TY - JOUR A1 - von Bohlen, A. A1 - Hergenröder, R. A1 - Sternemann, C. A1 - Paulus, M. A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - Wavelenght Dispersive Synchrotron Microprobe Used for Material Analysis N2 - Synchrotron radiation (SR) has been used in recent years as an excellent excitation source for X-ray fluorescence spectrometry. SR offers, in contrast to conventional X-ray sources, highly brilliant polychromatic, polarized radiation with which micro-domain X-ray fluorescence spectrometry becomes possible. A feasibility study of utility, conducted at BESSY (Berlin) and at DELTA (Dortmund), both synchrotron facilities of the third generation, to evaluate the use of wavelength dispersive X-ray fluorescence spectrometry in combination with synchrotron radiation is presented. First results for material analysis, obtained by combining the synchrotron radiation and a commercially available spectrometer commonly attached to a scanning electron microscope, are presented. The spectrometer, of the linear type, uses curved focusing Bragg-crystals of the Johann type which leads to a high spectral resolution up to 3 eV. Examples of micro-domain analyses are presented and compared with those obtained by synchrotron radiation induced energy dispersive X-ray fluorescence. KW - Synchrotron radiation KW - WDXRF KW - EDXRF KW - Micro analysis KW - Material analysis PY - 2005 DO - https://doi.org/10.1081/CI-200048048 SN - 1073-9149 SN - 1525-6030 VL - 33 IS - 2 SP - 137 EP - 150 PB - Dekker CY - New York, NY AN - OPUS4-14235 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -