TY - CONF A1 - Knabe, C. A1 - Gildenhaar, Renate A1 - Berger, R. A1 - Ostapowicz, W. A1 - Fitzner, R. A1 - Radlanski, R. A1 - Gross, U. A1 - Siebert, G. T1 - In vitro examination of novel calcium phosphates using osteogenic cultures T2 - 5th World Biomaterials Congress CY - Toronto, Canada DA - 1996-05-29 KW - In-vitro Untersuchung KW - Kalzium-Phosphat KW - Zahnersatz KW - Knochen PY - 1996 VL - 1 SP - 890 CY - Toronto AN - OPUS4-672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Groß, Hans-Joachim A1 - Schön, G. T1 - Internationales Symposium für die Beförderung gefährlicher Güter auf See- und Binnen-Wasserstraßen, Hamburg 1978 PY - 1978 SN - 0340-7551 VL - 8 IS - 1 SP - 7 EP - 8 PB - Bundesanstalt für Materialprüfung CY - Berlin AN - OPUS4-8890 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kretzschmar, Hans-Jürgen A1 - Groß, G. A1 - Keim, J. ED - Jones, C. E. R. ED - Cramers, C. A. T1 - Pyrolysis-Gas Chromatography and Spectroscopic Identification of Fluorine Polymers T2 - 3rd International Symposium on Analytical Pyrolysis CY - Amsterdam, The Netherlands DA - 1976-09-07 PY - 1977 SN - 0-444-41558-0 SP - 373 EP - 382 PB - Elsevier Scientific Pub. Co CY - Amsterdam AN - OPUS4-8686 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Treu, Dieter A1 - Ünveren, E. A1 - Kemnitz, G. A1 - Unger, Wolfgang T1 - Characterization of Cr(III) compounds of O, OH, F and Cl by XPS N2 - Cr2O3, CrCl3, α-CrF3, CrF3·3H20 and Cr(OH)3 were investigated by x-ray photoelectron (XPS) and x-ray excited Auger electron spectroscopy (XAES) using a latest generation XPS spectrometer. Non-conductive powders are analyzed with ultimate energy resolution. Multiplet splitting features and/or satellite emission were observed in the Cr 2p and Cr 3s spectra. Cr(III) compounds are of interest in many applications as for example in corrosion and catalysis. Chromia and chromium-III-fluoride activated by reaction with fluoroalkanes are very promising industrial catalysts. It is the aim of this selection of spectral reference data to enable deeper insight in the formation of catalytically active fluorinated chromia phases by using XPS analysis. KW - Chromium(III) compound KW - Cr2O3 KW - CrCl3 KW - Cr(OH)3 KW - CrF3 KW - CrF3.3H2O KW - XPS KW - XAES KW - Multiplet splitting KW - Satellite KW - Powder chromium(III) compounds PY - 2008 DO - https://doi.org/10.1116/11.20080801 SN - 1055-5269 SN - 1520-8575 VL - 15 SP - 77 EP - 123 PB - AIP CY - Woodbury, NY AN - OPUS4-23387 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Gross, Thomas A1 - Wirth, Thomas A1 - Castelli, R. A1 - Shard, A.G. A1 - Alexander, M. A1 - Seeberger, P.H. A1 - Unger, Wolfgang T1 - Surface analytical characterization of carbohydrate microarrays N2 - Microarrays are a versatile platform for diagnostics and high-throughput analysis. Carbohydrate microarrays are valuable tools to investigate interactions with other molecules since many glycans are involved in fundamental biological processes. A combined X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) surface analysis was used to investigate the basic steps in the production of carbohydrate microarrays. The preparation included coupling of a thiol-terminated mannoside to maleimide-functionalized glass surfaces derived from γ-aminopropyl silane (GAPS) slides. XPS results clearly demonstrate successful chemical modification in each fabrication step, and ToF-SIMS imaging revealed immobilized carbohydrates in the spotted regions of the final microarray. KW - Carbohydrates KW - Microarrays KW - XPS KW - ToF-SIMS KW - Nona-mannoside KW - Maleimide surfaces KW - Surface analysis PY - 2010 DO - https://doi.org/10.1002/sia.3255 SN - 0142-2421 SN - 1096-9918 VL - 42 SP - 1188 EP - 1192 PB - Wiley CY - Chichester AN - OPUS4-21500 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -