TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Interphase Characterization via the Stiffness Contrast of a Scanning Force Microscope in Displacement Modulation Mode N2 - The physical properties as well as the thickness of the interphase between polymer and reinforcing phase are generally expected to show a strong influence on the macroscopic mechanical properties of composite materials. In this study the scanning force microscope (SFM) has been applied for detecting stiffness gradients near the interface between copper and epoxide. In displacement modulation mode the load exerted by the tip is modulated sinusoidally by vibrating the normal position of the cantilever or the sample. The corresponding amplitude of dynamic cantilever bending is related to local surface stiffness. Thus, using the SFM, the local mechanical properties of the surface under investigation can be probed. When scanning the tip across the reinforcement/polymer interface, the polymeric interphasial zone can be identified with the observed stiffness gradient. For a commercial epoxide based on diglycidyl ether of bisphenol A (DGEBA) cured with an amine-containing hardener, a stiffness gradient was detected that could be fitted by a Gaussian profile typical for diffusional processes. The width of the stiffness gradient was 280 nm. The observation is discussed in terms of interface-induced segregation processes between resin and hardener, as well as heat conduction mechanisms that can occur during the exothermic curing reaction. Both mechanisms are diffusional in nature and, via the local network structure, are expected to show some influence on the local stiffness of the cured epoxy. Copyright © 2000 John Wiley & Sons, Ltd. T2 - ECASIA 99 CY - Sevilla, Spain DA - 1999-10-04 KW - Scanning Force Microscopy KW - Surface properties KW - Nanomechanics KW - Interface/Interphase KW - Polymer-matrix composites (PMCs) KW - Adherends PY - 2000 DO - https://doi.org/10.1002/1096-9918(200008)30:1<410::AID-SIA846>3.0.CO;2-G SN - 0142-2421 SN - 1096-9918 VL - 30 IS - 1 SP - 410 EP - 414 PB - Wiley CY - Chichester AN - OPUS4-873 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Der dynamische Lateralkontrast als Methode zur Charakterisierung von Polymeroberflächen T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6419 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Use of scanning force microscopy studies with combined friction, stiffness and thermal diffusivity contrasts for microscopic characterization of automotive brake pads KW - Antimony sulphide KW - Polybutadiene KW - Phenolic resin KW - SFM/AFM KW - Friction KW - Thermal diffusivity PY - 2002 DO - https://doi.org/10.1002/sia.1171 SN - 0142-2421 SN - 1096-9918 VL - 33 IS - 2 SP - 100 EP - 107 PB - Wiley CY - Chichester AN - OPUS4-1293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves N2 - Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by force–displacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Force–displacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail. KW - AFM KW - Lithography KW - Force-displacement curves KW - Stiffness KW - Adhesion KW - Elasto-plastic response PY - 2002 DO - https://doi.org/10.1163/156856102760136472 SN - 0169-4243 SN - 1568-5616 VL - 16 IS - 7 SP - 921 EP - 933 PB - VNU Science Press CY - Utrecht AN - OPUS4-1609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Methods for simultaneous measurements of topography and local electric properties using SFM T2 - Dreiländertagung: Elektronenmikroskopie CY - Regensburg, Germany DA - 1997-09-08 PY - 1997 AN - OPUS4-6442 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Eltanany, Gehan A1 - Sturm, Heinz A1 - Schulz, Eckhard ED - Degischer, H.-P. T1 - Interphasial stiffness gradients in polymer materials T2 - Symposium Verbundwerkstoffe und Werkstoffverbunde CY - Wien, Österreich DA - 2003-07-02 PY - 2003 SN - 3-527-30762-1 PB - Wiley-VCH CY - Weinheim AN - OPUS4-2525 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Methoden zur simultanen Messung der Topographie und lokalen elektrischen Eigenschaften in der Rasterkraftmikroskopie T2 - Diskussionstagung: Raster-Sonden-Mikroskopien und organische Materialien V CY - Münster, Germany DA - 1996-10-07 PY - 1996 AN - OPUS4-6405 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Investigation on mechanical behaviour of heterogeneous polymeric systems and fibre reinforced composites using micro indentation and scanning force microscopy T2 - 18th Disc. Conf. and 56th PMM CY - Prague, Czech Republic DA - 1998-07-20 PY - 1998 AN - OPUS4-6451 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - "Displacement Modulation" mit kontrollierter Kontaktdeformation T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-10 PY - 1997 AN - OPUS4-6437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Messung lokaler elektrischer Eigenschaften an keramischen Dielectrika T2 - EDO-Kolloquium der DEG CY - Münster, Germany DA - 1996-10-09 PY - 1996 AN - OPUS4-6403 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Interphasial Stiffness Gradients in Polymer Materials T2 - 14. Symposium "Verbundwerkstoffe und Werkstoffverbunde" CY - Vienna, Austria DA - 2003-07-02 PY - 2003 AN - OPUS4-4652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 DO - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Mapping of local mechanical and thermal properties - The Scanning Force Microscope in Tribology T2 - Dreiländertagung für Elektronenmikroskopie CY - Innsbruck, Austria DA - 2001-11-09 PY - 2001 AN - OPUS4-6525 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and a thermoplastic polymer T2 - 35. EDO-Herbsttagung, veranstaltet vom Arbeitskreis "Elektronenoptische Direktabbildung und Analyse von Oberflächen" (EDO) der Deutschen Ges. für Elektronenmikroskopie e.V. CY - Wuppertal, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-4161 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit Leitfähigkeitskontrast zur Oberflächenanalyse von Carbonfaser-Compositen und plasmamodifizierten Jodthiophen auf Si-Wafer T2 - 27. Tagung der Deutschen Gesellschaft für Elektronenmikroskopie CY - Leipzig, Germany DA - 1995-09-10 PY - 1995 AN - OPUS4-6386 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Hinrichsen, G. T1 - The scanning force microscope as a tool for the detection of local mechanical properties within the interphase of fibre reinforced polymers N2 - Scanning force microscopy (SFM) has been used to assess the local mechanical properties of fibre-reinforced polymers. Using a sinusoidal displacement modulation (DM) and lock-in technique the method allows to characterize local viscoelastic properties with a high lateral resolution. The simultaneous measurement of the local electrical conductivity is proposed which facilitates the interpretation of the mechanical data. The investigation of cross-sections perpendicular to the axis of carbon fibres embedded in PPS delivers some information about the change in local stiffness within the interfacial region. As a first approach, assuming a single-exponential decrease in local stiffness along a radial line from fibre to polymer we find characteristic decay lengths which are distributed in a range between 20 and 80nm. Further, a modified DM-mode is proposed which is expected to provide a contrast enhancement of the signal which is related to local stiffness. This can be achieved by installing an additional feedback loop which keeps constant the amplitude of dynamic indentation (CDI-mode). KW - Polymer-matrix composites (PMC´s) KW - Interface/interphase KW - SFM/AFM KW - Surface properties KW - Nondestructive testing PY - 1998 DO - https://doi.org/10.1016/S1359-835X(98)00077-3 SN - 1359-835X VL - 29 SP - 1251 EP - 1259 PB - Elsevier CY - Oxford AN - OPUS4-1294 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard ED - Konsta, A. T1 - Scanning force microscopy investigations on electroactive polymer films N2 - The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields. T2 - 10th IEEE International Symposium on Electrets (ISE) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 SN - 0-7803-5025-1 DO - https://doi.org/10.1109/ISE.1999.832086 SP - 465 EP - 468 PB - IEEE Operations Center CY - Piscataway, NJ AN - OPUS4-6862 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Tailored Ferroelectric Mikro- and Nanostructures by DPL T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6536 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Determination of electric properties of heterogeneous systems using the contact and non-contact force microscopy (SFM) T2 - 9th International Symposium on Electrets (ISE9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 AN - OPUS4-6404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces KW - Carbon fibre KW - Surface analysis KW - Conductivity microscopy KW - Scanning force microscopy KW - Scanning tunneling microscopy KW - Fiber surfaces PY - 1996 SN - 1359-835X VL - 27 IS - 9 SP - 677 EP - 684 PB - Elsevier CY - Oxford AN - OPUS4-6849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Zuverlässigkeit von Polymer-Werkstoffen - Interphasen nanoskopisch betrachtet T2 - 3. Workshop "Rasterkraftmikroskopie in der Werkstoffwissenschaft" CY - Berlin, BAM, Deutschland DA - 2002-02-28 PY - 2002 SP - 14 AN - OPUS4-1831 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Ferroelectric Mikro- and Nanostructures by DPL T2 - EDO Tagung CY - Wuppertal, Germany DA - 2002-09-10 PY - 2002 AN - OPUS4-6535 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and thermoplastic polymer T2 - The 13th European Microscopy Congress "EMC2004", veranstaltet von der "European Microscopy Society" (EMS) CY - Antwerp, Belgium DA - 2004-08-23 PY - 2004 AN - OPUS4-4154 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and copper electrodes T2 - The 13th European Microscopy Congress "EMC2004", veranstaltet von der "European Microscopy Society" (EMS) CY - Antwerp, Belgium DA - 2004-08-23 PY - 2004 AN - OPUS4-4150 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Lokale dynamische Reibungskontraste mittels sinusförmiger Vibration in der SFM T2 - Dreiländertagung: Elektronenmikroskopie CY - Regensburg, Germany DA - 1997-09-08 PY - 1997 AN - OPUS4-6441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Nanolithography on Polymeric Surfaces T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6534 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reliability of polymer based composites - interfaces and interphases from the nanomechanical point of view T2 - 15th International Congress on Electron Microscopy (ICEM) CY - Durban, South Africa DA - 2002-09-01 PY - 2002 SN - 0-620-29294-6 SP - 619 EP - 620 PB - Microscopy Society of Southern Africa CY - Onderstepoort AN - OPUS4-1833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. ED - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 DO - https://doi.org/10.1109/ISE.1996.578094 SP - 334 EP - 339 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Untersuchungen von Polymeroberflächen mittels dynamischer Lateralkraftexperimente T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6444 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit lokalem Leitfähigkeitskontrast zur Oberflächenanalyse von Kohlefaseroberflächen und plasmapolymerisierten dünnen Schichten PY - 1995 SN - 0340-3815 VL - 28 SP - 51 EP - 58 PB - Remy CY - Münster, Westf. AN - OPUS4-6847 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Oberflächencharakterisierung von Fasern und Interphasen mittels SFM-Techniken T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6443 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and copper electrodes T2 - 35. EDO-Herbsttagung, veranstaltet vom Arbeitskreis "Elektronenoptische Direktabbildung und Analyse von Oberflächen" (EDO) der Deutschen Ges. für Elektronenmikroskopie e.V. CY - Wuppertal, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-4162 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Investigations of the mechanical behaviour of heterogeneous polymeric systems and fibre reinforced composites using micro indentation and scanning force microscopy T2 - Special Lectures, 18. Disc. Conf. And 56the PMM.: Mech. Behaviour of polymeric materials CY - Prague, Czech Republic DA - 1998-07-20 PY - 1998 AN - OPUS4-12092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Reliability of Polymer Based Composites T2 - ICEM 15 CY - Durban, South Africa DA - 2002-08-30 PY - 2002 AN - OPUS4-6537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Schulz, Eckhard A1 - Weidner, Steffen A1 - Kühn, Gerhard T1 - Verbesserungen der mechanischen Festigkeiten von Faser-Polymer-Verbundwerkstoffen durch Vorbehandlung der Fasern im Niederdruckplasma T2 - Vortragsbände des 8. Internationalen Techtextil-Symposiums 1997 CY - Frankfurt am Main, Deutschland DA - 1997-05-12 PY - 1997 VL - 8 SP - 1(?) EP - 16(?) PB - Messe Frankfurt CY - Frankfurt am Main AN - OPUS4-7287 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Schulz, Eckhard A1 - Weidner, Steffen A1 - Kühn, Gerhard T1 - Improvement in Mechanical Strength of Fibre Polymer Composites by Fibre Pretreatment in Low-Pressure Plasmas T2 - Vortragsbände des 8. Internationalen Techtextil-Symposiums 1997 CY - Frankfurt am Main, Deutschland DA - 1997-05-12 PY - 1997 SP - 1(?) EP - 16(?) PB - Messe Frankfurt CY - Frankfurt am Main AN - OPUS4-7286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Falkenhagen, Jana A1 - Jancke, Harald A1 - Krüger, Ralph-Peter A1 - Rikowski, Eckhard A1 - Schulz, Günter T1 - Characterization of Silsesquioxanes by Size-exclusion chromatography and matrix-assisted laser desorption/ionization time-of-flight mass spectrometry N2 - Liquid chromatography in combination with spectroscopic methods like matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOFMS) or nuclear magnetic resonance (NMR) spectroscopy is a powerful method to characterize silsesquioxanes and silsesquioxane mixtures. As new examples, the formation of silsesquioxyl-substituted silsesquioxanes [(n-octyl)7(SiO1.5)8]2O and [(n-octyl)7(SiO1.5)8O]2[(n-octyl)6(SiO1.5)8] as well as the cage rearrangement of octa-[(n-heptyl)silsesquioxane] to larger structur es [(n-heptyl)SiO1.5)]n up to n=28 are shown. PY - 2003 DO - https://doi.org/10.1002/rcm.911 SN - 0951-4198 SN - 1097-0231 VL - 17 IS - 4 SP - 285 EP - 290 PB - Wiley CY - Chichester AN - OPUS4-2182 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Falkenhagen, Jana A1 - Krüger, Ralph-Peter A1 - Rikowski, Eckhard A1 - Schulz, Günter A1 - Friedrich, Jörg Florian ED - Grellmann, W. T1 - Synthesis and Characterisation of Polyhedral Silsesquioxanes with Nanotubular Structures T2 - 23. DVM-Vortrags- und Diskussionstagung "Werkstoffprüfung 2005", DA - 2005-12-01 PY - 2005 SP - 25 EP - 30 PB - DVM AN - OPUS4-11947 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -