TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Chirality determination of quartz crystals using electron backscatter diffraction N2 - We demonstrate the determination of crystal chirality using electron backscatter diffraction (EBSD) in the scanning electron microscope. The chirality of a-quartz as a space-group-dependent property is verified via direct comparison of experimental diffraction features to simulations using the dynamical theory of electron diffraction. KW - Electron backscatter diffraction KW - Kikuchi patterns KW - Chirality KW - Quartz PY - 2015 U6 - https://doi.org/10.1016/j.ultramic.2014.11.013 SN - 0304-3991 VL - 149 SP - 58 EP - 63 PB - Elsevier CY - New York, NY AN - OPUS4-31384 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - Introduction to PowderCell N2 - The presentation give a short introduction into the free-available software PowderCell (BAM)for the simulation of X-ray diffraction patterns of polycrystalline materials. T2 - PowderCell Users meeting CY - Joinville, Brazil DA - 19.10.2015 KW - X-ray diffraction KW - Simulation KW - Structure viewer KW - Subgroup relationships PY - 2015 AN - OPUS4-37791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo A1 - Hielscher, R. A1 - Han, M. A1 - Li, L. A1 - Payton, E. T1 - EBSD: more reliable and accurate N2 - The presentation discusses numerous new approaches in order to increase precision and accuracy of electrom backscatter diffraction measurements. T2 - 1st EBSD Workshop CY - Belo Horizonte, Brazil DA - 17.09.2015 KW - Orientation mapping KW - Electron backscatter diffraction KW - Lattice parameter determination KW - Orientation precision KW - Orientation noise PY - 2015 AN - OPUS4-37797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - The challenge of band detection N2 - The presentation demonstrates different traps which are related to the detection of Kikuchi bands in EBSD patterns. T2 - EBSD 2015 CY - Glasgow, UK DA - 30.03.2015 KW - Electron backscatter diffraction KW - Image processing KW - Pseudo symmerty KW - Crystal lattice KW - Pyrite KW - Pattern matching KW - Misindexing PY - 2015 AN - OPUS4-37805 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vos, M. A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Element-specific Kikuchi patterns of Rutile N2 - The kinetic energy of keV electrons backscattered from a rutile (TiO2) surface depends measurably on the mass of the scattering atom. This makes it possible to determine separately the angular distribution of electrons backscattered elastically from either Ti or O. Diffraction effects of these backscattered electrons inside the rutile crystal lead to the formation of Kikuchi patterns. The element-resolved Kikuchi patterns of Ti and O differ characteristically, but each can be described fairly well in terms of the dynamical theory of diffraction. Qualitatively, much of the differences can be understood by considering the relative arrangement of the Ti and O atoms with respect to planes defined by the crystal lattice. KW - Electron Rutherford backscattering KW - TiO2 KW - Kikuchi pattern KW - EBSD pattern KW - Simulation PY - 2015 U6 - https://doi.org/10.1016/j.ultramic.2015.04.018 SN - 0304-3991 VL - 156 SP - 50 EP - 58 AN - OPUS4-37787 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - SEM-TKD: Signal formation, practical challenges and related applications N2 - TKD and EBSD will be compared and benefits as well as limitations of TKD will be discussed. T2 - XIV Brazilian MRS Meeting CY - Rio de Janeiro, Brazil DA - 27.09.2015 KW - TKD KW - EBSD KW - Kikuchi diffraction KW - Nanoanalytic KW - Orientation mapping PY - 2015 AN - OPUS4-37788 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - Simulation of powder diffraction patterns N2 - The theory of powder diffraction simulation is explained at the example of PowderCell, a free-available software of BAM. T2 - PowderCell Users meeting CY - Joinville, Brazil DA - 21.09.2015 KW - Powder diffraction KW - X-ray diffraction KW - Phase analysis KW - Simulation PY - 2015 AN - OPUS4-37789 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Petrushin, N. A1 - Hvatzkiy, K. A1 - Gerasimov, V. A1 - Link, T. A1 - Epishin, A. A1 - Nolze, Gert A1 - Gerstein, G. T1 - A single-crystal co-base superalloy strengthened by gamma' precipitates: structure and mechanical properties N2 - An experimental Co-base superalloy was designed from the Ni-base system by exchange of Ni and Co concentrations. The alloy consist of a Co-matrix (γ phase) strengthened by cuboidal precipitates Co3(Al,X) (γ' phase). The γ'-solvus temperature is 1?005?°C. [001] single crystals of this alloy were solidified and tested for tension at different temperatures up to 1?000?°C. It was found that the Co-base alloy has a much lower yield stress than a corresponding Ni-base alloy, but a much higher ductility. The partitioning behaviour of the alloying elements in the Co-base alloy and the deformation mechanisms were investigated by scanning and transmission electron microscopy. KW - Microstructure KW - Precipitation KW - Stress PY - 2015 U6 - https://doi.org/10.1002/adem.201500088 SN - 1438-1656 VL - 17 IS - 6 SP - 755 EP - 760 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-34474 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nolze, Gert A1 - Grosse, C. A1 - Winkelmann, Aimo T1 - Kikuchi pattern analysis of noncentrosymmetric crystals N2 - Different models of Kikuchi pattern formation are compared with respect to their applicability to noncentrosymmetric crystals, and the breakdown of Friedel's rule in experimental electron backscatter diffraction (EBSD) patterns is discussed. Different AIIIBV semiconductor materials are used to evaluate the resulting asymmetry of Kikuchi band profiles for polar lattice planes. By comparison with the characteristic etch pit morphology on a single-crystal surface, the polar character of the measured lattice planes can be assigned absolutely. The presented approach enables point-group-resolved orientation mapping, which goes beyond the commonly applied Laue group analysis in EBSD. KW - EBSD KW - Pattern simulation KW - Point groups KW - Laue groups KW - Electron backscatter diffraction KW - Kikuchi patterns KW - Enantiomorphy; polarity KW - Friedel's rule PY - 2015 U6 - https://doi.org/10.1107/S1600576715014016 SN - 0021-8898 SN - 1600-5767 VL - 48 SP - 1405 EP - 1419 PB - Blackwell CY - Oxford AN - OPUS4-34477 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert A1 - Winkelmann, Aimo T1 - The challenge of band detection T2 - RMS Electron backscatter diffraction meeting CY - Glasgow, UK DA - 2015-03-30 KW - EBSD KW - Electron diffraction KW - Band detection KW - Simulation PY - 2015 SP - 1 EP - 2(?) AN - OPUS4-33029 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -