line intensity has to be divided by the correction factor (1+I_flchar/I_p +I_flcont/I_p )≈(1+I_flchar/I_p )(1+I_flcont/I_p ) in order to get those intensity I_p, which is excited only by the primary electrons and enables the determination of specimen composition. I_flchar and I_flcont mean the calculated characteristic and continuums fluorescence intensities. In order to get the intensity of fluorescence radiation, the absorption of the exciting radiation in the specimen, the photoionization probability and the self-absorption of the emitted line must be calculated. This can be performed in a straightforward way. The critical quantity is the X-ray yield of the exciting atoms in case of fluorescence by characteristic radiation and the bremsstrahlung yield of the specimen in case of continuum fluorescence. In the former case it is reasonable to apply the same physical model to calculate I_flchar and I_p. T2 - Microscopy & Microanalysis 2019 CY - Portland, OR, USA DA - 03.08.2019 KW - EPMA KW - Secondary fluorescence KW - Uncertainties KW - X-ray spectrometry KW - Fluorescence correction PY - 2019 AN - OPUS4-48673 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - New reference material candidates for traceable size measurement of non-spherical nanoparticles N2 - New model nanoparticles with well-controlled shape were synthesized within the EMPIR project nPSize - Improved traceability chain of nanoparticle size measurements. Their systematic characterization takes place by the traceable methods scanning/transmission electron microscopy, atomic force microscopy and small angle X-ray scattering. Following reference nanoparticle candidates are under investigation with respect to their homogeneity and stability: titania nanoplatelets (10-15 nm x 50-100 nm), titania bipyramides (~60 nm x 40 nm), titania acicular particles (100 nm x 15-20 nm; aspect ratio 5.5/6), gold nanorods (~10 nm x 30 nm), and gold nanocubes (~55 nm x 55 nm x 55 nm). T2 - HyMET Workshop on optical surface analysis methods for nanostructured layers CY - Berlin, Germany DA - 10.10.2019 KW - Nanoparticles KW - Reference materials KW - Traceability KW - Particle size distribution PY - 2019 AN - OPUS4-49285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E.B.M. A1 - Griepentrog, Michael A1 - Dück, Alexander A1 - Beck, Uwe T1 - Round Robin exercise: Coated materials for glow discharge spectroscopy N2 - A Round Robin (RR) exercise on selected coated materials has been carried out with the aim of finding the optimal conditions for the analysis of nitride layers with GD-OES. Such pre-normative work is necessary for the evaluation of parallel development of the production of nitride layers as certified reference materials (CRMs). Two types of samples, Ti–N layer and V–N layer, respectively, with chemical compositions close to stoichiometry and a thickness of ~3 µm, deposited on a steel substrate, have been provided to the RR participants. Additionally, another type of sample, a (100 nm CrNi/100 nm Cu) multilayer (ML) stack deposited on silicon wafer has also been included in the RR. This sample can be used as a CRM for checking GD spectrometer conditions and it has been proved helpful in further development of GDS instrumentation and methodology. The RR exercise has been performed in the frame of the EC Thematic Network on Glow Discharge Spectroscopy for Spectrochemical Analysis (‘GDS-Net’). KW - Coated/Layered Reference Materials KW - Nitrides KW - Multilayer KW - GDS KW - Round Robin PY - 2006 DO - https://doi.org/10.1039/B513426A SN - 0267-9477 SN - 1364-5544 VL - 21 IS - 1 SP - 74 EP - 81 PB - Royal Society of Chemistry CY - London AN - OPUS4-11762 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shimizu, K. A1 - Habaki, H. A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan T1 - New Development of Surface Analysis from a Standpoint of Users (1)DS"rf-GDOES" responding to needs for short time, high accuracy, diversified regions, and low cost KW - Atomic beam spectroscopy KW - Emission analysis KW - Cathode sputtering KW - Emission spectroscopy PY - 2004 SN - 0452-2834 VL - 52 IS - 8 SP - 72 EP - 75 PB - Nikkan kogyo shinbunsha CY - Tokyo AN - OPUS4-14523 LA - jpn AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Characterization of nanoparticles by means of high-resolution SEM/EDS T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan T1 - Liaison Report from ISO/TC 202 'Microbeam Analysis' to ISO/TC 229 'Nanotechnologies' N2 - Liaison activities within ISO/TC 202 'Microbeam Analysis' which are relevant to ISO/TC 229 'Nanotechnologies' are reported acoording to the structure defined by ISO/TC229 Nanotechnologies Liaisons Coordination Group (NLCG): new standards/documents, coordination issues, and further detailed specific information, e.g. publications, events, comments. KW - ISO/TC 229 Nanotechnologies KW - ISO/TC 202 Microbeam Analysis KW - Standardisation PY - 2023 SP - 1 EP - 3 CY - ISO, Geneva, CH AN - OPUS4-58986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rauscher, H. T1 - Role of the volume specific surface area in the NanoDefine decision flow scheme N2 - In this lecture the VSSA concept is explained, and VSSA as measured by BET. Results of the NanoDefine evaluation based on selected examples on real-world materials are presented. Recommendations for consideration of the VSSA concept for the implementation of the EC definition of nanomaterial for powder materials are given. T2 - Final Outreach Event “Classification of nanomaterials according to the EU definition” CY - Brüssel, Belgium DA - 19.09.2017 KW - Volume specific surface area (VSSA) KW - Nanomaterial KW - Nanomaterial classification KW - BET PY - 2017 AN - OPUS4-42391 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Surface and Microbeam Analytical Methods @BAM N2 - An overview of the activities in the field of surface and microbeam analysis at BAM-6.1 is given with focus on physico-chemical characterization at the nanoscale. Ideas of potential joint activities are presented: structural and chemical analysis of graphene, deposition techniques for nanoparticles, EBSD on steel for a broader range of methods, instruments and types of steel, soft X-ray Analysis of low-Z materials, analysis of mesoporous thin films, etc. T2 - BAM-IFW Workshop CY - Dresden, Germany DA - 28.03.2019 KW - PC characterisation KW - Nanoscale KW - Nanoparticles PY - 2019 AN - OPUS4-47860 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan A1 - Falke, M. A1 - Käppel, A. ED - Hozak, P. T1 - Characterization of EDS systems with respect to the geometrical collection efficiency T2 - IMC 2014 - 18th International microscopy congress CY - Prague, Czech Republic DA - 07.09.2014 KW - EDS KW - EDX KW - Geometrical collection efficiency KW - Solid angle PY - 2014 SN - 978-80-260-6720-7 SP - IT-5-P-1533, 1-2 AN - OPUS4-31945 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dumit, Verónica I. A1 - Furxhi, Irini A1 - Nymark, Penny A1 - Afantitis, Antreas A1 - Ammar, Ammar A1 - Amorim, Monica J. B. A1 - Antunes, Dalila A1 - Avramova, Svetlana A1 - Battistelli, Chiara L. A1 - Basei, Gianpietro A1 - Bossa, Cecilia A1 - Cimpan, Emil A1 - Cimpan, Mihaela Roxana A1 - Ciornii, Dmitri A1 - Costa, Anna A1 - Delpivo, Camilla A1 - Dusinska, Maria A1 - Fonseca, Ana Sofia A1 - Friedrichs, Steffi A1 - Hodoroaba, Vasile-Dan A1 - Hristozov, Danail A1 - Isigonis, Panagiotis A1 - Jeliazkova, Nina A1 - Kochev, Nikolay A1 - Kranjc, Eva A1 - Maier, Dieter A1 - Melagraki, Georgia A1 - Papadiamantis, Anastasios G. A1 - Puzyn, Tomasz A1 - Rauscher, Hubert A1 - Reilly, Katie A1 - Jiménez, Araceli Sánchez A1 - Scott‐Fordsmand, Janeck J. A1 - Shandilya, Neeraj A1 - Shin, Hyun Kil A1 - Tancheva, Gergana A1 - van Rijn, Jeaphianne P. M. A1 - Willighagen, Egon L. A1 - Wyrzykowska, Ewelina A1 - Bakker, Martine I. A1 - Drobne, Damjana A1 - Exner, Thomas E. A1 - Himly, Martin A1 - Lynch, Iseult T1 - Challenges and Future Directions in Assessing the Quality and Completeness of Advanced Materials Safety Data for Re‐Usability: A Position Paper From the Nanosafety Community N2 - Ensuring data quality, completeness, and interoperability is crucial for progressing safety research, Safe‐and‐Sustainable‐by‐Design approaches, and regulatory approval of nanoscale and advanced materials. While the FAIR (Findable, Accessible, Interoperable, and Re‐usable) principles aim to promote data re‐use, they do not address data quality, essential for data re‐use for advancing sustainable and safe innovation. Effective quality assurance procedures require (meta)data to conform to community‐agreed standards. Nanosafety data offer a key reference point for developing best practices in data management for advanced materials, as their large‐scale generation coincided with the emergence of dedicated data quality criteria and concepts such as FAIR data. This work highlights frameworks, methodologies, and tools that address the challenges associated with the multidisciplinary nature of nanomaterial safety data. Existing approaches to evaluating the reliability, relevance, and completeness of data are considered in light of their potential for integration into harmonized standards and adaptation to advance material requirements. The goal here is to emphasize the importance of automated tools to reduce manual labor in making (meta)data FAIR, enabling trusted data re‐use and fostering safer, more sustainable innovation of advanced materials. Awareness and prioritization of these challenges are critical for building robust data infrastructures. KW - Advanced materials KW - Safety data KW - Re-usability KW - Nanosafety KW - SSbD KW - FAIR KW - Standardisation PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-652918 DO - https://doi.org/10.1002/adsu.202500567 SN - 2366-7486 SP - 1 EP - 18 PB - Wiley-VCH CY - Weinheim AN - OPUS4-65291 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Analysis of Fluorine Traces in TiO2 Nanoplatelets by SEM/EDX, AES and TOF-SIMS N2 - The synthesis of TiO2 nanoplatelets with fluorine-containing reactants is carried out using Ti (IV) butoxide as precursor and concentrated HF as shape controller, the final product requires a working up in order to eliminate or at least to reduce the amount of residual fluorides, which is realized here by well-defined thermal treatment. Qualitative investigation of the bulk elemental composition by means of EDX of TiO2 nanoparticles (NPs) has identified fluorine in case of the as-synthesized samples. EDX spectra of thermally treated products exhibit either a fluorine content close to the limit of detection. The latter holds also true for the reference sample, TiO2 NPs of bipyramidal shape and prepared by a different synthesis route. For differentiation whether fluorine is present in the bulk or at the surface of the TiO2 nanoplatelets, top-surface sensitive AES and ToF-SIMS has been applied. Secondary ions of fluorine are detected in ToF-SIMS spectra of all samples, but could be roughly quantified by measurement of same reference sample as for EDX, namely TiO2 nano-bipyramids. This revealed that the amount of fluorine within1 nm depth beneath the surface is reduced in the thermally treated specimen compared to the raw product down to a content about as low as in the reference sample. AES allows analyzing analysis of the first few nanometers from the top-surface of individual NPs by point analysis. An F KLL peak has been detected at the surface of samples of as-prepared TiO2 nanoplatelets under optimized measurement conditions, but was not detectable after their calcination, which is in agreement with ToF-SIMS results. Moreover, high resolution AES on single TiO2 nanoplatelets elucidated that the surface atomic layers surrounding the TiO2 nanopaltelet contain fluorides before thermal treatment of the NPs. T2 - 17th European Conference on Applications of Surface and Interface Analysis ECASIA 2017 CY - Montpellier, France DA - 24.09.2017 KW - Titania KW - Nanoparticles KW - Fluorine KW - SEM/EDX KW - Auger Electron Spectroscopy KW - Nanoplatelets PY - 2017 AN - OPUS4-42656 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS N2 - The work is intended to compare the capabilities of two similar depth profiling techniques to analyse electrically non-conductive samples. In order to get a better evaluation of the depth resolution, various multilayer sandwiches, such as SiO2/TiO2 and Si3N4/SiO2 deposited on glass substrates have been investigated. Optimised depth profiles are presented for both methods, glow discharge optical emission spectrometry (GDOES) and radiofrequency mode (known as “HFM” in the SNMS literature) of plasma secondary neutral mass spectrometry (SNMS). The optimisation procedure, necessary to get the best set of plasma parameters, which result in the optimal depth resolution, is also described for one selected sample. Additionally, sputtering crater profilometry was carried out in order to check out the flatness of the sputtered crater. The influence of the thickness of the sample substrate on the sputtering rate is discussed. Finally, advantages and disadvantages of the use of these two depth profiling methods, especially for the non-conductive samples, are concluded from this comparative study. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of a cross-sectioned sample was carried out in order to get supplementary information. KW - rf-Glow discharge KW - HFM plasma SNMS KW - Non-conductive layered samples KW - Depth resolution KW - Crater shape KW - ToF-SIMS PY - 2001 DO - https://doi.org/10.1016/S0169-4332(01)00259-8 SN - 0169-4332 SN - 1873-5584 VL - 179 IS - 1-4 SP - 30 EP - 37 PB - North-Holland CY - Amsterdam AN - OPUS4-6882 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Technique evaluation and method development for the characterization and classification of materials according to the EC nano-definition T2 - Public NanoDefine Workshop: Characterization and classification of materials according to the EC nano-definiton CY - Brussels, Belgium DA - 2015-06-17 PY - 2015 AN - OPUS4-33883 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31468 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fernandez-Poulussen, D. A1 - Hodoroaba, Vasile-Dan T1 - Holistic, reliable and practical Characterization Framework for Graphene Family Materials, a correlated approach including Imaging based techniques N2 - ACCORDs is an Horizon Europe project working in the development of an imaging-based characterization framework (ACCORDs framework) for the holistic correlative assessment of Graphene Family Materials (GFMs) as a representative of 2D nanomaterials (NMs) to assess and predict 2D NMs health and environmental risks. The ACCORDs framework will operationalise safe and sustainable by design (SSbD) strategies proposed in past or ongoing H2020 projects or within OECD by correlating low-, medium-, and high-resolution physico-chemical-biological imaging-based methods with non-imaging methods in a tiered approach. ACCORDs will deliver the ACCORDs framework and user guidance, new imaging-based characterisation methods, reference in vitro tests, new reference 2D NMs for different matrices, a new minimum information reporting guideline for FAIR data sharing and reuse of images as well as an atlas with reference images for diagnostics of compromised safety of GFMs/GFM products. The new guidelines and standard proposals will be submitted to standardisation bodies to allow creation of regulatory ready products. The novelty of ACCORDs is in translating the principles of medical imaging-based diagnostics to 2D material hazard diagnostics. ACCORDs will accelerate industrial sectors in the area of aviation, marine construction, drone production, flexible electronics, photovoltaics, photocatalytics and print inks-based sensors. The value ACCORDs proposes to the graphene industry are practical, easy, imaging-based tools for GFM quality monitoring next to the production line with a possibility to be correlated with advanced highresolution imaging characterization methods in case hazard i.e. deviation from controls (benchmark values) are diagnosed. The ACCORDs framework and tools will contribute to the European Green Deal by addressing the topic: “Graphene: Europe in the lead” and to a new European strategy on standardization, released on 2nd February, 2022. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Graphene KW - Graphene-related 2D materials KW - SSbD KW - Imaging KW - ACCORDs PY - 2024 AN - OPUS4-60573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Towards Standardised Procedures for Morphology Measurement of 2D-Materials by Imaging N2 - The industry uptake of graphene-related 2D materials (GR2M) material increases, and international standardization is critical to enable commercialization. Reliable, accurate, and reproducible measurements are important due to the multiple production routes and producers of the material to maintain quality in manufacture. Several standards are under development within ISO/TC 229 ‘Nanotechnologies’, i.e. ISO/AWI TS 23879 “Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM” or ISO DTS 23359 “Chemical characterization of graphene in powders and suspensions”, which focus on determining the dimensional and chemical properties of GR2M. Interlaboratory comparisons are required to develop best practice and understand the associated measurement uncertainties. In this contribution challenges and solutions for the accurate measurement of the lateral size of GR2M will be discussed based on the results of a recently completed interlaboratory comparison organized under the pre-standardisation platform of VAMAS (www.vamas.org/twa41/documents/2023_vamas_twa41_project13_GO_SEM.pdf). Aspects related to sample preparation, measurement conditions, and image analysis with different approaches to extract the corresponding size and shape descriptors will be presented. A discussion on the measurement uncertainty budget associated to the final result will be also included. T2 - Graphene Week 2025 CY - Vicenza, Italy DA - 22.09.2025 KW - Graphene-related 2D materials (GR2M) KW - Interlaboratory comparison KW - VAMAS KW - Lateral size KW - ISO/TC 229 Nanotechnologies PY - 2025 AN - OPUS4-64250 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Guo, Z. A1 - Valsami-Jones, E. A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Influence of Sterilization on the Surface of Nanoparticles Studied with XPS / HAXPES in Comparison to SEM / EDS N2 - Nanosafety is becoming increasingly important as nanomaterials are widely used in industrial processes and consumer products. For nanotoxicity measurements prior sterilization of the samples is necessary, but as structure activity relationships are made with properties of pristine particles, the question arises, if the sterilization process has an impact on the physico-chemical properties of nanoparticles and thus on the biological behavior. This question will be addressed in this talk. For this purpose, results from SEM and EDS measurements are combined with those of a novel lab-based HAXPES spectrometer in order to obtain a more complete picture. At the end, an influence of sterilization will be evident, which indicates a restructuring of the nanoparticles owing to sterilization. T2 - Microscopy & Microanalysis 2022 CY - Portland, USA DA - 31.07.2022 KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Nanoparticles PY - 2022 DO - https://doi.org/10.1017/S1431927622004287 VL - 28 SP - 986 EP - 988 PB - Cambridge University Press AN - OPUS4-55352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Eggert, Claudia A1 - Hodoroaba, Vasile-Dan T1 - Welcome and Introduction N2 - Nanotechnology has emerged over the past decade as a key field involving the design, characterization, production, and application of materials, structures, devices, and systems at the nanometer scale. Due to their large specific surface area and significant surface chemistry, nanomaterials offer enhanced material properties and product functionalities. However, alongside these advancements comes the potential risk to humans and the environment. The development of nanomaterials has provided new opportunities to understand matter at the nanoscale, accelerating the creation of innovative advanced materials and devices. The expertise gained in the standardization and regulation of nanomaterials, particularly in characterizing nanoparticulate matter, should be applied to other innovative advanced materials, such as (nano)composites, 2D structures, additive manufactured materials, gels, and foams. Initial guidance for the safe-and-sustainable-by-design (SSbD) development of advanced materials during the early innovation phase has been introduced by various groups and projects. Additionally, digital material passports (DMP) and digital product passports (DPP) need to be defined and implemented uniformly across Europe. In 2024, the Innovative Advanced Materials Initiative (IAM-I) was launched by European stakeholders to contribute to a "Research and Innovation ecosystem that will significantly accelerate the time-to-market of sustainable innovative advanced materials (IAMs) and associated technologies designed for a digital circular economy." Knowledge transfer is a crucial pillar of this ecosystem, and a future IAM-I Academy could be a valuable tool. Initially, it is essential to define "education & training needs to boost Europe’s competitiveness and sovereignty within the area of IAM." T2 - Nano and Beyond - What can we learn from Nano for other Innovative Advanced Materials? CY - Online meeting DA - 04.07.2025 KW - Advance Materials KW - Nanomaterials KW - IAM-I KW - SSbD KW - DMP KW - DPP PY - 2025 UR - https://www.bam-akademie.de/kursangebot/kurs/webinar-nano-and-beyond-55.html?lang=en AN - OPUS4-63690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - SETNanoMetro advances: Fabrication and measurement of TiO2 engineered nanoparticles N2 - The press conference on the results of the European Project FP7 constitutes a dissemination event dedicated to the production and characterization of "Shape-engineered TiO2 nanoparticles for metrology of functional properties: setting design rules from material synthesis to nanostructured devices" with the main large-scale applications in the three reference sectors: energy, health and environment. T2 - Press conference on the results of the European Project FP7 CY - Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, Italy DA - 31.03.2017 KW - TiO2 KW - Nanoparticles KW - Measurement KW - Metrology KW - Shape-enegineered nanoparticles PY - 2017 AN - OPUS4-39622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced physico-chemical Characterisation & Correlation of Results with different Methods for GFMs N2 - An accurate characterisation of the morphological, structural, and chemical properties of nano and advanced materials is key for the understanding of the material functionality and constitutes the basis for future optimisation or even prediction of the product performance. Further, the correlation of the physical-chemical properties with results from biological testing leads to an understanding of the potential toxicological effects so that a minimisation of the materials risks becomes possible. The presentation will highlight with examples the importance of the selection of the relevant parameters/descriptors and particularly their measurement for the reliable characterisation of the morphology, structure, and chemistry of graphene-related 2D-materials (GR2M’s) [1-3]. One crucial aspect is also one of most challenging ones in the characterisation chain: the proper sample preparation, which shall be tailored to the accurate measurement of the defined analytical parameter. Practical examples of measurement of morphological descriptors of GR2M’s, such as equivalent circular diameter (ECD), minimum and maximum Feret, and aspect ratio with electron microscopy, or of the thickness with atomic force microscopy (AFM) will be showed, together with quantitative chemical characterisation with X-ray photoelectron spectroscopy (XPS) and, newly, with energy-dispersive X-ray spectroscopy with a scanning electron microscope (SEM/EDX) [4] by evaluating accurately the elemental content as the ratio of O/C and the composition of impurities. Another relevant, but challenging part of the characterisation of GR2M’s, particularly as the final products containing mostly low amounts of GR2M’s, is the analysis of homogeneity of the chemical composition by sensitive imaging methods. Examples of successful analysis with secondary ion mass spectrometry (SIMS), even if not quantitative, will be presented. T2 - Joint online Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Physico-chemical characterisation KW - Graphene-related 2D materials KW - OECD KW - Standardisation KW - GO flakes PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/ws_hamonisation_standardisation_2023/ AN - OPUS4-63557 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - (Pre)Standardisation and Metrology in Microbeam Analysis – Ongoing Activities and Opportunities N2 - The presentation addresses the current ongoing projects as well as the gaps and opportunities in microbeam analysis within ISO/TC 202 Microbeam Analysis standardisation body and in-liaison Technical Working Areas (TWAs) at the pre-standardization platform of VAMAS (Versailles Project on Advanced Materials and Standards). T2 - EMAS 2023 - 17th European Workshop on Modern Developmennts and Applications in Microbeam Analysis - General Assembly CY - Krakow, Poland DA - 07.05.2023 KW - Microbeam analysis KW - EDS KW - Electron microscopy KW - Inter-laboratory comparison KW - EBSD KW - Standardisation PY - 2023 AN - OPUS4-57483 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of the Lateral Size of Graphene Oxide Flakes by SEM N2 - The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are highlighted. The size and shape distributions as measured by 17 laboratories are showed expressed in size and shape descriptors extracted from SEM images by using two proposed measurement approaches. The implementation of the results into the corresponding ISO technical specification AWI/TS 23879 is discussed and planned, in relation with the AFM part. T2 - ISO/TC 229 Nanotechnologies Meeting Week CY - Stockholm, Sweden DA - 19.05.2025 KW - Graphene oxide KW - Interlaboratory comparison KW - SEM KW - Lateral size KW - VAMAS KW - ISO/TC 229 Nanotechnologies PY - 2025 AN - OPUS4-63189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - ED-EPMA Measurements of elemental Composition and Thickness of Fe-Ni Alloy Films T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23774 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sachse, René A1 - Moor, Maëlle A1 - Kraehnert, Ralph A1 - Hodoroaba, Vasile-Dan A1 - Hertwig, Andreas T1 - Ellipsometry-based approach for the characterization of mesoporous thin films for H2 technologies N2 - Porous thin layer materials are gaining importance in different fields of technology and pose a challenge to the accurate determination of materials properties important for their function. In this work, we demonstrate a hybrid measurement technique using ellipsometry together with other independent methods for validation. Ellipsometry provides information about the porosity of different mesoporous films (PtRuNP/OMC = 45%; IrOx = 46%) as well as about the pore size (pore radius of ca. 5 nm for PtRuNP/OMC). In addition, the electronic structure of a material, such as intraband transitions of a mesoporous IrOx film, can be identified, which can be used to better understand the mechanisms of chemical processes. In addition, we show that ellipsometry can be used as a scalable imaging and visualization method for quality assurance in production. These require accurate and traceable measurements, with reference materials playing an important role that include porosity and other related properties. We show that our novel analytical methods are useful for improving analytical work in this entire field. KW - Porous materials KW - Electrolysis KW - Spectroscopic ellipsometry KW - Hybrid metrology measurement KW - Electron microscopy PY - 2021 DO - https://doi.org/10.1002/adem.202101320 SP - 1 EP - 17 PB - Wiley-VCH AN - OPUS4-53960 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS interlaboratory comparisons on nanoparticles associated with the outcomes of the EMPIR project nPSize N2 - Following points are presented and discussed: i) nPSize as an EMPIR project on the nanoparticle size and shape distribution of (more) complex particles including sample preparation and machine learning approaches; ii) parallel development of ISO 21363 (PSSD by TEM), ISO 19749 (PSSD by SEM), ISO 22292 (3D TEM), ISO 52408 (NP Prep for AFM and EM), iii) VAMAS and pre-standardisation, TWA 34 „Nanoparticle Populations“ with two nPSize ILC projects P15 & P16 – results to be published and integrated in ISO 21363 (PSSD by TEM); iv) Remaining challenges: platelets, 2D materials (TiO2 and GR2M); v) Reference data sets as part of a complete Characterisation Workflow. T2 - How to identify Nanomaterials more effectively? Good Practices and Ways to Progress CY - Paris, France DA - 11.05.2023 KW - Nanoparticles KW - VAMAS KW - nPSize KW - Particle size distribution KW - Nanoparticle concentration KW - Interlaboratory comparison PY - 2023 UR - https://www.lne.fr/fr/service/formation/journee-technique-nanomateriaux-comment-identifier-efficacement-nanomateriaux?utm_source=Twitter&utm_medium=Tweet&utm_campaign=JT2301 AN - OPUS4-57485 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing VAMAS ILC s on Nanoparticles and Graphene Oxide N2 - This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Nanoparticles KW - VAMAS KW - Interlaboratory comparison KW - Standardisation KW - Electron microscopy KW - AFM KW - SAXS PY - 2024 AN - OPUS4-60097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. B. M. A1 - Wetzig, K. T1 - Exploitation of the effect of hydrogen on an analytical glow discharge T2 - Winter Conference on Plasma Spectrochemistry 2002 CY - Scottsdale, AZ, USA DA - 2002-01-06 PY - 2002 SN - 0161-6951 SP - 261 EP - 262 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-1589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of EDS X-Ray spectrometers - Extensions to high Count Rates T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik CY - Berlin, Germany DA - 2011-11-24 PY - 2011 AN - OPUS4-24922 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - Kolloquium zur Einweihung des neuen Wasserstofflabors der BAM, CY - Berlin, Germany DA - 2001-10-18 PY - 2001 AN - OPUS4-6148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - nPSize - Improved traceability chain of nanoparticle size measurements N2 - The overall objective of project Improved traceability chain of nanoparticle size measurements is to improve the traceability chain for nanoparticle size measurements. The main impact will be achieved by manifold contributions to standard documents for CEN/TC 352 “Nanotechnologies”, which directly addresses the research needs of CEN, CENELEC and ETSI mandated by EC to develop standards for methods and reference materials to accurately measure the size and size distribution of nanoparticles. This will take place in collaboration with ISO/TC229 ‘Nanotechnologies’, ISO/TC24/SC4 ‘Particle characterization’ and ISO/TC201 ‘Surface analysis’/ SC9 ‘Scanning probe microscopy’. T2 - 4. Sitzung des wissenschaftlichen Beirats zum Themefeld Umwelt der BAM CY - BAM, Berlin, Germany DA - 13.04.2018 KW - Nanoparticles KW - Nanoparticle size KW - Traceability KW - Standardization PY - 2018 AN - OPUS4-44695 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Hydrogen Embrittlement in Coating Technology - Measurement & Testing N2 - Pre-treatment and electroplating of especially low alloyed high tensile strength steel components (such as those used in the aircraft industry) can be followed by a delayed hydrogen-induced fracture known as hydrogen embrittlement. As estimated by the fracture behavior, atomic hydrogen being evolved during the coating process and penetrating into the base metals is mainly trapped close to the interface base metal-coating. During a baking procedure after plating the atomic hydrogen can be removed from the traps and effuse through the coating as well as being more homogeneously distributed in the bulk of the base metal, both reducing the risk of embrittlement. Up to now there has been no analytical proof. Now investigations using GD-OES show that the hydrogen distribution in the coating, at the interface and within the bulk material, can be directly measured. The results give an improved knowledge and enable to work out process parameters and test procedures for coating techniques to be more effective to avoid hydrogen embrittlement. PY - 2002 SN - 0360-3164 VL - 89 IS - 10 SP - 57 EP - 60 PB - American Electroplaters' Society CY - East Orange, NJ AN - OPUS4-1923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Webseite, freie Software für GDS-Anwender, Leitthema - Vorstellung, Anregungen T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-4327 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Round Robin Exercise: Coated Materials - Initial Report T2 - C Network on Glow Discharge Spectroscopy for Spectrochemical Analysis CY - Vienna, Austria DA - 2003-03-04 PY - 2003 AN - OPUS4-4326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Lokale Wasserstoffkonzentration: kritisch oder harmlos? PY - 2002 SN - 0026-0797 SN - 0043-2792 VL - 56 IS - 2 SP - 41 EP - 44 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-1542 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - GDOES - Ein Verfahren zur Messung von Wasserstoffprofilen an beschichteten Bauteilen PY - 2002 SN - 0026-0797 SN - 0043-2792 VL - 56 IS - 2 SP - 41 EP - 44 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-1212 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hartelt, Manfred A1 - Wäsche, Rolf A1 - Hodoroaba, Vasile-Dan T1 - Verschleißpartikel-Analyse mit Rasterelektronenmikroskopie und energiedispersiver Röntgenspektrometrie im Transmissionsmodus (TSEM/EDX) N2 - Untersucht wurden Verschleißpartikel als elektronentransparente Proben auf dünnen Trägerfolien mit einem hochauflösendem Rasterelektronenmikroskop und energiedispersiver Röntgenspektrometrie im Transmissionsmodus. Die hohe laterale Auflösung dieser modernen Methoden ermöglicht eine morphologische Charakterisierung der Verschleißpartikel bis in den nm-Bereich. Die hochauflösende Elementanalyse erlaubt eine Interpretation der Zusammensetzung und damit Rückschlüsse auf die Verschleißpartikelbildung. Die tribologischen Untersuchungen sind an einem Modell-Verschleißtribometer nach DIN 51834-2 geschmiert, aber ohne Ölkreislauf, durchgeführt worden. Die Präparation der Verschleißpartikel über eine Entnahme und Übertragung einer geringen Schmierstoffmenge mit einer Mikropipette auf eine TEM-Trägerfolie ist mit einem geringen Aufwand möglich. Der präparative Aufwand ist relativ gering. Das benötigte Schmierstoffvolumen beträgt wenige Mikroliter (0,001 ml). Die Untersuchung zeigt die geringe geometrische Größe der Verschleißpartikel und bestätigt indirekt die These der Reaktionsschichtbildung mit einer geringen Schichtdicke, die ständig verschleißt und sich stetig neu bildet. Die beschriebenen Verschleißprozesse sind in der Modell-Verschleiß-Prüfung mit sehr hohen Pressungen am Versuchsbeginn nachweisbar. KW - Modellverschleißprüfung KW - Verschleißpartikel-Analyse KW - TSEM PY - 2015 SN - 0724-3472 VL - 62 IS - 6 SP - 5 EP - 11 PB - Expert Verlag CY - Renningen AN - OPUS4-35043 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Verbesserung analytischer GD-OES-Parameter durch Zumischen von Wasserstoff sowie Untersuchungen von Beschichungen als Kandidaten für H-ZRM T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-4328 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Verbesserung analytischer GD-OES-Parameter durch Zumischen von Wasserstoff sowie Untersuchungen von Beschichtungen als Kandidaten für H-ZRM T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5006 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Results of a Round Robin Exercise "Coated Materials" for Glow Discharge Spectrometry (GDS) T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5009 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Website, freie Software für GDS-Anwender, Leitthema-Vorstellung, Anregungen T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5007 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Quantitative and localized Hydrogen Analysis of electroplated Material T2 - AESF SUR/FIN® 2004 & INTERFINISH 2004 World Congress CY - Chicago, IL, USA DA - 2004-06-28 PY - 2004 SP - 556 EP - 564 PB - American Electroplaters and Surface Finishers Society (AESF) CY - Orlando AN - OPUS4-4695 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ortsaufgelöste Elementaranalytik mit GD-OES und ortsaufgelöste Röntgenanalytik im REM T2 - veranstaltung Siemens - BAM CY - Berlin, Germany DA - 2003-09-17 PY - 2003 AN - OPUS4-4329 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - µ-RFA am REM T2 - TU-Kolloquium "Ausgewählte analytische Methoden der Physik" CY - Berlin, Germany DA - 2004-01-20 PY - 2004 AN - OPUS4-4611 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Schichtanalyse mit der optischen Glimmentladungsspektroskopie (GD-OES) PY - 2000 SN - 1662-3096 SN - 0040-1498 SN - 0040-148X SN - 1023-0823 PB - Binkert Medien CY - Laufenburg AN - OPUS4-1055 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Erste Ergebnisse bei der Suche nach geeigneten Kandidaten für die Herstellung von CRM für die Bestimmung von Wasserstoff in Festkörpern T2 - 11. Deutsches Anwendertreffen "Analytische Glimmladungs-Spektrometrie" CY - Dresden, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-5980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss des Wasserstoffs auf die analytischen Linien in der GD-OES - Temperaturmsessungen an der Oberfläche der Probe T2 - Doktoranden-Seminar des IFW-Dresden CY - Jetrichovice, Czech Republic DA - 1999-04-13 PY - 1999 AN - OPUS4-6029 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Emissionsprozesse in der Ar und Ne GD-OES, HF-GD-OES und HF-SNMS Tiefenprofilanalyse von beschichteten Gläsern/Glaskeramiken T2 - Doktorandenseminar CY - Jetrichovice, Czech Republic DA - 2000-04-17 PY - 2000 AN - OPUS4-6090 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Pressure Influence on the Depth Resolution of RF-Glow Discharge Depth Profiling Multilayer Coatings T2 - European Winter Conference on Plasma Spectrochemistry CY - Pau, France DA - 1999-01-10 PY - 1999 AN - OPUS4-6063 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss von H in der analytischen Glimmentladung T2 - GDS-Anwendertreffen CY - Dresden, Germany DA - 2000-10-17 PY - 2000 AN - OPUS4-6115 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss von Wasserstoff auf die Quantifizierung in der GD-OES T2 - IFW-Seminar CY - Dresden, Germany DA - 2000-03-17 PY - 2000 AN - OPUS4-6088 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profile measurements of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and TOF-SIMS T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - Gemeinsame Doktoranden-Klausur des IFS/IFW Dresden und der TU Szczecin CY - Szklarska Poreba, Poland DA - 2002-05-22 PY - 2002 AN - OPUS4-6212 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Exploitation of the hydrogen effect on GDS T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-04 PY - 2002 AN - OPUS4-6209 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluß von Wasserstoff in der GDOES, Grundlagen T2 - Gemeinsames Seminar IFW-Dresden und TU Szczecin CY - Lukecin, Poland DA - 2001-04-18 PY - 2001 AN - OPUS4-6158 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report on the RR exercise: Coated Materials T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-02 PY - 2002 AN - OPUS4-6208 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Analyse von Wasserstoff in der GDOES, Anwendungen T2 - IFW Dresden Seminar CY - Dresden, Germany DA - 2001-07-11 PY - 2001 AN - OPUS4-6159 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profiling of layered samples by Glow Discharge Optical Emission Spectroscopy (GD-OES) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 71 EP - 73 AN - OPUS4-6926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Website T2 - 9. Deutsches Anwendertreffen "Analytische GDS" CY - Berlin, Germany DA - 2002-09-09 PY - 2002 AN - OPUS4-6239 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - Promotionsverteidigung an der Technischen Universität Dresden CY - Dresden, Germany DA - 2002-10-15 PY - 2002 AN - OPUS4-6247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Hydrogen effect in GDS - Foe or friend? T2 - BNASS11 CY - Loughborough, England DA - 2002-07-08 PY - 2002 AN - OPUS4-6215 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - BAM - Fachgruppenseminar VIII.2 CY - Berlin, Germany DA - 2002-11-05 PY - 2002 AN - OPUS4-6250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Coating technology of high strength steels without hydrogen embrittlement T2 - Super-high strength steels : 1st international conference CY - Milan, Italy DA - 2005-11-02 KW - High strength steel KW - Electroplating KW - Corrosion protection KW - Hydrogen embrittlement KW - Glow discharge optical emission spectroscopy KW - GDOES PY - 2005 SN - 88-85298-56-7 SP - 1 EP - 6(?) PB - AIM CY - Mailand AN - OPUS4-11974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement T2 - 2006 Winter Conference on Plasma Spectrochemistry CY - Tucson, AZ, USA DA - 2006-01-08 PY - 2006 AN - OPUS4-11990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Quantitative and localized Hydrogen Analysis of electroplated Material KW - Hydrogen KW - GD-OES depth profiling KW - Electroplating KW - Certified reference materials (CRM) KW - Certified reference coatings (CRC) KW - Quantification KW - Embrittlement PY - 2004 SP - 63 EP - 70 PB - American Electroplaters and Surface Finishers Society (AESF) CY - Orlando AN - OPUS4-6977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Riedel, J.-U. A1 - Paatsch, Wolfgang T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement KW - GD-OES KW - GDS KW - Hydrogen KW - Embrittlement PY - 2006 SN - 0161-6951 VL - 31 SP - 354 EP - 356 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-11935 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Berechnung von Röntgenröhrenspektren auf der Grundlage experimenteller Röntgenausbeuten T2 - Forschungsseminar "Ausgewählte analytische Methoden der Physik" CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12453 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Simulation der Spektren von Röntgenröhren des Typs MCBM 50 im REM T2 - Fachtagung Prozessnahe Röntgenanalytik (PRORA 2005) CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11325 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison report from VAMAS with ISO/TC 202 Microbeam Analysis N2 - The progress in the activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects/inter-laboratory comparisons. The recently started project FIB sample processing for TEM is presented. Next projects in the pipeline involving EBSD and TKD are shortly announced. The need of more promotion for the engagement of more experts from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. T2 - 29th Annual Meeting of ISO/TC 202 Microbeam Analysis CY - Online meeting DA - 28.11.2022 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - EBSD KW - Electron microscopy KW - Thin films PY - 2022 AN - OPUS4-56424 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of elemental composition of Fe1-xNix and Si1-xGex alloy thin films by EMPA and µ-XRF N2 - It was demonstrated in the past that the electron probe microanalysis (EPMA) can be applied to determine accurately both elemental composition and thickness of thin films by using the dedicated software package for thin film analysis Stratagem. A relatively small number of film materials such as pure metallic films of platinum and nickel, binary alloys of Fe-Ni, and Pt-Ni-Co ternary alloy films has been reported in literature as working successfully. Further, the software can be applied ‘inversely’, i.e., by feeding it with the thickness of the film and using the determined mass coating, one can easily calculate the film density, which for porous layers leads us to the true film porosity. The present study repeats measurements on an already tested system of Fe-Ni thin films on silicon and reports for the first-time results of analysis on Si-Ge thin films deposited on a non-conductive aluminium oxide substrate. Standard-based and standardless EPMA (with EDS) results were used in combination with Stratagem for the quantification. Further, X-ray fluorescence analysis (XRF) can be used for the determination of elemental composition and thickness of such films as well. In this case, XRF with a μ-focus X-ray source (μ-XRF) attached to a SEM was applied. For quantification, a fundamental parameter (FP) approach has been used to calculate standard-based and standardless results. Compared to EPMA, XRF has a larger information depth and a higher elemental sensitivity because of a generally lower background. Both thin film systems have been chosen as samples of an international round robin test (RRT) organised in the frame of standardisation technical committee ISO/TC 201 ‘Surface chemical analysis’, under the lead of KRISS. The main objective of the RRT is to compare the results of atomic fractions of Fe1-xNix and Si1-xGex alloy films obtained by different surface Analysis techniques, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) applied in the depth-profiling operation mode. Five samples of different atomic fractions of each thin film system, i.e., Fe1-xNix and Si1-xGex, have been grown by ion beam sputter deposition on silicon and Al2O3 wafers, respectively. Reference FeNi and SiGe films with well-known elemental composition and thickness have been also supplied for standard-based analysis. The atomic fractions of all the samples including the references have been certified by RBS (Rutherford backscattering spectrometry) and ICP-AES (inductively coupled plasma atomic emission spectroscopy). T2 - EMAS 2019 - 16th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Trondheim, Norway DA - 19.05.2019 KW - EPMA KW - FeNi KW - SiGe KW - Thin film analysis KW - µ-XRF PY - 2019 AN - OPUS4-48113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - About Interlaboratory Comparisons (ILCs) and VAMAS N2 - Advanced materials, such as nanomaterials, 2D materials, or thin films, play a crucial role in driving economic development and addressing major challenges in the coming years. These challenges include mitigating the impact of climate change, advancing lightweight engineering, enhancing catalysis, and improving medical applications. To comprehend the performance of these materials and ensure their acceptance across various sectors as safe and sustainable for both humans and the environment, the availability of reference procedures, materials, and data is essential. One versatile tool for establishing such references and evaluating the proficiency of individual laboratories and their competencies is through (international) interlaboratory comparisons (ILC). Notably, initiatives like the Versailles Project on Advanced Materials and Standards (VAMAS) provide a platform for conducting ILCs. This webinar will showcase various examples of interlaboratory comparisons, illustrating their impact on the development of reference products. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Interlaboratory comparison KW - Reference products KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-60096 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphology Analysis of Graphene Oxide Flakes with SEM - Preparation of an Inter-Laboratory Comparison @VAMAS N2 - Experience gained at BAM within the European project ISGScope on the accurate measureemnt of graphene oxide flakes by electron microscopy is presented. Particularly, factors such as the type of solvent, substrate temperature, but also proper, gentle measurement parameters and image analysis conditions towards automation are highlighted. The measurement procedures in develeopment are being prepared to launch an inter-laboratory comparison under VAMAS (TWA41) as preparatory guidance for future standardisation at ISO. T2 - ISO/TC 229 Nanotechnologies Plenary Meeting - Graphene Standardisation CY - Teddington, UK DA - 14.11.2022 KW - Graphene oxide flakes KW - SEM KW - Morphology KW - VAMAS KW - Standardisation KW - Sample preparation KW - ISOGScope PY - 2022 AN - OPUS4-56300 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of Lateral Size of Graphene Oxide Flakes by SEM - An Update of the VAMAS TWA 41 Project P13 N2 - The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are highlighted. The implementation of the results into the corresponding ISO technical specification AWI/TS 23879 is also discussed and planned, in relation with the AFM part. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - VAMAS KW - ISO/TC 229 Nanotechnologies KW - Interlaboratory comparison KW - Graphene oxide flakes KW - SEM PY - 2023 AN - OPUS4-58813 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33249 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS N2 - Traceable morphological and chemical characterization of nanomaterials with respect to the various possible sizes, size distributions, shapes, and concentrations of real-world nanoparticles (NPs) is a challenging task. Particularly for the nonspherical, non-monodisperse nanoparticles – as typically for most of the commercial particles, including their strong tendency to agglomerate, there is a lack of standard operation procedures providing accurate nanoparticle characterisation. In the framework of the pre-standardisation framework of VAMAS (Versailles Project on Advanced Materials and Standards, www.vamas.org) two interlaboratory comparison (ILC) studies are being carried out under the Technical Working Area (TWA) 34 “Nanoparticle Populations”:i) Project #15 addresses the analysis of the size and shape distribution of TiO2 bipyramidal NPs by traceable imaging methods such as TEM, SEM, STEM-in-SEM, AFM as well as with SAXS as an ensemble method. This ILC is thought as the next level development of the case studies exemplified in the published ISO standards ISO 21363 and ISO 19749. It was agreed to complete the first ILC with the NPs already prepared according to the same procedure on a TEM grid, and, at a later stage, to carry out second ILCs with the same NPs distributed to the participants as liquid suspensions together with protocols for the uniform NP deposition on suited substrates - as developed and optimized within the European project nPSize. Once having good deposition protocols available, the door for automated image analysis gets opened. Corresponding image analysis protocols and reporting templates have been distributed to the ILC participants, too. ii) Project #16: two spherical SiO2 NP samples with bi-modal size distributions in two nominal relative number concentrations were prepared and distributed also as liquid suspensions accompanied by sample preparation, measurement, and image analysis protocols and reporting templates. Here, the NP concentration is the primary parameter to be measured. For the imaging methods it is targeted to measure the relative nanoparticle concentrations (relative populations of the two modes). The results of all the participating laboratories, in both ILCs, compiled in comparative representations will be shown and discussed for the first time. The reduction of the measurement uncertainties associated to the size, shape and number-concentration results induced by the significant improvement of the sample preparation on substrates (as single particles with a high-density coverage), combined with well-defined image analysis procedures will be highlighted. Finally, a very recent 3rd ILC an the determination of lateral size of Graphene Oxide flakes by SEM is presented as project P13 under VAMAS TWA41 Graphene and Related 2D. T2 - Microscopy and Microanalysis 2024 CY - Cleveland, OH, USA DA - 28.07.2024 KW - VAMAS KW - Interlaboratory comparison KW - Imaging KW - Nanoparticles KW - Electron microscopy KW - Graphene oxide KW - Particle size distribution PY - 2024 AN - OPUS4-60875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Physical-chemical Characterization of Graphene-Related 2D Materials: Development of Approaches for Reliable Quantification N2 - An accurate characterisation of the morphological, structural, and chemical properties of nano and advanced materials is key for the understanding of the material functionality and constitutes the basis for future optimisation or even prediction of the product performance. Further, the correlation of the physical-chemical properties with results from biological testing leads to an understanding of the potential toxicological effects so that a minimisation of the materials risks becomes possible. The presentation will highlight with examples the importance of the selection of the relevant parameters/descriptors and particularly their measurement for the reliable characterisation of the morphology, structure, and chemistry of graphene-related 2D-materials (GR2M’s) [1-3]. One crucial aspect is also one of most challenging ones in the characterisation chain: the proper sample preparation, which shall be tailored to the accurate measurement of the defined analytical parameter. Practical examples of measurement of morphological descriptors of GR2M’s, such as equivalent circular diameter (ECD), minimum and maximum Feret, and aspect ratio with electron microscopy, or of the thickness with atomic force microscopy (AFM) will be showed, together with quantitative chemical characterisation with X-ray photoelectron spectroscopy (XPS) and, newly, with energy-dispersive X-ray spectroscopy with a scanning electron microscope (SEM/EDX) [4] by evaluating accurately the elemental content as the ratio of O/C and the composition of impurities. Another relevant, but challenging part of the characterisation of GR2M’s, particularly as the final products containing mostly low amounts of GR2M’s, is the analysis of homogeneity of the chemical composition by sensitive imaging methods. Examples of successful analysis with secondary ion mass spectrometry (SIMS), even if not quantitative, will be showed. T2 - SaferWorldbyDesign Webinars CY - Online meeting DA - 25.03.2025 KW - Graphene-related 2D materials KW - Standardisation KW - Interlaboratory comparison KW - Physico-chemical characterisation PY - 2025 UR - https://saferworldbydesign.com/webinars/ AN - OPUS4-62791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quantitative EDS analysis on graphene related 2D materials N2 - The elemental analysis of solid matter by means of the Energy-Dispersive X-Ray Spectrometry (EDS) is meanwhile posible as a quick (seconds!) and more and more accurate analysis via standardsless (instantaneous) quantification. The sensitivity & quantification accuracy for light elements (C, O,..) has significantly increased in the recent years. The availability via table-top SEMs with incorporated EDS is also enhanced. Further, the EDS analysis at an SEM is well-standardized, see ISO/TC 202 Microbeam Analysis & VAMAS/ TWA 37 Quantitative Microstructural Analysis in good liaisonships with ISO/TC 229 Nanotechnologies. It is demostrated that key parameters such as oxygen-to-carbon atomic-% ratio and impurities can be realibly measured, with XPS as a reference method. Various EDS spectrometers and analysis conditions are tested and the validity of the EDS quantification of an ionic liquid of well-defined chemical composition is demonstrated. Next steps are to launch a corresponding VAMAS interlaboratory comparison and to discuss within ISO/TC 229 towards inclusion of EDS as a routine method for the elemental analysis of GR2M into the ISO/TS 23359 Nanotechnologies — Chemical characterization of GR2Ms in powders and suspensions. T2 - Annual Microscopy Community Meeting for the National Research Council in Canada CY - Online meeting DA - 18.11.2025 KW - Graphene-related 2D materials (GR2M) KW - Elemental analysis KW - Light elements KW - SEM/EDS KW - Standardisation PY - 2025 AN - OPUS4-64766 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges for an accurate Reference-free quantitative Analysis with µ-XRF at a SEM/EDS T2 - European Conference on X-Ray Spectrometry CY - Figueira da Foz, Portugal DA - 2010-06-20 PY - 2010 AN - OPUS4-23568 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of Lateral Dimensions of Particles & Flakes (2D) by Imaging Methods N2 - An overview with the basics of size and shape measurement of particles and 2D structures according to established methodologies (and popular imaging processing software packages) with imaging techniques is given. Main descriptors are explained based on practical cases are determined interactively at the flipchart. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Nanoparticles KW - 2D materials KW - Lateral dimensions KW - ISO KW - Imaging PY - 2024 AN - OPUS4-60454 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - WD- & ED- Electron Probe Microanalysis on Au-Cu alloys - A CCQM/SAWG Pilot Study (P130) T2 - Training course on Quality Assurance for Traceable Energy Dispersive Electron Probe Microanalysis (ED-EPMA) CY - Berlin, Germany DA - 2014-03-28 PY - 2014 AN - OPUS4-30584 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Correlative Morphological-Chemical Imaging of Nanostructured Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Conference on Applied Surface and Solid Material Analysis AOFKA 2023 CY - Zurich, Switzerland DA - 11.09.2023 KW - Correlative imaging KW - Electron microscopy KW - X-ray spectroscopy KW - Nanostructures PY - 2023 UR - https://aofka23.scg.ch/ AN - OPUS4-58338 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Correlative imaging analysis of non-spherical nanoparticles N2 - It sounds like being a simple analytical task, it is definitely not. The way toward accurate measurement of the size distribution of nanoparticles (NPs) with complex shape, having a broad size polydispersity, with inhomogeneous chemistry, and with a high degree of agglomeration/aggregation is very challenging for all available analytical methods. Particularly for the NPs with complex shape, the access to the smallest dimension (as e.g. required for regulatory purposes) can be enabled only by using imaging techniques with spatial resolution at the nanoscale. Moreover, the full 3D-chacterisation of the NP shape can be provided either by advanced characterization techniques like 3D-TEM tomography or by correlative analysis, i. e. synergetic/complementary measurement of the same field-of-view of the sample with different probes. Examples of the latter type of analysis are: i) electron microscopy for the lateral dimensions and AFM for the height of the NPs, ii) SEM with STEM-in-SEM (also called T-SEM), iii) Electron Microscopy with TKD (Transmission Kikuchi Diffraction) for determination of the geometrical orientation of crystalline NPs, iv) Raman and SEM for e.g. thickness of graphen flakes, or v) Electron Microscopy for descriptive NP shape and SAXS for the NP concentration, the latter as a NP property able to be measured with higher and higher accuracy. For all these types of measurement, reference NPs are necessary for the validation of the measured size. Particularly non-spherical reference NPs are still missing. Examples of such new reference NPs as characterized by the correlative analyses enumerated above will be presented in detail in the contribution. T2 - 2021 Fall Meeting of the European Materials Research Society (E-MRS) CY - Online meeting DA - 20.9.2021 KW - Nanoparticles KW - Transmission Kikuchi Diffraction (TKD) KW - Correlative imaging KW - Electron microscopy KW - AFM KW - TiO2 KW - VAMAS PY - 2021 UR - https://www.european-mrs.com/meetings/2021-fall-meeting AN - OPUS4-53367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ghasem Zadeh Khorasani, Media A1 - Elert, Anna Maria A1 - Hodoroaba, Vasile-Dan A1 - Agudo Jácome, Leonardo A1 - Altmann, Korinna A1 - Silbernagl, Dorothee A1 - Sturm, Heinz T1 - Short- and long-range mechanical and chemical interphases caused by interaction of Boehmite (γ-AlOOH) with anhydride-cured epoxy resins N2 - Understanding the interaction between boehmite and epoxy and the formation of their interphases with different mechanical and chemical structures is crucial to predict and optimize the properties of epoxy-boehmite nanocomposites. Probing the interfacial properties with atomic force microscopy (AFM)-based methods, especially particle-matrix long-range interactions, is challenging. This is due to size limitations of various analytical methods in resolving nanoparticles and their interphases, the overlap of interphases, and the effect of buried particles that prevent the accurate interphase property measurement. Here, we develop a layered model system in which the epoxy is cured in contact with a thin layer of hydrothermally synthesized boehmite. Different microscopy methods are employed to evaluate the interfacial properties. With intermodulation atomic force microscopy (ImAFM) and amplitude dependence force spectroscopy (ADFS), which contain information about stiffness, electrostatic, and van der Waals forces, a soft interphase was detected between the epoxy and boehmite. Surface potential maps obtained by scanning Kelvin probe microscopy (SKPM) revealed another interphase about one order of magnitude larger than the mechanical interphase. The AFM-infrared spectroscopy (AFM-IR) technique reveals that the soft interphase consists of unreacted curing agent. The long-range electrical interphase is attributed to the chemical alteration of the bulk epoxy and the formation of new absorption bands. KW - Nanocomposites KW - Interphase KW - Intermodulation AFM KW - Electron microscopy KW - Infrared nano AFM PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-483672 UR - https://www.mdpi.com/2079-4991/9/6/853/htm DO - https://doi.org/10.3390/nano9060853 SN - 2079-4991 VL - 9 IS - 6 SP - 853, 1 EP - 20 PB - MDPI AN - OPUS4-48367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Karafiludis, Stephanos A1 - de Oliveira Guilherme Buzanich, Ana A1 - Heinekamp, Christian A1 - Smales, Glen Jacob A1 - Hodoroaba, Vasile-Dan A1 - ten Elshof, J. E. A1 - Emmerling, Franziska A1 - Stawski, Tomasz T1 - Template-free synthesis of mesoporous, amorphous transition metal phosphate materials N2 - We present how mesoporosity can be engineered in transition metal phosphate (TMPs) materials in a template-free manner. The method involves a transformation of a precursor metal phosphate phase, called M-struvite (NH4MPO4·6H2O, M = Mg2+, Ni2+, Co2+, NixCo1-x2+). It relies on the thermal decomposition of crystalline M-struvite precursors to an amorphous and simultaneously mesoporous phase, which forms while degassing of NH3 and H2O. The temporal evolution of mesoporous frameworks and the response of the metal coordination environment were followed with in-situ and ex-situ scattering and diffraction, as well as X -ray spectroscopy. Despite sharing the same precursor struvite structure, different amorphous and mesoporous structures were obtained depending on the involved transition metal. We highlight the systematic differences in absolute surface area, pore shape, pore size, and phase transitions depending on a metal cation present in the analogous M-struvites. The amorphous structures of thermally decomposed Mg-, Ni- and NixCo1-x-struvites exhibit high surface areas and pore volumes (240 m²g-1 and 0.32 cm-3 g-1 for Mg and 90 m²g-1 and 0.13 cm-3 g-1 for Ni). We propose that the low-cost, environmentally friendly M-struvites could be obtained as recycling products from industrial and agricultural wastewaters. These waste products could be then upcycled into mesoporous TMPs through a simple thermal treatment for further applications, for instance, in (electro)catalysis. KW - Struvite KW - Pphosphates KW - Transition metal KW - In-situ SAXS/WAXS KW - Mesoporosity PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-569503 DO - https://doi.org/10.1039/D2NR05630E SN - 2040-3364 SP - 1 EP - 15 PB - Royal Society of Chemistry (RSC) AN - OPUS4-56950 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Ciornii, Dmitri A1 - Hodoroaba, Vasile-Dan A1 - Benismail, Nizar A1 - Altmann, Korinna T1 - Project 2: Interlaboratory Comparison on detection and quantitative assessment of microplastics by use of spectroscopic and thermo-analytical methods N2 - Validated and standardized methods in microplastic analysis are indispensable for robust monitoring and regulation. Alongside also reference materials are urgently needed. An interlaboratory comparison (ILC) offers a powerful tool to address both these challenges. The present study aimed to compare the precision and accuracy of various methods for the detection and quantification of microplastic in a water-soluble matrix. Additionally, it evaluated the suitability of the test materials (containing environmentally relevant plastic polymers) to serve as reference materials for the microplastic analysis. In this ILC several most used thermo-analytical and spectroscopic methods have been addressed: Pyrolysis-Gas Chromatography Mass Spectrometry (Py-GC/MS), Thermal Extraction-Desorption Gas Chromatography Mass Spectrometry (TED-GC/MS), micro-Fourier Transform Infrared Spectroscopy (µ-FTIR), and micro-Raman Spectroscopy and Laser Direct Infrared Spectroscopy (LDIR). Microplastic powders of polyethylene (PE) and polyethylene terephthalate (PET) were used to assess suitability of the test materials (microplastic tablets) for method validation and use in the ILCs. The participants were guided with a SOP how to dissolve the test samples and, depending on their selected method, either quantify the number of particles (by the spectroscopic methods) or determine the mass fraction of microplastic particles per sample (by the thermo-analytical methods). KW - ILC KW - Microplastic KW - FTIR KW - Raman KW - TED-GC/MS KW - Py-GC/MS PY - 2024 SP - 1 EP - 16 AN - OPUS4-60612 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Tougaard, S. A1 - Werner, W. S. M. A1 - Hronek, M. A1 - Kunz, Valentin A1 - Radnik, Jörg A1 - Stockmann, Jörg M. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Nirmalananthan-Budau, Nithiya A1 - Geißler, Daniel A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Correction to "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" N2 - This is a corrigendum to the original article "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" that was published in "The journal of physical chemistry C", vol. 123 (2019), no. 49 pp. 29765-29775. PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505451 DO - https://doi.org/10.1021/acs.jpcc.0c00027 SN - 1932-7447 SN - 1932-7455 VL - 124 IS - 6 SP - 3923 PB - American Chemical Society CY - Washington, DC AN - OPUS4-50545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro and Nano Plastics in the Environment N2 - The VAMAS/TWA 45 Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods” involving 85 participants around the world is primarily discussed with respect to the results received and a first data evaluation. Status of the Project "Guidelines for defining reference materials for plastic degradation in marine environment" is reported and two new project proposals are presented: "Development of standardized methodologies for characterisation of nanoplastics (starting soon, BAM as leader?) and "Development of analytical protocols for the identification and quantification of microplastics of fibrous shape (still in negotiation)". T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 09.10.2023 KW - Microplastics KW - Nanoplastics KW - Interlaboratory comparison KW - VAMAS KW - Reference materials KW - ISO PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58539 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Thünemann, Andreas A1 - Emmerling, Franziska A1 - Hodoroaba, Vasile-Dan T1 - Review of existing calibration or reference N2 - We report on calibration standards of nanoparticles meeting the definition of a nanomaterial given by the European Commission (EU 2011) which are relevant for the characterisation methods applied in the NanoDefine project. We found that the Impact of nanoparticles is outstanding in the scientific literature. A number of 270.000 paper titles on nanoparticles are listed in the Web of Science data base. But surprisingly, the availability of suitable certified standard reference materials is scarce. Only a few sources were found. For example, BAM provides the database Nanoscaled Reference Materials at http://www.nano-refmat.bam.de/en/ in cooperation with the ISO/TC 229 Nanotechnologies. In addition, two publications from 2013 on nanoscale reference materials are available. Candidates of nano-(certified) reference materials from other ongoing or just finished FP6 and FP7 nano-metrology projects have been extracted from the Compendium of Projects in the European NanoSafety Cluster (Compendium NSC, 2013). Recommendations for selection of representative test materials and calibration standards for NanoDefine internal tasks, respectively, are also given. KW - Nanomaterial KW - Reference materials KW - Certified reference materials PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-389836 UR - http://www.nanodefine.eu/index.php/downloads/nanodefine-technical-reports SP - 1 EP - 18 CY - Wageningen, The Netherlands AN - OPUS4-38983 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Putzu, Mara A1 - Wiesner, Yosri A1 - Weimann, Christiane A1 - Hodoroaba, Vasile-Dan A1 - Muniategui Lorenzo, Soledad A1 - Fernández-Gonzáles, Verónica A1 - Booth, Andy M. A1 - Igartua, Amaia A1 - Benismail, Nizar A1 - Coïc, Laureen A1 - Chivas-Joly, Carine A1 - Fenoglio, Ivana A1 - Rossi, Andrea Mario A1 - Giovannozzi, Andrea Mario A1 - Altmann, Korinna T1 - Optimization of tablet processing as a reference material for microplastic detection methods N2 - Reference materials (RMs) are essential and highly demanded tools for the development and validation of methods for microplastic (MP) quantification in complex matrices, to ensure comparable and harmonized approaches aligned with EU commission criteria for monitoring MPs (e.g., Drinking Water Directive and Urban Wastewater Treatment Directive). This study investigates different approaches for optimizing the production of polypropylene (PP) RMs in the form of water-soluble tablets, which were carefully evaluated for their homogeneity and stability according to ISO Guide 30, ISO 33401, and ISO 33405. PP particles (1–100 μm) were produced by cryomilling and embedded in a lactose/PEG matrix, then pressed into tablets (18 µg theoretical PP mass). The production process was optimized by varying (i) the size distribution of the matrix components and (ii) the mixer instrument. The materials obtained were characterized by thermogravimetric analysis to assess the homogeneity distribution of MPs with respect to PP mass in the individual tablets and their stability over a 4-month period. The most promising approach, with a homogenous mass of 19 μg (standard deviation of 4 μg), relative standard deviation of 19%, was further investigated for homogeneity by comparison with thermo-analytical mass determination methods, such as TED-GC/MS (thermal extraction desorption-gas chromatography/mass spectrometry) and Py-GC/MS (pyrolysis-gas chromatography-mass spectrometry), and for number-based characterization using micro-Raman spectroscopy. Material characterization was also examined using laser diffraction, scanning electron microscopy, and ATR-FTIR. Based on the results, the optimized processing protocol yields a PP RM suitable for quality control and method performance studies supporting standardization. KW - Microplastics KW - TED-GC/MS KW - Reference materials KW - Polypropylene PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-653290 DO - https://doi.org/10.1007/s00216-025-06271-7 SN - 1618-2642 SP - 1 EP - 14 PB - Springer Science and Business Media LLC AN - OPUS4-65329 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ciornii, Dmitri A1 - Hodoroaba, Vasile-Dan A1 - Wachtendorf, Volker A1 - Fengler, Petra A1 - Altmann, Korinna T1 - Interlaboratory Comparison Reveals State of the Art in Microplastic Detection and Quantification Methods N2 - In this study, we investigate the current accuracy of widely used microplastic (MP) detection methods through an interlaboratory comparison (ILC) involving ISO-approved techniques. The ILC was organized under the prestandardization platform of VAMAS (Versailles Project on Advanced Materials and Standards) and gathered a large number (84) of analytical laboratories across the globe. The aim of this ILC was (i) to test and to compare two thermo-analytical and three spectroscopical methods with respect to their suitability to identify and quantify microplastics in a water-soluble matrix and (ii) to test the suitability of the microplastic test materials to be used in ILCs. Two reference materials (RMs), polyethylene terephthalate (PET) and polyethylene (PE) as powders with rough size ranges between 10 and 200 μm, were used to press tablets for the ILC. The following parameters had to be assessed: polymer identity, mass fraction, particle number concentration, and particle size distribution. The reproducibility, SR, in thermo-analytical experiments ranged from 62%−117% (for PE) and 45.9%−62% (for PET). In spectroscopical experiments, the SR varied between 121% and 129% (for PE) and 64% and 70% (for PET). Tablet dissolution turned out to be a very challenging step and should be optimized. Based on the knowledge gained, development of guidance for improved tablet filtration is in progress. Further, in this study, we discuss the main sources of uncertainties that need to be considered and minimized for preparation of standardized protocols for future measurements with higher accuracy. KW - Microplastics KW - Interlaboratory comparison KW - PlasticsFatE KW - PET KW - PE KW - Reference materials KW - VAMAS KW - Thermo-analytical methods KW - Spectroscopical methods PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-630462 DO - https://doi.org/10.1021/acs.analchem.4c05403 SN - 1520-6882 VL - 97 SP - 8719 EP - 8728 PB - ACS Publications AN - OPUS4-63046 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wegner, Karl David A1 - Häusler, I. A1 - Knigge, Xenia A1 - Hodoroaba, Vasile-Dan A1 - Emmerling, Franziska A1 - Reiss, P. A1 - Resch-Genger, Ute T1 - One-Pot Heat-Up Synthesis of ZnSe Magic-Sized Clusters Using Thiol Ligands N2 - The synthesis of two new families of ZnSe magic-sized clusters (MSCs) is achieved using the thiol ligand 1-dodecanethiol in a simple one-pot heat-up approach. The sizes of the MSCs are controlled with the thiol ligand concentration and reaction temperature. KW - ZnSe KW - Magic-sized cluster KW - Dodecanethiol KW - Semiconductor nanocrystals KW - One-pot synthesis PY - 2022 DO - https://doi.org/10.1021/acs.inorgchem.2c00041 VL - 61 IS - 19 SP - 7207 EP - 7211 PB - ACS Publications CY - Washington, DC (USA) AN - OPUS4-54880 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Karafiludis, Stephanos A1 - Kochovski, Z. A1 - Scoppola, E. A1 - Retzmann, Anika A1 - Hodoroaba, Vasile-Dan A1 - ten Elshof, J. E. A1 - Emmerling, Franziska A1 - Stawski, Tomasz Maciej T1 - Nonclassical Crystallization Pathway of Transition Metal Phosphate Compounds N2 - Here, we elucidate nonclassical multistep crystallization pathways of transition metal phosphates from aqueous solutions. We followed precipitation processes of M-struvites, NH4MPO4·6H2O, and M-phosphate octahydrates, M3(PO4)2·8H2O, where M = Ni, Co, or NixCo1–x, by using in situ scattering and spectroscopy-based techniques, supported by elemental mass spectrometry analyses and advanced electron microscopy. Ni and Co phosphates crystallize via intermediate colloidal amorphous nanophases, which change their complex structures while agglomerating, condensing, and densifying throughout the extended reaction times. We reconstructed the three-dimensional morphology of these precursors by employing cryo-electron tomography (cryo-ET). We found that the complex interplay between metastable amorphous colloids and protocrystalline units determines the reaction pathways. Ultimately, the same crystalline structure, such as struvite, is formed. However, the multistep process stages vary in complexity and can last from a few minutes to several hours depending on the selected transition metal(s), their concentration, and the Ni/Co ratio. KW - Non-classical crystallization theory KW - Transition metals KW - Phosphates KW - Amorphous phases KW - Intermediate phases PY - 2023 DO - https://doi.org/10.1021/acs.chemmater.3c02346 SN - 1520-5002 VL - 35 IS - 24 SP - 10645 EP - 10657 PB - American Chemical Society (ACS) CY - Washington D.C. AN - OPUS4-59135 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Altmann, Korinna A1 - Hodoroaba, Vasile-Dan T1 - CUSP inter-laboratory comparisons N2 - In this breakout session first, an introduction is given on the planning and organisation of an inter-laboratory comparison (ILC) under the pre-standardisation plattform VAMAS within the newly formed technical working area TWA 45 Micro and Nano Plastics in the Environment. An update with the ILCs on micro- and nanoplastic performed so far is also given. In the third part, the requirements for a reference materials are presented. The needs from the different H2020 micro- and nanoplastic projects are collected and compiled in an ILC matrix for joint activities as the next steps. T2 - The European Research Cluster to Understand the Health Impact of Micro- and Nanoplastics (CUSP) Launching Event CY - Online meeting DA - 10.06.2021 KW - Microplastic KW - Nanoplastic KW - Inter-laboratory comparison KW - VAMAS KW - Reference material PY - 2021 AN - OPUS4-52808 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Mrkwitschka, Paul A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - XPS/HAXPES and EDS spectra with ROI N2 - XPS/HAXPES spectra as well as EDS spectra and SEM micrographs with regions of interest. Measurement scheme included as a powerpoint presentation. Investigated materials: Ionic liquid and commercial and lab-synthesized graphene oxide. KW - EDX KW - XPS KW - Graphene Oxide KW - Ionic Liquid PY - 2026 DO - https://doi.org/10.5281/zenodo.18231732 PB - Zenodo CY - Geneva AN - OPUS4-65624 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -