TY - CONF A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Surface Analysis by XPS and XAS Using a High-Rsolution and High-Flux Soft X-ray from Synchrotron T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 KW - XPS KW - XAS KW - DLC KW - Synchrotron Radiation PY - 2003 SP - 67 EP - 69 AN - OPUS4-6927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of carbon materials and plasma polymers by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 59 EP - 65 AN - OPUS4-6928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b197.pdf SN - 1344-6339 VL - 20 SP - 197 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive XPS depth-profiling of ta:C-films by variable excitation energy PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b198.pdf SN - 1344-6339 VL - 20 SP - 198 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2799 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Püschel, S. A1 - Liestmann, Z. A1 - Kalusniak, S. A1 - Kränkel, C. A1 - Schulz, Andreas A1 - Traub, Heike A1 - Tanaka, H. T1 - Impact of Ho3+, Er3+, and Tm3+ on laser cooling of Yb:YLF N2 - Ytterbium-doped LiYF4 (Yb:YLF) is a promising material for all-solid-state optical cryocoolers, but the impact of foreign rare-earth impurities on the laser-cooling performance is not completely understood. In particular, Tm3+ has been reported to reduce the background absorption. This study quantitatively assesses the impact of Ho3+, Tm3+, and Er3+ impurities on laser-cooling of Yb:YLF by anti-Stokes fluorescence. We grew five Yb(5%):YLF crystals intentionally doped with tens of ppm levels of these impurities. Laser-induced thermal modulation spectroscopy tests confirmed that these rare-earth impurities reduce the external quantum efficiency of Yb:YLF without affecting the background absorption coefficient. Although Er3+ is a well-known quencher for Yb3+, Er3+ co-doping only slightly decreases the laser-cooling efficiency at low pump intensities but becomes detrimental at high pump intensities (>5 kW cm−2). However, this detrimental effect diminishes at lower temperatures, as evidenced by cooling an Er3+ co-doped crystal to the same minimum temperature of 144K as a solely Yb3+-doped crystal. Contrary to previous reports, Tm3+ proved to be the most detrimental among the three impurities. KW - ICP KW - Laser cooling KW - Impurity KW - LiYF4 KW - Crystal PY - 2024 DO - https://doi.org/10.1364/OME.538215 VL - 14 IS - 10 SP - 2334 EP - 2348 PB - Optica Publishing Group CY - Washington DC, USA AN - OPUS4-61046 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -