TY - JOUR A1 - Hesselbach, J. A1 - Herrmann, C. A1 - Bock, R. A1 - Dettmer, T. A1 - Kley, Gerd A1 - Köcher, Peter A1 - Brenneis, Rudolf A1 - Meyer-Pittroff, R. A1 - Falk, O. A1 - Hansen, A. T1 - Kühlschmierstoffe aus technischen tierischen Fetten und Altspeisefetten - Herstellung, Technologie und Ökobilanzierung KW - Enzymatische Alkoholyse KW - Tierfett KW - Altspeisefett KW - Kühlschmierstoff KW - Umesterung KW - Produktökobilanz KW - LCA PY - 2003 SN - 1435-5272 VL - 9 IS - Sonderheft `Biokatalyse´ SP - 24 EP - 27 PB - BIOCOM CY - Berlin AN - OPUS4-2684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Henrichsen, H. A1 - Sturm, Heinz A1 - Boggild, P. A1 - Hansen, O. T1 - Submicron organic nanofiber devices with different anode-cathode materials: A simple approach N2 - The authors present a simple general method for simultaneously producing tens of submicron electrode gaps with different cathode and anode materials on top of nanofibers, nanowires, and nanotubes, with an optional gap size variation. Using this method, an ensemble of para-hexaphenylene (p6P) nanofiber devices of different length was fabricated with Sm and Au electrodes. The measured I-V characteristics are in agreement with a nonlinear hopping transport model, where domain barriers dominate the transport with an estimated domain size of 23±5 nm. KW - Nanofibers KW - Sub-micron electrode KW - Para-hexaphenylene KW - Samarium KW - Gold KW - I/V-characteristics KW - Nanolasers KW - Domain barriers PY - 2010 DO - https://doi.org/10.1116/1.3431088 SN - 1071-1023 SN - 0734-211X VL - 28 IS - 3 SP - 617 EP - 622 PB - American Institute of Physics CY - New York, NY AN - OPUS4-21573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Kim, C.S. A1 - Ruh, S. W. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Mata-Salazar, J. A1 - Juarez-Garcia, J.M. A1 - Cortazar-Martinez, O. A1 - Herrera-Gomez, A. A1 - Hansen, P.E. A1 - Madesen, J.S. A1 - Senna, C.A. A1 - Archanjo, B.S. A1 - Damasceno, J.C. A1 - Achete, C.A. A1 - Wang, H. A1 - Wang, M. A1 - Windover, D. A1 - Steel, E. A1 - Kurokawa, A. A1 - Fujimoto, T. A1 - Azuma, Y. A1 - Terauchi, S. A1 - Zhang, L. A1 - Jordaan, W.A. A1 - Spencer, S.J. A1 - Shard, A.G. A1 - Koenders, L. A1 - Krumrey, M. A1 - Busch, I. A1 - Jeynes, C. T1 - Thickness measurement of nm HfO2 films N2 - A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in the measurement capability of national metrology institutes for the thickness measurement of HfO2 films. In this pilot study, the thicknesses of six HfO2 films with nominal thickness from 1 nm to 4 nm were measured by X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectometry(XRR), X-ray Fluorescence Analysis (XRF), Transmission Electron Spectroscopy (TEM), Spectroscopic Ellipsometry (SE) and Rutherford Backscattering Spectrometry (RBS). The reference thicknesses were determined by mutual calibration of a zero-offset method (Medium Energy Ion Scattering Spectroscopy (MEIS) of KRISS) and a method traceable to the length unit (the average thicknesses of three XRR data except the thinnest film). These reference thicknesses are traceable to the length unit because they are based on the traceability of XRR. For the thickness measurement by XPS, the effective attenuation length of Hf 4f electrons was determined. In the cases of XRR and TEM, the offset values were determined from a linear fitting between the reference thicknesses and the individual data by XRR and TEM. The amount of substance of HfO2, expressed as thickness of HfO2 films (in both linear and areal density units), was found to be a good subject for a CCQM key comparison. To reach the main text of this paper, click on Final Report. The final report has been peer-reviewed and approved for publication by the CCQM. KW - Thickness measurements KW - nm films KW - X-ray Photoelectron Spectroscopy KW - Mutual calibration PY - 2021 DO - https://doi.org/10.1088/0026-1394/58/1A/08016 SN - 0026-1394 VL - 58 IS - 1a SP - 08016 PB - IOP Publishing Lt. CY - Bristol AN - OPUS4-54175 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -