TY - JOUR A1 - Geißler, Daniel A1 - Wegner, Karl David A1 - Fischer, C. A1 - Resch-Genger, Ute T1 - Exploring Simple Particle-Based Signal Amplification Strategies in a Heterogeneous Sandwich Immunoassay with Optical Detection JF - Analytical Chemistry N2 - Heterogeneous sandwich immunoassays are widely used for biomarker detection in bioanalysis and medical diagnostics. The high analyte sensitivity of the current “gold standard” enzyme-linked immunosorbent assay (ELISA) originates from the signal-generating enzymatic amplification step, yielding a high number of optically detectable reporter molecules. For future point-of-care testing (POCT) and point-of-need applications, there is an increasing interest in more simple detection strategies that circumvent time-consuming and temperature-dependent enzymatic reactions. A common concept to aim for detection limits comparable to those of enzymatic amplification reactions is the usage of polymer nanoparticles (NP) stained with a large number of chromophores. We explored different simple NP-based signal amplification strategies for heterogeneous sandwich immunoassays that rely on an extraction-triggered release step of different types of optically detectable reporters. Therefore, streptavidinfunctionalized polystyrene particles (PSP) are utilized as carriers for (i) the fluorescent dye coumarin 153 (C153) and (ii) hemin (hem) molecules catalyzing the luminol reaction enabling chemiluminescence (CL) detection. Additionally, (iii) NP labeling with hemin-based microperoxidase MP11 was assessed. For each amplification approach, the PSP was first systematically optimized regarding size, loading concentration, and surface chemistry. Then, for an immunoassay for the inflammation marker C- eactive protein (CRP), the analyte sensitivity achievable with optimized PSP ystems was compared with the established ELISA concept for photometric and CL detection. Careful optimization led to a limit of detection (LOD) of 0.1 ng/mL for MP11-labeled PSP and CL detection, performing similarly well to a photometric ELISA (0.13 ng/mL), which demonstrates the huge potential of our novel assay concept. KW - Nanoparticle KW - Fluorescence KW - Immunoassay KW - Quality assurance KW - Antibody KW - Polymer KW - Dye KW - Signal enhancement KW - CRP KW - Biosensing PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-597853 DO - https://doi.org/10.1021/acs.analchem.3c03691 SN - 1520-6882 VL - 96 IS - 13 SP - 5078 EP - 5085 PB - American Chemical Society CY - Columbus, Ohio AN - OPUS4-59785 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ernst, O. C. A1 - Böttcher, K. A1 - Fischer, Daniel A1 - Uebel, D. A1 - Teubner, T. A1 - Boeck, T. T1 - Morphogenesis of liquid indium microdroplets on solid molybdenum surfaces during solidification at normal pressure and under vacuum conditions JF - Langmuir N2 - Electrical and optical applications based on micro- and nanoparticles have specific demands on their interfacial properties. These properties are strongly related to atmospheric conditions to which the particles were exposed during their formation. In this study, metallic In microparticles are synthesized by solidification of In droplets on an amorphous Mo substrate at normal pressure and under vacuum conditions. The influence of ambient pressure on the interface and surface shape is investigated. While solidification at atmospheric pressure leads to collapsed particles with undisturbed contact to the substrate, low pressures result in smooth spherical particles but with cavities inside. Numerical simulations with COMSOL Multiphysics reveal different temperature profiles and heat flux in particles during solidification for both cases. This indicates different starting conditions of the solidification, which leads to the described phenomenon eventually. The investigation of the varying process conditions on the particle shape in combination with the calculated and measured temperature curves over time gives valuable insights into new approaches to synthesize micro- and nanoparticles with defined interfacial properties. Both ambient pressure and cooling rate provide well-controllable and reliable parameters for the realization of different interfacial shapes. KW - Morphogenesis KW - Indium KW - Microdroplet KW - Molybdenum PY - 2022 DO - https://doi.org/10.1021/acs.langmuir.1c02744 SN - 0743-7463 SN - 1520-5827 VL - 38 IS - 2 SP - 762 EP - 768 PB - ACS Publ. CY - Washington, DC AN - OPUS4-54242 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Baier, Jennifa A1 - Fischer, Daniel A1 - Griepentrog, Michael A1 - Hertwig, Andreas A1 - Hielscher-Hofinger, Stefan A1 - Stockmann, Jörg Manfred A1 - Weise, Matthias T1 - Mapping und Imaging modifizierter Oberflächen: Generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit T2 - Tagungsband zum 37. ak-adp 2020, Leipzig N2 - Der Vortrag widmet sich dem Mapping und Imaging modifizierter Oberflächen: generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit. Es werden Untersuchungsmethoden zu ihrer Prüfung dargestellt. T2 - 37. ak-adp 2021 CY - Jena, Germany DA - 16.06.2021 KW - Qualitätssicherung KW - Mapping modifizierter Oberflächen KW - Imaging modifizierter Oberflächen KW - Generische Kenngrößen KW - Haftfestigkeit KW - Klebfestigkeit PY - 2021 SP - 1 EP - 10 AN - OPUS4-52893 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Florian, Camilo A1 - Fischer, Daniel A1 - Freiberg, K. A1 - Duwe, M. A1 - Sahre, Mario A1 - Schneider, S. A1 - Hertwig, Andreas A1 - Krüger, Jörg A1 - Rettenmayr, M. A1 - Beck, Uwe A1 - Undisz, A. A1 - Bonse, Jörn T1 - Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon JF - Materials N2 - Superficial amorphization and re-crystallization of silicon in <111> and <100> orientation after irradiation by femtosecond laser pulses (790 nm, 30 fs) are studied using optical imaging and transmission electron microscopy. Spectroscopic imaging ellipsometry (SIE) allows fast data acquisition at multiple wavelengths and provides experimental data for calculating nanometric amorphous layer thickness profiles with micrometric lateral resolution based on a thin-film layer model. For a radially Gaussian laser beam and at moderate peak fluences above the melting and below the ablation thresholds, laterally parabolic amorphous layer profiles with maximum thicknesses of several tens of nanometers were quantitatively attained. The accuracy of the calculations is verified experimentally by high-resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (STEM-EDX). Along with topographic information obtained by atomic force microscopy (AFM), a comprehensive picture of the superficial re-solidification of silicon after local melting by femtosecond laser pulses is drawn. KW - Femtosecond laser KW - Silicon KW - Amorphization KW - Crystallization KW - Spectroscopic imaging ellipsometry PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-523687 UR - https://www.mdpi.com/1996-1944/14/7/1651 DO - https://doi.org/10.3390/ma14071651 SN - 1996-1944 VL - 14 IS - 7 SP - 1651-1 EP - 1651-21 PB - MDPI AG CY - Basel, Switzerland AN - OPUS4-52368 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Beck, Uwe A1 - Fischer, Daniel T1 - MISTRAL-Müller-Matrix-basierte Identifizierung von Inhomogenitäten und strukturellen Anomalien N2 - Mit abbildender Ellipsometrie (imaging ellipsometry: IE) können Nanometer-Beschichtungen/ Degradationen visualisiert und bezüglich Brechungsindex n, Extinktionskoeffizient k und Schichtdicke d charakterisiert werden. Materialseitig werden lokal Homogenität und Isotropie innerhalb eines/mehrerer Bildpunkte (field of analysis: FOA) und messtechnisch global die Ebenheit der Proben bezüglich aller Bildpunkte des Messfeldes vorausgesetzt. Für die Müller-Matrix-basierte abbildende Ellipsometrie (MM-IE), die den optischen Response anisotroper Materialien in jedem Bildpunkt über die bis zu 16 Müller-Matrix-Elemente erfasst, ist dies von besonderer Relevanz. Reale Substrate sind aber oft nicht eben, können lokal Noppen/Mulden (im FOA) aufweisen oder sind global konvex/ konkav im möglichen Messfeld (field of view: FOV) gekrümmt. Diese lokalen/globalen strukturellen Anomalien des Substrats werden schon für die IE messtechnisch/modellseitig oft nicht beherrscht und sind für die MM-IE in der Wirkung auf die MM-Elemente unbekannt. Diese Defizite sollen messtechnisch bzw. modellmäßig behoben und somit die Messung lokal/global gekrümmter Oberflächen ermöglicht werden (MM-CSIE, CS curved surface). KW - Abbildende Ellipsometrie (IE) KW - Müller-Matrix Ellipsometrie (MM-IE) KW - Gekrümmte Oberflächen KW - Schichtdicke KW - Optische Konstanten PY - 2020 SP - 1 EP - 7 AN - OPUS4-51574 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Almalla, A. A1 - Hertwig, Andreas A1 - Fischer, Daniel A1 - Özcan Sandikcioglu, Özlem A1 - Witt, Julia T1 - Development of layer-by-layer assembled thin coatings on aluminium alloy AA2024-T3 for high resolution studies of local corrosion processes JF - Journal of applied polymer science N2 - The aim of this study is to develop nanometer-thin epoxy-based films on aluminium alloy AA2024-T3 as a model coating system for high resolution corrosion studies. Spin coating was used for the layer-by-layer (LbL) deposition of poly-(ethylenimine) (PEI) and poly([o-cresyl glycidyl ether]-co-formaldehyde) (CNER) bilayers. The film chemistry and the cross-linking process were characterized by means of Fourier-transform infrared spectroscopy (FTIR). Ellipsometric data confirmed the linear increase of film thickness. The potentiodynamic polarization and electrochemical impedance spectroscopy (EIS) results indicate the improvement of the film barrier properties with increasing film thickness. Mapping of the topography and the volta potential was performed by means of scanning Kelvin probe force microscopy (SKPFM). The results indicate the presence of a homogeneous film structure, while the intermetallic phases can still be identified below the coating. The SKPFM Analysis confirmed that the model films are suitable for investigation of corrosion processes at the coating/metal interface. KW - Spectroscopy KW - Coatings KW - Electrochemistry KW - Microscopy KW - Resins PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-514627 DO - https://doi.org/10.1002/app.49826 SN - 0021-8995 VL - 137 IS - 48 SP - e49826-1 EP - e49826-9 PB - Wiley CY - New York, NY AN - OPUS4-51462 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wu, Cheng-Chieh A1 - Weisbrich, S. A1 - Neitzel, F. A1 - Kadoke, Daniel A1 - Fischer, Michael A1 - Kohlhoff, Harald ED - Pastramă, Ştefan Dan ED - Constantinescu, Dan Mihai T1 - A Small-Scale Test Bridge for Measurement and Model-based Structural Analysis JF - Materials Today: Proceedings N2 - The Measurement- and Model-based Structural Analysis (MeMoS) integrates a finite element model into least squares adjustment and thus allows to evaluate a mechanical model and measurements in a combined analysis. To examine the capability to detect and localise damage using this integrated analysis MeMoS, a small-scale truss bridge made of aluminium profiles is built as a test specimen for this purpose. T2 - 35th Danubia Adria Symposium on Advances in Experimental Mechanics CY - Sinaia, Romania DA - 25.09.2018 KW - Structural analysis KW - Damage detection and localisation KW - Finite element method KW - Photogrammetry KW - Adjustment calculation PY - 2019 UR - http://www.sciencedirect.com/science/article/pii/S2214785319304894 DO - https://doi.org/10.1016/j.matpr.2019.03.130 SN - 2214-7853 VL - 12 IS - 2 SP - 319 EP - 328 PB - Elsevier Ltd. AN - OPUS4-48053 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Duwe, M. A1 - Quast, J.-H. A1 - Schneider, S. A1 - Fischer, Daniel A1 - Beck, Uwe T1 - Thin-film metrology of tilted and curved surfaces by imaging Mueller-matrix ellipsometry JF - Journal of Vacuum Science & Technology B N2 - For the vast majority of ellipsometric measurements, the application of planar substrates is mandatory and requires a proper sample alignment prior to the measurement. Here, the authors present a generalized approach of how to extract the isotropic ellipsometric sample parameters from an imaging Mueller-matrix measurement even if the sample is significantly misaligned. They validate the method by layer-thickness calculations based on imaging Mueller-matrix measurements of flat crystalline silicon samples that were misaligned on purpose. Furthermore, they also exploit this method’s capabilities to perform spatially resolved layer-thickness measurements of a single-layer indium-tin-oxide coating on a fused-silica microlens without the need of realignment or repositioning of the sample during the measurement. T2 - 8th International conference on spectroscopic ellipsometry (ICSE-8) CY - Barcelona, Spain DA - 26.05.2019 KW - Metrology KW - Thin films KW - Polarization spectroscopy KW - Spectroskopic Imaging KW - Mueller-Matrix imaging ellipsometry PY - 2019 DO - https://doi.org/10.1116/1.5122757 SN - 2166-2746 SN - 2327-9877 VL - 37 IS - 6 SP - 062908 PB - AIP CY - New York, NY AN - OPUS4-50209 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Beck, Uwe A1 - Duwe, M. A1 - Schneider, S. T1 - Mueller-matrix imaging ellipsometry of structural anomalies and inhomogenities N2 - In the last years, the implementation of imaging ellipsometry in the variety of optical characterization techniques has shown tremendous potential to analyze the topology of surfaces in the lateral dimension. In the later studies, this contrast-rich surface images were affiliated with changes of the refraction indices, Absorption bands or layer thicknesses. However, it was realized that additional factors like curvature or scattering can have a great Impact on the ellipsometric readout of the analyzed system. In this study, we focus on the systematic evaluation of structural anomalies and inhomogenities of several Basic systems. This includes spherical particles as a model for microscopic curved surfaces in a range of 0.25 to 25 μm in diameter. In the macroscopic regime several conventional convex lenses were analyzed. Additional affords were made to generate microscopic concave model systems by applying nanoindentation with a spherical indentation unit. With this method calottes with a depth of 0.04 to 2 μm and radius of 2.5 μm were made. The macroscopic counterpart is delivered by conventional concave lens systems. For all systems, a variety of different bulk materials was investigated. This includes metal oxides, metals and polymers as well as combinations of each by applying coatings on the bulk materials with different layer thicknesses. To analyze these structural anomalies and inhomogenities properly, Mueller-Matrix imaging ellipsometry is the method of choice to address cross- and depolarization effects that occur due to the curved surfaces. Supplementary methods were used for an independent characterization of the topological properties of all structural anomalies and inhomogenities. This includes AFM and SEM for the microscopic samples (microparticles and nanoindented holes) and white light interferometry for the macroscopic lenses. This study results in a systematic screening of different coated and uncoated material systems with a topology that does not fit into conventional ellipsometry and thus is analyzed by Muller-Matrix imaging ellipsometry. This will help in quality control and is a contribution to the understanding of the polarizing effects of non-ideal Systems analyzed by ellipsometry. T2 - 8th International conference on spectroscopic ellipsometry (ICSE-8) CY - Barcelona, Spain DA - 26.05.2019 KW - Spectroskopic Imaging KW - Mueller-Matrix imaging ellipsometry KW - Structural anomalies KW - Structural inhomogenities PY - 2019 AN - OPUS4-48347 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Daniel A1 - Griepentrog, Michael A1 - Beck, Uwe A1 - Duwe, M. A1 - Quast, J.-H. A1 - Schneider, S. T1 - Effect of curvature of spherical microscopic indentations on the ellipsometric readout JF - Journal of Vacuum Science & Technology B 37 N2 - The authors describe and interpret curvature-related changes to the ellipsometric readout. As model system for a concave curvature, a set of three spherical microscopic indents in silicon (100) of different sizes was prepared by instrumented indentation testing using a spherical indenter. For reference, these samples were characterized by AFM to reveal the topography of each structure. The concavelike indents were analyzed by Mueller-Matrix imaging ellipsometry to extract lateral intensity images of 12 elements of the Mueller-Matrix. As a result of the detailed analysis of the image elements m22, m23, and m14, it was possible to correlate intensity changes and symmetry properties to depolarization and cross polarization induced by the edge threshold and the curved surface of the indent. KW - Spectroskopic Imaging KW - Mueller-Matrix imaging ellipsometry KW - Structural anomalies KW - Structural inhomogenities PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-498105 DO - https://doi.org/10.1116/1.5122252 VL - 37 IS - 6 SP - 062906-1 EP - 062906-5 PB - American Vacuum Society AN - OPUS4-49810 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Beck, Uwe A1 - Schneider, S. A1 - Duwe, M T1 - Visualisierung von mikro- und nanoskalierten Oberflächenstrukturen mittels abbildender Ellipsometry N2 - In den letzten Jahren hat die Einbindung der abbildenden Ellipsometrie in die Gruppe der optischen Verfahren zur Oberflächencharakterisierung ein enormes Potential bei der Analyse von topologischen Strukturänderungen gezeigt. Der dabei abgebildete Kon-trast wurde typischerweise auf Änderungen im Brechungsindex, Absorptionseffekte oder Schichtdickenänderungen zurückgeführt. In späteren Studien wurde festgestellt, dass auch andere Faktoren, wie etwa die Krümmung der Oberfläche oder Kanten von Struktu-ren einen signifikanten Einfluss auf die Messung der ellipsometrischen Paramater haben. Um diese Effekte aus der ellipsometrischen Messung extrahieren zu können, wird auf die Analyse der Müller-Matrix zurückgegriffen. In dem hier vorliegenden Beitrag wird gezeigt, wie die Müller-Matrix-Imaging Ellipsomet-rie (MM-IE) zur Charakterisierung von Oberflächenstrukturen verwendet werden kann. Dazu werden mikro- und nanoskaliert gekrümmte Oberflächen zunächst mit verschiede-nen Referenzmethoden, wie Rasterelektronenmikroskopie (SEM), Lichtmikroskopie (OM), Weißlichtinterferenzmikroskopie (WLIM) und Rasterkraftmikroskopie (AFM) vali-diert erfasst. Der anschließende Vergleich mit den Ergebnissen der Müller-Matrix-Ima-ging-Ellipsometrie ermöglicht eine Korrelation der zugrunde liegenden Strukturphäno-mene mit den ellipsometrischen Daten. In diesem Artikel wird das Prinzip an drei industriell relevanten Strukturgruppen demonstriert: Sub-Mikropartikel, Mikropartikel und sub-mikroskalierte Vertiefungen. T2 - 14. ThGOT Thementage Grenz- und Oberflächentechnik CY - Zeulenroda, Germany DA - 12.03.2019 KW - Ellipsometrie KW - Nanoskaliert KW - Mikroskaliert KW - Oberflächengeometrie KW - Brechungsindex KW - Müller-Matrix-Ellipsometrie PY - 2019 AN - OPUS4-47645 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Beck, Uwe T1 - Visualisierung von mikro- und nanoskalierten Oberflächenstrukturen mittels abbildender Ellipsometrie T2 - Tagungsband, 14. ThGOT Thementage Grenz- und Oberflächentechnik und 6. Kolloquium Dünne Schichten in der Optik N2 - In den letzten Jahren hat die Einbindung der abbildenden Ellipsometrie in die Gruppe der optischen Verfahren zur Oberflächencharakterisierung ein enormes Potential bei der Analyse von topologischen Strukturänderungen gezeigt. Der dabei abgebildete Kon-trast wurde typischerweise auf Änderungen im Brechungsindex, Absorptionseffekte oder Schichtdickenänderungen zurückgeführt. In späteren Studien wurde festgestellt, dass auch andere Faktoren, wie etwa die Krümmung der Oberfläche oder Kanten von Struktu-ren einen signifikanten Einfluss auf die Messung der ellipsometrischen Paramater haben. Um diese Effekte aus der ellipsometrischen Messung extrahieren zu können, wird auf die Analyse der Müller-Matrix zurückgegriffen. In dem hier vorliegenden Beitrag wird gezeigt, wie die Müller-Matrix-Imaging Ellipsomet-rie (MM-IE) zur Charakterisierung von Oberflächenstrukturen verwendet werden kann. Dazu werden mikro- und nanoskaliert gekrümmte Oberflächen zunächst mit verschiede-nen Referenzmethoden, wie Rasterelektronenmikroskopie (SEM), Lichtmikroskopie (OM), Weißlichtinterferenzmikroskopie (WLIM) und Rasterkraftmikroskopie (AFM) vali-diert erfasst. Der anschließende Vergleich mit den Ergebnissen der Müller-Matrix-Ima-ging-Ellipsometrie ermöglicht eine Korrelation der zugrunde liegenden Strukturphäno-mene mit den ellipsometrischen Daten. In diesem Artikel wird das Prinzip an drei industriell relevanten Strukturgruppen demonstriert: Sub-Mikropartikel, Mikropartikel und sub-mikroskalierte Vertiefungen. T2 - 14. ThGOT Thementage Grenz- und Oberflächentechnik und 6. Kolloquium Dünne Schichten in der Optik CY - Zeulenroda, Germany DA - 12.03.2019 KW - Ellipsometrie KW - Nanoskaliert KW - Mikroskaliert KW - Oberflächengeometrie KW - Brechungsindex KW - Müller-Matrix-Ellipsometrie PY - 2019 SN - 978-3-00-062102-4 SP - 1 EP - 5 AN - OPUS4-47646 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kage, Daniel A1 - Fischer, Linn A1 - Hoffmann, Katrin A1 - Thiele, T. A1 - Schedler, U. A1 - Resch-Genger, Ute T1 - Close spectroscopic look at dye-stained polymer microbeads JF - The Journal of Physical Chemistry C N2 - Dye-stained micrometer-sized polymer beads are important tools in the life sciences with applications in biomedical, biochemical, and clinical research. Here, bead-based assays are increasingly used, for example, in DNA sequencing and the detection of autoimmune diseases or pathogenic microorganisms. Moreover, stained beads are employed as calibration tools for fluorescence microscopy and flow cytometry methods with increasing complexity. To address the requirements concerning the relevant fluorescence features, the spectroscopic properties of representative polymer beads with diameters ranging from about 1 to 10 μm stained with varying concentrations of rhodamine 6G were systematically assessed. The observed dependence of the spectral properties, fluorescence decay kinetics, and fluorescence quantum yields on bead size and dye loading concentration is attributed to different fluorescence characteristics of fluorophores located in the particle core and near-surface dye molecules. Supported by the fluorescence anisotropy measurements, the origin of the observed alteration of fluorescence features is ascribed to a combination of excitation energy transfer and polarity-related effects that are especially pronounced at the interface of the bead and the surrounding medium. The results of our studies underline the need to carefully control and optimize all Parameters that can affect the fluorescence properties of the dye-stained beads. KW - Fluorophore KW - Polymer particles KW - Photophysics KW - Life sciences KW - Standards PY - 2018 DO - https://doi.org/10.1021/acs.jpcc.8b02546 SN - 1932-7447 VL - 122 IS - 24 SP - 12782 EP - 12791 PB - ACS Publications CY - Washington, DC AN - OPUS4-45453 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Franz, Philipp A1 - Metz, Christain A1 - Brackrock, Daniel A1 - Fischer, C. A1 - Wachtendorf, Volker A1 - Maierhofer, Christiane T1 - Zerstörungsfreie Charakterisierung und Qualitätssicherung der Materialeigenschaften und Beständigkeit additiv gefertigter Kunststoffteile T2 - DGZfP-Jahrestagung 2018 N2 - Mit additiven Fertigungsverfahren hergestellte Bauteile und Produkte aus Kunststoffen werden zunehmend nicht mehr nur als Prototypen, sondern als voll funktionsfähige Bauteile und Produkte gefertigt. Bedingt durch die Fertigungsprozesse und den schichtweisen Aufbau resultieren physikalische Materialeigenschaften, die stark von den Fertigungsparametern abhängen und zudem anisotrop sind. Von den Fertigungsparametern werden auch die Oberflächeneigenschaften beeinflusst, sodass zu erwarten ist, dass sich die Beständigkeit gegenüber äußeren Umwelteinflüssen bei additiv gefertigten Bauteilen von der konventionell gefertigter unterscheiden kann. Nachfolgend wird daher die Entwicklung eines Qualitätssicherungskonzeptes basierend auf spektroskopischen und zerstörungsfreien Prüfverfahren vorgestellt, in dem der Alterungsprozess von mittels Fused Deposition Modelling (FDM) und mittels Lasersintering (LS) hergestellten Probekörpern untersucht wird. T2 - DGZfP-Jahrestagung 2018 CY - Leipzig, Germany DA - 07.05.2018 KW - Additive Fertigung KW - Kunststoffe KW - Zerstörungsfreie Prüfung PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-449016 SN - 978-3-940283-92-4 VL - DGZfP BB 166 SP - Mo.2.A.1, 1 EP - 9 AN - OPUS4-44901 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Wu, Cheng-Chieh A1 - Kadoke, Daniel A1 - Fischer, Michael A1 - Kohlhoff, Harald A1 - Weisbrich, S. A1 - Neitzel, F. ED - Pastramă, Ştefan Dan ED - Constantinescu, Dan Mihai T1 - A small-scale test bridge for measurement- and model-based structural analysis T2 - 35TH DANUBIA ADRIA SYMPOSIUM ON ADVANCES IN EXPERIMENTAL MECHANICS Extended abstracts N2 - To examine the capability to detect and localise damage using the Measurement- and Model-based Structural Analysis (MeMoS), a small-scale truss bridge (1520 mm × 720 mm × 720 mm) made of aluminium profiles is built as a test specimen for this purpose. The truss frame of the test bridge is made of aluminium profiles with a sophisticated design of the cross-sectional area. In comparison, with solid profiles, only a fraction of the material is needed to produce the profiles, while their bending resistance decreases slightly. The profiles are built into a truss frame by connecting them by means of fastening sets made of steel. The bridge model is mounted on four steel bearings which each of them consist of a cylinder arranged between two plates. Fixed bearings are made by holding onto one end of the bridge. The bridge is subjected by an external load by placing a heavy object beneath it. At the same time, measurements can be conducted below the bridge. Therefore, the bridge specimen is elevated by attaching it on a pedestal with four columns. Damages can be induced by loosening the fastening pieces. T2 - 35th Danubia-Adria Symposium on Advances in Experimental Mechanics CY - Sinaia, Romania DA - 25.09.2018 KW - Adjustment calculation KW - Finite element method KW - Damage detection and localisation KW - Structural analysis KW - Photogrammetry PY - 2018 SN - 978-606-23-0874-2 SP - 23 EP - 24 PB - PRINTECH CY - Bukarest AN - OPUS4-46116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kirner, Sabrina V. A1 - Slachciak, Nadine A1 - Elert, Anna Maria A1 - Griepentrog, Michael A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Sahre, Mario A1 - Dörfel, Ilona A1 - Sturm, Heinz A1 - Pentzien, Simone A1 - Koter, Robert A1 - Spaltmann, Dirk A1 - Krüger, Jörg A1 - Bonse, Jörn T1 - Tribological performance of titanium samples oxidized by fs-laser radiation, thermal heating, or electrochemical anodization JF - Applied Physics A N2 - Commercial grade-1 titanium samples (Ti, 99.6%) were treated using three alternative methods, (i) femtosecond laser processing, (ii) thermal heat treatment, and (iii) electrochemical anodization, respectively, resulting in the formation of differently conditioned superficial titanium oxide layers. The laser processing (i) was carried out by a Ti:sapphire laser (pulse duration 30 fs, central wavelength 790 nm, pulse repetition rate 1 kHz) in a regime of generating laser-induced periodic surface structures (LIPSS). The experimental conditions (laser fluence, spatial spot overlap) were optimized in a sample-scanning setup for the processing of several square-millimeters large surface areas covered homogeneously by these nanostructures. The differently oxidized titanium surfaces were characterized by optical microscopy, micro Raman spectroscopy, variable angle spectroscopic ellipsometry, and instrumented indentation testing. The tribological performance was characterized in the regime of mixed friction by reciprocating sliding tests against a sphere of hardened steel in fully formulated engine oil as lubricant. The specific tribological performance of the differently treated surfaces is discussed with respect to possible physical and chemical mechanisms. KW - Femtosecond laser KW - Titanium KW - Oxidation KW - Friction PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-445609 DO - https://doi.org/10.1007/s00339-018-1745-8 SN - 0947-8396 SN - 1432-0630 VL - 124 IS - 4 SP - 326, 1 EP - 10 PB - Springer-Verlag AN - OPUS4-44560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - THES A1 - Fischer, Daniel T1 - Charakterisierung von dotierten Zinnoxidschichten für die Detektion von Gasen durch ellipsometrische Messung der Oberflächenplasmonenresonanz N2 - In der vorliegenden Dissertation wird die Verbesserung von Gassensoren durch Beschichtung mit dotierten Zinnoxidschichten untersucht, wobei zur Messung der Gase die Methode der oberflächenplasmonenresonanzverstärkten Ellipsometrie (SPREE) angewendet wurde. Die vorgestellten Ergebnisse unterteilen sich dabei in drei Schritte: Herstellung der Schichtsysteme, Analyse der chemischen, strukturellen und optischen Eigenschaften, sowie die Anwendung in der SPREE Gasmessung. Die dotierten Zinnoxidschichten wurden erfolgreich mittels Hochfrequenz-Magnetronsputtern hergestellt, indem das Zinnoxidtarget mit dem metallischen Dotierungsmaterial (Eisen bzw. Nickel) modifiziert wurde. Die chemische Analyse der Schichten wurde mit energiedispersiver Röntgenspektroskopie (EDX), Flugzeit-Sekundärionenmassenspektrometrie (TOF-SIMS) und Röntgenfluoreszenz unter streifendem Einfall (GI-XRF) durchgeführt. Die EDX Untersuchungen zeigten qualitativ, dass das Dotierungsmaterial in die Schicht eingebaut wurde. Mithilfe der TOF-SIMS Experimente konnte nachgewiesen werden, dass die Dotierungskonzentration innerhalb der Schicht heterogen verteilt ist und mithilfe der GI-XRF Messung konnte der Dotierungsgrad quantitativ mit ca. 10% bestimmt werden. Für die strukturelle Untersuchung wurden die Methoden der Rasterkraftmikroskopie (AFM) und Transmissionselektronenmikroskopie (TEM) ausgewählt. Die AFM Messungen zeigten, dass die Schichten eine mittlere quadratische Rauheit kleiner als 1 nm aufweisen und die Rauheit damit nicht als Faktor in der Gasmessung berücksichtigt werden muss. In den TEM Messungen wurde der Schichtaufbau bestätigt und gezeigt, dass in den dotierten Schichten nanokristalline Strukturen vorliegen. Die optische Charakterisierung der Schichten wurde mit spektraler Ellipsometrie (SE) durchgeführt, um die dielektrische Funktion in Abhängigkeit der Dotierung zu untersuchen. Dafür wurden Modelle für die dielektrische Funktion auf der Basis von mehreren Gauss-Funktionen entwickelt. Es zeigte sich, dass die undotierten Schichten sich wie typische Dielektrika mit Bandkanten >4 eV verhält und mit drei Gauss-Funktionen simuliert werden kann. Für die dotierten Schichten verschiebt sich die Bandkante, in Abhängigkeit vom Grad der Dotierung und dem Oxidationsgrad, zu bis zu 2.1 eV. Außerdem muss das Modell um eine zusätzliche Gauss-Funktion im nahen Infrarot erweitert werden, die auf die Anwesenheit von metallischen Nanopartikeln zurückzuführen ist. Weiterhin zeigte sich, dass die dielektrischen Eigenschaften von der Dicke der Schicht abhängen. Die Benutzung der Zusatzschichten in der SPREE Gasmessung zeigte, dass diese Schichten die Sensoroberfläche effektiv vor Degradation schützt. Weiterhin wurde nachgewiesen, dass die Sensitivität der jeweiligen Sensorschicht für bestimmte Gase von der Dotierung der Schicht abhängt. Es wurde gezeigt, dass eine Eisendotierung zu einer erhöhten Sensitivität für Kohlenmonoxid führt, während undotierte Schichten vor allem unpolare Alkane bevorzugen. Die Nickel-dotierten Schichten zeigten im Vergleich zur Eisendotierung deutlich schlechtere Ergebnisse für alle Gase. Diese Effekte wurden auf die unterschiedliche Bindungsstärke der Gase an die metallischen Nanopartikel und das Vorhandensein einer unterschiedlichen Zahl an Adsorptionsplätzen zurückgeführt. Für Wasserstoff wurden für alle Proben vergleichbare Ergebnisse gefunden, was darauf zurückzuführen ist, dass diese Moleküle aufgrund der geringen Größe und Masse in die Schicht diffundieren. Zusätzlich wurde das SPREE Verfahren signifikant verbessert, indem die Druckabhängigkeit Sensoren erstmals erfasst wurde. Weiterhin wurde die Auswertung weiterentwickelt, indem nur einzelne Parameter des Stokes-Vektors für die Gasmessung benutzt wurden. KW - Oberflächenplasmonen KW - Ellipsometrie KW - Transparente Halbleiter KW - Dotiertes Zinnoxid KW - Gasmessung PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-435039 DO - https://doi.org/10.14279/depositonce-5969 SP - 1 EP - 154 PB - Technische Universität CY - Berlin AN - OPUS4-43503 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Lohse, V. A1 - Negendank, D. A1 - Kormunda, M. A1 - Esser, N. T1 - Thin SnOx films for surface plasmon resonance enhanced ellipsometric gas sensing (SPREE) JF - Beilstein Journal of Nanotechnology N2 - Background: Gas sensors are very important in several fields like gas monitoring, safety and environmental applications. In this approach, a new gas sensing concept is investigated which combines the powerful adsorption probability of metal oxide conductive sensors (MOS) with an optical ellipsometric readout. This concept Shows promising results to solve the problems of cross sensitivity of the MOS concept. Results: Undoped tin oxide (SnOx) and iron doped tin oxide (Fe:SnOx) thin add-on films were prepared by magnetron sputtering on the top of the actual surface plasmon resonance (SPR) sensing gold layer. The films were tested for their sensitivity to several gas species in the surface plasmon resonance enhanced (SPREE) gas measurement. It was found that the undoped tin oxide (SnOx) shows higher sensitivities to propane (C3H8) then to carbon monoxide (CO). By using Fe:SnOx, this relation is inverted. This behavior was explained by a change of the amount of binding sites for CO in the layer due to this iron doping. For hydrogen (H2) no such relation was found but the sensing ability was identical for both layer materials. This observation was related to a different sensing mechanism for H2 which is driven by the Diffusion into the layer instead of adsorption on the surface. Conclusion: The gas sensing selectivity can be enhanced by tuning the properties of the thin film overcoating. A relation of the binding sites in the doped and undoped SnOx films and the gas sensing abilities for CO and C3H8 was found. This could open the path for optimized gas sensing devices with different coated SPREE sensors. KW - Doped tin oxide KW - Ellipsometry KW - Gas sensing KW - Surface plasmon KW - Resonance KW - Thin films KW - Transparent conductive oxides PY - 2017 DO - https://doi.org/10.3762/bjnano.8.56 SN - 2190-4286 VL - 8 SP - 522 EP - 529 AN - OPUS4-39391 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Negendank, Detlef A1 - Lohse, Volkmar A1 - Kormunda, M. A1 - Esser, N. T1 - Dependence of the optical constants and the performance in the SPREE gas measurement on the thickness of doped tin oxide over coatings JF - Applied Surface Science N2 - In this study, thickness related changes of the optical properties of doped tin oxide were studied. Two different sets of samples were prepared. The first set was doped with iron or nickel on silicon substrate with thicknesses of 29–56 nm, the second was iron doped on gold/glass substrate with 1.6–6.3 nm. The optical constants were determined by using spectral ellipsometry (SE) followed by modelling of the dielectric function with an oscillator model using Gaussian peaks. The analysis of the optical constants shows a dependence of the refraction and the absorption on the thickness of the doped tin oxide coating. In addition to the tin oxide absorption in the UV, one additional absorption peak was found in the near-IR/red which is related to plasmonic effects due to the doping. This peak shifts from the near-IR to the red part of the visible spectrum and becomes stronger by reducing the thickness, probably due to the formation of metal nanoparticles in this layer. These results were found for two different sets of samples by using the same optical model. Afterwards the second sample set was tested in the Surface Plasmon Resonance Enhanced Ellipsometric (SPREE) gas measurement with CO gas. It was found that the thickness has significant influence on the sensitivity and thus the adsorption of the CO gas. By increasing the thickness from 1.6 nm to 5.1 nm, the sensing ability is enhanced due to a higher coverage of the surface with the over coating. This is explained by the high affinity of CO molecules to the incorporated Fe-nanoparticles in the tin oxide coating. By increasing the thickness further to 6.3 nm, the sensing ability drops because the layer disturbs the SPR sensing effect too much. T2 - 7th International Conference on Spectroscopic Ellipsometry (ICSE-7) DA - 06.06.2016 KW - Surface plasmon resonance KW - Spectroscopic ellipsometry KW - Doped tin oxide KW - Gas sensing KW - Plasmonic absorption PY - 2017 DO - https://doi.org/10.1016/j.apsusc.2016.11.188 SN - 0169-4332 VL - 421, Teil B SP - 480 EP - 486 PB - Elsevier B.V. AN - OPUS4-42692 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of metal doped SnOx thin films for SPREE-based gas sensors N2 - Gas sensors are an important tool in various areas for example in industrial process control as well as Gas sensors are an important tool in various areas for example in industrial process control as well as safety applications or in research. A useful gas detector should be selective, precise, stable and cost-effective. In the present research a surface based gas detection technique is investigated using the SPR effect with ellipsometric readout. This technique is called surface plasmon resonance enhanced ellipsometry (SPREE). The sensor consists of a gold layer (40 nm) top-coated with a doped metal-oxide (M:SnOₓ, 5 nm). The coating is added by magnetron sputtering with doped targets with different doping concentrations. It could be shown that, without the top-coating, these type of sensors can detect various gases, e.g. CO, H2, O2, O3, He, N2, with sensitivities down to the ppm range (in air). The goal of the present study is to characterize the additional coating materials in dependence of the coating conditions. With the help of the doped-metal oxide, the sensitivity increases dramatically by a factor of 100. Additionally, a selectivity for specific gases is observed which depends on the doping conditions of the coating. Changing the properties of the plasma coating process and the doping metal gives access to a variety of different layers and enables us to find the best conditions. T2 - Leibniz Institut für Analytische Wissenschaften ISAS e.V. - Kolloqium CY - Berlin, Germany DA - 05.05.2016 KW - Ellipsometry KW - SPR effect KW - SnOx KW - Gas sensors PY - 2016 AN - OPUS4-37034 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kormunda, M. A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Sebik, M. A1 - Esser, N. T1 - Preparation of pulsed DC magnetron deposited Fe-doped SnO2 coatings JF - Physica Status Solidi A N2 - Iron-doped SnO2 coatings were deposited in a 50 kHz DC-pulsed magnetron sputtering discharge. The pulses had a duration of 4 µs in selected gas mixtures from pure argon up to 60% of oxygen at a constant total pressure of 0.2 Pa. A single target of SnO2 with Fe inset was used. The mass spectrometry study detected the gas-related ions Ar+, O2+ and O+, where the last one becomes the dominant positive ion at higher oxygen contents. Atomic oxygen ions had a higher energy as it resulted from the collision-caused dissociation on the target surface. The tin-related species were detected as Sn+ and SnO+. SnO2+ species were not detected. The deposition rate decreased by using gas mixtures with oxygen as well as the corresponding amount of Sn-related species in the plasma. The increase of oxygen also increased significantly the sheet resistance of the films. The XPS study showed that the iron concentration decreased by using additional oxygen. But the O/Sn ratio in the coatings was constant, contrary to the increased FeO/Fe ratio in the films. An additional analysis of the coatings by spectroscopic ellipsometry has shown a dependence of the polarizability and the permittivity on the amount of oxygen used during the deposition. In contrast, the study has found no such dependence for the absorption of the layers. KW - Coatings KW - Magnetron sputtering KW - Optical properties KW - Sheet resistivity KW - SnO2 PY - 2016 UR - http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532882/full DO - https://doi.org/10.1002/pssa.201532882 SN - 0031-8965 SN - 1862-6300 VL - 213 IS - 9 SP - 2303 EP - 2309 PB - WILEY-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-38106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of doped SnOx layers for novel SPR-based gas sensors T2 - DPG Frühjahrstagung T2 - DPG Frühjahrstagung CY - Regensburg, Germany DA - 2016-03-06 PY - 2016 AN - OPUS4-35274 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of metal doped SnOx thin films for SPREE-based gas sensors T2 - EMRS Spring Meeting T2 - EMRS Spring Meeting CY - Lille, France DA - 2016-05-02 PY - 2016 AN - OPUS4-35275 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of doped SnOx layer for gas sensors based on SPREE (surface plasmon resonance enhanced ellipsometry). T2 - International conference on spectroscopic ellipsometry (ICSE 7) T2 - International conference on spectroscopic ellipsometry (ICSE 7) CY - Berlin, Germany DA - 2016-06-06 PY - 2016 AN - OPUS4-35276 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of Fe-doped SnO2 layers for novel SPR-based gas sensors T2 - Workshop Ellipsometry 2015 T2 - Workshop Ellipsometry 2015 CY - Enschede, The Netherlands DA - 2015-02-25 PY - 2015 AN - OPUS4-32112 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kormunda, M. A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Sebik, M. A1 - Pavlik, J. A1 - Esser, N. T1 - Deposition and characterization of single magnetron deposited Fe:SnOx coatings JF - Thin solid films N2 - Coatings deposited by magnetron co-sputtering from a single RF magnetron with a ceramic SnO2 target with iron inset in argon plasma were studied. The mass spectra of the process identified Sn+ and SnO+ species as the dominant species sputtered from the target, but no SnO2+ species were detected. The dominant positive ions in argon plasma are Ar+ species. The only detected negative ions were O-. Sputtered neutral tin related species were not detected. Iron related species were also not detected because their concentration is below the detection limit. The concentration of iron dopant in the tin oxide coatings was controlled by the RF bias applied on the substrate holder while the discharge pressure also has some influence. The iron concentration was in the range from 0.9 at.% up to 19 at.% increasing with the substrate bias while the sheet resistivity decreases. The stoichiometry ratio of O/(Sn + Fe) in the coatings increased from 1.7 up to 2 in dependence on the substrate bias from floating bias (- 5 V) up to - 120 V of RF self-bias, respectively. The tin in the coatings was mainly bonded in Sn4 + state and iron was mainly in Fe2 + state when other tin bonding states were detected only in a small amounts. Iron bonding states in contrary to elemental compositions of the coatings were not influenced by the RF bias applied on the substrate. The coatings showed high transparency in the visible spectral range. However, an increased metallic behavior could be detected by using a higher RF bias for the deposition. The X-ray diffraction patterns and electron microscopy pictures made on the coatings confirmed the presence of an amorphous phase. KW - Metal oxides KW - Transparent conductive oxides (TCO) KW - Magnetron KW - Optical properties KW - Ellipsometry KW - XPS characterzation PY - 2015 DO - https://doi.org/10.1016/j.tsf.2015.11.009 SN - 0040-6090 VL - 595 IS - Part A SP - 200 EP - 208 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-35281 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of Fe-doped SnOx thin films for SPREE-based gas sensors T2 - EMRS 2015 T2 - EMRS 2015 CY - Lille, France DA - 2015-05-11 PY - 2015 AN - OPUS4-32955 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. A1 - Esser, N. T1 - Ellipsometric characterization of Fe-doped SnO2 layers for SPR-based gas sensors T2 - Kolloquium des ISAS e. V. T2 - Kolloquium des ISAS e. V. CY - Berlin, Deutschland DA - 2015-03-04 PY - 2015 AN - OPUS4-32941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Nooke, A. A1 - Weise, Matthias A1 - Beck, Uwe A1 - Kormunda, M. T1 - Doped Tin Oxide layers as sensitising layers in optical gas sensors: A study of optical properties using spectral ellipsometry T2 - European Material Research Society (E-MRS) - Spring Meeting 2014 T2 - European Material Research Society (E-MRS) - Spring Meeting 2014 CY - Lille, France DA - 2014-05-26 PY - 2014 AN - OPUS4-30109 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Nooke, A. A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Kormunda, M. T1 - Gas sensor using the SPR effect detected by ellipsometry T2 - 8th Workshop Ellipsometry T2 - 8th Workshop Ellipsometry CY - Dresden, Germany DA - 2014-03-10 PY - 2014 AN - OPUS4-31912 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Nooke, A. A1 - Hertwig, Andreas A1 - Weise, Matthias A1 - Beck, Uwe A1 - Kormunda, M. T1 - Doped tin oxide layers as sensitising layers in optical gas sensors T2 - ISAS Kolloquium T2 - ISAS Kolloquium CY - Berlin, Germany DA - 2014-06-30 PY - 2014 AN - OPUS4-31913 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Daniel A1 - Nooke, Alida A1 - Hertwig, Andreas A1 - Weise, Matthias A1 - Beck, Uwe A1 - Kormunda, M. T1 - Doped Tin Oxide Layers as sensitising Layers in optical gas sensors: A study of optical properties using spectral ellipsometry T2 - 14th International Conference on Plasma Surface Engineering (PSE 2014) T2 - 14th International Conference on Plasma Surface Engineering (PSE 2014) CY - Garmisch-Partenkirchen, Germany DA - 2014-09-15 PY - 2014 AN - OPUS4-31547 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -