TY - JOUR A1 - Hinrichs, V. A1 - Kalinka, Gerhard A1 - Hinrichsen, G. T1 - An Avrami-based model for the description of the secondary crystallization of polymers N2 - A mathematical model for the description of the overall crystallization of polymers has been developed which separates the pure geometric spreading of the semicrystalline superstructures from the increasing crystallinity inside these entities. The model uses the Avrami theory for the geometric part and a freely optional function for the increasing local crystallinity. The two functions are combined by a mathematical procedure called convolution. The free option of the local crystallinity function enables this model to permit calculation of this function, which is not accessible to direct measurement. Thus with given Avrami parameters and measured values of the time-dependent overall crystallinity, this function of the local crystallinity (secondary crystallization function) can be calculated. The model has been applied to test data produced by computer simulations. KW - Thermoplaste KW - Kristallisation KW - Nachkristallisation KW - Sphärolithe KW - Kristallisationskinetik KW - Modellrechnung PY - 1996 U6 - https://doi.org/10.1080/00222349608220382 SN - 0022-2348 SN - 1525-609X VL - 35 IS - 3-4 SP - 295 EP - 302 PB - Dekker Chemistry CY - New York, NY AN - OPUS4-11983 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 U6 - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hinrichs, V. A1 - Leistner, A. A1 - Kalinka, Gerhard A1 - Schulz, Eckhard A1 - Hinrichsen, G. T1 - Viscoelastic properties of the interphase in fibre reinforced polymers - measurement and simulation KW - Polymer KW - Glass fibre KW - Interphase KW - Coating KW - Glass transition KW - Dynamic KW - Viscoelastic PY - 1999 VL - 6 IS - 2 SP - 93 EP - 101 PB - North-Holland CY - New York, NY AN - OPUS4-12003 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -