TY - JOUR A1 - Zhou, Z. A1 - Han, Q. A1 - Wang, D. A1 - Macé, T. A1 - Kipphardt, Heinrich A1 - Maiwald, Michael A1 - Tuma, Dirk A1 - Uehara, S. A1 - Akima, D. A1 - Shimosaka, T. A1 - Jung, J. A1 - Oh, S.-H. A1 - van der Veen, A. A1 - van Wijk, J.I.T. A1 - Ziel, P. R. A1 - Konopelko, L. A1 - Valkova, M. A1 - Mogale, D.M. A1 - Botha, A. A1 - Brewer, P. A1 - Murugan, A. A1 - Minnaro, M.D. A1 - Miller, M. A1 - Guenther, F. A1 - Kelly, M.E. T1 - CCQM K101 Final report international comparison CCQM-K101:Oxygen in nitrogen-a track B comparison and that the matrix contains argon N2 - This key comparison aims to assess the capabilities of the participants to determine the amount-of-substance fraction oxygen in nitrogen. The GAWG has classified this as a track B comparison, due to the unexpected 50 μmol/mol argon mole fraction content of the transfer standards, which effects the achievable performance of some measurement techniques such a GC-TCD. The separation of oxygen and argon is challenging, and not all systems in use are equally well designed for it. As this analytical challenge due to a substantial fraction of argon in the transfer standards became a reality, the Gas Analysis Working Group (GAWG) decided to qualify this key comparison as a regular key comparison and not as a core comparison, which may be used to support calibration and measurement capabilities (CMCs) for oxygen in nitrogen, or for oxygen in nitrogen mixtures containing argon only (see also the section on support to CMCs). KW - CCQM-K101 KW - Gas analysis PY - 2016 UR - http://iopscience.iop.org/article/10.1088/0026-1394/53/1A/08013 SN - 1681-7575 SN - 0026-1394 VL - 53 IS - Techn Suppl SP - 08013, 1 EP - 71 PB - IOP publishing AN - OPUS4-40013 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Li, L. A1 - Han, M. A1 - Nolze, Gert T1 - The determination of lattice parameters using single EBSD patterns N2 - A typical electron backscatter diffraction (EBSD) pattern usually contains more than a hundred of Kikuchi poles that formed by intersecting dozens of visible Kikuchi bands. The poles correspond to zone axes in real space or lattice planes in reciprocal space. The band widths are inversely proportional to the interplanar spacings of diffracting lattice planes, and the angle formed by the beam source and two band center-lines approximately corresponds to angle between two lattice planes. However, EBSD patterns always suffer from gnomic distortions. In addition, the band width measurement has a relative error of 5-20% due to the complex profile. Thus, an EBSD pattern always provides abundant crystallographic information but disappointingly low accuracy. T2 - Microscopy & MicroAnalysis 2016 CY - Columbus, Ohio, USA DA - 24.07.2016 KW - Electron backscatter diffraction KW - Lattice parameter determination PY - 2016 UR - https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927616004025 SN - 1431-9276 SN - 1435-8115 VL - 22 SP - Suppl. 3, 634 EP - 635 AN - OPUS4-37742 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -