TY - CONF A1 - Nolze, Gert T1 - Introduction to PowderCell N2 - The presentation give a short introduction into the free-available software PowderCell (BAM)for the simulation of X-ray diffraction patterns of polycrystalline materials. T2 - PowderCell Users meeting CY - Joinville, Brazil DA - 19.10.2015 KW - X-ray diffraction KW - Simulation KW - Structure viewer KW - Subgroup relationships PY - 2015 AN - OPUS4-37791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - EBSD: more reliable and accurate N2 - The presentation discusses numerous new approaches in order to increase precision and accuracy of electrom backscatter diffraction measurements. T2 - 1st EBSD Workshop CY - Belo Horizonte, Brazil DA - 17.09.2015 KW - Orientation mapping KW - Electron backscatter diffraction KW - Lattice parameter determination KW - Orientation precision KW - Orientation noise PY - 2015 AN - OPUS4-37797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - The challenge of band detection N2 - The presentation demonstrates different traps which are related to the detection of Kikuchi bands in EBSD patterns. T2 - EBSD 2015 CY - Glasgow, UK DA - 30.03.2015 KW - Electron backscatter diffraction KW - Image processing KW - Pseudo symmerty KW - Crystal lattice KW - Pyrite KW - Pattern matching KW - Misindexing PY - 2015 AN - OPUS4-37805 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vos, M. A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Element-specific Kikuchi patterns of Rutile N2 - The kinetic energy of keV electrons backscattered from a rutile (TiO2) surface depends measurably on the mass of the scattering atom. This makes it possible to determine separately the angular distribution of electrons backscattered elastically from either Ti or O. Diffraction effects of these backscattered electrons inside the rutile crystal lead to the formation of Kikuchi patterns. The element-resolved Kikuchi patterns of Ti and O differ characteristically, but each can be described fairly well in terms of the dynamical theory of diffraction. Qualitatively, much of the differences can be understood by considering the relative arrangement of the Ti and O atoms with respect to planes defined by the crystal lattice. KW - Electron Rutherford backscattering KW - TiO2 KW - Kikuchi pattern KW - EBSD pattern KW - Simulation PY - 2015 DO - https://doi.org/10.1016/j.ultramic.2015.04.018 SN - 0304-3991 VL - 156 SP - 50 EP - 58 AN - OPUS4-37787 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - SEM-TKD: Signal formation, practical challenges and related applications N2 - TKD and EBSD will be compared and benefits as well as limitations of TKD will be discussed. T2 - XIV Brazilian MRS Meeting CY - Rio de Janeiro, Brazil DA - 27.09.2015 KW - TKD KW - EBSD KW - Kikuchi diffraction KW - Nanoanalytic KW - Orientation mapping PY - 2015 AN - OPUS4-37788 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - Simulation of powder diffraction patterns N2 - The theory of powder diffraction simulation is explained at the example of PowderCell, a free-available software of BAM. T2 - PowderCell Users meeting CY - Joinville, Brazil DA - 21.09.2015 KW - Powder diffraction KW - X-ray diffraction KW - Phase analysis KW - Simulation PY - 2015 AN - OPUS4-37789 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nolze, Gert T1 - Euler angles and crystal symmetry N2 - For the description of (single) crystal orientations, e.g. as measured by electron backscatter diffraction (EBSD) & X-ray diffraction (XRD), Euler angles are still generally used to import and export data. However, because of the lack of standard definitions for the unit cell reference settings and specimen axes, several transformation descriptions exist which produce different sets of Euler angles for the same orientation. There is also no recommended region within the minimal Euler orientation space into which orientations should be placed. This is the reason why different sets of Euler angles for the same orientation are generated by the available software packages for indexing EBSD patterns. These issues are reviewed and addressed. The influence of crystal symmetry in form of chiral (enantiomorphic) groups is discussed, as well as how multiple, but symmetry-equivalent sets of Euler angles can be reduced in order to deliver a unique orientation description. The Euler coloring algorithms applied to EBSD map data is critically discussed. The specific case of cubic symmetry, especially the effect of the three-fold rotation on the Euler space is investigated in more detail for the highest-symmetric chiral group 432. Recommendations for standard settings of the unit cell to orthogonal coordinate system transformation are given which exploit inherent symmetry. KW - EBSD KW - Crystal orientation KW - Pattern indexing KW - Subgroup relationship PY - 2015 UR - http://onlinelibrary.wiley.com/doi/10.1002/crat.201400427/full DO - https://doi.org/10.1002/crat.201400427 SN - 0023-4753 SN - 1521-4079 SN - 0232-1300 VL - 50 IS - 2 SP - 188 EP - 201 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-32545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - The challenge of band detection T2 - RMS Electron backscatter diffraction meeting CY - Glasgow, UK DA - 2015-03-30 KW - EBSD KW - Electron diffraction KW - Band detection KW - Simulation PY - 2015 SP - 1 EP - 2(?) AN - OPUS4-33029 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Orientation mapping of non-centrosymmetric crystals T2 - RMS Electron backscatter diffraction meeting CY - Glasgow, UK DA - 30.03.2015 KW - EBSD KW - Cross-correlation KW - Non-centrosymmetry KW - Simulation PY - 2015 SP - 1 AN - OPUS4-33030 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Point-group sensitive orientation mapping of non-centrosymmetric crystals N2 - We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD). The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centro-symmetric Laue-groups according to Friedel's rule. Using polycrystalline GaP as an example, we apply a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation according to the non-centrosymmetric point group of the crystal structure under investigation. KW - Scanning electron microscopy KW - Electron backscatter diffraction KW - Orientation mapping KW - Non-centrosymmetric crystals PY - 2015 DO - https://doi.org/10.1063/1.4907938 SN - 0003-6951 SN - 1077-3118 VL - 106 SP - 072101-1 EP - 072101-4 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-32670 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -