TY - JOUR A1 - Zier, M. A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Radtke, Martin A1 - Munnik, F. T1 - Accurate stopping power determination of 15N ions for hydrogen depth profiling by a combination of ion beams and synchrotron radiation N2 - Hydrogen analysis is of particular importance in thin film technology and it is often necessary to obtain a depth profile. The method with the best depth resolution is NRA using the 6385 keV resonance of the 1H(15N,αγ)12C nuclear reaction. The correct quantification of the depth and concentration scales in the measured hydrogen profiles relies on accurate stopping power values. We present a method to deduce these values from a combination of two techniques: NRA and X-ray reflectometry (XRR). This method is applied to the determination of the stopping power of ~6.4 MeV 15N ions in H-containing amorphous Si-layers (a-Si:H). Density-independent stopping powers at different H concentrations are determined by combining the results from NRA and XRR with an overall uncertainty of 3.3%, showing good agreement with SRIM values. This work shows exemplary the methodology for future evaluation of stopping powers for quality assurance in NRA. KW - Nuclear reaction analysis KW - Hydrogen depth profiling KW - Stopping cross section KW - Linear energy transfer KW - Synchrotron radiation KW - XRR PY - 2012 U6 - https://doi.org/10.1016/j.nimb.2011.07.027 SN - 0168-583X SN - 1872-9584 VL - 273 SP - 18 EP - 21 PB - Elsevier CY - Amsterdam AN - OPUS4-25722 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munnik, F. A1 - Cabral, A. R. A1 - Lehmann, B. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich T1 - Iodine detection in a heavy matrix, a comparison of PIXE and XRF T2 - 12th International Conference on Nuclear Microprobe Technology and Applications CY - Leipzig, Germany DA - 2010-07-26 PY - 2010 AN - OPUS4-21035 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cabral, A.R. A1 - Radtke, Martin A1 - Munnik, F. A1 - Lehmann, B. A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Tupinambá, M. A1 - Kwitko-Ribeiro, R. T1 - Iodine in alluvial platinum-palladium nuggets: evidence for biogenic precious-metal fixation N2 - Synchrotron radiation-induced X-ray fluorescence (SR-XRF) spectrometry was applied to determine iodine concentrations in alluvial Pt–Pd aggregates with delicate morphological features from Córrego Bom Sucesso, Minas Gerais, Brazil. The millimetre-sized botryoidal and rod-shaped grains of alluvial Pt–Pd–Hg intermetallic compounds have surprisingly high concentrations of iodine, in the range from 10 to ~ 120 μg/g. Because iodine is a strongly biophile element, known to be enriched in peatlands and plant remains in soils by microbial activity, its concentration in the Pt–Pd nuggets suggests biogenic precious-metal fixation in the aqueous alluvial milieu. Biogenic and inorganic processes, such as bioreduction and electrochemical metal accretion, could mutually have contributed to the growth of nanoparticles, formed on organic templates, to millimetric Pt–Pd nuggets. KW - Lodine KW - Pt-Pd nuggets KW - Córrego Bom Sucesso KW - Minas Gerais KW - Brazil PY - 2011 U6 - https://doi.org/10.1016/j.chemgeo.2010.12.003 SN - 0009-2541 SN - 1872-6836 VL - 281 IS - 1-2 SP - 125 EP - 132 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-23174 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe A1 - Munnik, F. A1 - Michalak, P. P. A1 - Radtke, Martin A1 - Buzanich, Günter A1 - Merchel, S. A1 - Renno, A. D. A1 - Riesemeier, Heinrich T1 - Spatially-resolved analysis of natural minerals as carriers of high-tech metals and Rare Earth Elements: comparison of EPMA, PIXE and Sy-µXRF T2 - 13th INTERNATIONAL CONFERENCE ON NUCLEAR MICROPROBE TECHNOLOGY & APPLICATIONS 2012 CY - Lisbon, Portugal DA - 2012-07-22 PY - 2012 AN - OPUS4-26962 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nowak, S.H. A1 - Bjeoumikhov, A. A1 - Von Borany, J. A1 - Buchriegler, J. A1 - Munnik, F. A1 - Petric, M. A1 - Renno, A.D. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Strüder, L. A1 - Wedell, R. A1 - Ziegenrücker, R. T1 - Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera N2 - We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5µm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector. KW - X-ray KW - Color X-ray camera KW - CXC KW - Synchrotron radiation KW - BESSY KW - BAMline PY - 2015 U6 - https://doi.org/10.1002/xrs.2590 SN - 0049-8246 VL - 44 IS - 3 SP - 135 EP - 140 PB - Wiley & Sons, Ltd. CY - Chichester AN - OPUS4-33170 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nowak, S.H. A1 - Bjeoumikhov, A. A1 - Von Borany, J. A1 - Buchriegler, J. A1 - Munnik, F. A1 - Petric, M. A1 - Radtke, Martin A1 - Renno, A.D. A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Wedell, R. T1 - Sub-pixel resolution with a color X-ray camera N2 - The color X-ray camera SLcam® is a full-field, single photon detector providing scanning-free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with the use of polycapillary optics guiding X-ray photons from small regions on a sample to distinct energy dispersive pixels on a charged-coupled device detector. Applying sub-pixel resolution, signals from individual capillary channels can be distinguished. Therefore, the SLcam® spatial resolution, which is normally limited to the pixel size of the charge-coupled device, can be improved to the size of individual polycapillary channels. In this work a new approach to a sub-pixel resolution algorithm comprising photon events also from the pixel centers is proposed. The details of the employed numerical method and several sub-pixel resolution examples are presented and discussed. KW - Color X-ray camera KW - Sub pixel analysis PY - 2015 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-334948 SN - 0267-9477 SN - 1364-5544 SP - 1890 EP - 1897 PB - Royal Society of Chemistry CY - London AN - OPUS4-33494 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Nowak, S. H. A1 - Petric, M. A1 - Buchriegler, J. A1 - Bjeoumikhov, A. A1 - Bjeoumikhova, Z. A1 - von Borany, J. A1 - Munnik, F. A1 - Radtke, Martin A1 - Renno, A. D. A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Tilgner, J. A1 - Wedell, R. T1 - Road to micron resolution with a color X-ray camera – polycapillary optics characterization N2 - In a color X-ray camera spatial resolution is achieved by means of a polycapillary optic conducting X-ray photons from small regions on a sample to distinct energy dispersive pixels on a CCD matrix. At present, the resolution limit of color X-ray camera systems can go down to several microns and is mainly restricted by Pixel dimensions. The recent development of an efficient subpixel resolution algorithm allows a release from pixel size, limiting the resolution only to the quality of theoptics. In this work polycapillary properties that influence the spatial resolution are systematized and assessed both theoretically and experimentally. It is demonstrated that with the current technological Level reaching one micron resolution is challenging, but possible. KW - Color X-ray camera KW - Polycapillary optics PY - 2017 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-404404 UR - https://arxiv.org/abs/1705.08939 SN - 2331-8422 SP - 1 EP - 11 PB - Cornell University CY - Ithaca, NY AN - OPUS4-40440 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -