TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the k-Values of Cu-Au Alloys with ED- and WD-EPMA - Results of an inter-laboratory comparison T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31470 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, M. T1 - A method to test the performance of an energy-dispersive X-ray spectrometer (EDS) N2 - A test material for routine performance evaluation of energy-dispersive X-ray spectrometers (EDS) is presented. It consists of a synthetic, thick coating of C, Al, Mn, Cu, and Zr, in an elemental composition that provides interference-free characteristic X-ray lines of similar intensities at 10 kV scanning electron microscope voltage. The EDS energy resolution at the C-K, Mn-Lα, Cu-Lα, Al-K, Zr-Lα, and Mn-Kα lines, the calibration state of the energy scale, and the Mn-Lα/Mn-Kα intensity ratio as a measure for the low-energy detection efficiency are calculated by a dedicated software package from the 10 kV spectrum. Measurements at various input count rates and processor shaping times enable an estimation of the operation conditions for which the X-ray spectrum is not yet corrupted by pile-up events. Representative examples of EDS systems characterized with the test material and the related software are presented and discussed. KW - Energy-dispersive X-ray spectrometer (EDS) KW - Energy-dispersive X-ray spectroscopy (EDX, XEDS) KW - Scanning electron microscope (SEM) KW - Energy resolution KW - Test material KW - Performance check KW - ISO 15632 PY - 2014 DO - https://doi.org/10.1017/S1431927614001652 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - 05 SP - 1556 EP - 1564 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31565 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Organic Surface Modification and Analysis of Titania Nanoparticles for Self-Assembly in Multiple Layers N2 - The characteristics of TiO2 coatings can greatly influence their final performance in large-scale applications. In the present study self-assembly of TiO2 nanoparticles (NPs) in multiple layers was selected as a deposition procedure on various substrates. For this, the main prerequisite constitutes the surface modification of both NPs and substrate with e.g. silane coupling agents. A set of functionalized TiO2 NPs has been produced by reaction with either (3- aminopropyl)triethoxysilane (APTES) or (3-aminopropyl)phosphonic acid (APPA) to functionalize the NP surface with free amino-groups. Then, the complementary functionalized NP set can be obtained from an aliquot of the first one, through the conversion of free surface amino-groups to aldehydes by reaction with glutaraldehyde (GA). Several types of TiO2 NPs differing in size, shape and specific surface area have been functionalized. FTIR, TGA, SEM/EDS, XPS, Auger electron spectroscopy (AES) and ToF-SIMS analyses have been carried out to evaluate the degree of functionalization, all the analytical methods employed demonstrating successful functionalization of TiO2 NP surface with APTES or APPA and GA. T2 - European Conference on Applications of Surface and Interface Analysis ECASIA 2019 CY - Dresden, Germany DA - 15.09.2019 KW - TiO2 KW - Layer-by-layer deposition KW - Surface functionalization KW - P25 KW - Surface characterization PY - 2019 AN - OPUS4-49279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison Report ISO/TC 229 for ISO/TC 202 and vice-versa N2 - The liaison between the two ISO technical committees TC 229 Nanotechnologies and TC 202 Microbeam analysis, in both directions, is described in detail with highlight on the projects under developement since 2023 and which involve input/knowledge from ISO/TC 202. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - ISO TC 229 KW - Standardisation KW - Nanotechnologies KW - Microbeam analysis PY - 2024 AN - OPUS4-61511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Griepentrog, Michael T1 - A new material for the performance check of X-ray spectrometers attached to a SEM T2 - Microscopy and Microanalysis 2006 CY - Chicago, IL, USA DA - 2006-07-30 KW - X-ray spectrometer KW - EDS KW - WDS KW - Calibration PY - 2006 DO - https://doi.org/10.1017/S1431927606061307 SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 SP - 870 EP - 871 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12665 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. T1 - Calculation of X-ray spectra for a side window tube T2 - Microscopy and Microanalysis CY - Chicago, IL, United States of America DA - 2006-07-30 KW - X-ray spectroscopy KW - X-ray tube KW - Microanalysis KW - XRF PY - 2006 DO - https://doi.org/10.1017/S143192760606123X SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12667 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Kombination von Elektronenstrahl-Mikroanalyse und Röntgenfluoreszenzanalyse im Rasterelektronenmikroskop T2 - 36. EDO Herbsttagung CY - Wuppertal, Germany DA - 2006-10-04 PY - 2006 AN - OPUS4-13192 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - iMOXS - a microfocus X-ray source for µ-XRF at a SEM T2 - 45th Annual Conference of the Microscopy Society of Southern Africa (MSSA 2006), Technical Forum CY - Port Elizabeth, South Africa DA - 2006-11-28 PY - 2006 AN - OPUS4-14230 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Extension of analytical secondary electron microscopy in materials reserarch by using µX-Ray fluorescence T2 - 2nd International Advanced Materials Forum for Young Scientists & ICYS Workshop CY - Tsukuba, Japan DA - 2007-02-19 PY - 2007 AN - OPUS4-14583 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Berechnung von Rayleigh- und Comptonstreuung für die Evaluierung von Röntgenspektren T2 - Forschungsseminar "Moderne Analytische Methoden der Physik" (TUB) CY - Berlin, Germany DA - 2007-01-16 PY - 2007 AN - OPUS4-14500 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro-X-Ray fluorescence as an extension of the analytical scanning electron microscope T2 - The 56th Annual Denver X-Ray Conference (DXC 2007) CY - Denver, CO, USA DA - 2007-07-30 PY - 2007 AN - OPUS4-15187 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der aktuellen Transmission einer Röntgen-Minilinse durch Vergleich von berechneten und gemessenen Streuspektren T2 - Fachtagung Prozessnahe Röntgenanalytik, PRORA 2007 CY - Berlin, Germany DA - 2007-11-15 PY - 2007 AN - OPUS4-16175 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - In-depth analysis of the chemical compostion of thick coatings T2 - European Congress and Exhibition on Advanced Materials and Processes (EUROMAT 2007) CY - Nuremberg, Germany DA - 2007-09-10 PY - 2007 AN - OPUS4-15878 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der Transmission von Kapillarlinsen durch Streuspektren T2 - TU-Forschungsseminar "Moderne Analytische Methoden der Physik" CY - Berlin, Germany DA - 2008-01-15 PY - 2008 AN - OPUS4-16483 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - X-ray fluorescence as an additional analytical method for a scanning electron microscope N2 - Energy dispersive and wavelength dispersive X-ray spectrometry are used to determine the composition of a specimen in a scanning electron microscope (SEM) by electron probe microanalysis (EPMA). A valuable completion for the SEM is analysis by X-ray fluorescence (XRFA). The main advantage of this method consists in its low detection limit. XRFA with a SEM uses the same spectrometers as for EPMA, necessary are only an additional X-ray source for the excitation of fluorescence spectra and software for their evaluation. Recent developments of smart low-power X-ray tubes and X-ray optical components enabled the construction of compact X-ray sources with focussing properties as add-on for a SEM. For quantitative XRFA the source spectrum has to be known. For its calculation the X-ray production yields Y have been measured for the commonly used tube target materials Mo, Rh and W. The excitation spectra were calculated for a variety of source types and compared with respect to the achievable photon flux and its spectral distribution. KW - X-ray spectroscopy KW - X-ray production yield KW - X-ray tube spectrum KW - X-ray fluorescence analysis KW - XRF KW - X-ray optics KW - Scanning electron microscopy KW - Analytical SEM PY - 2008 DO - https://doi.org/10.1007/s00604-007-0854-4 SN - 0026-3672 SN - 1436-5073 VL - 161 IS - 3-4 SP - 413 EP - 419 PB - Springer CY - Wien AN - OPUS4-17537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Machbarkeitsstudie zu geeigneten Kandidaten für die Herstellung von CRM für die Bestimmung von Wasserstoff in Festkörpern T2 - 14. Deutsches Anwendertreffen "Analytische Glimmentladungs-Spektroskopie" CY - Berlin, Germany DA - 2008-04-17 PY - 2008 AN - OPUS4-17460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Calculation of scattering spectra for the determination of the actual transmission of an X-ray minilens for µXRF T2 - European Conference on X-Ray Spectrometry (EXRS 2008) CY - Cavtat, Croatia DA - 2008-06-16 PY - 2008 AN - OPUS4-16644 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - How to develop Key Comparisons for Electron Probe Microanalysis (incl. EDX/WDX) T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2008-04-01 PY - 2008 AN - OPUS4-17382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Determination of the real transmission jof an x-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra KW - X-ray optics KW - Transmission KW - Micro-focus-XRF KW - SEM PY - 2009 DO - https://doi.org/10.1002/xrs.1151 SN - 0049-8246 VL - 38 IS - 3 SP - 216 EP - 221 PB - Wiley CY - Chichester AN - OPUS4-19352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A basic physical Model of X-Ray Scattering for improved X-Ray Fluoescence Analysis - Polychromatic X-Ray Tube Excitation T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19534 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19535 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to a SEM T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19442 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - X-Ray Scattering and its Benefit for X-Ray Spectrometry at the SEM T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 37 - Quantitative Microstructural Analysis & Liaison with ISO/TC 202 Microbeam Analysis, Liaison with ISO N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. Further, a short overview of the VAMAS areas of activities is given where Germany is involved. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 46th Steering Committee Meeting CY - Online meeting DA - 08.09.2021 KW - VAMAS KW - Nanoparticles KW - Standardisation KW - Inter-laboratory comparison KW - ISO/TC 202 KW - ISO/TC 229 KW - ISO/TC 201 KW - Microstructure KW - EBSD PY - 2021 UR - http://www.vamas.org/twa/ AN - OPUS4-53237 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fagan, J. T1 - Contributors invited for two studies on concentration of bimodal silica nanoparticle and bipyramidal titania N2 - International standardisation network VAMAS is calling for participants in two studies on the measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension and the measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension. KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - TiO2 KW - SiO2 PY - 2021 UR - https://www.iom3.org/resource/contributors-invited-for-two-studies-on-concentration-of-bimodal-silica-nanoparticle-and-bipyramidal-titania.html SP - 1 EP - 2 PB - Institute of Materials, Minerals and Mining (IOM3) CY - London, UK AN - OPUS4-54410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - EDS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - EDS spectra of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided. KW - EDS KW - Titania nanoparticles KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.4986420 PB - Zenodo CY - Geneva AN - OPUS4-52833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bennet, Francesca A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - SEM raw data for the particles size distribution of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - SEM raw images of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided together with the particle size distribution of the minimum Feret Diameter extracted from the given images. KW - SEM KW - Titania nanoparticles KW - Particle size distribution KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.5007367 PB - Zenodo CY - Geneva AN - OPUS4-52836 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Röntgenspektroskopie am Rasterelektronenmikroskop in der AG "Schicht- und Oberflächenanalytik" 2002 - 2008 T2 - Kolloquium "Energiedispersive Elektronenstrahl- und Röntgenfluoeszenz-Mikrobereichsanalyse am REM" CY - Berlin, Germany DA - 2008-05-27 PY - 2008 AN - OPUS4-17603 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and chemical analysis of mesoporous mixed IrOx-TiOy thin films as electrode materials N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - Mesoporous KW - Thin films KW - Iridium oxide KW - Titanium oxide KW - Thin film analysis KW - Porosity KW - SIMS KW - Auger electron spectroscopy PY - 2024 AN - OPUS4-60185 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Chemical Nanoscale Analysis of Mesoporous Mixed IrOx-TiOx Thin Films N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach. Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Thin films KW - Mesoporous KW - IR oxide KW - Ti oxide KW - Porosity PY - 2024 AN - OPUS4-60452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Pellegrino, Francesco A1 - Hodoroaba, Vasile-Dan T1 - STEM-in-SEM versus SE-InLens-type-SEM as a Reliable Analytical Pair-Tool for Measurement of Nanoparticle Size and Shape Distribution N2 - Following points are addressed in this contribution: Advantages of correlative analysis in electron microscopy; Measurement principle of the different electron microscopy modes used; Presentation of the nanomaterials used for this study; Role of sample preparation; and, with particular description, the Sequence kV-variation with InLens SE & transmission SEM detection of the same field-of-view. KW - Nanoparticles KW - Electron microscopy KW - Metrology KW - Particle size distribution PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.308 VL - 30 IS - Supplement_1 SP - 650 EP - 651 PB - Oxford University Press (OUP) AN - OPUS4-61042 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Heilmann, Maria A1 - Pellegrino, Francesco A1 - Durand, Bénédicte A1 - Taché, Olivier A1 - Zurutuza, Amaia A1 - Hodoroaba, Vasile-Dan T1 - Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS N2 - An overview with the basics of size and shape measurement of particles and 2D structures according to established methodologies (and popular imaging processing software packages) with imaging techniques is given. Main descriptors are explained based on case studies with ongoing interlaboratory comparisons under the pre-standardisation platform of VAMAS. KW - VAMAS KW - Interlaboratory comparison KW - Imaging KW - Size distribution KW - Particle concentration KW - 2D materials PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.319 VL - 30 IS - Supplement 1 SP - 669 EP - 670 PB - Oxford University Press (OUP) AN - OPUS4-61183 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report VAMAS/TWA 37 "Quantitative Microstructural Analysis" & Liaison with ISO/TC 202 "Microbeam Analysis" N2 - The progress in activities on Quantitative MicroStructural Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 Microbeam Analysis is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing projects "Development of guidelines for reproducible TEM specimen preparation by FIB processing", "Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)", "Repeatability of high angular resolution electron backscatter diffraction (HR-EBSD) analysis for elastic strain measurements", and "Measurement of grain size and distribution of nanocrystalline nickel by using Transmission Kikuchi Diffraction (TKD) in SEM" are presented in detail. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Interlaboratory comparison KW - Microbeam Analysis KW - FIB KW - SEM KW - TEM KW - Sample preparation PY - 2024 UR - www.vamas.org/twa37/index.html AN - OPUS4-61388 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis and other TWAs since the last Annual Meeting of ISO/TC 202 is reported. The VAMAS/TWA 37 projects initiated in the last year and the new ones in the planing phase are highlighted with technical and organisational details. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - Microbeam Analysis KW - Interlaboratory comparison KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-61513 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges in Correlative imaging of Advanced Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Online meeting DA - 18.11.2024 KW - Imaging KW - Advanced materials KW - Correlative imaging KW - Nanomaterials KW - Electron microscopy KW - ToF-SIMS PY - 2024 UR - https://macrame-project.eu/macrame-meetings-workshops/2nd-joint-online-workshop-harmonisation-standardisation-of-test-methods-for-nano-and-advanced-materials/ AN - OPUS4-61858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fernandez-Poulussen, D. A1 - Hodoroaba, Vasile-Dan T1 - Holistic, reliable and practical Characterization Framework for Graphene Family Materials, a correlated approach including Imaging based techniques N2 - ACCORDs is an Horizon Europe project working in the development of an imaging-based characterization framework (ACCORDs framework) for the holistic correlative assessment of Graphene Family Materials (GFMs) as a representative of 2D nanomaterials (NMs) to assess and predict 2D NMs health and environmental risks. The ACCORDs framework will operationalise safe and sustainable by design (SSbD) strategies proposed in past or ongoing H2020 projects or within OECD by correlating low-, medium-, and high-resolution physico-chemical-biological imaging-based methods with non-imaging methods in a tiered approach. ACCORDs will deliver the ACCORDs framework and user guidance, new imaging-based characterisation methods, reference in vitro tests, new reference 2D NMs for different matrices, a new minimum information reporting guideline for FAIR data sharing and reuse of images as well as an atlas with reference images for diagnostics of compromised safety of GFMs/GFM products. The new guidelines and standard proposals will be submitted to standardisation bodies to allow creation of regulatory ready products. The novelty of ACCORDs is in translating the principles of medical imaging-based diagnostics to 2D material hazard diagnostics. ACCORDs will accelerate industrial sectors in the area of aviation, marine construction, drone production, flexible electronics, photovoltaics, photocatalytics and print inks-based sensors. The value ACCORDs proposes to the graphene industry are practical, easy, imaging-based tools for GFM quality monitoring next to the production line with a possibility to be correlated with advanced highresolution imaging characterization methods in case hazard i.e. deviation from controls (benchmark values) are diagnosed. The ACCORDs framework and tools will contribute to the European Green Deal by addressing the topic: “Graphene: Europe in the lead” and to a new European strategy on standardization, released on 2nd February, 2022 T2 - Joint Regulatory Risk Assessors Summit – Advancing Safety & Sustainability Assessments of Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Graphene-related 2D materials (GR2M) KW - Imaging KW - SSbD KW - ACCORDs PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda AN - OPUS4-63660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, Jeffrey A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA Nanoparticle Populations Projects 15 and 16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Nanoparticles KW - Nanoparticle size and shape distribution KW - Particle number concentration KW - Interlaboratory comparison KW - Standardisation PY - 2024 UR - http://www.vamas.org/twa34/index.html AN - OPUS4-61422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, J. A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 34 Nanoparticle Populations Combined Projects P15 and P16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. - Discussion of sample preparation issues - Publication of the results in 2026 T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Particle size and shape distribution KW - Particle number concentration KW - Standardisation PY - 2025 UR - https://www.vamas.org/twa34/index.html AN - OPUS4-64234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Advanced Materials Germany 2025 N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Advanced Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Advanced materials KW - Standardisation PY - 2025 AN - OPUS4-64232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the Collection Solid Angle of EDS Detectors T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33248 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - A test material and a quick procedure for the performance check of X-ray spectrometers attached to the SEM PY - 2009 DO - https://doi.org/10.1017/S143192760909432X SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1120 EP - 1121 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19793 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Performance check of a wavelength dispersive X-ray spectrometer (WDS) attached to the SEM PY - 2009 DO - https://doi.org/10.1017/S1431927609094112 SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1118 EP - 1119 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Spezielles iMOXS für die Spektroskopie leichter Elemente T2 - iMOXS Anwendertreffen, BAM CY - Berlin, Germany DA - 2009-10-01 PY - 2009 AN - OPUS4-20042 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM T2 - Microscopy & Microanalysis CY - Portland, OR, USA DA - 2010-08-01 PY - 2010 AN - OPUS4-20909 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A joint NIST/BAM Pilot Study for EPMA (WD & ED) - A Proposal T2 - "Surface Analysis Working Group" (SAWG) Meeting, CCQM CY - Paris, France DA - 2010-04-14 PY - 2010 AN - OPUS4-21170 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance check of EDS X-ray spectrometers; extension to high count rates T2 - EMAS 2011, 12th european workshop on modern developments and applications in microbeam analysis CY - Angers, France DA - 2011-05-15 PY - 2011 AN - OPUS4-23550 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Elemental Analysis with ED-EPMA, WE-EPMA and µ-XRF at a SEM T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23778 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of the performance of energy dispersive X-ray spectrometers - ISO 15632 and more T2 - IUMAS, 5th International Union of Microbeam Analysis Society CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23776 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - CCQM-P130: A Joint NIST/BAM Pilot Study for ED- and WD-EPMA T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2011-04-12 PY - 2011 AN - OPUS4-23567 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der ED-Röntgenspektrometer-Eigenschaften mit dem BAM-Testmaterial EDS-TM001 T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of EDS X-Ray Spectrometers - Extension to high Count Rates T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Nachweisgrenzen der µ-RFA mit REM/EDS für RoHS-Elemente T2 - µ-RFA-Workshop, BAM CY - Berlin, Germany DA - 2011-09-22 PY - 2011 AN - OPUS4-24462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension N2 - The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration • electron microscopy (SEM, TEM) and atomic force microscopy (AFM) • two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - SiO2 KW - Electron microscopy KW - AFM PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study T2 - Microscopy and Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Reference materials for the performance check and specification of energy dispersive X-ray spectrometers (EDS) in electron probe microanalysis (EPMA) T2 - European Conference on X-Ray Spectrometry CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26119 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Reference Materials for the Performance Check and Specification of Energy Dispersive X-Ray Spectrometers in Electron Probe Microanalysis T2 - European Conference on X-Ray Spectrometry EXRS 2012 CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26143 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26307 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Modeling of X-Ray Scattering for an improved XRF-Analysis T2 - European Conference on X-Ray Spectrometry CY - Vienna, Austria DA - 2012-06-18 PY - 2012 AN - OPUS4-26121 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan T1 - Instrumental performance parameters for specification and check of energy dispersive X-ray spectrometers as in the international standard ISO 15632 N2 - Simple procedures for specifying and checking the performance of energy dispersive X-ray spectrometers (EDS) have been since 2002 available in form of the international standard ISO 15632:2002 [1]. When specifying their spectrometers all major EDS manufacturers refer meanwhile to this standard. Main spectrometer parameters such as energy resolution can be determined as recommended in there. Just several years ago the Si-Li detector has been the mostly widespread type of detector. Since four-five years, silicon drift detector (SDD) EDS providing comparable (in many cases even better) energy resolutions at much higher count rates than the conventional Si-Li’s have got the breakthrough on the market. KW - ED-EPMA KW - WD-EPMA KW - (mu-)XRF KW - EDX PY - 2011 DO - https://doi.org/10.1017/S1431927611003941 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - Suppl. 2 SP - 614 EP - 615 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26750 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - WD- & ED-Electron Probe Microanalysis on Au-Cu alloys - Report on progress with CCQM-P130 and how to design a Key Comparison based thereon T2 - CCQM/SAWG (Surface and Micro/Nano Analysis Working Group) Meeting 2013 CY - Sèvres, France DA - 2013-04-16 PY - 2013 AN - OPUS4-28148 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery by Means of SEM/EDX - Hints about the Manufacturing Process T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28509 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Procop, M. A1 - Hodoroaba, Vasile-Dan T1 - Characterization of polycapillary X-ray semilenses with SEM/EDX KW - Polycapillary X-ray optics KW - Semi-lens KW - Parallelising mode KW - SEM KW - EDS KW - Acceptance area KW - FWHM KW - Transmission KW - Focal distance KW - XRF PY - 2010 DO - https://doi.org/10.1017/S1431927610054280 SN - 1431-9276 SN - 1435-8115 VL - 16 IS - Suppl 2 SP - 932 EP - 933 PB - Cambridge University Press CY - New York, NY AN - OPUS4-27219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Welcoming elemental analysis of nanoparticles by EDX in combination with high-resolution electron microscopy in transmission mode T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Prediction of Detection Limits of Micro X-Ray Fluorescence (µXRF) T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26309 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Silizium-Drift-Detektoren kontra ISO 15632:2002 T2 - Kolloquium 30 Jahre EDS-Analytik in Berlin CY - Berlin, Germany DA - 2012-05-22 PY - 2012 AN - OPUS4-25970 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Akcakayiran, D. A1 - Grigoriev, D. A1 - Shchukin, D.G. T1 - High-resolution SEM with coupled transmission mode and EDX for quick characterization of micro- and nanocapsules for self-healing anti-corrosion coatings N2 - More and more sub-micro and nano-materials shall be "quickly", but accurately characterized with respect to their morphology, shape, size or size distribution, but also to the chemical composition as well by means of an SEM/EDX (Scanning Electron Microscopy / X-Ray Energy Dispersive Spectrometry) system. This undertaking is becoming successful indeed if the transmission mode at low voltages such as those at a SEM, i. e. mostly up to 30 kV, and EDX, respectively is employed. The transmission mode at conventional SEM can e "activated" firstly by re-defining the specimen to be analyzed and preparing it as a thin specimen, which is quasi-transparent to electrons and by finding a way of collecting only the transmitted electrons for analysis. The first issue can be easily realized by using the conventional TEM grids (and the respective sample preparation); the second one becomes feasible either (i) by placing a socalled STEM semiconductor detector directly under the thin specimen or (ii) by using a Special transmission set-up, which enables to the conventional Everhart-Thornley detector to collect only transmitted electrons by blocking the direct collection of secondary electrons and guiding only the transmitted electrons onto it. KW - Microcapsules KW - Nanocapsules KW - Anti-corrosion KW - SEM KW - TSEM KW - Transmission KW - EDX PY - 2013 DO - https://doi.org/10.1017/S1431927613003863 SN - 1431-9276 SN - 1435-8115 VL - 19 IS - Suppl. 2 SP - 374 EP - 375 PB - Cambridge University Press CY - New York, NY AN - OPUS4-29444 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurements techniques: validation with an interlaboratory comparison T2 - Conference on Aerosol Technology 2014 CY - Karlsruhe, Germany DA - 2014-06-16 PY - 2014 AN - OPUS4-30110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quick Characterization of Micro- and Nanocapsules for self-Healing Anti-Corrosion Coatings by High-Resolution SEM with Coupled Transmission Mode and EDX T2 - ECASIA´13 (The 15th European Conference on Applications of Surface and Interface Analysis) CY - Cagliari, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-29558 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Check and Specification of the Performance of EDS Systems attached to the SEM by Means of a New Test Material EDS-TM002 and an Updated Evaluation Software Package EDS Spectrometer Test (Version 3.4) T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28952 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - High-Resolution SEM with Coupled Transmission Mode and EDX for Quick Characterization of Micro- and Nanocapsules for Self-Healing Anti-Corrosion Coatings T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28951 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Test materials for the performance check and specification of energy dispersive X-ray spectrometers (EDS) for use in electron probe microanalysis (EPMA) T2 - ECASIA´13 (The 15th European Conference on Applications of Surface and Interface Analysis) CY - Cagliari, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-29559 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of atomic fractions in Cu(In, Ga)Se2 films by Auger Electron Spectroscopy (AES) und Energy Dispersive Electron Probe Microanalysis (ED-EPMA) T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31467 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - WD- & ED- Electron Probe Microanalysis on Au-Cu alloys. Report on progress with CCQM-P130 and How to design a Key Comparison based thereon. T2 - CCQM/SAWG annual meeting CY - Paris, France DA - 2014-04-08 PY - 2014 AN - OPUS4-30585 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Characterization of EDS Systems with respect to the Geometrical Collection Efficiency T2 - 18th International Microscopy Congress IMC 2014 CY - Prague, Czech Republic DA - 2014-09-07 PY - 2014 AN - OPUS4-31914 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Eds elemental selectivity with respect to nanoparticle analysis T2 - EMAS 2015 CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and compositional high-resolution imaging of individual nanoparticles by analytical methods using excitation with a scanning electron beam T2 - IUVSTA Workshop: Nanoparticle concentration, chemistry and interfaces CY - Peckforton Castle, Cheshire, UK DA - 2015-04-20 PY - 2015 AN - OPUS4-34185 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Size and shape distribution of bipyramidal TiO2 nanoparticles by TEM - An inter-laboratory comparison N2 - Extraction of true, 3D shape (and size) of non-spherical nanoparticles (NPs) is associated with errors by conventional 2D electron microscopy using projection images. Significant efforts within the ISO technical committee TC 229 ‘Nanotechnologies’ are aimed at establishing accurate TEM and SEM measurement of NP size and shape as robust, standard procedures. Study groups have been organizing inter-laboratory comparisons on well-selected NP systems according to the market needs, such as aggregated titania nano-powder for which size and shape distribution of primary crystallites of irregular shape must be measured accurately. To be noticed is e. g. the fact that the measurement procedure allows only manual selection of the particles clearly distinguishable for analysis as well as manual definition of the contour of the imaged NPs. An inter-laboratory exercise on titania NPs (pure anatase, grown by hydrothermal synthesis) of well-defined non-spherical shape, i.e. bipyramidal has been recently started within ISO/TC 229 under similar conditions as for the irregular shaped titania. Overlapped particles were allowed to be considered, as long as they are clearly distinguishable. One decisive NP selection criterion was to analyze only those NPs with a roundness value below 0.7, i.e. the NPs laying on the support foil and, hence, with projection areas clearly deviating from perfect circles (R=1). The overall evaluation (for 15 labs) of the size descriptors (area, Feret, minFeret, perimeter) and shape descriptors (aspect ratio, roundness, compactness, extent) by analysis of variance is just to be finished and included in ISO/WD 21363 Nanotechnologies -- Protocol for particle size distribution by transmission electron microscopy. T2 - Microscopy & Microanalysis 2018 CY - Baltimore, MD, USA DA - 05.08.2018 KW - Nanoparticles KW - Electron microscopy KW - ISO KW - Nanotechnology PY - 2018 AN - OPUS4-45750 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - High-Quality Data in Microbeam Analysis – Possible Joint Exercises N2 - Microbeam analysis data are of continuously improving quality, this owing mainly to developments in instrumentation (hardware and software) and computer performance. The knowledge and skills of the operators must be also kept correspondingly updated. To be deemed as technically competent, the laboratories must be accredited according to an accreditation scheme, mostly following ISO/IEC 17025. International standards are able to provide requirements, specifications, guidelines or characteristics of methods, instruments or samples with the final goal that these can be used consistently in accredited laboratories. In the field of electron microscopy and microbeam Analysis standardisation and metrology are terms that are encountered rather seldom at major conferences and scientific publications. Several ISO standards already published and used successfully by a large part of the electron microscopy and microbeam analysis community. For example, file formats such as EMSA/MSA for spectral-data exchange or tagged image file format (TIFF) for SEM images; procedures for the specification of X-ray spectrometers, the specification of certified reference materials (CRMs), and for measurement of average grain size by electron backscatter diffraction (EBSD); and guidelines for calibrating image magnification in SEM or TEM. A main task of ISO technical committee TC 202 ‘Microbeam Analysis’ is to identify feasible projects/proposals needed to be developed into new international standards, particularly in respect to recent technology, such the silicon drift detector (SDD). As far as the metrological aspects are regarded, The International Bureau of Weights and Measures (BIPM) through the Consultative Committee for the Amount of Substance (CCQM) is concerned with the metrological aspect in Chemistry and Biology. In particular, the Surface Analysis Working Group (SAWG) assists in identifying and establishing inter-laboratory work to test the consistency as well as to improve the traceability of spatially resolved chemical surface analysis at the micro and nanoscale. Examples of recent projects on quantitative microbeam analysis at low energies, such as the quantification of light elements such as carbon and nitrogen will be presented. The significant sources of measurement uncertainty will be emphasized. These are: quality of the unknown and the reference materials used, the quantification model, instrumental parameters like take-off-angle, spectrometer efficiency, and particularly the beam current. The crucial importance of working with uniform and well-defined measurement and data evaluation protocols will be discussed in compliance with the ISO document “Guide to the expression of uncertainty in measurement (GUM)”. Another international platform where pre-standardisation work can be organised is VAMAS (Versailles Project on Advanced Materials and Standards). International collaborative Projects aim at providing the technical basis for harmonised measurements, testing, specifications, and standards to be further developed at ISO level. One key point of VAMAS activities is constituted by inter-laboratory comparisons for high-quality data. In the field of microbeam analysis, the technical working area (TWA) 37 Quantitative Microstructural Analysis deals with corresponding projects. Good ideas, e.g., on analysis at low energies, are particularly encouraged by directly contacting the author. Support and guidance will be supplied. T2 - EMAS 2019 - 16th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Trondheim, Norway DA - 19.05.2019 KW - Data KW - Inter-laboratory comparison KW - Electron probe microanalysis (EPMA) KW - EBSD KW - VAMAS KW - Electron microscopy PY - 2019 AN - OPUS4-48108 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. T1 - Measurement of Elemental Composition of FeNi and SiGe Alloy Thin Films by EMPA and µ-XRF N2 - It was demonstrated in the past that the electron probe microanalysis (EPMA) can be applied to determine accurately both elemental composition and thickness of thin films by using the dedicated software package for thin film analysis Stratagem. A relatively small number of film materials such as pure metallic films of platinum and nickel, binary alloys of Fe-Ni, and Pt-Ni-Co ternary alloy films has been reported in literature as working successfully. Further, the software can be applied ‘inversely’, i.e., by feeding it with the thickness of the film and using the determined mass coating, one can easily calculate the film density, which for porous layers leads us to the true film porosity. The present study repeats measurements on an already tested system of Fe-Ni thin films on silicon and reports for the first-time results of analysis on Si-Ge thin films deposited on a non-conductive aluminium oxide substrate. Standard-based and standardless EPMA (with EDS) results were used in combination with Stratagem for the quantification. Further, X-ray fluorescence analysis (XRF) can be used for the determination of elemental composition and thickness of such films as well. In this case, XRF with a μ-focus X-ray source (μ-XRF) attached to a SEM was applied. For quantification, a fundamental parameter (FP) approach has been used to calculate standard-based and standardless results. Compared to EPMA, XRF has a larger information depth and a higher elemental sensitivity because of a generally lower background. Both thin film systems have been chosen as samples of an international round robin test (RRT) organised in the frame of standardisation technical committee ISO/TC 201 ‘Surface chemical analysis’, under the lead of KRISS. The main objective of the RRT is to compare the results of atomic fractions of Fe1-xNix and Si1-xGex alloy films obtained by different surface Analysis techniques, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) applied in the depth-profiling operation mode. Five samples of different atomic fractions of each thin film system, i.e., Fe1-xNix and Si1-xGex, have been grown by ion beam sputter deposition on silicon and Al2O3 wafers, respectively. Reference FeNi and SiGe films with well-known elemental composition and thickness have been also supplied for standard-based analysis. The atomic fractions of all the samples including the references have been certified by RBS (Rutherford backscattering spectrometry) and ICP-AES (inductively coupled plasma atomic emission spectroscopy). T2 - EMAS 2019 - 16th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Trondheim, Norway DA - 19.05.2019 KW - Thin film analysis KW - SEM/EDS KW - EPMA KW - Fe-Ni KW - Si-Ge PY - 2019 AN - OPUS4-48104 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Analysis of elemental composition and porosity of mesoporous IrOx-TiOx thin films by SEM/EDS N2 - Porous materials play an important role in several fields of technology, especially for energy applications like photovoltaics, electrolysis or batteries. The activity of porous films is affected by properties like porosity, film thickness, chemical composition of the material, as well as the crystallinity of the framework. The complex morphology of such porous films constitutes a challenge even for modern analytical techniques and requires new approaches employing the combination/complementation of data of different analytical methods. In this contribution, we characterise thin mesoporous iridium-titanium mixed oxide film properties by electron probe microanalysis (EPMA) with energy-dispersive X-ray spectroscopy (EDS) at an SEM. Mesoporous iridium oxide - titanium oxide (IrOx-TiOx) films were prepared via dip-coating of a solution containing a triblock-copolymer as structure-directing agent, an iridium precursor as well as a titanium precursor in ethanol. IrOx-TiOx films were synthesized with different amounts of iridium and calcined in air. The SEM micrographs reveal for all films the achievement of a well-ordered mesoporous structure and homogeneous films with thicknesses between 67 nm and 152 nm. For the determination of film elemental composition and porosity, EPMA can be used as part of a combined SEM/EDS/STRATAGem analysis. Elemental compositions and mass depositions (in μg cm-2) of IrOx-TiOx films were calculated with the thin film analysis Software STRATAGem via k-values measured with SEM/EDS. Pure bulk Ir, TiO2 and Si were measured as references. The average density of the films was obtained from the mass Deposition and the film thickness as measured by cross-section SEM. The porosity was then extracted from the measured average film density divided by a theoretical bulk density. The latter is calculated from the weight fractions of IrOx and TiOx as determined with STRATAGem and the bulk mass densities of IrO2 and TiO2 (rutil) from literature. The fitting results of the k-values from the STRATAGem software, which are in fair agreement with the measured k-values. The application of the SEM/EDS/STRATAGem approach for accurate porosity determination on pure mesoporous TiOx films and pure porous IrOx films has been recently demonstrated. The porosities of pure IrOx, TiOx and mixed IrOx-TiOx films in this study have been determined. The contribution will assess in detail the advantages and limitations of the combined SEM/EDS/STRATAGem analysis for the morphology and porosity of thin metal oxide films. Moreover, the comparison with other measurement techniques and the combination of datasets from multiple measurements will be discussed. T2 - EMAS 2019 - 16th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Trondheim, Norway DA - 19.05.2019 KW - Thin films KW - Porous layers KW - Electron probe microanalysis (EPMA) KW - Porosity PY - 2019 AN - OPUS4-48107 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Check of the energy-dispersive X-ray spectrometers (EDS) performance with the BAM test material EDS-TM001/2 and BAM software EDS spectrometer test N2 - The test material EDS-TM001 together with an accompanying software package, “EDX spectrometer check”, have been made available in 2009 by BAM to be employed by EDS (energy dispersive spectrometer) users to check the performance of an EDS attached to the SEM. Particularly for test laboratories operating under accreditation schemes like ISO/IEC 17025, a periodical control of the critical instrumental parameters in end-user laboratories is required. With EDS-TM001 or EDS-TM002 (second generation) test material, this periodical check is reduced to the acquisition of only one 10 kV spectrum. The software “EDX spectrometer check” is destined to evaluate automatically this spectrum and determine the performance of the EDS in terms of energy resolution and calibration as well as possible alteration of low-energy efficiency due to detector contamination. Energy resolution can be compared with the specified values according to the international ISO standard ISO 15632:2012. EDS-TM is a synthetic material consisting of a thick layer of C, Al, Mn, Cu and Zr in a well-defined composition, deposited on a steel (in case of EDS-TM001) or silicon (in case of EDS-TM002) substrate. Meanwhile, more than one hundred laboratories (most of them located in Germany) use the EDS-TM001 or EDS-TM002 test material for the periodical check of their EDS. A detailed description of the test material and software together with examples of application was published recently. New results and gained experiences will be presented as well. T2 - BERM-15: International Symposium on Biological and Environmental Reference Materials CY - Berlin, Germany DA - 24.09.2018 KW - EDS KW - SEM/EDX KW - Test material KW - EDS-TM001 KW - EDS-TM002 KW - EDS Spectrometer Test KW - X-rays PY - 2018 AN - OPUS4-46253 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem N2 - For the determination of porosity of Ir oxide thin films, electron probe microanalysis (EPMA) can be used as part of a combined SEM/EDS/STRATAGem analysis. The mass deposition (in μg cm-2) of films was calculated with the analysis software STRATAGem via k-values measured with EDS. The average density of coated films was obtained from the mass deposition and the film thickness as measured by the cross-section SEM. The porosity was calculated by dividing the average film density by the bulk (theoretical) density of the film material. Film porosities were counterchecked by spectroscopic ellipsometry (SE) using the Bruggeman effective medium approximation (BEMA). The results obtained by both analytical approaches/methods used, SEM/EDS/STRATAGem and SE were in good agreement. T2 - Microscopy & Microanalysis 2018 CY - Baltimore, MD, USA DA - 05.08.2018 KW - Electron probe microanalysis (EPMA) KW - Iridium oxide KW - Porous thin films KW - Spectroscopic ellipsometry PY - 2018 AN - OPUS4-46509 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ionic liquids as reference material: A "hot" candidate to check your EDS below 1 keV T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA´15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34702 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Charakterisierung von Nanopartikeln mit hoch-sensitiven EDX-Detektoren am REM T2 - Bruker Seminartage zur Mikroanalyse 2015 CY - Berlin DA - 2015-10-14 PY - 2015 AN - OPUS4-34680 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Inter-laboratory comparison on shape of bipyramidal TiO2 nanoparticles by TEM N2 - The TiO2 material selected for the present inter-laboratory comparison (ILC) was the bipyramidal anatase UT001 batch synthesized hydrothermally by University of Turin in the frame of the EU/FP7 Project SETNanoMetro and carefully prepared on TEM grids by BAM to be distributed to the ILC participants. A clear measurement protocol including data analysis and reporting (including an xls reporting template) has been also prepared by BAM. 14 of 18 participants have measured and reported results which have been already checked by BAM as being conform to the agreed protocol. After receiving the last results (of 4 participants) the ILC data evaluation will be carried out by BAM in line with agreed ISO/TC229 procedures as for the other case sudies. T2 - Annual Meeting of ISO/TC 229 Nanotechnologies CY - Singapore, Republic of Singapore DA - 07.11.2016 KW - TiO2 KW - Nanoparticles KW - Inter-laboratory comparison KW - Shape KW - TEM KW - Particle size distribution PY - 2016 AN - OPUS4-38868 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement and calculation of multimodal material VSSA N2 - In order to ground the debate on the metrics that apply for VSSA determined by adsorption isotherms and to illustrate the consequences of real bimodality for VSSA screening, a bimodal mixture has been selected for systematic investigations. A sample of BaSO4 fine was spiked with 10% g/g of BaSO4 ultrafine. The ultrafine grade is a clear nanomaterial (NM) according to the size criterion with a median Feretmin of 27 nm and the fine grade is clearly a non-NM with a median Feretmin of 249 nm. Because of the number ratio of 300:1, the mixture has to be a NM according to the size criterion. Three independent BET measurements were performed on the mixture by two different labs and resulted in a mean VSSA of 23 m2/cm3 with a standard deviation of 3.3 m2/cm3, which leads to a dminVSSA of 258 nm, and, therefore, would falsely classify the material as a non-NM. This effect was predicted earlier by calculated examples (Roebben et al. 2014) and demonstrates that mixtures of nano- and non-nano multimodal materials very likely lead to false negative classifications. Moreover, the measured VSSA values for the mixture of 23 m²/cm³ are in excellent accord with the value of 24.6 m²/cm³ predicted from the TEM size distributions of the individual materials according to the model described by JRC (Roebben et al. 2014), but are significantly different from the prediction of 309 m²/cm³ obtained from the same TEM size distribution by a particle number weighted approach (Lecloux 2015). The same is true for a 50% g/g mixture. We conclude that the mass-based VSSA approach (Roebben et al. 2014) is equal to the VSSA that is measurable by adsorption isotherms, such as from standardized BET. T2 - NANoREG Technical Meeting on VSSA discussion CY - Schiphol, The Netherlands DA - 26.09.2016 KW - VSSA KW - Nanomaterial KW - Electron microscopy KW - Particle size distribution PY - 2016 AN - OPUS4-38914 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Inter-laboratory Comparison on Shape of Bipramidal TiO2 Nanoparticles by Transmission Electron Microscopy - First Results N2 - First results of an inter-laboratory comparsion launched in the frame of ISO/TC 229 'Nanotechnologies' / JWG 2 'Measurement and Characterization' are presented and the further data treatment discussed. Feret min, Feret and Aspect Ratio of bipyramidal TiO2 nanoparticles as determined according to the measurememnt protocol distributed by BAM are compared for all 17 participants for the first time. The inclusion of the case study into the ongoing ISO/TC 229/JWG 2 project on Measurement of size and shape distribution of nanoparticles by TEM is discussed. T2 - Meeting of ISO/TC 229 'Nanotechnologies' CY - Tokyo, Japan DA - 29.05.2017 KW - Inter-laboratory comparison KW - Particle size and shape distribution KW - Bipyramidal TiO2 nanoparticles KW - ISO/TC 229 KW - TEM PY - 2017 AN - OPUS4-40476 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Available particle-sizing techniques at work for the classification as a nanomaterial - How reliable it really is? N2 - The capability of currently available particle sizing techniques for reliable classification of materials that potentially fall under the EU Definition of a nanomaterial is discussed. A systematic quantitative evaluation of the sizing techniques is presented together with representative case studies of analysis of industrially relevant materials. Recommendations on the most appropriate and efficient use of techniques for different types of material are given. T2 - Frontiers of Nanomaterial Characterization CY - Tokyo, Japan DA - 28.05.2017 KW - Nanomaterial classification KW - Nanoparticles KW - Number-weighted median size KW - Particle size analysis KW - Characterization techniques PY - 2017 AN - OPUS4-40474 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of particle sizing techniques for implementation of the EC Definition of a nanomaterial N2 - Many techniques are available for measuring particle size distribution. For ideal materials (spherical particles, well dispersed) it is possible to evaluate the Performance of these methods. The performance of the analytical instrumentation for the purpose of classifying materials according to EC Definition is unknown. In this work the performance of commercially available particle sizing techniques on representative NanoDefine set of real-world testing materials (RTM) and quality control materials (QCM) for the implementation of the Definition is evaluated. T2 - Final NanoDefine Outreach Event Classification of nanomaterials according to the EU definition CY - Brüssel, Belgium DA - 19.09.2017 KW - Nanomaterial classification KW - Particle sizing techniques KW - Nanoparticles KW - EC definition of a nanomaterial PY - 2017 UR - http://www.nanodefine.eu/index.php/nanodefine-meetings/125-final-outreach-event-2017 AN - OPUS4-42507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Volume specific surface area (VSSA) by BET: concept and demonstration on industrial materials N2 - Volume specific surface area (VSSA) as measured by BET constituites a simple and reliable solution to (most) powders. Porous, coated, polydisperse/multimodal materials are to be treated with care, i.e. doubled by analysis with electron microscopy or more advanced BET analysis (e.g. t-plot)for each material in part. T2 - Final NanoDefine Outreach Event: Classification of nanomaterials according to the EU definition CY - Brüssel, Belgium DA - 19.09.2017 KW - VSSA KW - BET KW - Nanoparticles KW - Powder KW - Nanomaterial classfication PY - 2017 UR - http://www.nanodefine.eu/index.php/nanodefine-meetings/125-final-outreach-event-2017 AN - OPUS4-42509 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of nanoparticle size and shape distribution – Current situation and outlook N2 - The EC Recommendation on the definition of nanomaterial, based solely on size of the constituent particles, foresees development of harmonised measurement methods ensuring ‘consistent results across materials and over time’. The EU/FP7 research project NanoDefine has been exclusively dedicated to support the implementation of this EC Recommendation for the European Union’s legislation. For the first time, measurement techniques able to determine the size of nanoparticles have been evaluated systematically on a well-defined set of quality control materials (spherical, monodisperse) as well as industrial materials of complex shapes and considerable polydispersity. Particularly based on the analytical performance of the measurement techniques as tested on the challenging real-world particulate materials, it was possible to formulate recommendations for use of a new tiered approach consisting of screening and confirmatory techniques. Thus, a consistent framework of guidance for nanomaterial identification according to the EC Definition has been issued in form of the NanoDefiner e-tool, with a transparent decision flow scheme and an extensive user manual. Selected examples of analysis and classification as nano-/non-nanomaterials will be given, highlighting the limits of applicability of the available measurement techniques in dependence on sample properties. On some recent relevant developments in sample preparation – as a crucial part for an accurate analysis - will be also reported. Further, ISO/TC 229 ‘Nanotechnologies’ activities aiming at establishing accurate TEM and SEM measurement of NP size and shape as robust, traceable, standard procedures are highlighted. With participation of BAM, study groups have been organizing inter-laboratory comparisons on well-selected NP systems according to the market needs, such as aggregated or shape-controlled titania nano-powder for which size and shape distribution of primary particles must be measured accurately. T2 - Symposium Preparation, Characterization and Processing of Nano and Submicron Powders CY - Berlin, Germany DA - 14.06.2018 KW - Nanoparticles KW - Nanomaterial KW - EC definition KW - Nanoparticle size distribution PY - 2018 AN - OPUS4-45191 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Shape controlled TiO2 nanoparticles as candidates for nano-CRM’s – an ISO case study N2 - Extraction of true, 3D shape (and size) of non-spherical nanoparticles (NPs) is associated with errors by conventional 2D electron microscopy using projection images. Significant efforts within the ISO technical committee TC 229 ‘Nanotechnologies’ are aimed at establishing accurate TEM and SEM measurement of NP size and shape as robust, standard procedures. Study groups have been organizing inter-laboratory comparisons on well-selected NP systems according to the market needs, such as aggregated titania nano-powder for which size and shape distribution of primary crystallites of irregular shape must be measured accurately. To be noticed is e. g. the fact that the measurement procedure allows only manual selection of the particles clearly distinguishable for analysis as well as manual definition of the contour of the imaged NPs. An inter-laboratory exercise on titania NPs (pure anatase, grown by hydrothermal synthesis) of well-defined non-spherical shape, i.e. bipyramidal has been recently started within ISO/TC 229 under similar conditions as for the irregular shaped titania. Overlapped particles were allowed to be considered, as long as they are clearly distinguishable. One decisive NP selection criterion was to analyze only those NPs with a roundness value below 0.7, i.e. the NPs laying on the support foil and, hence, with projection areas clearly deviating from perfect circles (R=1). The overall evaluation (for 15 labs) of the size descriptors (area, Feret, minFeret, perimeter) and shape descriptors (aspect ratio, roundness, compactness, extent) by analysis of variance is just to be finished and included in ISO/WD 21363 Nanotechnologies -- Protocol for particle size distribution by transmission electron microscopy. T2 - NanoWorkshop 2018 (Workshop on reference nanomaterials, current situation and needs: development, measurement, standardization) CY - Berlin, Germany DA - 14.05.2018 KW - Titanium oxide KW - Nanoparticles KW - Shape-controlled KW - Electron microscopy KW - Reference material PY - 2018 AN - OPUS4-44996 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Aktivitäten der BAM im EU-Projekt NanoDefine N2 - Die Präsentation gibt einen Überblick über die Aktivitäten der BAM im EU-Projekt 'NanoDefine'. Verknüpfungen zur Entwicklung von nano-Referenzmaterialien, ISO- und VAMAS-Aktivitäten und anderen nano-Projekten werden vorausschauend diskutiert. T2 - Expertenaustausch zum Thema ‘Nanosicherheit’ zwischen BMU, BMWi und BAM CY - Berlin, Germany DA - 01.06.2018 KW - Nanomaterial KW - ISO KW - NanoDefine KW - EU-Definition KW - Nanopartikel PY - 2018 AN - OPUS4-45078 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Controlled deposition of nanoparticles by electrospray for improved analysis by imaging techniques N2 - Of many experimental techniques for measuring particle sizes and size distributions, electron microscopy (EM) is still considered as the gold standard, especially in the nano range (1–100 nm). Furthermore, high-resolution X-ray spectroscopy (EDX) in conjunction with EM can be applied to individual NPs. Preparation of an EM sample for generic particulate materials is a difficult task. Usually the particles in a suspension are deposited on a support. However, this procedure includes the drying of larger solvent amounts on the substrate itself, and this can affect the spatial distribution of the deposited particles. One possibility to overcome this is the use of an electrospray system, where the suspension of particles is sprayed onto the substrate in charged droplets that are so small that they either dry off on the substrate immediately without affecting the position of particles, or even already during their flight time to the substrate. Additionally, the charging of particles minimizes agglomeration and aggregation, maximizing the collection of the EM grids. The prototype of an electrospray deposition system from RAMEM under its trademark IONER (www.ioner.eu) was tested. Electrospray is theoretically described since a long time, but no dedicated commercial instruments are available for the preparation of TEM grids yet, apart from electrostatic deposition of aerosols.2 Several materials have been sprayed onto TEM grids and the resulting particle distributions were evaluated. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimized. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles (suited to automatic analysis). T2 - RSC-NPL Symposium: Nanoparticle concentration – critical needs and state-of-the-art measurement CY - London, UK DA - 24.04.2018 KW - Electrospray deposition KW - Nanoparticles KW - Electron microscopy PY - 2018 AN - OPUS4-44802 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Volume specific surface area (VSSA) by BET as a reliable metric for (nano)particle size analysis for powders N2 - We discuss the role of the volume specific surface area (VSSA) as determined from the specific surface area measured by the (extended) Brunauer-Emmett-Teller (BET) technique, in the identification process of powdered nano- and non-nanomaterials in line with the EU definition of nanomaterial. Results obtained in the NanoDefine project demonstrate that under appropriate conditions, VSSA can be used as proxy to the number-based particle size distribution. The extent of agreement between nano/non-nano classification by electron microscopy (EM) and classification by VSSA is investigated systematically on a large set of diverse particulate substances, representing most of the cases expected in regulatory practice. Thus, parameters such as particle shape, size polydispersity/multi-modality, and particle (inner or coating) porosity are evaluated. Based on these results, we derive a tiered screening strategy for powders, involving the use of VSSA for the purpose of implementing the definition of nanomaterial, and recommend it for inclusion in a technical guidance for the implementation of the definition. T2 - RSC-NPL Symposium: Nanoparticle concentration – critical needs and state-of-the-art measurement CY - London, UK DA - 24.04.2018 KW - Nanoparticles KW - Nanomaterial KW - Particle size distribution KW - BET KW - VSSA PY - 2018 AN - OPUS4-44801 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Improved traceability chain of nanoparticle size measurements N2 - The overall objective of project Improved traceability chain of nanoparticle size measurements is to improve the traceability chain for nanoparticle size measurements. The main impact will be achieved by manifold contributions to standard documents for CEN/TC 352 “Nanotechnologies”, which directly addresses the research needs of CEN, CENELEC and ETSI mandated by EC to develop standards for methods and reference materials to accurately measure the size and size distribution of nanoparticles. This will take place in collaboration with ISO/TC229 ‘Nanotechnologies’, ISO/TC24/SC4 ‘Particle characterization’ and ISO/TC201 ‘Surface analysis’/ SC9 ‘Scanning probe microscopy’. T2 - EMPIR 2017 Review Conference CY - Monaco DA - 9.11.2017 KW - Nanoparticles KW - Traceability KW - Electron micrsocopy KW - Size KW - Shape PY - 2017 AN - OPUS4-43019 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - External Liaison Report ISO/TC 202 'Microbeam Analysis' to ISO/TC 229 'Nanotechnologies' N2 - The liaison report from the ISO Technical Committee ISO/TC 202 'Microbeam Analysis' for the November 2022 ISO/TC 229 Nanotechnologies Plenary Meeting Nanotechnologies Liaison Coordination Group (NLCG) is provided. Essential Information such as newly published standards and projects in develeopment relevant for ISO/TC 229 resulted from the progress within the last year and additional comments on behalf of ISO/TC 202 are included in the report. KW - ISO/TC 202 KW - ISO/TC 229 KW - VAMAS KW - Nanotechnologies KW - Microbeam Analysis KW - Standardisation PY - 2022 SP - 1 EP - 4 CY - ISO, Geneva, CH AN - OPUS4-56734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -