TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin T1 - Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques - II. Investigations of heterogeneous systems N2 - Applying a high-frequency lateral vibration between tip and sample in a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. Harmonically modulated lateral force microscopy (HM-LFM) offers several advantages compared with standard lateral force microscopy (LFM). After a brief investigation of the scan velocity dependence of LFM and HM-LFM, two samples were investigated. First, the surface of a poly(acrylonitrile-co-styrene)/polybutadiene blend (ABS) was used to demonstrate the ability of the new technique to decrease the stick effects of the SFM tip. Second, an interface between two chemically very similar polymers was prepared by melting polypropylene (PP) and poly(propene-block-ethene) (PP-block-PE) films on each other. After cutting, the surface roughness of this sample was very high. It is shown that only HM-LFM clearly resolves the local micromechanical properties without artefacts. KW - Scale PY - 1999 DO - https://doi.org/10.1002/masy.19991470125 SN - 1022-1360 SN - 0258-0322 SN - 1521-3900 VL - 147 SP - 259 EP - 267 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6856 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg Florian ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Techniques for surface composition analysis with scanning force microscopy (SFM) using electrical surface properties T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 579 EP - 582 PB - Wiley CY - Chichester AN - OPUS4-6854 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard ED - Xia, Z. T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy N2 - Two different approaches to investigate the local complex conductivity and the surface charge with Scanning Force Microscopy (SFM) techniques are presented. It is shown that the measurement of local electrical properties with SFM leads to interesting information about the composition of electrically heterogeneous surfaces T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 DO - https://doi.org/10.1109/ISE.1996.578073 SP - 223 EP - 228 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Investigation of polymeric composites reinforced with high oriented short glass fibres using the single fibre push-out test T2 - Euro-Conf. Surfaces and Interfaces in Polymers and Composites CY - Lausanne, Switzerland DA - 1997-06-03 PY - 1997 AN - OPUS4-6439 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Characterisation of heterogeneous polymeric systems using different SFM contrasts - harmonically modulated friction and nanoindentation T2 - ICEM-14 CY - Cancún, Mexico DA - 1998-08-30 PY - 1998 AN - OPUS4-6452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Lokale dynamische Reibungskontraste mittels sinusförmiger Vibration im SFM T2 - Dreiländertagung: Elektronenmikroskopie CY - Regensburg, Germany DA - 1997-09-09 PY - 1997 AN - OPUS4-6417 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Local AC current contrast on carbon fiber surfaces imaged by scanning force microscopy N2 - After a delamination process in a C-fiber reinforced polymer composite, the identification of the polymer residue of poly-(phenylene sulphide) on carbon fiber surfaces gives important information on the composite failure mechanism. Using scanning force microscopy (SFM) in its lateral force imaging mode or with the stiffness imaging mode, it is almost impossible to distinguish the two composite components owing to a very low material-based contrast of the local friction and compliance. The new technique using contrast based on a local AC current measurement allows a clear identification of the conducting carbon fiber and the non-conducting polymer coverage. KW - Matrix adhesion KW - Films KW - Photoconduction KW - Composites PY - 1995 DO - https://doi.org/10.1002/actp.1995.010460505 SN - 0323-7648 SN - 1521-4044 VL - 46 IS - 5 SP - 379 EP - 384 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Reliability of polymer materials - the nanoscopic view on interphases T2 - Kick-off Meeting zu einem gemeinsamen DAAD-Projekt mit der Universidad Pais Vasco (UVP), Dept. of Chemical and Environmental Engineering, Industrial Engineering School (EITI), Materials and Technologies Group CY - San Sebastián, Spain DA - 2002-08-08 PY - 2002 SP - 1(?) EP - 12(?) AN - OPUS4-1832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Interphase Characterization via the Stiffness Contrast of a Scanning Force Microscope in Displacement Modulation Mode N2 - The physical properties as well as the thickness of the interphase between polymer and reinforcing phase are generally expected to show a strong influence on the macroscopic mechanical properties of composite materials. In this study the scanning force microscope (SFM) has been applied for detecting stiffness gradients near the interface between copper and epoxide. In displacement modulation mode the load exerted by the tip is modulated sinusoidally by vibrating the normal position of the cantilever or the sample. The corresponding amplitude of dynamic cantilever bending is related to local surface stiffness. Thus, using the SFM, the local mechanical properties of the surface under investigation can be probed. When scanning the tip across the reinforcement/polymer interface, the polymeric interphasial zone can be identified with the observed stiffness gradient. For a commercial epoxide based on diglycidyl ether of bisphenol A (DGEBA) cured with an amine-containing hardener, a stiffness gradient was detected that could be fitted by a Gaussian profile typical for diffusional processes. The width of the stiffness gradient was 280 nm. The observation is discussed in terms of interface-induced segregation processes between resin and hardener, as well as heat conduction mechanisms that can occur during the exothermic curing reaction. Both mechanisms are diffusional in nature and, via the local network structure, are expected to show some influence on the local stiffness of the cured epoxy. Copyright © 2000 John Wiley & Sons, Ltd. T2 - ECASIA 99 CY - Sevilla, Spain DA - 1999-10-04 KW - Scanning Force Microscopy KW - Surface properties KW - Nanomechanics KW - Interface/Interphase KW - Polymer-matrix composites (PMCs) KW - Adherends PY - 2000 DO - https://doi.org/10.1002/1096-9918(200008)30:1<410::AID-SIA846>3.0.CO;2-G SN - 0142-2421 SN - 1096-9918 VL - 30 IS - 1 SP - 410 EP - 414 PB - Wiley CY - Chichester AN - OPUS4-873 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Der dynamische Lateralkontrast als Methode zur Charakterisierung von Polymeroberflächen T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-09 PY - 1997 AN - OPUS4-6419 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Use of scanning force microscopy studies with combined friction, stiffness and thermal diffusivity contrasts for microscopic characterization of automotive brake pads KW - Antimony sulphide KW - Polybutadiene KW - Phenolic resin KW - SFM/AFM KW - Friction KW - Thermal diffusivity PY - 2002 DO - https://doi.org/10.1002/sia.1171 SN - 0142-2421 SN - 1096-9918 VL - 33 IS - 2 SP - 100 EP - 107 PB - Wiley CY - Chichester AN - OPUS4-1293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves N2 - Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by force–displacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Force–displacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail. KW - AFM KW - Lithography KW - Force-displacement curves KW - Stiffness KW - Adhesion KW - Elasto-plastic response PY - 2002 DO - https://doi.org/10.1163/156856102760136472 SN - 0169-4243 SN - 1568-5616 VL - 16 IS - 7 SP - 921 EP - 933 PB - VNU Science Press CY - Utrecht AN - OPUS4-1609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Methods for simultaneous measurements of topography and local electric properties using SFM T2 - Dreiländertagung: Elektronenmikroskopie CY - Regensburg, Germany DA - 1997-09-08 PY - 1997 AN - OPUS4-6442 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Eltanany, Gehan A1 - Sturm, Heinz A1 - Schulz, Eckhard ED - Degischer, H.-P. T1 - Interphasial stiffness gradients in polymer materials T2 - Symposium Verbundwerkstoffe und Werkstoffverbunde CY - Wien, Österreich DA - 2003-07-02 PY - 2003 SN - 3-527-30762-1 PB - Wiley-VCH CY - Weinheim AN - OPUS4-2525 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Methoden zur simultanen Messung der Topographie und lokalen elektrischen Eigenschaften in der Rasterkraftmikroskopie T2 - Diskussionstagung: Raster-Sonden-Mikroskopien und organische Materialien V CY - Münster, Germany DA - 1996-10-07 PY - 1996 AN - OPUS4-6405 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Investigation on mechanical behaviour of heterogeneous polymeric systems and fibre reinforced composites using micro indentation and scanning force microscopy T2 - 18th Disc. Conf. and 56th PMM CY - Prague, Czech Republic DA - 1998-07-20 PY - 1998 AN - OPUS4-6451 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - "Displacement Modulation" mit kontrollierter Kontaktdeformation T2 - Raster-Sonden-Mikroskopien und organische Materialien VI CY - Tübingen, Germany DA - 1997-10-10 PY - 1997 AN - OPUS4-6437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Messung lokaler elektrischer Eigenschaften an keramischen Dielectrika T2 - EDO-Kolloquium der DEG CY - Münster, Germany DA - 1996-10-09 PY - 1996 AN - OPUS4-6403 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Interphasial Stiffness Gradients in Polymer Materials T2 - 14. Symposium "Verbundwerkstoffe und Werkstoffverbunde" CY - Vienna, Austria DA - 2003-07-02 PY - 2003 AN - OPUS4-4652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 DO - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Mapping of local mechanical and thermal properties - The Scanning Force Microscope in Tribology T2 - Dreiländertagung für Elektronenmikroskopie CY - Innsbruck, Austria DA - 2001-11-09 PY - 2001 AN - OPUS4-6525 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - A close view of the interface between cured epoxy-amine system and a thermoplastic polymer T2 - 35. EDO-Herbsttagung, veranstaltet vom Arbeitskreis "Elektronenoptische Direktabbildung und Analyse von Oberflächen" (EDO) der Deutschen Ges. für Elektronenmikroskopie e.V. CY - Wuppertal, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-4161 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit Leitfähigkeitskontrast zur Oberflächenanalyse von Carbonfaser-Compositen und plasmamodifizierten Jodthiophen auf Si-Wafer T2 - 27. Tagung der Deutschen Gesellschaft für Elektronenmikroskopie CY - Leipzig, Germany DA - 1995-09-10 PY - 1995 AN - OPUS4-6386 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Hinrichsen, G. T1 - The scanning force microscope as a tool for the detection of local mechanical properties within the interphase of fibre reinforced polymers N2 - Scanning force microscopy (SFM) has been used to assess the local mechanical properties of fibre-reinforced polymers. Using a sinusoidal displacement modulation (DM) and lock-in technique the method allows to characterize local viscoelastic properties with a high lateral resolution. The simultaneous measurement of the local electrical conductivity is proposed which facilitates the interpretation of the mechanical data. The investigation of cross-sections perpendicular to the axis of carbon fibres embedded in PPS delivers some information about the change in local stiffness within the interfacial region. As a first approach, assuming a single-exponential decrease in local stiffness along a radial line from fibre to polymer we find characteristic decay lengths which are distributed in a range between 20 and 80nm. Further, a modified DM-mode is proposed which is expected to provide a contrast enhancement of the signal which is related to local stiffness. This can be achieved by installing an additional feedback loop which keeps constant the amplitude of dynamic indentation (CDI-mode). KW - Polymer-matrix composites (PMC´s) KW - Interface/interphase KW - SFM/AFM KW - Surface properties KW - Nondestructive testing PY - 1998 DO - https://doi.org/10.1016/S1359-835X(98)00077-3 SN - 1359-835X VL - 29 SP - 1251 EP - 1259 PB - Elsevier CY - Oxford AN - OPUS4-1294 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard ED - Konsta, A. T1 - Scanning force microscopy investigations on electroactive polymer films N2 - The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields. T2 - 10th IEEE International Symposium on Electrets (ISE) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 SN - 0-7803-5025-1 DO - https://doi.org/10.1109/ISE.1999.832086 SP - 465 EP - 468 PB - IEEE Operations Center CY - Piscataway, NJ AN - OPUS4-6862 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -