TY - CONF A1 - Cobet, C. A1 - Wollschläger, Nicole A1 - Esser, N. A1 - Richter, W. A1 - Baudach, Steffen A1 - Beck, Uwe A1 - Männ, Marion A1 - Brunn, S. A1 - Gruska, B. A1 - Richter, U. T1 - VUV-XUV-Ellipsometrie mit Synchrotronstrahlung T2 - 2. Workshop Ellipsometrie CY - Berlin, Deutschland DA - 2002-02-18 PY - 2002 AN - OPUS4-2282 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Gruska, B. A1 - Wandel, K. A1 - Procop, Mathias ED - Lengeler, B. T1 - The InGaAs/SiO2 interface investigated by angle resolved XPS and ellipsometry T2 - 4th International Conference on the Formation of Semiconductor Interfaces (ICFSI) CY - Jülich, Germany DA - 1993-06-14 PY - 1993 SN - 981-021559-2 VL - 4 SP - 373 EP - 376 PB - World Scientific CY - Singapore AN - OPUS4-7088 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -