TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Cappella, Brunero A1 - Peiner, Erwin T1 - Calibrating a high-speed contact-resonance profilometer N2 - A European EMPIR project, which aims to use large-scale piezoresistive microprobes for contact resonance applications, a well-established measurement mode of atomic force microscopes (AFMs), is being funded. As the probes used in this project are much larger in size than typical AFM probes some of the simplifications and assumptions made for AFM probes are not applicable. This study presents a guide on how to systematically create a model that replicates the dynamic behavior of microprobes, including air damping, nonlinear sensitivities, and frequency dependencies. The model is then verified by analyzing a series of measurements. KW - Piezoresistive cantilever KW - AFM KW - contact resonance PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509899 DO - https://doi.org/10.5194/jsss-9-179-2020 VL - 9 SP - 179 EP - 187 PB - Copernicus Publications AN - OPUS4-50989 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Influence of relative humidity on wear of self-mated 100 Cr6 steel N2 - The influence of relative humidity on friction and wear is subject of several studies in the last decades. A comprehensive understanding of physical and chemical phenomena affecting the tribology is hampered by the lack of reproducible experimental results, by the large number of variables, and by several difficulties in the detection of tribochemical processes and products. In the present work, we analyze the wear coefficient and the wear volumes of 686 unlubricated tests performed on different oscillating tribometers with 100Cr6 balls on 100Cr6 planes at different relative humidity. Aim of this work is to assess the repeatability and reproducibility of data, to determine the dependence of the wear coefficient on the relative humidity, to understand the underlying physicochemical phenomena and to build three dimensional maps of the wear coefficient as a function of both humidity and the product of normal force and sliding distance. KW - Wear KW - 100Cr6 KW - Relative humidity PY - 2020 DO - https://doi.org/10.1016/j.wear.2020.203239 VL - 450-451 SP - 203239 AN - OPUS4-50583 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Comparative analysis of error sources in the determination of wear volumes of oscillating ball-on-plane tests N2 - The accurate determination of wear volumes is a prerequisite for the study of numerous tribological phenomena. Wear volumes can be measured with different techniques or else be calculated starting from some quantities measured from the wear scar. Advantages and drawbacks of the measuring techniques are shown by means of wear scars and calottes resulting from ball-on-plane tests with 100Cr6 specimens. When measuring wear volumes, white light interferometry results to be one of the most suitable techniques. When wear volumes are calculated, errors result mainly from two sources: (1) the arbitrary choice of one or few line profiles for the determination of the width and of the planimetric wear, and (2) approximations in the calculation, which are even necessary when values of the wear volumes of the single tribological partners and not only the total volume are of interest. The effect of both error sources on the accuracy in the determination of wear volumes is characterized and elucidated by examples. It is found that errors due to approximations are negligible when compared to errors due to the arbitrary choice of one line profile. KW - Error sources analysis KW - White light interferometry KW - Statistical analysis KW - AFM KW - Wear KW - Oscillating ball-on-disc test PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-508407 DO - https://doi.org/10.3389/fmech.2020.00025 VL - 6 SP - Article 25 AN - OPUS4-50840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Hartelt, Manfred A1 - Wäsche, Rolf T1 - High resolution imaging of macroscopic wear scars in the initial stage N2 - The topography of wear scars on the surface of a steel disc coated with a diamond-like carbon (DLC) layer has been investigated with an Atomic Force Microscope (AFM). AFM topography images have been combined together taking advantage of the stitching technique for the study of wear scars in their initial stage. Moreover, the topography of the sample has been acquired before and after the sliding tests. In this way even very small changes of the sample surface (<10 nm) can be detected. Three main phenomena taking place at the very initial stage of wear could be identified: the abrasion of small asperities bulging out of the sample surface, the carving of swallow grooves with depth under 20 nm, and the partial or total closure of cavities present on the surface. This last phenomenon shows that, before the carving of a wear scar, the plastic deformation of particular regions of the sample, i.e. the volume around the cavities, takes place already after few cycles (in this case between 400 and 800) in the initial phase of the sliding test. KW - Atomic force microscopy KW - Stitching technique KW - Running in KW - Plastic deformation PY - 2015 DO - https://doi.org/10.1016/j.wear.2015.07.013 SN - 0043-1648 VL - 338-339 SP - 372 EP - 378 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-34734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Wassenberg, J. R. A1 - Heim, L.-O. A1 - Klostermann, M. A1 - Venzmer, J. A1 - Bonaccurso, E. T1 - Mechanical properties of silicone methacrylate microparticles determined by AFM colloidal probe technique N2 - The mechanical properties of seven types of silicone methacrylate microparticles prepared by solution polymerization with a Pickering emulsifier were investigated by Atomic Force Microscope force–displacement curves acquired in air with the Colloidal Probe Technique, i.e., with spherical SiO2 particles of known radius glued on tipless cantilevers. The deformation curves derived from the force–displacement curves were fitted with Hertz equation for the contact between two spherical particles, which lead to the determination of the elastic modulus of the samples. The performed measurements and the analysis provide quite exact values of the elastic modulus of all investigated polymer particles. Moreover, the results of the measurements were repeatable over large time intervals, also with different experimental setups. The influence of the sample preparation (polymerization method, cross-linking density of the polymer, and thickness of the external shell of the Pickering emulsifier) is discussed as well. The elastic moduli correlate with the cross-linking density (from 2 MPa for low cross-linking density up to 100–130 MPa for medium cross-linking density), whereas the thickness of the external shell formed by the Pickering emulsifier has no measurable influence on the mechanical properties of the microparticles. KW - Colloidal probe technique KW - Hertz model KW - Silicone elastomer PY - 2014 DO - https://doi.org/10.1016/j.polymer.2014.01.021 SN - 0032-3861 SN - 1873-2291 VL - 55 IS - 5 SP - 1209 EP - 1216 PB - Elsevier Ltd. AN - OPUS4-30316 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wäsche, Rolf A1 - Hartelt, Manfred A1 - Cappella, Brunero T1 - The use of AFM for high resolution imaging of macroscopic wear scars N2 - In this article we demonstrate the use of atomic force microscopy (AFM) measurements for the study of macroscopic wear scars. By stitching AFM images acquired over the wear scar, the detailed structure of the scar can be characterized even when the scar is much wider than the typical maximum scan range of the AFM (50–100 µm). The results obtained by AFM are compared with those yielded by white light interferometry (WLI). The comparison validates the WLI measurements; at the same time, it shows decisive differences in the resolutions of these two methods. As a consequence, AFM measurements are necessary whenever a precise characterization of the structure of the scar is required. However, since stitching of AFM images is rather time-consuming, white light interferometry is recommended as a faster method whenever experiments are aimed at just a gross characterization of the scar and the measurement of mean quantities (e.g. the wear volume). KW - Wear scar KW - Imaging KW - Roughness KW - Wear volume KW - Atomic force microscopy KW - White light interferometry PY - 2014 DO - https://doi.org/10.1016/j.wear.2013.11.009 SN - 0043-1648 VL - 309 IS - 1-2 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam AN - OPUS4-30289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krämer, Günther A1 - Griepentrog, Michael A1 - Bonaccurso, E. A1 - Cappella, Brunero T1 - Study of morphology and mechanical properties of polystyrene-polybutadiene blends with nanometre resolution using AFM and force-distance curves N2 - Thin polybutadiene/polystyrene blend films were deposited on glass substrates by spin-coating. The two polymers were chosen, as they are immiscible and differ strongly in their mechanical properties. The blend was characterized with Tapping Mode and force–distance curves. Several advantages of force–distance curves measurements compared to Tapping Mode are shown, most of all the capability of yielding quantitative information about several properties, such as Young's modulus and adhesion. Also the aging behaviour of the blend exposed to air could be observed, in particular the increase of the Young's modulus due to cross-linking and dewetting processes. Additionally, the sample was used to improve the resolution of force–distance curves up to 6 nm, which is to date the best resolution achieved with force–distance curves. Such an improvement resolves the major disadvantage of force–distance curves, compared to other scanning mode, i.e. its inferior resolution. KW - Polymer blends KW - Mechanical properties KW - Atomic force microscopy KW - Force-distance curves KW - High-resolution force-volume PY - 2014 DO - https://doi.org/10.1016/j.eurpolymj.2014.03.026 SN - 0014-3057 SN - 1873-1945 VL - 55 SP - 123 EP - 134 PB - Elsevier CY - Oxford AN - OPUS4-30625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Application of contact-resonance AFM methods to polymer samples N2 - Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model. KW - Atomic force microscopy KW - Contact resonance KW - Mechanical properties KW - Polymers KW - Wear PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-515621 DO - https://doi.org/10.3762/bjnano.11.154 VL - 11 SP - 1714 EP - 1727 AN - OPUS4-51562 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Behle, H. A1 - Xu, Min A1 - Cappella, Brunero A1 - Brand, U. A1 - Peiner, E. T1 - Customized piezoresistive microprobes for combined imaging of topography and mechanical properties N2 - Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films. KW - Cantilever microprobe KW - Piezoresistive KW - Atomic force microscopy KW - Force-distance curves KW - Contact resonance KW - Lubricants PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-524225 DO - https://doi.org/10.1016/j.measen.2021.100042 VL - 15 SP - 100042 PB - Elsevier Ltd. AN - OPUS4-52422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Large scale multi-parameter analysis of wear of self-mated 100Cr6 steel - A study of the validity of Archard's law N2 - Considerable scattering of experimental wear results affects seriously the evaluation of repeatability and reproducibility of tribological measurements and hampers detecting, studying, and verifying tribological laws. An accurate characterization of the statistics of results, the detection of the influence of operating parameters, and the verification of equations describing tribological phenomena can be achieved only through the analysis of large datasets with wide variation of parameters. Taking advantage of more than 400 experiments performed with the same material pairing under the same conditions on four different tribometers, the repeatability and reproducibility of volumetric wear measurements has been evaluated using Welch's test. By testing Archard's law over seven orders of magnitude of sFN, it was found that this law is not universally valid and that, under certain conditions, the wear coefficient depends on sFN itself. KW - Wear KW - Archard's law KW - 100Cr6 steel KW - Scattering PY - 2021 DO - https://doi.org/10.1016/j.triboint.2021.106945 VL - 159 SP - 6945 PB - Elsevier Ltd. AN - OPUS4-52244 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Reichelt, Manuel T1 - Origin of lognormal distribution of wear coefficient values N2 - Wear test results exhibit often large scattering. Hence, the study of spreading of experimental results requires big datasets. In various studies, wear coefficients were found to have lognormal distributions. Therefore, it was supposed that the wear coefficient is affected by two normally distributed variables, which combine through a product. In the present study, we demonstrate that a lognormal distribution may arise from a nonconstant wear coefficient, too, i.e., when a system does not follow Archard’s law. KW - Wear KW - Archard's law KW - Statistical distributions KW - Spreading PY - 2021 DO - https://doi.org/10.1016/j.triboint.2021.107207 SN - 0301-679X VL - 164 PB - Elsevier Ltd. AN - OPUS4-53100 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Correction to: Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - The article "Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance Curves" was originally published Online First in the journal "Tribology letters" without Open Access. After publication in volume 68, issue 1, the authors decided to opt for Open Choice and to make the article an Open Access publication. Therefore, the copyright of the article has been changed to © The Authors 2021 and the article is forthwith distributed under the terms of the Creative Commons Attribution 4.0 International License. PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542710 DO - https://doi.org/10.1007/s11249-021-01491-1 SN - 1573-2711 VL - 69 SP - 1 PB - Springer CY - Cham AN - OPUS4-54271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero T1 - Force-distance curves on lubricant films: An approach to the characterization of the shape of the AFM tip N2 - Force-distance curves have been acquired with an atomic force microscope on perfluorpolyether films. It is shown that curves acquired on films of different thickness, at different rates and with different dwell times can be overlapped by rescaling the time or distance axis.When the time or distance axis is rescaled,the force depends only on the surface tension of perfluorpolyether and on geometrical properties of thetip (aperture and perimeter of the tip at a given distance from the apex). Hence, curves acquired with thesame tip overlap. By comparing curves acquired at different rates the dynamics of tip-wetting can be investigated. Fur-thermore, rescaled force-distance curves have been matched with the perimeter of cross sections ofthe tip, i.e. with the perimeter of the three-phase contact line. Such measurements pave the way for anon-destructive investigation of the tip shape. KW - Lubricant films KW - Surface tension KW - Atomic force microscopy KW - Force-distance curves KW - AFM tip shape PY - 2017 DO - https://doi.org/10.1016/j.micron.2016.11.006 SN - 0968-4328 VL - 93 SP - 20 EP - 28 AN - OPUS4-38391 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Study of micro- and nanoscale wetting properties of lubricants using AFM force-distance curves N2 - Atomic force microscopy (AFM) plays an important role as a multifuntional tool in nanotribology.In the present work it was shown that the main features of force-distance curves on different lubricants have been characterized and the underlying phenomena could be explained. KW - Lubricants KW - Atomic force microscopy KW - Force-distance curves PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-504631 DO - https://doi.org/10.1007/s11249-020-1275-3 SN - 1573-2711 VL - 68 IS - 1 SP - 1 EP - 12 PB - Springer CY - Cham AN - OPUS4-50463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reichelt, Manuel A1 - Cappella, Brunero T1 - Micro- and nanowear of self-mated steel generated and studied with an AFM at the single asperity level N2 - We show for the first time tribotests performed with self-mated 100Cr6 steel, taking advantage of an AFM, employed as a tribometer for the tribotests as well as for the inspection of wear of both tribopartners. Emphasis is put on the morphology of the scars, on wear particles, and on wear of the “colloidal” particles glued on the AFM cantilever. Measurements demonstrate the possibility of characterizing single asperity events leading to very small wear. We highlight several phenomena, which are elementary key constituents of tribological processes. Such phenomena, probably occurring also at the macroscale, can be detected, identified, and characterized with high spatial and time resolution only at the nanoscale, thus giving insight into conditions and causes of their emergence. KW - Nanowear KW - Atomic force microscope KW - 100Cr6 (AISI 52100) steel KW - Wear particles KW - Single asperity contact KW - Particle transfer KW - Zero wear PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-531389 DO - https://doi.org/10.3389/fmech.2021.722434 SN - 2297-3079 VL - 7 SP - 1 EP - 16 PB - Frontiers Media CY - Lausanne AN - OPUS4-53138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Friction and mechanical properties of AFM-scan-induced ripples in polymer films N2 - In the present paper, friction and mechanical properties of AFM-Scan-Induced ripple structures on films of polystyrene and poly-n-(butyl methacrylate) are investigated. Force volume measurements allow a quantitative analysis of the elastic moduli with nanometer resolution, showing a contrast in mechanical response between bundles and troughs. Additionally, analysis of the lateral cantilever deflection shows a clear correlation between friction and the sample topography. Those results support the theory of crack propagation and the formation of voids as a mechanism responsible for the formation of ripples. This paper also shows the limits of the presented measuring methods for soft, compliant, and small structures. KW - AFM KW - Polymer KW - Ripples KW - Mechanical properties KW - Friction PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-532772 DO - https://doi.org/10.3389/fmech.2021.672898 SN - 2297-3079 VL - 7 SP - 1 EP - 8 PB - Frontiers Media CY - Lausanne AN - OPUS4-53277 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Spaltmann, Dirk A1 - Gee, M. T1 - Editorial: Tribology and Atomic Force Microscopy - Towards Single Asperity Contact N2 - The concept behind this Research Topic (RT) was to collect works, in which Atomic Force Microscopy (AFM) techniques are employed to study tribological phenomena and to push the resolution of measurements towards single asperity contact. Thanks to the direct determination of sample height with sub-nanometer resolution and the possibility of measuring local friction, AFM can be employed after a tribotest to detect topography and friction changes at the nanometer scale. Recently, efforts are being expended to use AFM cantilevers as tribometers, i.e., as probes altering the volume of suitable samples, thereby measuring tip and/or sample wear and friction at the nano/microscale. Thus, single asperity contact, friction, and wear can be investigated. Since friction and wear at the macroscale are the result of asperities interactions, such experiments are of great importance for better understanding of tribological processes. KW - Nanotribology KW - Friction KW - Wear KW - Single asperity KW - AFM PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-571037 DO - https://doi.org/10.3389/fmech.2022.853934 SN - 2297-3079 VL - 8 SP - 1 EP - 2 PB - Frontiers Media CY - Lausanne AN - OPUS4-57103 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Mechanical properties of homogeneous and microstructured polymer films T2 - Institut für Physikalische und Theoretische Chemie der Universität Siegen CY - Siegen, Germany DA - 2014-06-23 PY - 2014 AN - OPUS4-32026 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Griepentrog, Michael A1 - Krämer, Günther A1 - Cappella, Brunero T1 - Comparison of nanoindentation and AFM methods for the determination of mechanical properties of polymers N2 - Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the indenter tip was characterized using a white light interferometer and AFM. The measured nanoindentation curves were fitted with the Hertz equation to calculate the Young's modulus of the polymers. Once the Young's moduli of the polymers were known, AFM was used to acquire force-distance-curves on the same samples. We also used the Hertz theory for the analysis in this case. As a result, the tip radius of the AFM cantilever tip could be measured. This procedure is proposed as a method to determine the shape and size of AFM tips for the quantitative characterization of surface forces through force-distance curves. KW - Mechanical properties KW - Polymers KW - AFM KW - Nanoindenter PY - 2013 DO - https://doi.org/10.1016/j.polymertesting.2013.01.011 SN - 0142-9418 VL - 32 IS - 3 SP - 455 EP - 460 PB - Elsevier Science CY - Amsterdam [u.a.] AN - OPUS4-32073 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Mechanical properties of thin polymer films on stiff substrates N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates in order to examine the so-called 'mechanical double layer' topic, i.e. the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The hyperbolic fit, a novel semi-empirical equation introduced in previous articles, has been further corroborated. The interpretation of this equation has been deepened, yielding a quantitative and demonstrative characterization of the mechanical properties of double layers. Provided that the Young's moduli of bulk polymer and substrate are measured from the deformation curves, this mathematical model permits to fit the deformation–force curves on the double layers and to determine the thickness of the polymer films in wide range (0–200 nm). KW - Atomic force microscopy KW - Indentation KW - Rheology KW - Polymers KW - Thin films PY - 2010 DO - https://doi.org/10.1002/sca.20196 SN - 0161-0457 SN - 1932-8745 VL - 32 IS - 5 SP - 282 EP - 293 PB - Wiley CY - Hoboken, NJ AN - OPUS4-22681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silbernagl, Dorothee A1 - Cappella, Brunero T1 - Reconstruction of a hidden topography by single AFM force-distance curves N2 - Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a stiff substrate with an irregular and complex topography hidden underneath a compliant and even polymer film. This situation is a special case of a mechanical double-layer, which we examined in detail in previous experiments. Up to now uniform and non-uniform polymer films on an even substrate were examined. The film thickness on each point of the sample surface was known and force–distance curves could be averaged in groups according to the film thickness. In this way we were able to develop a semi empirical approach which allows describing the shape of averaged force–distance curves depending on the Young’s moduli of the involved materials and on the film thickness. In this experiment we reconstruct a hidden topography, i.e., we determine the polymer thickness on each point of the sample by analyzing single force–distance curves with our semi empirical equation. The accuracy reached by this approach permits to obtain a reconstruction of the shape and position of the embedded particles limited by a maximum detection depth. Single curves are also analyzed qualitatively in order to locate areas where the adhesion at the polymer/glass interface is weak or the two phases are detached. KW - Atomic Force Microscopy KW - Force-distance curves KW - Composite materials KW - Mechanical properties KW - Interfaces PY - 2009 DO - https://doi.org/10.1016/j.susc.2009.04.029 SN - 0039-6028 VL - 603 IS - 16 SP - 2363 EP - 2369 PB - Elsevier CY - Amsterdam AN - OPUS4-22682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanica lProperties of Mechanical Double-Layers: A Novel Semiempirical Analysis N2 - Force-displacement curves have been acquired with a commercial atomic force microscope on a thin film of poly(n-butyl methacrylate) on glass substrates. The film thickness is nonuniform, ranging in the measured area from 0 to 30 nm, and gives the possibility to survey the so-called "mechanical double-layer" topic, i.e., the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The stiffness and the deformation for each force-distance curve were determined and related to the film thickness. We were able to estimate the resolution of the film thickness that can be achieved by means of force-distance curves. By exploiting the data acquired in the present and in a previous experiment, a novel semiempirical approach to describe the mechanical properties of a mechanical double-layer is introduced. The mathematical model, with which deformation-force curves can be described, permits to calculate the Young's moduli of film and substrate in agreement with literature values and to determine the film thickness in agreement with the topography. PY - 2007 DO - https://doi.org/10.1021/la701234q SN - 0743-7463 SN - 1520-5827 VL - 23 IS - 21 SP - 10779 EP - 10787 PB - American Chemical Society CY - Washington, DC AN - OPUS4-17808 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Silbernagl, Dorothee T1 - Nanomechanical properties of polymer thin films measured by force-distance curves N2 - Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called “mechanical double-layer” topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach. KW - Atomic force microscopy KW - Polymer thin films KW - Indentation KW - Young´s modulus PY - 2008 DO - https://doi.org/10.1016/j.tsf.2007.09.042 SN - 0040-6090 VL - 516 IS - 8 SP - 1952 EP - 1960 PB - Elsevier CY - Amsterdam AN - OPUS4-17809 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -