TY - JOUR A1 - Griepentrog, Michael A1 - Krämer, Günther A1 - Cappella, Brunero T1 - Comparison of nanoindentation and AFM methods for the determination of mechanical properties of polymers N2 - Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the indenter tip was characterized using a white light interferometer and AFM. The measured nanoindentation curves were fitted with the Hertz equation to calculate the Young's modulus of the polymers. Once the Young's moduli of the polymers were known, AFM was used to acquire force-distance-curves on the same samples. We also used the Hertz theory for the analysis in this case. As a result, the tip radius of the AFM cantilever tip could be measured. This procedure is proposed as a method to determine the shape and size of AFM tips for the quantitative characterization of surface forces through force-distance curves. KW - Mechanical properties KW - Polymers KW - AFM KW - Nanoindenter PY - 2013 DO - https://doi.org/10.1016/j.polymertesting.2013.01.011 SN - 0142-9418 VL - 32 IS - 3 SP - 455 EP - 460 PB - Elsevier Science CY - Amsterdam [u.a.] AN - OPUS4-32073 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Mechanical properties of thin polymer films on stiff substrates N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates in order to examine the so-called 'mechanical double layer' topic, i.e. the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The hyperbolic fit, a novel semi-empirical equation introduced in previous articles, has been further corroborated. The interpretation of this equation has been deepened, yielding a quantitative and demonstrative characterization of the mechanical properties of double layers. Provided that the Young's moduli of bulk polymer and substrate are measured from the deformation curves, this mathematical model permits to fit the deformation–force curves on the double layers and to determine the thickness of the polymer films in wide range (0–200 nm). KW - Atomic force microscopy KW - Indentation KW - Rheology KW - Polymers KW - Thin films PY - 2010 DO - https://doi.org/10.1002/sca.20196 SN - 0161-0457 SN - 1932-8745 VL - 32 IS - 5 SP - 282 EP - 293 PB - Wiley CY - Hoboken, NJ AN - OPUS4-22681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Reconstruction of a hidden topography by single AFM force-distance curves N2 - Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a stiff substrate with an irregular and complex topography hidden underneath a compliant and even polymer film. This situation is a special case of a mechanical double-layer, which we examined in detail in previous experiments. Up to now uniform and non-uniform polymer films on an even substrate were examined. The film thickness on each point of the sample surface was known and force–distance curves could be averaged in groups according to the film thickness. In this way we were able to develop a semi empirical approach which allows describing the shape of averaged force–distance curves depending on the Young’s moduli of the involved materials and on the film thickness. In this experiment we reconstruct a hidden topography, i.e., we determine the polymer thickness on each point of the sample by analyzing single force–distance curves with our semi empirical equation. The accuracy reached by this approach permits to obtain a reconstruction of the shape and position of the embedded particles limited by a maximum detection depth. Single curves are also analyzed qualitatively in order to locate areas where the adhesion at the polymer/glass interface is weak or the two phases are detached. KW - Atomic Force Microscopy KW - Force-distance curves KW - Composite materials KW - Mechanical properties KW - Interfaces PY - 2009 DO - https://doi.org/10.1016/j.susc.2009.04.029 SN - 0039-6028 VL - 603 IS - 16 SP - 2363 EP - 2369 PB - Elsevier CY - Amsterdam AN - OPUS4-22682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanica lProperties of Mechanical Double-Layers: A Novel Semiempirical Analysis N2 - Force-displacement curves have been acquired with a commercial atomic force microscope on a thin film of poly(n-butyl methacrylate) on glass substrates. The film thickness is nonuniform, ranging in the measured area from 0 to 30 nm, and gives the possibility to survey the so-called "mechanical double-layer" topic, i.e., the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The stiffness and the deformation for each force-distance curve were determined and related to the film thickness. We were able to estimate the resolution of the film thickness that can be achieved by means of force-distance curves. By exploiting the data acquired in the present and in a previous experiment, a novel semiempirical approach to describe the mechanical properties of a mechanical double-layer is introduced. The mathematical model, with which deformation-force curves can be described, permits to calculate the Young's moduli of film and substrate in agreement with literature values and to determine the film thickness in agreement with the topography. PY - 2007 DO - https://doi.org/10.1021/la701234q SN - 0743-7463 SN - 1520-5827 VL - 23 IS - 21 SP - 10779 EP - 10787 PB - American Chemical Society CY - Washington, DC AN - OPUS4-17808 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanical properties of polymer thin films measured by force-distance curves N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called “mechanical double-layer” topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach. KW - Atomic force microscopy KW - Polymer thin films KW - Indentation KW - Young´s modulus PY - 2008 DO - https://doi.org/10.1016/j.tsf.2007.09.042 SN - 0040-6090 VL - 516 IS - 8 SP - 1952 EP - 1960 PB - Elsevier CY - Amsterdam AN - OPUS4-17809 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - DPL auf Polymeroberflächen T2 - Humboldt Universität Berlin CY - Berlin, Germany DA - 2002-11-11 PY - 2002 AN - OPUS4-7437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Ulm, Germany DA - 2001-07-16 PY - 2001 AN - OPUS4-7499 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Workshop "Restersondenmikroskopie in Forschung und Industrie" CY - Berlin, Germany DA - 2001-03-08 PY - 2001 AN - OPUS4-7500 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography Techniques with AFM T2 - - CY - Pisa, Italy DA - 2001-07-23 PY - 2001 AN - OPUS4-7501 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero T1 - Atomic force microscope as a tool for the modification and analysis of surfaces KW - AFM KW - Lithography KW - Surface forces PY - 2004 VL - 1 SP - 1 EP - 30 PB - Transworld Research Network CY - Trivandrum AN - OPUS4-4745 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Seminar am MPI für Polymerforschung CY - Mainz, Germany DA - 2003-05-12 PY - 2003 AN - OPUS4-2919 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography of Polymer Surfaces T2 - Fachbereich Chemie der Universität Siegen CY - Siegen, Germany DA - 2003-12-01 PY - 2003 AN - OPUS4-4082 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Munich, Germany DA - 2001-07-18 PY - 2001 AN - OPUS4-7854 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Butt, H.-J. A1 - Cappella, Brunero A1 - Kappl, M. T1 - Force measurements with the atomic force microscope - Technique, interpretation and applications N2 - The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force curves has become essential in different fields of research such as surface science, materials engineering, and biology. Another application is the analysis of surface forces per se. Some of the most fundamental questions in colloid and surface science can be addressed directly with the AFM: What are the interactions between particles in a liquid? How can a dispersion be stabilized? How do surfaces in general and particles in particular adhere to each other? Particles and surfaces interactions have major implications for friction and lubrication. Force measurements on single molecules involving the rupture of single chemical bonds and the stretching of polymer chains have almost become routine. The structure and properties of confined liquids can be addressed since force measurements provide information on the energy of a confined liquid film. After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1–104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed. KW - AFM KW - Force curves KW - Surface forces KW - Atomic force microscope PY - 2005 DO - https://doi.org/10.1016/j.surfrep.2005.08.003 SN - 0167-5729 VL - 59 IS - 1-6 SP - 1 EP - 152 PB - North-Holland CY - Amsterdam AN - OPUS4-11181 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Stark, Wolfgang T1 - Adhesion of amorphous polymers as a function of temperature probed with AFM force-distance curves N2 - Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) and on two films of polystyrene with different molecular weight. In a previous publication [B. Cappella, S.K. Kaliappan, H. Sturm, Macromolecules 38 (2005)1874] the analysis of force–displacement curves has been focused on the stiffness and on the Young's modulus of the samples. In the present publication we consider the temperature dependence of the work of adhesion. We have obtained master curves of the work of adhesion at fixed maximum loads and, by comparing the results of the two analysis, we show that the work of adhesion follows the Williams–Landel–Ferry equation with the same coefficients previously found for the Young's modulus. Furthermore, we show that the temperature dependence of the work of adhesion of the polymers is a consequence of the temperature dependence of the tip–sample contact area and in the end of the temperature dependence of the stiffness and of the elastic–plastic properties of the samples. KW - Atomic force microscope KW - Force-distance curves KW - Indentation KW - Elastic-plastic properties KW - Adhesion KW - Time-temperature superposition principle KW - Glass transition temperature PY - 2005 DO - https://doi.org/10.1016/j.jcis.2005.09.043 SN - 0021-9797 SN - 1095-7103 SP - 1 EP - 8(?) PB - Elsevier CY - Orlando, Fla. AN - OPUS4-11187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hartelt, Manfred A1 - Cappella, Brunero A1 - Wäsche, Rolf T1 - Verschleißbestimmung im nm-Bereich N2 - Die Verschleißbeträge können im nm-Bereich quantifiziert werden durch die Berechnung eines Mittelwert-Profils. Grundlage dieser Berechnung ist die hochauflösende Erfassung der 3D-Topographiedaten, die tribologisch beanspruchte und nichtbeanspruchte Oberflächenbereiche gleichermaßen beinhalten. Ein bestimmtes Messverfahren (taktil oder optisch) wird nicht favorisiert. Die vertikale Auflösung des Messverfahrens sollte im nm-Bereich liegen. N2 - The wear rates can be quantified in the nm range by calculating a mean profile. Based on this calculation is the high-resolution recording of the 3D topography data containing tribologically worn and unworn surface areas alike. A specific measurement method (tactile or visual) is not favored. The vertical resolution of the measurement process should be in the nm range. T2 - 54. Tribologie-Fachtagung - Reibung, Schmierung und Verschleiß - Forschung und praktische Anwendungen CY - Göttingen, Germany DA - 30.09.2013 PY - 2013 SN - 978-3-00-022603-8 VL - I SP - 31/1 EP - 31/10 AN - OPUS4-29640 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Atomic force microscope study of friction at the submicron-scale during tribotests with self-mated steel N2 - Friction at the microscale during reciprocal sliding tribotests was studied for the first time with self-mated steel (100Cr6/AISI 52100) taking advantage of an atomic force microscope (AFM). To this aim, microsized steel particles were glued to the AFM-cantilever and employed as colloidal tips to perform tribotests on a steel disc. The torsion of the cantilever, which correlates with the friction force, was measured during the tests. Few tests with the same load did not yield any wear and show that the load and adhesion contributions to friction stay constant when the shape of the test particle does not change. Most of the presented tribotests engendered wear. For those tests, the increase of friction during the tribotests was attributed to the emerging plowing contribution. Furthermore, analysis of both torsion and local slope gives information on the creation of wear particles and their influence on friction. KW - Friction KW - Microtribology KW - Sliding KW - Wear PY - 2022 DO - https://doi.org/10.1115/1.4054251 VL - 144 IS - 10 SP - 1 EP - 9 PB - ASME AN - OPUS4-54839 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zubia Aranburu, Judith A1 - Cappella, Brunero A1 - Zabala Eguren, A. A1 - Buruaga Lamarain, L. A1 - Aginagalde Lopez, A. A1 - Bonse, Jörn A1 - Schwibbert, Karin T1 - Quantification of the adhesion force of E. coli on Ti via single-cell force spectroscopy N2 - Antibiotic resistance is a growing global problem which poses a massive threat to human health. Although human activity contributes to the acceleration of the process, bacteria have a self-driven stabilisation mechanism to protect themselves from such and other external threats: biofilm formation. Nonetheless, it is the adhesion of a single bacterial cell to a surface that triggers the formation of such network of biomolecules and microorganisms, as well as its hazardous consequences. The main objective of this work was to quantify the adhesion force of a single E. coli cell on a Ti substrate via the AFM-related single-cell force spectroscopy, with both the cell and the substrate material being of high clinical relevance. A set of 25 x 25 force displacement curves was acquired with a maximum force of 3.2 nN without dwell time, yielding a topography map and an adhesion force map that showed to be correlated. A mean adhesion force of 0.85 ± 0.175 nN was measured and the presence of cell appendages on the bacterial cell wall was verified through individual force-displacement curves. Bacterial viability was assessed after the measurements via live/dead staining. T2 - XL Congreso Anual de la Sociedad Española de Ingeniería Biomédica CASEIB 2022 CY - Valladolid, Spain DA - 23.11.2022 KW - Bacteria KW - Atomic force microscopy KW - Force distance curve PY - 2022 SN - 978-84-09-45972-8 SP - 217 EP - 220 AN - OPUS4-57039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pisonero, J. A1 - Bouzas-Ramos, D. A1 - Traub, Heike A1 - Cappella, Brunero A1 - Alvarez-Llamas, C. A1 - Richter, Silke A1 - Mayo, J. C. A1 - Costa-Fernandez, J. M. A1 - Bordel, N. A1 - Jakubowski, Norbert T1 - Critical evaluation of fast and highly resolved elemental distribution in single cells using LA-ICP-SFMS N2 - The analytical potential of a nanosecond laser ablation inductively coupled plasma mass spectrometer (ns-LA-ICP-SFMS) system, equipped with an ultra-fast wash-out ablation chamber, is critically investigated for fast and highly spatially resolved (∼μm) qualitative elemental distribution within single cells. Initially, a low surface roughness (< 10 nm) thin In–SnO2 layer (total coating thickness ∼200 nm) deposited on glass is employed to investigate the size, morphology and overlapping of laser-induced craters obtained at different laser repetition rates, making use of Atomic Force Microscopy (AFM). Conical craters with a surface diameter of about 2 µm and depths of about 100 nm were measured after a single laser shot. Furthermore, the influence of the sampling distance (i.e. distance between the sample surface and the inner sniffer of the ablation chamber) on the LA-ICP-MS ion signal wash-out time is evaluated. A significant decrease of the transient 120Sn+ ion signal is noticed after slight variations (±200 μm) around the optimum sampling position. Ultra-fast wash-outs (< 10 ms) are achieved reducing the aerosol mixing from consecutive laser shots even when operating the laser at high repetition rates (25 – 100 Hz). Fast and highly spatially resolved images of elemental distribution within mouse embryonic fibroblast cells (NIH/3T3 fibroblast cells) and human cervical carcinoma cells (HeLa cells), incubated with gold nanoparticles (Au NPs) and Cd-based quantum dots (QDs), respectively, are determined at the optimized operating conditions. Elemental distribution of Au and Cd in single cells is achieved using a high scanning speed (50 µm/s) and high repetition rate (100 Hz). The results obtained for the distribution of fluorescent Cd-based QDs within the HeLa cells are in good agreement with those obtained by confocal microscopy. The size, morphology and overlapping of laser-induced craters in the fixed cells are also investigated using AFM, observing conical craters with a surface diameter of about 2.5 µm and depths of about 800 nm after a single laser shot. KW - Laser ablation KW - ICP-MS KW - Nanoparticle KW - Atomic Force Microscopy KW - Cell PY - 2018 DO - https://doi.org/10.1039/c8ja00096d SP - 1 EP - 9 PB - Royal Society of Chemistry CY - Cambridge AN - OPUS4-45564 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pisonero, J. A1 - Traub, Heike A1 - Cappella, Brunero A1 - Álvarez-Llamas, C. A1 - Méndez, A. A1 - Richter, Silke A1 - Ruiz Encinar, J. A1 - Costa-Fernandez, J. M. A1 - Bordel, N. T1 - Exploring quantitative cellular biomaging and assessment of CdSe/ZnS quantum dots cellular uptake in single cells, using ns-LA-ICP-SFMS N2 - High spatially resolved quantitative bioimaging of CdSe/ZnS Quantum Dots uptake in two kinds of cells is investigated combining laser ablation inductively coupled plasma mass spectrometry and the spatially resolved analysis of dried pL-droplets from a solution with a known concentration of Quantum Dots. Single cells and dried pL-droplets are morphologically characterized by Atomic Force Microscopy. A number concentration of CdSe/ZnS QDs between 3.5 104 and 48 104 is estimated to be uptaken by several selected single cells, after being incubated in the presence of a QDs suspension added to a standard cell culture medium. Mono-elemental bioimaging at subcellular resolution seems to show a higher number concentration of the CdSe/ZnS QDs in the cytosol around the cell nucleus. KW - LA-ICP-SFMS KW - Fast single pulse response KW - Quantitative bioimaging KW - Cellular uptake KW - HT22 KW - HeLa KW - Single cell KW - pL-droplets KW - CdSe/ZnS quantum Dots KW - AFM PY - 2021 DO - https://doi.org/10.1016/j.talanta.2021.122162 SN - 0039-9140 VL - 227 SP - 122162 PB - Elsevier B.V. AN - OPUS4-52121 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Nanolithography on Polymers using the AFM T2 - Dreiländertagung für Elektronenmikroskopie CY - Innsbruck, Austria DA - 2001-11-09 PY - 2001 AN - OPUS4-6516 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography of Polymer Surfaces using SPM T2 - Frühjahrstagung DPG CY - Regensburg, Germany DA - 2002-03-13 PY - 2002 AN - OPUS4-6529 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -