TY - JOUR A1 - Guerra, M. F. A1 - Radtke, Martin A1 - Reiche, I. A1 - Riesemeier, Heinrich A1 - Strub, Erik T1 - Analysis of trace elements in gold alloys by SR-XRF at high energy at the BAMline JF - Nuclear instruments and methods in physics research B N2 - Measuring in a non-destructive way the characteristic trace elements of the metal allows following the circulation of gold in the past. The aim of this work is to probe the possibilities of X-ray fluorescence with high energy synchrotron radiation (SR-XRF) at the BAMline at BESSY II to determine the concentration of Pt in ancient gold alloys. A HP-Ge detector was used to measure the Pt K-lines excited with an incident energy of 79.5 keV. Data processing was done by subtraction of a Pt free gold standard spectrum from the spectrum of the sample. Depending on the sample composition, the MDL ranges between 40 and 90 ppm. The first results obtained for a small set of gold alloys of different thickness, size and composition showed that high energy SR-XRF is a significant method for the non-destructive determination of Pt in gold. KW - SR-XRF KW - Gold KW - Provenancing KW - Trace elements PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.008 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2334 EP - 2338 PB - Elsevier CY - Amsterdam AN - OPUS4-17735 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reinholz, Uwe A1 - Bremser, Wolfram A1 - Brzezinka, Klaus-Werner A1 - Strub, Erik A1 - Weise, Hans-Peter A1 - Merchel, Silke T1 - A thin-layer reference material for hydrogen analysis JF - Nuclear instruments and methods in physics research B N2 - In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials – depending on the deposition process – and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (1–2 µm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:H–Si) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison. KW - Hydrogen KW - Nuclear reaction analysis KW - Depth profiling KW - Reference material KW - Ion beam analysis PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.015 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2418 EP - 2423 PB - Elsevier CY - Amsterdam AN - OPUS4-17553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Strub, Erik A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Reznikova, E. T1 - Measurements with compound refractive lenses at the "BAMline" JF - Nuclear instruments and methods in physics research B N2 - A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut für Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that beam diameters below 1 µm can be obtained. The beam size accepted by the lenses is (140 × 140) µm2, thus the intensity gain in the micrometer spot, including absorption, is about 15,000. It is possible to switch between different beam energies within a few minutes. First results of scans and the application of the lenses for MicroXANES (X-ray absorption near-edge structure) measurements are presented in this paper. Also, the possibility of MicroEXAFS (extended X-ray absorption fine structure) measurements is discussed. KW - X-ray optics KW - XANES KW - EXAFS KW - XAS KW - XRF KW - Speciation PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.02.057 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2165 EP - 2168 PB - Elsevier CY - Amsterdam AN - OPUS4-17554 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Strub, Erik A1 - Plarre, Rüdiger A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Schoknecht, Ute A1 - Urban, Klaus A1 - Jüngel, P. T1 - Determination of Cr(VI) in wood specimen: A XANES study at the Cr K edge JF - Nuclear instruments and methods in physics research B N2 - The content of chromium in different oxidation states in chromium-treated wood was studied with XANES (X-ray absorption near-edge structure) measurements at the Cr K absorption edge. It could be shown that wood samples treated with Cr(VI) (pine and beech) did still contain a measurable content of Cr(VI) after four weeks conditioning. If such wood samples were heat exposed for 2 h with 135 °C prior conditioning, Cr(VI) was no longer detected by XANES, indicating a complete reduction to chromium (III). KW - X-ray spectroscopy KW - XANES KW - XAS KW - XRF KW - Specifikation KW - Reduction PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.011 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2405 EP - 2407 PB - Elsevier CY - Amsterdam AN - OPUS4-17555 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Allsop, N. A. A1 - Schönmann, A. A1 - Belaidi, A. A1 - Muffler, H.-J. A1 - Mertesacker, B. A1 - Bohne, W. A1 - Strub, Erik A1 - Röhrich, J. A1 - Lux-Steiner, M. C. A1 - Fischer, C.-H. T1 - Indium sulfide thin films deposited by the spray ion layer gas reaction technique JF - Thin solid films N2 - The Spray Ion Layer Gas Reaction (Spray-ILGAR) technique is a new variation on the ILGAR technique used to prepare chalcogenide thin films. High quality indium sulfide thin films were produced by Spray-ILGAR with an indirect bandgap of 2.2 eV and a high suitability for use as buffer layers in chalcopyrite solar cells. The process involves the cyclical spray deposition of an indium containing precursor layer followed by its conversion to sulfide using hydrogen sulfide gas. Analysis of the deposition reveals that the indium chloride based precursor is transported via the vapour phase from the spray droplets to the substrate surface. KW - Spray deposition KW - Indium sulfide KW - Ion layer gas reaction KW - ILGAR KW - X-ray diffraction KW - X-ray fluorescence KW - Deposition process PY - 2006 DO - https://doi.org/10.1016/j.tsf.2006.01.019 SN - 0040-6090 VL - 513 IS - 1-2 SP - 52 EP - 56 PB - Elsevier CY - Amsterdam AN - OPUS4-14267 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Thamm, T. A1 - Wett, D. A1 - Bohne, W. A1 - Strub, Erik A1 - Röhrich, J. A1 - Szargan, R. A1 - Marx, G. A1 - Goedel, W.A. T1 - Investigations on PECVD boron carbonitride layers by means of ERDA, XPS and nano-indentation measurements JF - Microchimica acta N2 - The deposition of boron carbonitride layers on silicon substrates by a microwave plasma enhanced chemical vapour deposition (MW-PECVD) process using N-trimethylborazine (TMB) and benzene as precursors is presented. As plasma gases argon and nitrogen were used. In this investigation we focus on the influence of the gas composition, substrate temperature and -bias on the layer composition, layer structure as well as the thermal stability. The films were analyzed with respect to their composition and bonding structure using elastic recoil detection analysis (ERDA) and X-ray photoelectron spectroscopy (XPS). Furthermore, nanoindentation measurements before and after annealing tests at 500 and 700°C were performed. The measurements show a strong dependence of the structure and mechanical properties on the substrate temperature. The hydrogen content strongly decreases to 8 at.% with higher substrate temperatures. Simultaneously, the layer hardness and Young’s modulus increase up to 21 and 173 GPa, respectively. The hardness does not decrease after annealing for 1 hour at 700°C. KW - BCN KW - PECVD KW - XPS KW - ERDA KW - Hardness KW - Annealing tests PY - 2006 DO - https://doi.org/10.1007/s00604-006-0702-y SN - 0026-3672 SN - 1436-5073 VL - 156 IS - 1-2 SP - 53 EP - 56 PB - Springer CY - Wien AN - OPUS4-14268 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Strub, Erik A1 - Bohne, W. A1 - Röhrich, J. T1 - Determination of the energy loss of various elements in metal foils with the TOF-ERDA setup at the ISL Berlin JF - Nuclear instruments and methods in physics research B N2 - The TOF-ERDA setup at the ISL Berlin was used to perform precise energy loss measurements of scattered ions. Different samples were irradiated with a 350 MeV Au beam and the TOF of the recoiled elements was measured without and with an additional metal stopping foil (Fe, Ag or Au) behind the target. The energy loss of the different elements in these foils was derived from the shift of the high energy edges of the spectra. The values are mainly consistent with the semi-empirical Ziegler/Biersack data. Deviations, trends and possible errors are discussed. KW - ERDA KW - Stopping power KW - Energy loss PY - 2006 DO - https://doi.org/10.1016/j.nimb.2006.03.079 SN - 0168-583X SN - 1872-9584 VL - 249 IS - 1-2 SP - 62 EP - 64 PB - Elsevier CY - Amsterdam AN - OPUS4-14269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Martínez, F.L. A1 - Toledano, M. A1 - San Andrés, E. A1 - Mártil, I. A1 - González-Díaz, G. A1 - Bohne, W. A1 - Röhrich, J. A1 - Strub, Erik T1 - Compositional analysis of polycrystalline hafnium oxide thin films by heavy-ion elastic recoil detection analysis JF - Thin solid films KW - Hafnium oxide KW - Elastic recoil detection analysis KW - Oxygen KW - Interfacial silicon oxide PY - 2006 SN - 0040-6090 VL - 515 IS - 2 SP - 695 EP - 699 PB - Elsevier CY - Amsterdam AN - OPUS4-14270 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gavrilov, S. A1 - Oja, I. A1 - Lim, B. A1 - Belaidi, A. A1 - Bohne, W. A1 - Strub, Erik A1 - Röhrich, J. A1 - Lux-Steiner, M.C. A1 - dittrich, T. T1 - Charge selective contact on ultra-thin In(OH)xSy/Pb(OH)xSy heterostructure prepared by SILAR JF - Physica status solidi A N2 - Ultra-thin In(OH)x Sy/Pb(OH)x Sy heterostructures were formed by the wet chemical SILAR (successive ion layer adsorption and reaction) technique. ERDA (elastic recoil detection analysis) was used for stoichiometry analysis. The heterocontacts were conditioned by joint annealing of the two layers at different low temperatures in air. The charge selectivity was demonstrated with various small area solar cell structures. The results are discussed on the base of formation of bonds between sulphide clusters and passivation of defects with hydrogen containing species in hydroxy-sulphides. PY - 2006 DO - https://doi.org/10.1002/pssa.200521468 SN - 1862-6300 SN - 0031-8965 VL - 203 IS - 5 SP - 1024 EP - 1029 PB - Wiley-VCH CY - Berlin AN - OPUS4-14217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chromik, S. A1 - Huran, J. A1 - Strbík, V. A1 - Spanková, M. A1 - Vávra, I. A1 - Bohne, W. A1 - Röhrich, J. A1 - Strub, Erik A1 - Kovác, P. A1 - Stancek, S. T1 - Nanogranular MgB2 thin films on SiC buffered Si substrates prepared by an in situ method JF - Superconductor science and technology N2 - MgB2 thin films were deposited on SiC buffered Si substrates by sequential electron beam evaporation of a B–Mg bilayer followed by in situ annealing. The application of a SiC buffer layer enables the maximum annealing temperature of 830 °C to be reached. Transmission electron microscopy analysis confirms the growth of a nanogranular MgB2 film and the presence of a Mg2Si compound at the surface of the film. The 150–200 nm thick films show a maximum zero resistance critical temperature TC0 above 37 K and a critical current density JC~106 A cm-2 at 11 K. PY - 2006 DO - https://doi.org/10.1088/0953-2048/19/6/027 SN - 0953-2048 SN - 1361-6668 VL - 19 IS - 6 SP - 577 EP - 580 PB - IOPP CY - Bristol AN - OPUS4-14443 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Strub, Erik A1 - Riesemeier, Heinrich A1 - Radtke, Martin T1 - SRXRF zur Zertifizierung von Referenzmaterialien T2 - SAAGAS 21 - Seminar Aktivierungsanalyse und Gammaspektroskopie T2 - SAAGAS 21 - Seminar Aktivierungsanalyse und Gammaspektroskopie CY - Mainz, Germany DA - 2007-03-21 PY - 2007 AN - OPUS4-14669 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Strub, Erik A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich T1 - Determination of Cr(VI) in wood specimen: a XANES study T2 - Ecaart 9 T2 - Ecaart 9 CY - Florence, Italy DA - 2007-09-03 PY - 2007 AN - OPUS4-16394 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Strub, Erik A1 - Radtke, Martin A1 - Riesemeier, Heinrich A1 - Reinholz, Uwe T1 - Measurements with compound refractive lenses at the "BAMline" T2 - Ecaart 9 T2 - Ecaart 9 CY - Florence, Italy DA - 2007-09-03 PY - 2007 AN - OPUS4-16383 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Strub, Erik A1 - Born, H. T1 - Neues vom Berliner Goldhut: Materialanalysen mit Synchrotronstrahlung JF - Acta praehistorica et archaeologica KW - Sy-RFA KW - Berliner Goldhut PY - 2009 SN - 0341-1184 VL - 41 SP - 29 EP - 35 PB - Marie Leidorf GmbH CY - Berlin AN - OPUS4-20271 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -