TY - CONF A1 - Ewert, U. A1 - Jaenisch, Gerd-Rüdiger A1 - Deresch, A. A1 - Bircher, B. A. A1 - Meli, F. T1 - New concepts for the measurement of focal spot parameters of nano- and microfocus X-ray tubes N2 - Accurate measurement of focal spot sizes of X-ray tubes, betatrons and linear accelerators is still an open problem. Several standards are currently active, which provide different results depending on the focal spot shape. CEN published the standard series EN 12543 (five parts) in 1999, which describes the measurement of focal spot sizes of X-ray tubes for NDT applications. The measurement procedure and its tolerances deviate from the measurement standards for medical X-ray tubes, e.g. EN 60336:2006 / IEC 60336:2005. EN 12543 describes different measurement methods for X-ray tubes with focal spots in several size ranges, defined as macrofocus, minifocus and microfocus. CEN TC 138 WG 1 und ASTM E 07.01 are revising (CEN) or have just revised (ASTM) the standards for focal spot size measurements, basing them on pin hole or edge measurements only. Slit cameras are applied for medical tube evaluation only. Tomographic methods for focal spot size shape reconstruction were proposed and will be discussed, but have not yet been used for standardization. The currently available standards cover the range of spot sizes from 5 µm up to several millimetres. During the last years, more and more nanofocus tubes have been developed for high-resolution applications and microscopy. Manufacturers and users apply different methods for measurement of nanofocus spot sizes and image resolution, which differ by a factor of up to two. These well-known methods and new alternative methods for the measurement of nanofocus spots (size and shape) will be evaluated and improved in the EMPIR project “NanoXSpot” in order to develop a related measurement standard. T2 - International Symposium on Digital Industrial Radiology and Computed Tomography CY - Fürth, Germany DA - 02.07.2019 KW - X-Ray tube KW - Focal spot measurement KW - Standadization PY - 2019 AN - OPUS4-48442 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -