TY - CONF A1 - Beck, Uwe A1 - Wirth, Thomas A1 - Sahre, Mario A1 - Männ, Marion A1 - Gamer, Nadja A1 - Hoffmann, V. A1 - Hentschel, R. A1 - Brauneck, U. A1 - Mollenhauer, R. ED - Berg, S. T1 - Reference coatings for gdoes depth profiling - Preliminary results of a VAMAS project T2 - 7th International Conference on Plasma Surface Engineering (PSE 2000) CY - Garmisch-Partenkirchen, Germany DA - 2000-09-17 PY - 2000 SN - 0257-8972 IS - 142-144 PB - Elsevier CY - Amsterdam AN - OPUS4-970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Tilgner, R. A1 - Alpern, P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. T1 - Package induced deformation of integrated circuits KW - Synchrotron Laue Contrast Radiography SLCR KW - Synchrotron Radiation KW - Electronic Power Device IC PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2006.pdf#page=26 SN - 1611-6127 SP - 24 EP - 25 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-15797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. A1 - Diete, W. A1 - Klein, U. A1 - Frahm, R. T1 - BAMlin - the first hard X-ray beamline at BESSY II N2 - The first hard X-ray beamline at BESSY II will be installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a Double-Multilayer-Monochromator and a Double-Crystal-Monochromator. The two devices can be used separately or in-line. Main applications of monochromatic radiation with photon energies up to 50 keV are X-ray fluorescence analysis, micro-computed tomography, X-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV will be available for radiometric applications. KW - Double-Multilayer-Monochromator with meridional bender KW - Double-Crystal-Monochromator with sagittal bender KW - X-ray fluorescence analysis KW - Micro-computed tomography KW - X-ray topography KW - Detector calibration KW - Reflectometry PY - 2001 DO - https://doi.org/10.1016/S0168-9002(01)00466-1 SN - 0168-9002 SN - 0167-5087 VL - 467-468 IS - 1 SP - 703 EP - 706 PB - North-Holland CY - Amsterdam AN - OPUS4-1171 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Alpern, P. A1 - Tilgner, R. T1 - Sichere Automobil Elektronik durch nanogenaues Synchrotron-Prüfverfahren T2 - DGZfP Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - Synchrotron Laue Contrast Radiography PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 8 PB - DGZfP CY - Berlin AN - OPUS4-15837 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Manke, I. A1 - Kardjilov, N. A1 - Schäfer, R. A1 - Hilger, A. A1 - Grothausmann, R. A1 - Strobl, M. A1 - Dawson, M. A1 - Grünzweig, C. A1 - Tötzke, C. A1 - David, C. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Banhart, J. T1 - Three-dimensional imaging of magnetic domains with neutron grating interferometry N2 - This paper gives a brief overview on3D imaging of magnetic domains with shearing grating neutron tomography. We investigated the three-dimensional distribution of magnetic domain walls in the bulk of a wedge-shaped FeSi single crystal. The width of the magnetic domains wasanalyzed at different locations within the crystal. Magnetic domains close to the tip of the wedge are much smaller than in the bulk. Furthermore, the three-dimensional shape of individual domains wasinvestigated. We discuss prospects and limitations of the applied measurement technique. KW - Neutron imaging KW - Tomography KW - Magnetic domains KW - Grating interferometry KW - Darkfield imaging KW - Shearing gratings KW - Talbot-Lau KW - Three-dimensional data quantification KW - Tomographic reconstruction PY - 2015 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-341919 DO - https://doi.org/10.1016/j.phpro.2015.07.057 SN - 1875-3892 VL - 69 SP - 404 EP - 412 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-34191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Cooper, R.C. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Wheeler, M. A1 - Hentschel, Manfred P. A1 - Staude, Andreas A1 - Pandey, A. A1 - Shyam, A. A1 - Bruno, Giovanni T1 - Stress-induced microcrack density evolution in β-eucryptite ceramics: Experimental observations and possible route to strain hardening N2 - In order to investigate their microcracking behaviour, the microstructures of several β-eucryptite ceramics, obtained from glass precursor and cerammed to yield different grain sizes and microcrack densities, were characterized by laboratory and synchrotron x-ray refraction and tomography. Results were compared with those obtained from scanning electron microscopy (SEM). In SEM images, the characterized materials appeared fully dense but computed tomography showed the presence of pore clusters. Uniaxial tensile testing was performed on specimens while strain maps were recorded and analyzed by Digital Image Correlation (DIC). X-ray refraction techniques were applied on specimens before and after tensile testing to measure the amount of the internal specific surface (i.e., area per unit volume). X-ray refraction revealed that (a) the small grain size (SGS) material contained a large specific surface, originating from the grain boundaries and the interfaces of TiO2 precipitates; (b) the medium (MGS) and large grain size (LGS) materials possessed higher amounts of specific surface compared to SGS material due to microcracks, which decreased after tensile loading; (c) the precursor glass had negligible internal surface. The unexpected decrease in the internal surface of MGS and LGS after tensile testing is explained by the presence of compressive regions in the DIC strain maps and further by theoretical arguments. It is suggested that while some microcracks merge via propagation, more close mechanically, thereby explaining the observed X-ray refraction results. The mechanisms proposed would allow the development of a strain hardening route in ceramics. KW - Beta-eucryptite KW - Microcracked ceramics KW - X-ray refraction KW - Tensile load KW - Strain hardening KW - Synchrotron KW - BAMline KW - Computed Tomography KW - CT PY - 2018 UR - http://www.sciencedirect.com/science/article/pii/S1359645417308881 DO - https://doi.org/10.1016/j.actamat.2017.10.030 SN - 1359-6454 SN - 1873-2453 VL - 144 IS - Supplement C SP - 627 EP - 641 PB - Elsevier B.V. AN - OPUS4-43024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Ekenhorst, Derk A1 - Judd, M.D. A1 - Raynal, R. T1 - X-ray refraction characterizes leight weight materials PY - 1998 SN - 1018-8657 VL - 8 IS - 3 SP - 14 EP - 15 PB - European Space Agency CY - Noordwijk AN - OPUS4-3331 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Müller, Bernd R. T1 - Röntgen-Topographie mit Klein- und Weitwinkel-Streuung N2 - Röntgen-Topographische Verfahren sind dadurch gekennzeichnet, daß die Streueigenschaften eines Probekörpers ortskorreliert erfaßt werden. Somit vereinigen sie die Vorzüge der bildgebenden Eigenschaft der Radiographie mit der Strukturselektivität der Röntgenanalyse. Sowohl die Röntgen-Weitwinkel-Streuung als auch die Röntgen-Kleinwinkel-Streuung (-Beugung und -Refraktion) werden topographisch für die Materialcharakterisierung eingesetzt. Die Topographie-Verfahren und Untersuchungsbeispiele an nichtmetallischen Werkstoffen werden dargestellt. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2002 CY - Weimar, Deutschland DA - 2002-05-06 KW - Röntgen-Streuung KW - Materialcharakterisierung KW - Komposite KW - Keramik PY - 2002 UR - http://www.ndt.net/article/dgzfp02/papers/v15/v15.htm SN - 3-931381-39-0 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 80-CD PB - DGZfP CY - Berlin AN - OPUS4-2027 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg T1 - Das Anwendungspotential der Röntgen-Topographie vom Mikroriss bis zur Gepäckprüfung T2 - DGZfP-Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - CFK KW - Bildgebende Röntgenverfahren KW - Röntgen-Topographie und -Streuung KW - Keramik KW - Explosivstoffe KW - Ermüdungsrisse PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 9 PB - DGZfP CY - Berlin AN - OPUS4-15799 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grothausmann, R. A1 - Zehl, G. A1 - Manke, I. A1 - Fiechter, S. A1 - Bogdanoff, P. A1 - Dorbandt, I. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Schumacher, G. A1 - Banhart, J. T1 - Nanometer-Tomographie: kleinste Katalysatorteilchen erblicken - Mit Elektronen und Computern die mobile Brennstoffzelle erforschen KW - Electron tomography KW - Polymer electrolyte membrane fuel cell (PEMFC) KW - Reconstruction algorithm KW - DIRECTT PY - 2012 DO - https://doi.org/10.1002/maco.201290007 SN - 0947-5117 SN - 1521-4176 VL - 63 IS - 2 SP - 1 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-26348 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Synchrotron radiation refraction topography for charcterization of lightweight materials N2 - The employment of synchrotron radiation for refraction topography of materials has considerable advantages over standard x-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro-structured materials. This effect of x-ray optics is additional to small-angle scattering by diffraction, when the scattering objects reach micrometre dimensions. We have developed x-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high-performance composites, ceramics and other low-density materials. Sub-micron particle dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer-generated interface topographs. For this purpose investigations are now being performed at the new hard x-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 to 60 keV from a double multilayer and/or a double-crystal monochromator. A separate instrument is dedicated to the further development and application of synchrotron radiation refraction (SRR) topography. Different from conventional small-angle scattering cameras with collimating slits and pinholes, scattering angles down to a few seconds of arc are selected by a single-crystal analyser, similar to a Bonse-Hart diffractometer. A 20 µm spatial resolution of the scattering micro-structures is achieved by a CCD camera with a fluorescent converter. First SRR topographs of aircraft composites [carbon fibre-reinforced plastics (CFRP), carbon fibre-reinforced ceramics (C/C), metal matrix ceramics (MMC)] will be reported. KW - BAMline KW - Refraction topography PY - 2004 DO - https://doi.org/10.1002/xrs.736 SN - 0049-8246 VL - 33 IS - 6 SP - 402 EP - 406 PB - Wiley CY - Chichester AN - OPUS4-11930 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios ED - Gerhard Busse, T1 - Synchrotron-Refraction-Computed-Tomography for NDT and characterisation of lightweight composite materials T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Refraction KW - Computed Tomography KW - NDE KW - Ti-MMC PY - 2008 SN - 978-0-415-46476-5 SP - 217 EP - 221 PB - Taylor & Francis CY - London, UK AN - OPUS4-18680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing CY - Montreal, Canada DA - 2004-08-30 KW - NDE KW - X-ray refraction KW - Composites KW - MMC PY - 2004 SP - 9 pages PB - International Committee for Non-Destructive Testing CY - Montreal AN - OPUS4-5486 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -