TY - JOUR A1 - Martin, T. A1 - Zimmermann, E. A1 - Klitzsch, N. A1 - Hördt, A. A1 - Huisman, J. A. A1 - Radic, T. A1 - Kruschwitz, Sabine T1 - Round-robin test of SIP laboratory measurements using electrical test networks N2 - This study presents the results of an interlaboratory test designed to evaluate the accuracy of spectral induced polarization (SIP) measurements using controlled electrical test networks. The study, conducted in Germany since 2006, involved 12 research institutes, six different impedance measurement devices and four types of electrical test networks specifically designed to evaluate phase shift errors in SIP measurements. The test networks, with impedances ranging from 100 to 150 kΩ, represent high-impedance samples with different phase characteristics, and pose the measurement challenges typical of such samples, including high contact impedances and parasitic capacitances. Four key findings emerged from the study: (1) Impedance measurements across all devices showed deviations within 1 per cent over a wide frequency range (0.001–1000 Hz); (2) phase errors remained below 1 mrad up to 100 Hz for most devices, but increased at higher frequencies due to parasitic capacitances and electromagnetic coupling effects; (3) lab-specific instruments have lower phase errors than field instruments when used in a laboratory environment, primarily due to the effects of long cables and too low input impedances of the field instruments; and (4) short cables and driven shielding technology effectively minimized parasitic capacitance and improved measurement accuracy. The study highlights the usefulness of test networks in assessing the accuracy of SIP measurements and raises awareness of the various factors influencing the quality of SIP data. KW - Induced polarization KW - Electrical properties KW - Electrical resistivity tomography (ERT) PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-631522 DO - https://doi.org/10.1093/gji/ggaf153 SN - 0956-540X VL - 242 IS - 1 SP - 1 EP - 13 PB - Oxford University Press (OUP) AN - OPUS4-63152 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Yegen, E. A1 - Zimmermann, Uwe A1 - Unger, Wolfgang A1 - Braun, T. T1 - C-F bond cleavage during derivatization reactions of amino groups with TFBA and PFB at plasma-processed organic surfaces? N2 - Chemical derivatization XPS is used for the quantitative determination of amines at conventional organic surfaces, and it is also applied to plasma-processed aminated surfaces. When using TFBA and PFB as derivatization reagents for tagging primary amino groups, unexpected fluorine species were observed in the second case. The existence of reaction pathways other than those expected for amine derivatization with PFB or TFBA has to be assumed. This phenomenon is tentatively interpreted as the result of C—F bond cleavage during derivatization reactions of TFBA and PFB at plasma-polymerized allylamine and other plasma-processed aminated surfaces. As a consequence, quantification procedures based on derivatization by PFB or TFBA will underestimate amine surface concentrations. KW - Aminated surfaces KW - Chemical derivatization KW - ESCA KW - Plasma polymers KW - XPS PY - 2009 DO - https://doi.org/10.1002/ppap.200800100 SN - 1612-8850 SN - 1612-8869 VL - 6 IS - 1 SP - 11 EP - 16 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-18686 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Zimmermann, J. A1 - Sawodny, O. A1 - Lyda, W. A1 - Burla, A. A1 - Osten, W. A1 - Eigenbrod, H. A1 - Westkämper, E. A1 - Shaw, L. A1 - Weckenmann, A. A1 - Herffurth, T. A1 - Duparré, A. A1 - Tünnermann, A. A1 - Staude, Andreas A1 - Goebbels, Jürgen ED - Weckenmann, A. T1 - Registrierung multimodaler Messungen am Beispiel eines MEMS N2 - Die Produktion von elektronischen, optischen und elektro-mechanischen Mikro- und Nanosystemen stellt hohe Anforderungen an die Messtechnik, um die Fertigungsprozesse zu optimieren und die Qualität zu prüfen. Existierende Messverfahren unterliegen Beschränkungen hinsichtlich des Auflösungsvermögens, der Messfeldgröße und des Ergebnisses der Messung. Der kombinierte Einsatz von Sensoren mit unterschiedlichen Fähigkeiten in den Auflösungsstufen mittels einer intelligenten Messstrategie ermöglicht eine effiziente Prüfung. Neben den geeigneten Prüfstrategien werden auch Methoden zur Fusion und Auswertung der Daten von Sensoren mit unterschiedlichen Auflösungsfähigkeiten benötigt. Datenfusion bezeichnet dabei das Zusammenfügen verschiedener Messungen, um entweder unterschiedliche Eigenschaften eines Messobjekts in einem gemeinsamen Koordinatensystem angeben zu können oder um aus verschiedenen Messungen derselben Eigenschaft des Messobjekts einen Datensatz von höherer Qualität gegenüber den einzelnen Datensätzen zu erhalten. Voraussetzung für die Datenfusion ist Registrierung, die eine Überführung von Messdaten unterschiedlicher Messfelder oder Messmittel in ein gemeinsames Koordinatensystem darstellt und Thema dieses Beitrages ist. T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Deutschland DA - 06.11.2010 PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 173 EP - 187 PB - Shaker Verlag GmbH AN - OPUS4-24876 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Neuschaefer-Rube, U. A1 - Becke, C. A1 - Sadowski, E. A1 - Tan, Ö. A1 - Staude, Andreas A1 - Zimmermann, J. ED - Weckenmann, A. T1 - Virtuelle Messgeräte und Simulationen im Mikrobereich - Potential und Grenzen T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Deutschland DA - 2010-10-06 PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 206 EP - 218 PB - Shaker Verlag GmbH AN - OPUS4-24877 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Martin, T A1 - Zimmermann, E A1 - Klitzsch, N A1 - Hördt, A A1 - Huisman, J A A1 - Radic, T A1 - Kruschwitz, Sabine T1 - Round-robin test of SIP laboratory measurements using electrical test networks N2 - This study presents the results of an interlaboratory test designed to evaluate the accuracy of spectral induced polarization (SIP) measurements using controlled electrical test networks. The study, conducted in Germany since 2006, involved 12 research institutes, six different impedance measurement devices and four types of electrical test networks specifically designed to evaluate phase shift errors in SIP measurements. The test networks, with impedances ranging from 100 to 150 kΩ, represent high-impedance samples with different phase characteristics, and pose the measurement challenges typical of such samples, including high contact impedances and parasitic capacitances. Four key findings emerged from the study: (1) Impedance measurements across all devices showed deviations within 1 per cent over a wide frequency range (0.001–1000 Hz); (2) phase errors remained below 1 mrad up to 100 Hz for most devices, but increased at higher frequencies due to parasitic capacitances and electromagnetic coupling effects; (3) lab-specific instruments have lower phase errors than field instruments when used in a laboratory environment, primarily due to the effects of long cables and too low input impedances of the field instruments; and (4) short cables and driven shielding technology effectively minimized parasitic capacitance and improved measurement accuracy. The study highlights the usefulness of test networks in assessing the accuracy of SIP measurements and raises awareness of the various factors influencing the quality of SIP data. KW - Induced polarization KW - Electrical properties KW - Electrical resistivity tomography (ERT) PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-636755 DO - https://doi.org/10.1093/gji/ggaf153 SN - 0956-540X VL - 242 IS - 1 SP - 1 EP - 13 PB - Oxford University Press (OUP) AN - OPUS4-63675 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kemna, A. A1 - Binley, A. A1 - Cassiani, G. A1 - Niederleithinger, Ernst A1 - Revil, A. A1 - Slater, L. A1 - Williams, K. H. A1 - Orozco, A.F. A1 - Haegel, F.-H. A1 - Hördt, A. A1 - Kruschwitz, Sabine A1 - Leroux, V. A1 - Titov, K. A1 - Zimmermann, E. T1 - An overview of the spectral induced polarization method for near-surface applications N2 - Over the last 15 years significant advancements in induced polarization (IP) research have taken place, particularly with respect to spectral IP (SIP), concerning the understanding of the mechanisms of the IP phenomenon, the conduction of accurate and broadband laboratory measurements, the modelling and inversion of IP data for imaging purposes and the increasing application of the method in near-surface investigations. We summarize here the current state of the science of the SIP method for near-surface applications and describe which aspects still represent open issues and should be the focus of future research efforts. Significant progress has been made over the last decade in the understanding of the microscopic mechanisms of IP; however, integrated mechanistic models involving different possible polarization processes at the grain/pore scale are still lacking. A prerequisite for the advances in the mechanistic understanding of IP was the development of improved laboratory instrumentation, which has led to a continuously growing data base of SIP measurements on various soil and rock samples. We summarize the experience of numerous experimental studies by formulating key recommendations for reliable SIP laboratory measurements. To make use of the established theoretical and empirical relationships between SIP characteristics and target petrophysical properties at the field scale, sophisticated forward modelling and inversion algorithms are needed. Considerable progress has also been made in this field, in particular with the development of complex resistivity algorithms allowing the modelling and inversion of IP data in the frequency domain. The ultimate goal for the future are algorithms and codes for the integral inversion of 3D, time-lapse and multi-frequency IP data, which defines a 5D inversion problem involving the dimensions space (for imaging), time (for monitoring) and frequency (for spectroscopy). We also offer guidelines for reliable and accurate measurements of IP spectra, which are essential for improved understanding of IP mechanisms and their links to physical, chemical and biological properties of interest. We believe that the SIP method offers potential for subsurface structure and process characterization, in particular in hydrogeophysical and biogeophysical studies. KW - Induced polarisation KW - Review KW - Moisture KW - Soil KW - Masonry resistivity PY - 2012 DO - https://doi.org/10.3997/1873-0604.2012027 SN - 1569-4445 VL - 101 IS - 6 SP - 453 EP - 468 PB - EAGE - European Association of Geoscientists & Engineers CY - Houten AN - OPUS4-27433 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -