TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Determination of the k-Values of Cu-Au Alloys with ED- and WD-EPMA - Results of an inter-laboratory comparison T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31470 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, M. T1 - A method to test the performance of an energy-dispersive X-ray spectrometer (EDS) N2 - A test material for routine performance evaluation of energy-dispersive X-ray spectrometers (EDS) is presented. It consists of a synthetic, thick coating of C, Al, Mn, Cu, and Zr, in an elemental composition that provides interference-free characteristic X-ray lines of similar intensities at 10 kV scanning electron microscope voltage. The EDS energy resolution at the C-K, Mn-Lα, Cu-Lα, Al-K, Zr-Lα, and Mn-Kα lines, the calibration state of the energy scale, and the Mn-Lα/Mn-Kα intensity ratio as a measure for the low-energy detection efficiency are calculated by a dedicated software package from the 10 kV spectrum. Measurements at various input count rates and processor shaping times enable an estimation of the operation conditions for which the X-ray spectrum is not yet corrupted by pile-up events. Representative examples of EDS systems characterized with the test material and the related software are presented and discussed. KW - Energy-dispersive X-ray spectrometer (EDS) KW - Energy-dispersive X-ray spectroscopy (EDX, XEDS) KW - Scanning electron microscope (SEM) KW - Energy resolution KW - Test material KW - Performance check KW - ISO 15632 PY - 2014 DO - https://doi.org/10.1017/S1431927614001652 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - 05 SP - 1556 EP - 1564 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31565 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Organic Surface Modification and Analysis of Titania Nanoparticles for Self-Assembly in Multiple Layers N2 - The characteristics of TiO2 coatings can greatly influence their final performance in large-scale applications. In the present study self-assembly of TiO2 nanoparticles (NPs) in multiple layers was selected as a deposition procedure on various substrates. For this, the main prerequisite constitutes the surface modification of both NPs and substrate with e.g. silane coupling agents. A set of functionalized TiO2 NPs has been produced by reaction with either (3- aminopropyl)triethoxysilane (APTES) or (3-aminopropyl)phosphonic acid (APPA) to functionalize the NP surface with free amino-groups. Then, the complementary functionalized NP set can be obtained from an aliquot of the first one, through the conversion of free surface amino-groups to aldehydes by reaction with glutaraldehyde (GA). Several types of TiO2 NPs differing in size, shape and specific surface area have been functionalized. FTIR, TGA, SEM/EDS, XPS, Auger electron spectroscopy (AES) and ToF-SIMS analyses have been carried out to evaluate the degree of functionalization, all the analytical methods employed demonstrating successful functionalization of TiO2 NP surface with APTES or APPA and GA. T2 - European Conference on Applications of Surface and Interface Analysis ECASIA 2019 CY - Dresden, Germany DA - 15.09.2019 KW - TiO2 KW - Layer-by-layer deposition KW - Surface functionalization KW - P25 KW - Surface characterization PY - 2019 AN - OPUS4-49279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison Report ISO/TC 229 for ISO/TC 202 and vice-versa N2 - The liaison between the two ISO technical committees TC 229 Nanotechnologies and TC 202 Microbeam analysis, in both directions, is described in detail with highlight on the projects under developement since 2023 and which involve input/knowledge from ISO/TC 202. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - ISO TC 229 KW - Standardisation KW - Nanotechnologies KW - Microbeam analysis PY - 2024 AN - OPUS4-61511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Griepentrog, Michael T1 - A new material for the performance check of X-ray spectrometers attached to a SEM T2 - Microscopy and Microanalysis 2006 CY - Chicago, IL, USA DA - 2006-07-30 KW - X-ray spectrometer KW - EDS KW - WDS KW - Calibration PY - 2006 DO - https://doi.org/10.1017/S1431927606061307 SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 SP - 870 EP - 871 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12665 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. T1 - Calculation of X-ray spectra for a side window tube T2 - Microscopy and Microanalysis CY - Chicago, IL, United States of America DA - 2006-07-30 KW - X-ray spectroscopy KW - X-ray tube KW - Microanalysis KW - XRF PY - 2006 DO - https://doi.org/10.1017/S143192760606123X SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12667 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Kombination von Elektronenstrahl-Mikroanalyse und Röntgenfluoreszenzanalyse im Rasterelektronenmikroskop T2 - 36. EDO Herbsttagung CY - Wuppertal, Germany DA - 2006-10-04 PY - 2006 AN - OPUS4-13192 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - iMOXS - a microfocus X-ray source for µ-XRF at a SEM T2 - 45th Annual Conference of the Microscopy Society of Southern Africa (MSSA 2006), Technical Forum CY - Port Elizabeth, South Africa DA - 2006-11-28 PY - 2006 AN - OPUS4-14230 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Extension of analytical secondary electron microscopy in materials reserarch by using µX-Ray fluorescence T2 - 2nd International Advanced Materials Forum for Young Scientists & ICYS Workshop CY - Tsukuba, Japan DA - 2007-02-19 PY - 2007 AN - OPUS4-14583 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Berechnung von Rayleigh- und Comptonstreuung für die Evaluierung von Röntgenspektren T2 - Forschungsseminar "Moderne Analytische Methoden der Physik" (TUB) CY - Berlin, Germany DA - 2007-01-16 PY - 2007 AN - OPUS4-14500 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro-X-Ray fluorescence as an extension of the analytical scanning electron microscope T2 - The 56th Annual Denver X-Ray Conference (DXC 2007) CY - Denver, CO, USA DA - 2007-07-30 PY - 2007 AN - OPUS4-15187 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der aktuellen Transmission einer Röntgen-Minilinse durch Vergleich von berechneten und gemessenen Streuspektren T2 - Fachtagung Prozessnahe Röntgenanalytik, PRORA 2007 CY - Berlin, Germany DA - 2007-11-15 PY - 2007 AN - OPUS4-16175 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - In-depth analysis of the chemical compostion of thick coatings T2 - European Congress and Exhibition on Advanced Materials and Processes (EUROMAT 2007) CY - Nuremberg, Germany DA - 2007-09-10 PY - 2007 AN - OPUS4-15878 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Bestimmung der Transmission von Kapillarlinsen durch Streuspektren T2 - TU-Forschungsseminar "Moderne Analytische Methoden der Physik" CY - Berlin, Germany DA - 2008-01-15 PY - 2008 AN - OPUS4-16483 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - X-ray fluorescence as an additional analytical method for a scanning electron microscope N2 - Energy dispersive and wavelength dispersive X-ray spectrometry are used to determine the composition of a specimen in a scanning electron microscope (SEM) by electron probe microanalysis (EPMA). A valuable completion for the SEM is analysis by X-ray fluorescence (XRFA). The main advantage of this method consists in its low detection limit. XRFA with a SEM uses the same spectrometers as for EPMA, necessary are only an additional X-ray source for the excitation of fluorescence spectra and software for their evaluation. Recent developments of smart low-power X-ray tubes and X-ray optical components enabled the construction of compact X-ray sources with focussing properties as add-on for a SEM. For quantitative XRFA the source spectrum has to be known. For its calculation the X-ray production yields Y have been measured for the commonly used tube target materials Mo, Rh and W. The excitation spectra were calculated for a variety of source types and compared with respect to the achievable photon flux and its spectral distribution. KW - X-ray spectroscopy KW - X-ray production yield KW - X-ray tube spectrum KW - X-ray fluorescence analysis KW - XRF KW - X-ray optics KW - Scanning electron microscopy KW - Analytical SEM PY - 2008 DO - https://doi.org/10.1007/s00604-007-0854-4 SN - 0026-3672 SN - 1436-5073 VL - 161 IS - 3-4 SP - 413 EP - 419 PB - Springer CY - Wien AN - OPUS4-17537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Machbarkeitsstudie zu geeigneten Kandidaten für die Herstellung von CRM für die Bestimmung von Wasserstoff in Festkörpern T2 - 14. Deutsches Anwendertreffen "Analytische Glimmentladungs-Spektroskopie" CY - Berlin, Germany DA - 2008-04-17 PY - 2008 AN - OPUS4-17460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Calculation of scattering spectra for the determination of the actual transmission of an X-ray minilens for µXRF T2 - European Conference on X-Ray Spectrometry (EXRS 2008) CY - Cavtat, Croatia DA - 2008-06-16 PY - 2008 AN - OPUS4-16644 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - How to develop Key Comparisons for Electron Probe Microanalysis (incl. EDX/WDX) T2 - Surface Analysis Working Group (SAWG) Meeting, CCQM CY - Sèvres, France DA - 2008-04-01 PY - 2008 AN - OPUS4-17382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Determination of the real transmission jof an x-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra KW - X-ray optics KW - Transmission KW - Micro-focus-XRF KW - SEM PY - 2009 DO - https://doi.org/10.1002/xrs.1151 SN - 0049-8246 VL - 38 IS - 3 SP - 216 EP - 221 PB - Wiley CY - Chichester AN - OPUS4-19352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - A basic physical Model of X-Ray Scattering for improved X-Ray Fluoescence Analysis - Polychromatic X-Ray Tube Excitation T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19534 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -