TY - JOUR A1 - Tomandl, G. A1 - Mangler, M. A1 - Stoyan, D. A1 - Tscheschel, A. A1 - Goebbels, Jürgen A1 - Weidemann, Gerd T1 - Characterization methods for functionally graded materials N2 - In this paper the characterisation of functionally graded materials is elucidated by several different methods. These methods described here are used for the quantitative analysis of materials with a local dependence of microstructure parameters. Using X-ray microscopy (computed tomography) for 3D-measurements and optical microscopy on polished sections for 1D and 2D measurements on the same sample, a ceramic filter consisting of sintered spherical particles, various mathematical evaluation methods are described and compared. KW - Functionally graded materials KW - Computed tomography KW - X-ray microscopy KW - Optical microscopy KW - Ceramics PY - 2006 DO - https://doi.org/10.1007/s10853-006-6632-6 SN - 0022-2461 SN - 1573-4803 VL - 41 IS - 13 SP - 4143 EP - 4151 PB - Springer Science + Business Media B.V. CY - Norwell, Mass. AN - OPUS4-13722 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weidemann, Gerd A1 - Goebbels, Jürgen A1 - Illerhaus, Bernhard A1 - Dittrich, R. A1 - Mangler, M. A1 - Tomandl, G. T1 - Charakterisierung von Gradientenwerkstoffen mittels hochauflösender Computertomographie T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2001 CY - Berlin, Deutschland DA - 2001-05-21 PY - 2001 UR - http://www.ndt.net/article/dgzfp01/papers/p16/p16.htm N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 75-CD PB - DGZfP CY - Berlin AN - OPUS4-1128 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -