TY - CONF A1 - Ortel, Erik A1 - Fischer, A. A1 - Chuenchom, L. A1 - Polte, Jörg A1 - Smarsly, B. A1 - Krähnert, R. T1 - Mesoporous metal oxide films with controlled pore size, wall thickness and pore hierarchy templated by PEO-b-PB-b-PEO triblock copolymers T2 - 24. Deutsche Zeolith- Tagung CY - Magdeburg, Germany DA - 2012-03-07 PY - 2012 AN - OPUS4-25122 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Mesopoous metal oxide films with controlled pore size, wall thickness and pore hierarchy templated by PEO-b-PEO triblock copolymers T2 - 24. Deutsche Zeolith -Tagung CY - Magdeburg, Germany DA - 2012-03-07 PY - 2012 AN - OPUS4-25717 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Determination of Thin Film Porosity by SEM/EDX: Application to mesoporous TiO2 layers T2 - International summer workshop "Nanoscience meets Metrology" CY - Erice (Sicily) Italy DA - 2015-07-27 PY - 2015 AN - OPUS4-34703 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Thin Film Porosity Determined by X-Rays at SEM: Application to mesoporous T2 - Bruker Seminartage zur Mikroanalyse CY - Berlin DA - 2015-10-14 PY - 2015 AN - OPUS4-34740 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Improved Spatial Resolution of EDX/SEM for the Elemental Analysis of Nanoparticles T2 - Microscopy & Microanalysis 2015 CY - Portland, Oregon, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-33870 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Charakterisierung von TiO2-Nanopartikeln mit kontrollierter Form mittels Rasterelektronenmikroskopie (SEM und TSEM) T2 - Methoden zur Präparation von Partikeln auf Substraten und Strategien zur Messung mit Elektronenmikroskopie (SEM) und Rasterkraftmikroskopie (AFM) CY - Berlin, Germany DA - 2014-07-07 PY - 2014 AN - OPUS4-31065 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Imaging of shape-engineered TiO2 nanoparticles by high-resolution SEM/EDX T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33242 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - SEM/EDX for the Determination of Thin Film Porosity: Application to mesoporous TiO2 layers T2 - MC2015 CY - Göttingen DA - 2015-09-06 PY - 2015 AN - OPUS4-34707 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Determination of porosity of highly porous thin films by combined SEM-EDS analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33244 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Accurate Shape and Size Determination of Engineered NPs by Electron Microscopy (SEM, T-SEM, TEM, SAED) T2 - MC2015 CY - Göttingen DA - 2015-09-06 PY - 2015 AN - OPUS4-34706 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Determination of porosity of highly porous thin films by combined SEM-EDS analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33245 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Thin Film Porosity Determined by X-Rays at SEM T2 - Microscopy & Microanalysis 2015 Meeting CY - Portland, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-34708 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Shape recognition of nanoparticles by high-resolution SEM and TSEM T2 - Microscopy & Microanalysis 2015 Meeting CY - Portland, USA DA - 2015-08-02 PY - 2015 AN - OPUS4-34709 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Shape recognition of nanoparticles by high-resolution SEM and TSEM T2 - International summer workshop Nanoscience meets Metrology CY - Erice, Italy DA - 2015-07-27 PY - 2015 AN - OPUS4-34705 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ortel, Erik T1 - Structural Characterization of Shape-engineered TiO2 Nanoparticles by XRD and SAED T2 - International summer workshop Nanoscience meets Metrology CY - Erice, Italy DA - 2015-07-27 PY - 2015 AN - OPUS4-34704 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -