TY - JOUR A1 - Weise, Hans-Peter A1 - Ecker, Klaus A1 - Kowalewsky, Helmut A1 - Wolk, Thomas T1 - Gas permeation through common elastomer sealing materials N2 - Using a quadrupole mass spectrometer system the permeation of D2, He, Ne, Ar, Kr and Xe through EPDM (ethylene-propylene-diene rubber), Viton (fluoro rubber) and Silicone-rubber was measured as a function of temperature. The results for O-ring samples were compared with those for slab geometry. From the measured permeation functions the diffusion coefficients, the permeation coefficients and the solubilities of the gases in the elastomer materials were evaluated using a nonlinear fitting algorithm. The variations of these data with temperature yield the activation energies for diffusion and permeation as well as the heat of solution. The results confirm that the transmission of noble gases and of deuterium through elastomer materials is merely a physical process because the activation energies are far below common values for processes involving chemical reactions. The solubilities correlate well with the boiling temperatures of the gases and with the well depth of the Lennard-Jones interaction potential between the gas atoms. The diffusion coefficients monotonically decrease and the activation energies monotonically increase with increasing molecular diameter of the gases. KW - gas permeation KW - elastomer KW - sealing material PY - 1990 SN - 0391-3155 VL - 20 IS - 2 SP - 225 EP - 230 PB - Tamburini Ed. CY - Milano AN - OPUS4-50600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weise, Hans-Peter ED - Henning, K. T1 - Strahlenexposition der Bevölkerung in der Umgebung von Beschleunigeranlagen niedriger Energie T2 - 18. Jahrestagung des Fachverbandes für Strahlenschutz CY - Lübeck-Travemünde, Germany DA - 1985-10-06 PY - 1985 N1 - Serientitel: FS-Berichte aus der Schriftenreihe des Fachverbandes für Strahlenschutz – Series title: FS-Berichte aus der Schriftenreihe des Fachverbandes für Strahlenschutz IS - 85-37 SP - 470 EP - 483 PB - Fachverband für Strahlenschutz CY - Würenlingen AN - OPUS4-34252 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weise, Hans-Peter A1 - Jost, Peter ED - Hacke, J. ED - Borchardt, D. ED - Kaul, A. T1 - Bestimmung der Körperdosis bei externer Strahlenexposition durch Photonenstrahlen (Fallstudie) PY - 1985 SN - 3-87344-074-1 SP - 1 EP - 16 PB - Hoffmann CY - Berlin AN - OPUS4-34253 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kettschau, A. A1 - Goebbels, Jürgen A1 - Reimers, Peter A1 - Weise, Hans-Peter ED - Merz, E. T1 - Possibilities of quality assurance on radioactive waste packages by computertomography and other radiometric techniques T2 - International Seminar on Radioactive Waste Products - Suitability for Final Disposal CY - Jülich, Germany DA - 1985-06-10 PY - 1985 N1 - Serientitel: Berichte der Kernforschungsanlage Jülich – Series title: Berichte der Kernforschungsanlage Jülich IS - 54 SP - 483 EP - 491 PB - Zentralbibliothek der Kernforschungsanlage CY - Jülich AN - OPUS4-34222 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weise, Hans-Peter T1 - Berechnung der Strahlenexposition in der Umgebung von Schwerionen-Beschleunigeranlagen T2 - Gemeinsame Strahlenschutztagung über Radiologische Auswirkungen von Kernkraftwerken und anderen Kerntechnischen Anlagen auf den Menschen und seine Umwelt, Jahrestagung der Société Française de Radioprotection, Jahrestagung des Fachverbandes für Strahlenschutz CY - Lausanne, Switzerland DA - 30.09.1981 PY - 1982 SP - 45 EP - 52 CY - Würenlingen AN - OPUS4-36435 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Segebade, C. A1 - Lutz, G. J. A1 - Weise, Hans-Peter A1 - Fusban, H.-U. T1 - Quantitative Evaluation of Interference Reactions in Photon Activation Analysis PY - 1981 SN - 0134-0719 SN - 0022-4081 VL - 67 IS - 1 SP - 205 EP - 214 PB - Elsevier Sequoia CY - Lausanne AN - OPUS4-33361 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weise, Hans-Peter A1 - Jost, Peter T1 - Shielding against scattered radiation at electron accelerator installations N2 - Shielding data for high energy X-rays scattered from common shielding materials at electron accelerators were determined. The required thickness of secondary protective barriers can be calculated if the intensity and the quality of scattered radiation are known. Therefore the differential exposure albedo of various important materials was measured for primary X-rays in the energy ränge from 10 MeV to 35 MeV using an electron linear accelerator. The quality of secondary X-rays was investigated by measuring the spectra of scattered photons with a Nal-detector. From these spectra the attenuation of scattered X-rays in common shielding materials was computed using transmission factors for monoenergetic photons taken from the literature. The calculations were performed for the limiting cases of broad beam and narrow beam geometry. The results are compared with directly measured attenuation curves and with recommendations given in the literature. PY - 1983 IS - 45 SP - 3 EP - 7 AN - OPUS4-40798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weise, Hans-Peter T1 - Strahlenschutz an Beschleunigeranlagen, Strahlenfelder, Abschirmung und Aktivierung N2 - Der folgende Beitrag befaßt sich mit den beim Betrieb von Elektronen- und lonenbeschleunigern auftretenden Strahlenfeldern und deren Abschirmung sowie mit der in Beschleunigerkomponenten und Abschirmungen induzierten Radioaktivität. Der Schwerpunkt liegt auf Beschleunigern mit kleinen und mittleren Energien (typischerweise unter 100 MeV). Beschleuniger für Hochenergiephysik werden nicht behandelt. PY - 1983 VL - 13 IS - 3 SP - 373 EP - 383 PB - Bundesanstalt für Materialforschung und -prüfung (BAM) CY - Berlin AN - OPUS4-40816 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jost, Peter A1 - Weise, Hans-Peter T1 - Messung der Luftaktivierung beim Betrieb von Elektronenbeschleunigern und Vergleich mit theoretischen Rechnungen T2 - Jahrestagung des Fachverbandes für Strahlenschutz in Zusammenarbeit mit der Gesellschaft für Strahlenschutz- und Umweltforschung, Institut für Strahlenschutz CY - Neuherberg ; (München) DA - 19.10.1982 PY - 1983 SP - 239 EP - 242 AN - OPUS4-40686 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reinholz, Uwe A1 - Bremser, Wolfram A1 - Brzezinka, Klaus-Werner A1 - Strub, Erik A1 - Weise, Hans-Peter A1 - Merchel, Silke T1 - A thin-layer reference material for hydrogen analysis N2 - In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials – depending on the deposition process – and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (1–2 µm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:H–Si) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison. KW - Hydrogen KW - Nuclear reaction analysis KW - Depth profiling KW - Reference material KW - Ion beam analysis PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.015 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2418 EP - 2423 PB - Elsevier CY - Amsterdam AN - OPUS4-17553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -