TY - CONF A1 - Streeck, C. A1 - Dietrich, Paul A1 - Fischer, Tobias A1 - Rurack, Knut A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry N2 - Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry An increasing field of application, e.g. in biotechnology is the dedicated adjustment of surface properties by functionalization with organic molecules. For a detailed understanding and further development of such nano-layers, a quantitative determination of the surface density of molecular species is required. By means of reference-free X-Ray Fluorescence (XRF) spectrometry such surfaces can be analyzed quantitatively by detecting specific marker elements. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a SI-traceable quantitative analysis without any calibration sample or reference material is possible. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like Carbon C, Nitrogen N and Oxygen is possible. Here, aminated surfaces with varying densities of amino groups prepared from binary mixtures of silanes were investigated. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and Fluorescence measurements based on laser-excitation in the optical light spectrum the functional-group density of silane monolayers were determined. The nitrogen atom in the head-group of the silane-molecule could be used as specific marker for the reference-free quantitative XRF analysis and were used for traceable calibration of XPS and Fluorescence Spectroscopy. T2 - EMRS Spring Meeting 2017, ALTECH 2017, Symposium S, Analytical techniques for precise characterization of nano materials CY - Strasbourg, France DA - 22.05.2017 KW - XPS KW - XRF KW - Amino silane film KW - Traceability PY - 2017 AN - OPUS4-43374 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -