TY - CONF A1 - Sturm, Heinz T1 - Nanomechanics at the Carbon Fibre/PPS interface: A combined SFM study of Topography, AC Conductivity and Surface Stiffness T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und der Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6458 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - The use of a fibre-based light sensor for the calibration of Scanning Probe Microscopy piezos KW - Tunneling microscopy KW - Height calibration KW - Force-microscopy PY - 1999 SN - 1862-6300 SN - 0031-8965 VL - 173 IS - 1 SP - 225 EP - 234 PB - Wiley-VCH CY - Berlin AN - OPUS4-6857 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulator Lateral Force Microscopy: principles, experiments and unsolved problems T2 - Institutsvortrag Universität Basel DA - 2003-02-20 PY - 2003 AN - OPUS4-2912 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz T1 - Scanning force microscopic investigations of the femtosecond laser pulse irradiation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti : sapphire femtosecond pulses (800 nm, 130 fs, 10 Hz). As a result of the irradiation with a variable number of laser pulses per spot (N /spl les/ 5), several morphological changes (crater formation, rim formation, ripple structures, and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy, allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height < 20 nm, width /spl ap/ 300 nm) bordering the ablated crater. A Fourier analysis of the multipulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth < 100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, material modifications were also observed in the irradiated regions by means of the FMM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. KW - Laser materials-processing applications KW - Laser radiation effects KW - Microscopy KW - Semiconductor materials KW - Ultrafast optics PY - 2004 DO - https://doi.org/10.1109/TNANO.2004.828574 SN - 1536-125X SN - 1941-0085 VL - 3 IS - 3 SP - 358 EP - 367 PB - Institute of Electrical and Electronics Engineers CY - New York, NY AN - OPUS4-4067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Prebarrier modified Richardson-Schottky barrier at the Metal-Polyester Interface T2 - 34th IUPAC International Symposium on Macromol. CY - Prague, Czech Republic DA - 1992-07-05 PY - 1992 AN - OPUS4-6378 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Using a SFM/ESEM hybrid for the analysis of vibrating surfaces T2 - MC 2009 Microscopy Conference CY - Graz, Austria DA - 2009-08-30 PY - 2009 AN - OPUS4-20706 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schröter, Maria-Astrid A1 - Sturm, Heinz A1 - Holschneider, M. T1 - Phase and amplitude patterns in DySEM mappings of vibrating microstructures N2 - We use a dynamic scanning electron microscope (DySEM) to analyze the movement of oscillating micromechanical structures. A dynamic secondary electron (SE) signal is recorded and correlated to the oscillatory excitation of scanning force microscope (SFM) cantilever by means of lock-in amplifiers. We show, how the relative phase of the oscillations modulate the resulting real part and phase pictures of the DySEM mapping. This can be used to obtain information about the underlying oscillatory dynamics. We apply the theory to the case of a cantilever in oscillation, driven at different flexural and torsional resonance modes. This is an extension of a recent work (Schr¨oter et al 2012 Nanotechnology 23 435501), where we reported on a general methodology to distinguish nonlinear features caused by the Imaging process from those caused by cantilever motion. KW - DySEM KW - mechanical nonlinearity KW - vibration KW - DySEM KW - mechanische Nichtlinearitäten KW - Vibration PY - 2013 DO - https://doi.org/doi:10.1088/0957-4484/24/21/215701 VL - 24 IS - 21 SP - 215701-1 EP - 215701-10 PB - IOP PUBLISHING LTD CY - Bristol, UK AN - OPUS4-35396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - An AFM-ESEM Hybride T2 - 2. BAM-IVW-Symposium im DFG-Proekt:Gleitverschleiss polymer Verbundwerkstoffen zwischen Raumtemperatur und 4,2 K CY - Berlin, Germany DA - 2003-02-27 PY - 2003 AN - OPUS4-2913 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Bericht und Neuanträge des Teilprojektes A1/B5 T2 - Sfb605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6513 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-14 PY - 1998 AN - OPUS4-6460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopische Verfahren zur Messung lokaler elektrischer Eigenschaften von Festkörpern T2 - TU Berlin CY - Berlin, Germany DA - 1996-04-19 PY - 1996 AN - OPUS4-6400 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. ED - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 DO - https://doi.org/10.1109/ISE.1996.578094 SP - 334 EP - 339 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Recipes for the Calibration of Piezos with a cheap and easy-to-use Fibre Optical Displacement Sensor T2 - 2nd German Brazilian Workshop on Applied Surface Science CY - Templin, Germany DA - 1998-09-21 PY - 1998 AN - OPUS4-6465 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schröter, Maria-Astrid A1 - Holschneider, M. A1 - Sturm, Heinz T1 - Analytical and numerical analysis of imaging mechanism of dynamic scanning electron microscopy N2 - The direct observation of small oscillating structures with the help of a scanning electron beam is a new approach to study the vibrational dynamics of cantilevers and microelectromechanical systems. In the scanning electron microscope, the conventional signal of secondary electrons (SE, dc part) is separated from the signal response of the SE detector, which is correlated to the respective excitation frequency for vibration by means of a lock-in amplifier. The dynamic response is separated either into images of amplitude and phase shift or into real and imaginary parts. Spatial resolution is limited to the diameter of the electron beam. The sensitivity limit to vibrational motion is estimated to be sub-nanometer for high integration times. Due to complex imaging mechanisms, a theoretical model was developed for the interpretation of the obtained measurements, relating cantilever shapes to interaction processes consisting of incident electron beam, electron–lever interaction, emitted electrons and detector response. Conclusions drawn from this new model are compared with numerical results based on the Euler–Bernoulli equation. KW - Electron microscopy KW - Scanning force microscopy KW - Cantilever motion KW - Modes KW - Harmonics KW - Mathematical model KW - Imaging theory PY - 2012 DO - https://doi.org/10.1088/0957-4484/23/43/435501 SN - 0957-4484 SN - 1361-6528 VL - 23 IS - 43 SP - 1 EP - 10 PB - IOP Publishing Ltd. CY - Bristol AN - OPUS4-27642 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Bilayer polymer/oxide coating for electroluminescent organic semiconductors T2 - E-MRS 2011 Spring Meeting; IUMRS ICAM 20011 & E-MRS / MRS Bilateral Conference on Energy CY - Nice, France DA - 2011-05-09 PY - 2011 AN - OPUS4-23667 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -