TY - CONF A1 - Schulz, Eckhard T1 - Tailored Ferroelectric Mikro- and Nanostructures by DPL T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6536 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Determination of electric properties of heterogeneous systems using the contact and non-contact force microscopy (SFM) T2 - 9th International Symposium on Electrets (ISE9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 AN - OPUS4-6404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces KW - Carbon fibre KW - Surface analysis KW - Conductivity microscopy KW - Scanning force microscopy KW - Scanning tunneling microscopy KW - Fiber surfaces PY - 1996 SN - 1359-835X VL - 27 IS - 9 SP - 677 EP - 684 PB - Elsevier CY - Oxford AN - OPUS4-6849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Zuverlässigkeit von Polymer-Werkstoffen - Interphasen nanoskopisch betrachtet T2 - 3. Workshop "Rasterkraftmikroskopie in der Werkstoffwissenschaft" CY - Berlin, BAM, Deutschland DA - 2002-02-28 PY - 2002 SP - 14 AN - OPUS4-1831 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Ferroelectric Mikro- and Nanostructures by DPL T2 - EDO Tagung CY - Wuppertal, Germany DA - 2002-09-10 PY - 2002 AN - OPUS4-6535 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and thermoplastic polymer T2 - The 13th European Microscopy Congress "EMC2004", veranstaltet von der "European Microscopy Society" (EMS) CY - Antwerp, Belgium DA - 2004-08-23 PY - 2004 AN - OPUS4-4154 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and copper electrodes T2 - The 13th European Microscopy Congress "EMC2004", veranstaltet von der "European Microscopy Society" (EMS) CY - Antwerp, Belgium DA - 2004-08-23 PY - 2004 AN - OPUS4-4150 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Lokale dynamische Reibungskontraste mittels sinusförmiger Vibration in der SFM T2 - Dreiländertagung: Elektronenmikroskopie CY - Regensburg, Germany DA - 1997-09-08 PY - 1997 AN - OPUS4-6441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Nanolithography on Polymeric Surfaces T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6534 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reliability of polymer based composites - interfaces and interphases from the nanomechanical point of view T2 - 15th International Congress on Electron Microscopy (ICEM) CY - Durban, South Africa DA - 2002-09-01 PY - 2002 SN - 0-620-29294-6 SP - 619 EP - 620 PB - Microscopy Society of Southern Africa CY - Onderstepoort AN - OPUS4-1833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. ED - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 DO - https://doi.org/10.1109/ISE.1996.578094 SP - 334 EP - 339 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Untersuchungen von Polymeroberflächen mittels dynamischer Lateralkraftexperimente T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6444 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit lokalem Leitfähigkeitskontrast zur Oberflächenanalyse von Kohlefaseroberflächen und plasmapolymerisierten dünnen Schichten PY - 1995 SN - 0340-3815 VL - 28 SP - 51 EP - 58 PB - Remy CY - Münster, Westf. AN - OPUS4-6847 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Oberflächencharakterisierung von Fasern und Interphasen mittels SFM-Techniken T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6443 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and copper electrodes T2 - 35. EDO-Herbsttagung, veranstaltet vom Arbeitskreis "Elektronenoptische Direktabbildung und Analyse von Oberflächen" (EDO) der Deutschen Ges. für Elektronenmikroskopie e.V. CY - Wuppertal, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-4162 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Investigations of the mechanical behaviour of heterogeneous polymeric systems and fibre reinforced composites using micro indentation and scanning force microscopy T2 - Special Lectures, 18. Disc. Conf. And 56the PMM.: Mech. Behaviour of polymeric materials CY - Prague, Czech Republic DA - 1998-07-20 PY - 1998 AN - OPUS4-12092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Reliability of Polymer Based Composites T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Schulz, Eckhard A1 - Weidner, Steffen A1 - Kühn, Gerhard T1 - Verbesserungen der mechanischen Festigkeiten von Faser-Polymer-Verbundwerkstoffen durch Vorbehandlung der Fasern im Niederdruckplasma T2 - Vortragsbände des 8. Internationalen Techtextil-Symposiums 1997 CY - Frankfurt am Main, Deutschland DA - 1997-05-12 PY - 1997 VL - 8 SP - 1(?) EP - 16(?) PB - Messe Frankfurt CY - Frankfurt am Main AN - OPUS4-7287 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Schulz, Eckhard A1 - Weidner, Steffen A1 - Kühn, Gerhard T1 - Improvement in Mechanical Strength of Fibre Polymer Composites by Fibre Pretreatment in Low-Pressure Plasmas T2 - Vortragsbände des 8. Internationalen Techtextil-Symposiums 1997 CY - Frankfurt am Main, Deutschland DA - 1997-05-12 PY - 1997 SP - 1(?) EP - 16(?) PB - Messe Frankfurt CY - Frankfurt am Main AN - OPUS4-7286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Falkenhagen, Jana A1 - Jancke, Harald A1 - Krüger, Ralph-Peter A1 - Rikowski, Eckhard A1 - Schulz, Günter T1 - Characterization of Silsesquioxanes by Size-exclusion chromatography and matrix-assisted laser desorption/ionization time-of-flight mass spectrometry N2 - Liquid chromatography in combination with spectroscopic methods like matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOFMS) or nuclear magnetic resonance (NMR) spectroscopy is a powerful method to characterize silsesquioxanes and silsesquioxane mixtures. As new examples, the formation of silsesquioxyl-substituted silsesquioxanes [(n-octyl)7(SiO1.5)8]2O and [(n-octyl)7(SiO1.5)8O]2[(n-octyl)6(SiO1.5)8] as well as the cage rearrangement of octa-[(n-heptyl)silsesquioxane] to larger structur es [(n-heptyl)SiO1.5)]n up to n=28 are shown. PY - 2003 DO - https://doi.org/10.1002/rcm.911 SN - 0951-4198 SN - 1097-0231 VL - 17 IS - 4 SP - 285 EP - 290 PB - Wiley CY - Chichester AN - OPUS4-2182 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Falkenhagen, Jana A1 - Krüger, Ralph-Peter A1 - Rikowski, Eckhard A1 - Schulz, Günter A1 - Friedrich, Jörg Florian ED - Grellmann, W. T1 - Synthesis and Characterisation of Polyhedral Silsesquioxanes with Nanotubular Structures T2 - 23. DVM-Vortrags- und Diskussionstagung "Werkstoffprüfung 2005", DA - 2005-12-01 PY - 2005 SP - 25 EP - 30 PB - DVM AN - OPUS4-11947 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -