TY - JOUR A1 - Mino, L. A1 - Pellegrino, F. A1 - Rades, Steffi A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan A1 - Spotto, G. A1 - Maurino, V. A1 - Martra, G. T1 - Beyond shape engineering of TiO2 nanoparticles: Post-synthesis treatment dependence of surface hydration, hydroxylation, Lewis acidity and photocatalytic activity of TiO2 anatase nanoparticles with dominant {001} or {101} facets N2 - TiO2 anatase nanoparticles are among the relevant players in the field of light-responsive semiconductor nanomaterials used to face environmental and energy issues. In particular, shape-engineered TiO2 anatase nanosheets with dominant {001} basal facets gained momentum because of the possibility to exploit different and/or improved functional behaviors with respect to usual bipyramidal TiO2 anatase nanoparticles, mainly exposing {101} facets. Nevertheless, such behavior depends in a significant extent on the physicochemical features of surfaces exposed by nanosheets. They can vary in dependence on the presence or removal degree of capping agents, namely, fluorides, used for shape-engineering, and experimental investigations in this respect are still a few. Here we report on the evolution of interfacial/ surface features of TiO2 anatase nanosheets with dominant {001} facets from pristine nanoparticles fluorinated both in the bulk and at their surface to nanoparticles with F− free surfaces by treatment in a basic solution and to totally F− free nanoparticles by calcination at 873 K. The nanoparticles fluorine content and its subsequent evolution is determined by complementary techniques (ion chromatography, TOF-SIMS, XPS, AES, SEM-EDX), probing different depths. In parallel, the evolution of the electronic properties and the Ti valence state is monitored by UV−vis spectroscopy and XPS. The calcination treatment results in {001} facets poorly hydroxylated, hydrated, and hydrophilic, which appear as surface features consequent to the expected (1 × 4) reconstruction. Moreover, IR spectroscopy of CO adsorbed as probe molecule indicates that the Lewis acidity of Ti4+ sites exposed on (1 × 4) reconstructed {001} facets of calcined TiO2 nanosheets is weaker than that of cationic centers on {101} facets of bipyramidal TiO2 anatase nanoparticles. The samples have also been tested in phenol photodegradation highlighting that differences in surface hydration, hydroxylation, and Lewis acidity between TiO2 nanoparticles with nanosheet (freed by F− by calcination at 873 K) and bipyramidal shape have a strong impact on the photocatalytic activity that is found to be quite limited for the nanoparticles mainly exposing (1 × 4) reconstructed {001} facets. KW - Nanoparticles KW - TiO2 KW - F- doping KW - Shape-controlled nanoparticles KW - Nanosheets PY - 2018 DO - https://doi.org/10.1021/acsanm.8b01477 SN - 2574-0970 VL - 1 IS - 9 SP - 5355 EP - 5365 PB - ACS Publications CY - Washington, DC, U.S.A. AN - OPUS4-46157 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Minimum Requirements for Nanomaterial Data - Examples with Electron Microscopy and Energy-Dispersive X-Ray Spectroscopy N2 - In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und EDX-Elementanalyse, die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) bei der Charakterisierung von Nanomaterialien vorgestellt und diskutiert. N2 - Based on practical examples of analysis with Electron Microscopy and Energy-Dispersive X-ray Spectroscopy, the minimum information requirements for reliable and reproducible nanomaterial characterization data such as particle size and shape distribution and elemental analysis are presented and discussed. T2 - nano@BAM-Workshop Digitalisierung in der Nanosicherheit CY - Online meeting DA - 04.12.2020 KW - Nanoparticles KW - Electron microscopy KW - EDX KW - Reference data KW - Reproducibility KW - Standardisation PY - 2020 AN - OPUS4-51775 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Hodoroaba, Vasile-Dan T1 - An attempt of exploiting the compton-to-rayleigh intensity ratio for improved analysis with muXRF at a SEM KW - X-ray scattering KW - Compton scattering KW - Rayleigh scattering KW - XRF PY - 2012 DO - https://doi.org/10.1017/S1431927612006678 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. 2 SP - 964 EP - 965 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26753 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Survey on the Suitability of Coatings Containings Hydrogen as Layered CRM for GDS T2 - 2004 Winter Conference on Plasma Spectrochemistry CY - Fort Lauderdale, FL, USA DA - 2004-01-05 PY - 2004 AN - OPUS4-4613 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sarma, Dominik A1 - Mielke, Johannes A1 - Sahre, Mario A1 - Beck, Uwe A1 - Hodoroaba, Vasile-Dan A1 - Rurack, Knut T1 - TSEM-based contour analysis as a tool for the quantification of the profile roughness of silica shells on polystyrene core particles N2 - Core-shell (CS) particles with a polymeric core and a silica shell play an important role in the materials and (bio)analytical sciences. Besides the establishment of reliable synthesis procedures, comprehensive particle characterization is essential for batch-to-batch reproducibility and objective performance assessment across architectures, protocols, and laboratories. Particle characterization with respect to size, size distribution, shell thickness and texture, surface area and roughness or materials composition is commonly conducted with different analytical methods, often on different samples. Our approach uses a dual-mode TSEM/SEM set-up with an EDX detector to obtain a complementary data set with sufficient statistical confidence of one and the same sample on a single instrument. Our protocol reveals information about size, size distribution and shell thickness of the various particles employed from overview images, while an increased field of view (FOV) and high-resolution EDX analysis yields detailed information on shell texture and elemental composition. An image analysis tool was developed to derive and quantify the profile roughness of CS particles from individual beads. Comparison with surface roughness data from AFM showed a similar trend in roughness across the series of particles. Reliable classification into smooth and rough is proposed and roughness changes within different particle batches were tracked systematically. KW - Core-shell particles KW - Electron microscopy KW - Transmission mode KW - Roughness KW - Image analysis PY - 2017 DO - https://doi.org/10.1016/j.apsusc.2017.07.099 SN - 0169-4332 SN - 1873-5584 VL - 426 IS - 1 SP - 446 EP - 455 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-42256 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Elemental Composition and Thickness Determination of Thin Films by Electron Probe Microanalysis (EPMA) N2 - microscopy (AFM), or X-ray reflectometry. For the additional determination of thin film composition, techniques like X-ray photoelectron spectroscopy (XPS) or mass spectrometry-based techniques can be used. An alternative non-destructive technique is electron probe microanalysis (EPMA). This method assumes a sample of homogenous (bulk) chemical composition, so that it cannot be usually applied to thin film samples. However, in combination with the thin film software StrataGEM, the thickness as well as the composition of such films on a substrate can be determined. This has been demonstrated for FeNi on Si and SiGe on Al2O3 film systems. For both systems five samples with different elemental composition and a reference were produced and characterised by Korean research institute KRISS using inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM). These samples were used for an international round robin test. In 2021, a new and open-source thin film evaluation programme called BadgerFilm has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios). In this contribution, we re-evaluated the data acquired for the FeNi and SiGe systems using the BadgerFilm software package and compared the resulting composition and thickness with the results of the established StrataGEM software and other reference methods. With the current evaluation, the BadgerFilm software shows good agreement with the composition and thickness calculated by StrataGEM and as the reference values provided by the KRISS. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - Thin films KW - Electron Probe Microanalysis KW - Interlaboratory Comparisons PY - 2022 AN - OPUS4-54963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Emission spectrum of copper in an argon glow discharge containing hydrogen T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6080 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Boehm, S. A1 - Kim, K. J. T1 - Analysis of Elemental Composition of Fe1-xNix and Si1-xGex Alloy Thin Films by EPMA and μ-XRF N2 - The present study reports on measurements on thin Fe-Ni films on silicon and first-time results of analysis on Si-Ge thin films deposited on a non-conductive aluminium oxide Substrate by electron probe microanalysis (EPMA). Standard-based and standardless EPMA (with EDS) results were used in combination with the thin film analysis software Stratagem for the quantification. Further, X-ray fluorescence analysis (XRF) can be used for the determination of elemental composition and thickness of such films as well. In this case, XRF with a μ-focus X-ray source (μ-XRF) attached to a SEM was applied. For quantification, a fundamental parameter (FP) approach has been used to calculate standard-based and standardless results. Both thin film systems have been chosen as samples of an international round robin test (RRT) organised in the frame of standardisation technical committee ISO/TC 201 ‘Surface chemical analysis’, under the lead of KRISS. The main objective of the RRT is to compare the results of atomic fractions of Fe1-xNix and Si1-xGex alloy films obtained by different surface Analysis techniques, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) applied in the depth-profiling operation mode. Five samples of different atomic fractions of each thin film system, i.e., Fe1-xNix and Si1-xGex, have been grown by ion beam sputter deposition on silicon and Al2O3 wafers, respectively. Reference FeNi and SiGe films with well-known elemental composition and thickness have been also supplied for standard-based analysis. An excellent agreement has been obtained between the atomic fractions determined by EPMA and µ-XRF with the KRISS certified values.zeige mehr KW - Thin film analysis KW - EPMA KW - XRF KW - Fe-Ni KW - Si-Ge PY - 2019 DO - https://doi.org/10.1017/S1431927619009668 VL - 25 SP - 1786 EP - 1787 PB - Cambridge University Press AN - OPUS4-49245 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Electrospray as a sample preparation tool for electron microscopic investigations: Toward quantitative evaluation of nanoparticles N2 - The potential of electrospray deposition, for the controlled preparation of particles for imaging in electron microscopes, is evaluated on various materials: from mono-modal suspensions of spherical particles to multimodal suspensions and to real-world industrial materials. It is shown that agglomeration is reduced substantially on the sample carrier, compared with conventional sample preparation techniques. For the first time, it is possible to assess the number concentration of a tri-modal polystyrene suspension by electron microscopy, due to the high Deposition efficiency of the electrospray. We discovered that some suspension stabilizing surfactants form artifact particles during electrospraying. These can be avoided by optimizing the sprayed suspension. T2 - Microscopy & Microanalysis 2017 Meeting CY - St. Louis, MO, USA DA - 06.08.2017 KW - Electrospray deposition KW - Nanoparticles KW - Electron microscopy KW - Sample preparation KW - TEM KW - SEM PY - 2017 AN - OPUS4-41578 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Source of Measurement Uncertainties associated to Quantitative ED-EPMA T2 - Training course on Quality Assurance for Traceable Energy Dispersive Electron Probe Microanalysis (ED-EPMA) CY - Berlin, Germany DA - 2014-03-28 PY - 2014 AN - OPUS4-30586 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Check of the performance of EDS systems attached to the SEM with the test material EDS-TM001/2 and evaluation software package EDS spectrometer test -application, experiences and updates N2 - The test material EDS-TM001 together with an accompanying software package, “EDX spectrometer check”, have been made available in 2009 by BAM to be employed by EDS (energy dispersive spectrometer) users to check the performance of an EDS attached to the SEM. Particularly for test laboratories operating under accreditation schemes like ISO/IEC 17025, a periodical control of the critical instrumental parameters in end-user laboratories is required. With EDS-TM001 or EDS-TM002 (second generation) test material, this periodical check is simplified to the acquisition of only one 10 kV spectrum. The software “EDX spectrometer check” is destined to evaluate automatically this spectrum and determine the performance of the EDS in terms of energy resolution and calibration as well as possible alteration of low-energy efficiency due to detector contamination. Energy resolution can be compared with the specified values according to the international ISO standard ISO 15632:2012. EDS-TM is a synthetic material consisting of a thick layer of C, Al, Mn, Cu and Zr in a well-defined composition, deposited on a steel (in case of EDS-TM001) or silicon (in case of EDS-TM002) substrate. Meanwhile, more than one hundred laboratories use the EDS-TM001 or EDS-TM002 test material for the periodical check of their EDS. A detailed description of the test material and software together with examples of application was published recently. New results and gained experiences will be presented as well. When the FWHM of lines appearing in the EDS-TM spectrum are determined, the spectrum background must be subtracted accurately. The applied physical background subtraction procedure is robust and takes into account the transmission of the detector window. While the previous version considers only Moxtek AP windows, the new version includes selection of silicon nitride window and the case of windowless detector. Moreover, the new version allows importing of spectra in Bruker spx format and EMSA/MSA files from EDAX TEAM software. T2 - Microscopy & Microanalysis 2018 CY - Baltimore, MD, USA DA - 05.08.2018 KW - X-ray spectrometer KW - EDS KW - SEM KW - Performance check KW - Test material PY - 2018 AN - OPUS4-45751 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rühle, Bastian A1 - Krumrey, Julian Frederic A1 - Hodoroaba, Vasile-Dan T1 - Dataset accompanying the publication "Workflow towards automated segmentation of agglomerated, non-spherical particles from electron microscopy images using artificial neural networks" N2 - This dataset accompanies the following publication, first published in Scientific Reports (www.nature.com/articles/s41598-021-84287-6): B. Ruehle, J. Krumrey, V.-D. Hodoroaba, Scientific Reports, Workflow towards Automated Segmentation of Agglomerated, Non-Spherical Particles from Electron Microscopy Images using Artificial Neural Networks, DOI: 10.1038/s41598-021-84287-6 It contains electron microscopy micrographs of TiO2 particles, the corresponding segmentation masks, and their classifications into different categories depending on their visibility/occlusion. Please refer to the publication and its supporting information for more details on the acquisition and contents of the dataset, as well as the GitHub repository at https://github.com/BAMresearch/automatic-sem-image-segmentation KW - Electron microscopy KW - Neural networks KW - Image segmentation KW - Automated image analysis PY - 2021 DO - https://doi.org/10.5281/zenodo.4563942 PB - Zenodo CY - Geneva AN - OPUS4-52246 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Neamtu, Mariana A1 - Nadejde, C. A1 - Hodoroaba, Vasile-Dan A1 - Schneider, Rudolf A1 - Paul, Andrea A1 - Ababei, G. A1 - Panne, Ulrich T1 - Green Fenton-like magnetic nanocatalysts: Synthesis, characterization and catalytic application N2 - Five iron oxalate core–shell magnetite nanoparticles catalysts are evaluated as magnetic heterogeneous materials. Simple and efficient procedures for the preparation of magnetic iron oxalate coated nanoparticles are presented. The catalysts are fully characterized using various investigation techniques. Additionally, the formation of photo-sensitized oxygen by spin-trapping using electron spin resonance is investigated. The catalytic activity of two model substrates (carbamazepine and bisphenol A) is also evaluated. The effect of operational parameters (catalyst and H2O2 concentration, UVA light) on the degradation performance of the oxidation process is investigated. The obtained reaction rates depend on the nature of the compound and increase with iron oxide shell thickness of the catalyst. Moreover, these materials show a significant activity during two consecutive tests. The optimum experimental parameters are found to be 1.0 g L−1 of catalysts, 10 mM H2O2, under UVA irradiation. More than 99% of both substrates are removed after 30 min of reaction time under the experimental conditions given above. The results obtained show that the catalysts are suitable candidates for the removal of pollutants in wastewaters by means of the Fenton heterogeneous reaction. KW - Five iron oxalate core–shell magnetite nanoparticles catalysts are evaluated as magnetic heterogeneous KW - Characterization KW - Micropollutants PY - 2015 DO - https://doi.org/10.1016/j.apcatb.2015.04.050 SN - 0926-3373 SN - 1873-3883 VL - 176-177 SP - 667 EP - 677 PB - Elsevier AN - OPUS4-40072 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Avishai, N. A1 - Avishai, A. A1 - Hodoroaba, Vasile-Dan T1 - What is the effective geometrical collection efficiency of your XEDS detector? Routine procedure applied in a SEM laboratory N2 - In this contribution, two large-area EDS detectors were tested according to the procedure proposed by Procop et al. (2015). In a first step, the optimal working distance (WD) in the two different SEM chambers was determined by moving the sample stage in the Z direction and monitoring the count rates at a magnification of 10,000 and a field of view of 25.6 µm. The WD at which the highest intensity was measured was selected as the optimal position, corresponding to the crossover between the EDS detector optical axis and electron beam optical axis. Next the Cu Kα peak was measured at different relative EDS positions while it was partially removed from the fully inserted position. The spectrum at each location was collected for 10 sec using the highest pulse rate and intermediate current to minimize pile up effects. The ‘inverse squared normalized intensities vs. relative EDS position’ used to extract the true detector – specimen distance shows a non-linear relationship even at the minimal relative positions, which indicates shadowing due to obstruction or use of an unsuitable and/or off-centered collimator. The normalized count rates measured as a function of the EDS distances, results in a too low GCE (too low true solid angles) for both tested detectors. The source of losses of signal was shadowing caused by collimators. T2 - Microscopy & Microanalysis 2016 Meeting CY - Columbus, Ohio, USA DA - 24.07.2016 KW - EDS KW - Solid angle KW - Net effective sensor area KW - X-ray yields PY - 2016 AN - OPUS4-36982 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Transmission and Scanning Electron Microscopy (SEM/TEM) N2 - Die Bestimmung der Nanopartikelgrößen- und -formverteilung nach OECD TG 125 mit der Transmission and Scanning Electron Microscopy (SEM/TEM) wird punktuell vorgestellt: - Generelles Messprinzip - Beispiele - Korrelative Mikroskopie - Welchen Durchmesser misst die Methode? - Welche Partikel kann diese Methode messen? - Welche Informationen kann diese Methode liefern? - Wo stößt die Methode an ihre Grenzen? - Implementierung und Datenauswertung, - Reporting. Anschließend wurde eine Q&A-Session für die Imaging-Methoden organisiert. T2 - Digital Info-Days „Nano or not Nano“ - Measuring according to OECD Test Guideline No. 125 CY - Online meeting DA - 16.02.2023 KW - Nanoparticles KW - OECD TG 125 KW - Partikelgrößenverteilung KW - Elektronenmikroskopie PY - 2023 UR - https://www.bam-akademie.de/kursangebot/kurs/digitale-info-tage-%E2%80%9Enano-or-not-nano%E2%80%9C-19.html AN - OPUS4-57217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R.B. A1 - Rackwitz, Vanessa A1 - Bremser, Wolfram A1 - Unger, Wolfgang T1 - Determination of the k-values of copper-gold alloys with ED- and WD-EPMA - Results of an inter-laboratory comparison N2 - An inter-laboratory comparison organized as a pilot study (PS) has been performed under the umbrella of the Consultative Committee for Amount of Substance – Metrology in Chemistry (CCQM) / Surface Analysis Working Group (SAWG) with the objective to compare k-values measured with Electron Probe X-ray Microanalysis (EPMA) for copper-gold alloys. The k-value, defined as the ratio of the Xray photon intensity of an X-ray characteristic line of the unknown sample to the corresponding one in the reference material, is a rough estimate of the mass fraction of the respective element. Basically, the mass fractions can be calculated from the k-values after applying a matrix correction procedure, which includes empirical approaches, so that traceability gets lost. Due to its physical, measurable nature, the k-value has been selected in the present PS as the primary measurand. The mass fraction has been set as the secondary (derived) measurand. Both EDX and WDX have been employed. The WDX results and the overall comparability between the k-values obtained by EDX and WDX are still in progress. KW - Interlaboratory comparison KW - EDX KW - WDX KW - EPMA KW - K-values KW - Cu-Au alloy KW - CCQM PY - 2014 DO - https://doi.org/10.1017/S1431927614005376 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 730 EP - 731 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31338 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Maurino, V. A1 - Hodoroaba, Vasile-Dan T1 - Synthesis of Shape controlled TiO2 N2 - Titanium dioxide is one of the most studied metal oxides due to its chemical, surface, electronic and (photo)catalytic properties, providing this material of multisectorial applications ranging from healthcare, photocatalysis, smart materials with self cleaning and self sterilizing properties and solar energy harvesting. However it is difficult to correlate the functional properties of TiO2 nanomaterials to the properties at single nanoparticle level due to the high polydispersity in shape, size and surface features of the currently available TiO2 nanoparticles (NPs). Although intensive experimental and theoretical studies have been conducted on the reactivity of different surfaces of metal oxides such as TiO2 much less attention is paid on the dependence of functional properties, like photocatalytic activity, dye adsorption, open circuit potential and fill factor in dye sensitized solar cells, on crystal facets in different orientations. One of the goal of SETNanoMetro project was the development of design rules to tune crystal facets of TiO2 NPs in order to optimize and control functional properties. In the present work we have developed a series of design rules in order to obtain sets of anatase TiO2 NPs with low polydispersity and to tune their shape and size by hydrothermal processing of Ti(IV)-Triethanolamine complex in presence of different shape controllers. Through a careful experimental design, a predictive soft model was developed. The model is able to predict the synthesis outcome allowing to tune the shape factor from 5 (prisms) to 1.5 (bipyramids) to 0.2 (platelets). This allows to control the main crystal facets exposed ranging from (100) to (001). Due to the dependence of functional properties of nanomaterials on shape distribution and not only size, the availability of NPs sets with uniform and well defined and tunable shapes can be of paramount relevance in order to produce reference nanomaterials for shape measurement. T2 - NanoWorkshop 2018 (Workshop on reference nanomaterials, current situation and needs: development, measurement, standardization) CY - Berlin, Germany DA - 14.05.2018 KW - Anatase KW - Shape control KW - Hydrothermal synthesis KW - Nanoparticles PY - 2018 AN - OPUS4-45634 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Terborg, R. A1 - Kim, K.J. A1 - Unger, Wolfgang T1 - Measurement of atomic fractions in Cu(In,Ga)Se2 films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA) N2 - A pilot study (PS) has been performed under the Consultative Committee for Amount of Substance (CCQM) / Surface Analysis Working Group (SAWG) with the objective to compare the atomic fractions of Cu, In, Ga and Se in CIGS alloy films. Four polycrystalline CIGS films with different atomic fractions were fabricated by variation of the relative atomic fraction of Ga on 100 mm x 100 mm soda-lime glass (SLG) substrates. Similar to real solar cells the atomic fractions of the four elements (Cu, In, Ga, Se) are not homogeneous with depth. For the analysis of the CIGS layers of about 2 μm thickness depth profiling with surface analysis techniques such as XPS, AES and SIMS was recommended. A CIGS alloy reference sample with atomic fractions certified by isotope dilution ICP-MS at KRISS has been also put at disposal by the coordinator of the comparison. The certified values were close to the atomic fractions of the samples to be analyzed. Hence, the atomic fractions of Cu, In, Ga and Se in the CIGS films could be determined by the relative sensitivity factors (RSF) derived from the reference CIGS film. The total ion intensities of the constituent elements were obtained by the total number counting (TNC) method. KW - Interlaboratory comparison KW - Auger Electron Spectroscopy (AES) KW - EDX KW - EPMA KW - CIGS KW - CCQM PY - 2014 DO - https://doi.org/10.1017/S1431927614003730 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 402 EP - 403 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31339 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Motzkus, C. A1 - Macé, T. A1 - Vaslin-Reimann, S. T1 - Performance of high-resolution SEM/EDX systems equipped with transmission mode (TSEM) for imaging and measurement of size and size distribution of spherical nanoparticles N2 - The analytical performance of high-resolution scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) for accurate determination of the size, size distribution, qualitative elemental analysis of nanoparticles (NPs) was systematically investigated. It is demonstrated how powerful high-resolution SEM is by using both mono- and bi-modal distributions of SiO2 airborne NPs collected on appropriate substrates after their generation from colloidal suspension. The transmission mode of the SEM (TSEM) is systematically employed for NPs prepared on thin film substrates such as transmission electron microscopy grids. Measurements in the transmission mode were performed by using a 'single-unit' TSEM transmission setup as manufactured and patented by Zeiss. This alternative to the 'conventional' STEM detector consists of a special sample holder that is used in conjunction with the in-place Everhart–Thornley detector. In addition, the EDX capabilities for imaging NPs, highlighting the promising potential with respect to exploitation of the sensitivity of the new large area silicon drift detector energy dispersive X-ray spectrometers were also investigated. The work was carried out in the frame of a large prenormative VAMAS (Versailles Project on Advanced Materials and Standards) project, dedicated to finding appropriate methods and procedures for traceable characterization of NP size and size distribution. KW - Transmission scanning electron microscopy/microscope (TSEM, T-SEM, STEM) KW - High-resolution scanning electron microscope (SEM) KW - Transmission KW - SiO2 KW - Nanoparticles KW - Size KW - Size distribution KW - EDX KW - Large area SDD PY - 2014 DO - https://doi.org/10.1017/S1431927614000014 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - 2 SP - 602 EP - 612 PB - Cambridge University Press CY - New York, NY AN - OPUS4-30612 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa T1 - Gaining improved chemical composition by exploitation of compton-to-rayleigh intensity ratio in XRF analysis N2 - The high specificity of the coherent (Rayleigh), as well as incoherent (Compton) X-ray scattering to the mean atomic number of a specimen to be analyzed by X-ray fluorescence (XRF), is exploited to gain more information on the chemical composition. Concretely, the evaluation of the Compton-to-Rayleigh intensity ratio from XRF spectra and its relation to the average atomic number of reference materials via a calibration curve can reveal valuable information on the elemental composition complementary to that obtained from the reference-free XRF analysis. Particularly for matrices of lower mean atomic numbers, the sensitivity of the approach is so high that it can be easily distinguished between specimens of mean atomic numbers differing from each other by 0.1. Hence, the content of light elements which are “invisible” for XRF, particularly hydrogen, or of heavier impurities/additives in light materials can be calculated 'by difference' from the scattering calibration curve. The excellent agreement between such an experimental, empirical calibration curve and a synthetically generated one, on the basis of a reliable physical model for the X-ray scattering, is also demonstrated. Thus, the feasibility of the approach for given experimental conditions and particular analytical questions can be tested prior to experiments with reference materials. For the present work a microfocus X-ray source attached on an SEM/EDX (scanning electron microscopy/energy dispersive X-ray spectroscopy) system was used so that the Compton-to-Rayleigh intensity ratio could be acquired with EDX spectral data for improved analysis of the elemental composition. PY - 2014 DO - https://doi.org/10.1021/ac5000619 SN - 0003-2700 SN - 1520-6882 VL - 86 IS - 14 SP - 6858 EP - 6864 PB - American Chemical Society CY - Washington, DC AN - OPUS4-31179 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Yamamoto, K. A1 - Grulke, E. A. A1 - Maurino, V. ED - Bosse, H. ED - Buhr, E. ED - Dziomba, T. ED - Hodoroaba, Vasile-Dan ED - Klein, T. ED - Krumrey, M. T1 - Shape controlled TiO2 nanoparticles as candidates for nano-CRM’s – an ISO case study N2 - Extraction of true, 3D shape (and size) of non-spherical nanoparticles (NPs) is associated with Errors by conventional 2D electron microscopy using projection images. Significant efforts within the ISO technical committee TC 229 ‘Nanotechnologies’ are aimed at establishing accurate TEM and SEM measurement of NP size and shape as robust, standard procedures. Study groups have been organizing inter-laboratory comparisons on well-selected NP systems according to the market needs, such as aggregated titania nano-powder for which size and shape distribution of primary crystallites of irregular shape must be measured accurately. To be noticed is e. g. the fact that the measurement procedure allows only manual selection of the particles clearly distinguishable for analysis as well as manual definition of the contour of the imaged NPs. An inter-laboratory exercise on titania NPs (pure anatase, grown by hydrothermal synthesis) of well-defined non-spherical shape, i.e. bipyramidal, has been recently started within ISO/TC 229 under similar conditions as for the irregular shaped titania. In the TEM micrograph the particles tracked manually according to the measurement protocol. Overlapped particles were allowed to be considered, as long as they are clearly distinguishable. One decisive NP selection criterion was to analyze only those NPs with a roundness value below 0.7, i.e. the NPs laying on the support foil and, hence, with projection areas clearly deviating from perfect circles (R=1). The overall evaluation (for 15 labs) of the size descriptors (area, Feret, minFeret, perimeter) and shape descriptors (aspect ratio, roundness, compactness, extent) by analysis of variance is just to be finished and included in ISO/WD 21363 Nanotechnologies -- Protocol for particle size distribution by transmission electron microscopy. T2 - NanoWorkshop 2018: Workshop on Reference Nanomaterials CY - Berlin, Germany DA - 14.05.2018 KW - Titanium dioxide KW - Nanoparticles KW - Shape-controlled KW - Electron microscopy PY - 2019 SN - 978-3-95606-440-1 DO - https://doi.org/https://doi.org/10.7795/110.20190412 SN - 0179-0609 VL - F-61 SP - 245 EP - 255 PB - Physikalisch-Technische Bundesanstalt CY - Braunschweig und Berlin AN - OPUS4-49990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Steers, E.B.M. A1 - Hoffmann, V. A1 - Wetzig, K. T1 - The effect of small quantities of hydrogen on a glow discharge in neon. Comparison with the argon case N2 - In order to gain an insight into the numerous effects caused by the addition of hydrogen to an argon glow discharge, comparison experiments have been made with neon as carrier gas. In some cases the effects are diminished or even disappear. Using various bulk samples, such as copper, steel and titanium, sputtered in a neon glow discharge, the intensities of the analytical lines are affected by the presence of hydrogen in different ways from argon; the dependent parameter (the discharge current in this work) and the sputtering rate vary less than in argon. The crater shape and roughness are also affected and these effects are discussed qualitatively. Probably the most important spectral feature caused by hydrogen in the case of a discharge in argon is the emission of a continuous background. This does not appear in neon under similar discharge conditions and only weakly at high hydrogen concentrations. This supports the suggestion, made in previous work, that an effective quenching process of the argon metastables (11.55 and 11.72 eV) is Penning excitation of the hydrogen molecules, and subsequent decay to a repulsive state with emission of the continuum; in neon the energy match does not occur. It was found with neon, as with argon, that similar features occur as when hydrogen is introduced in different ways into the glow discharge: as a molecular gas contamination or as a constituent of the sample. Glow discharge mass spectrometry (GD-MS) experiments carried out with both argon and neon support the results obtained by optical emission spectrometry (OES) and provide further relevant information. PY - 2001 DO - https://doi.org/10.1039/b007527m SN - 0267-9477 SN - 1364-5544 VL - 16 SP - 43 EP - 49 PB - Royal Society of Chemistry CY - London AN - OPUS4-6887 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mrkwitschka, Paul A1 - Mühlbauer, Michaela A1 - Rossi, Andrea A1 - Pellegrino, Francesco A1 - Zurutuza, Amaia A1 - Radnik, Jörg A1 - Meier, Florian A1 - Hodoroaba, Vasile-Dan T1 - Morphological Analysis of Graphene Oxide by Scanning Electron Microscopy and Correlative Field-flow Fractionation Coupled with Multi-angle Light Scattering N2 - In this paper graphene related 2D materials (GR2M) arre investigated by centrifugal field flow fractioning (CF3) and SEM. Three materials were selected as case studies (CS): graphene „HD-G (CS I), graphene oxide UniTo“ (CS II), and graphene oxide „Graphenea“ (CS III). For CS I particles were evaluated as constituent particles in agglomerates, for the other two materials only isolated (non aggregated/agglomerated) flakes were considered for determination of the area equivalent circular diameter (ECD). Size analysis of all three materials was carried out by CF3 coupled with MALS (Multi-Angle Light Scattering). For evaluation, it was found that the data obtained was best suited to a disc model. Results are in good agreement when compared to the sizes obtained before CF3 analysis. CS II material is too heterogenous to accurately determine flake size by imaging. CF3 coupled with MALS enables to assess fractions within the highly heterogenous material of CS II. Imaging of the material in CS III after CF3 measurement indicates that the procedure is non-destructive. This could not be verified for the CS‘s I & II As a next step we plan to analyse the fractionated samples by imaging them within a SEM wet-cell. KW - 2D Materials KW - SEM KW - Centrifugal field flow fractionation (CF3) KW - Imaging KW - Size distribution PY - 2025 DO - https://doi.org/10.1093/mam/ozaf048.222 VL - 31 IS - 7 SP - 442 EP - 443 PB - Oxford Academic AN - OPUS4-63804 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quantitative microstructural analysis - VAMAS/TWA 37 N2 - The 44th Meeting of the Versailles Project on Advanced Materials and Standards (VAMAS) Steering Committee has just taken place at NIST in Boulder (CO, USA). BAM participates with significant contributions in Technical Working Areas on nanoparticle and surface chemistry characterization, but also has positioned itself to new global material challenges and trends in the developement of advanced materials and their characterization, such as thermal properties, self-healing materials, and micro- and nanoplastic. T2 - Annual Meeting of the Versailles Project on Advanced Materials and Standards (VAMAS) Steering Committee CY - Boulder, CO, USA DA - 22.05.2019 KW - VAMAS KW - Nanoparticles KW - Microbeam analysis KW - Advanced materials PY - 2019 AN - OPUS4-48184 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Towards accurate analysis of particle size distribution for non-spherically shaped nanoparticles as quality control materials N2 - Measurement of nanoparticle size (distribution) becomes a challenging analytical problem when non-spherical nanoparticles must be accurately measured. Most industrial nanoparticles have not only non-spherical shapes but also possess polydisperse size distributions, and due to their agglomeration/aggregation state are difficult (or even impossible) to be addressed individually. Moreover, driven by regulatory purposes related to the identification of a material as a nanomaterial, the accurate measurement of the smallest dimension of a (nano)particulate material makes the analysis even more complex. In the first phase of the EU Project nPSize - Improved traceability chain of nanoparticle size measurements (https://www.bam.de/Content/DE/Projekte/laufend/nPSize/npsize.html), the efforts are focused on synthesis of nanoparticles of well-defined, non-spherical shape. Following candidates of reference materials (CRM) with certifiable particle size (distribution) are under characterization with respect to their homogeneity and stability: (i) titania nanoplatelets (10-15 nm thickness x 50-60 nm lateral), (ii) titania bipyramides (~60 nm length x 40 nm width), (iii) titania acicular particles (100 nm length x 15-20 nm width; aspect ratio 5.5/6), (iv) gold nanorods (~10 nm width x 30 nm length), and (v) gold nanocubes (~55 nm x 55 nm x 55 nm). T2 - Microscopy & Microanalysis 2019 CY - Portland, OR, USA DA - 03.08.2019 KW - Nanoparticles KW - Reference materials KW - Traceability KW - Non-spherical shape KW - Titanium dioxide PY - 2019 AN - OPUS4-48671 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison Report ISO/TC 229 Nanotechnology for ISO/TC 202 Microbeam Analysis and vice-versa N2 - The liaison between the ISO technical committees TC 229 Nanotechnologies and TC 202 Microbeam analysis is described in detail with highlight on the projects under development and published since 2024 and which involve input /knowledge from ISO/TC 202. T2 - 32nd Plenary Meeting of ISO/TC 202 Microbeam Analysis CY - London, United Kingdom DA - 28.10.2025 KW - Nanotechnology KW - Microabeam analysis KW - Standardisation KW - ISO PY - 2025 AN - OPUS4-64551 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fontanges, Richard T1 - A new deep-learning AI tool for analysing images of complex nanoparticles N2 - A thousand times thinner than a human hair, nanoparticles (NPs) are finding applications in a range of modern products. However, as some can affect human health or the environment, knowing the types present is essential. Electron microscopy is the ‘gold standard’ for NP analysis, allowing identification based on manual size analysis, but a new method was required to analyse these particles quickly, accurately and in a consistent way. KW - Nanoparticles KW - Imaging KW - AI tool KW - Particle size and shape distribution PY - 2024 UR - https://www.euramet.org/casestudies/casestudiesdetails/news/a-new-deep-learning-ai-tool-for-analysing-images-of-complex-nanoparticles SP - 1 EP - 2 PB - EURAMET CY - Braunschweig AN - OPUS4-60095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -