TY - JOUR A1 - Resch-Genger, Ute A1 - DeRose, P.C. T1 - Characterization of photoluminescence measuring systems (IUPAC technical report) N2 - Procedures for the characterization of photoluminescence measuring systems are discussed, focusing on spectrofluorometers and fit-for-purpose methods including suitable standards. The aim here is to increase the awareness for the importance of a reliable instrument characterization and to improve the reliability and comparability of measurements of photoluminescence. KW - Fluorescence intensities KW - Instrument calibration KW - IUPAC Analytical Chemistry Division KW - IUPAC organic and biomolecular chemistry division KW - IUPAC physical and biophysical chemistry division KW - Performance validation KW - Photoluminescence KW - Photoluminescence measuring systems KW - Relative fluorescence quantum yields KW - Fluorescence standard KW - Quality assurance KW - Instrument qualification PY - 2012 DO - https://doi.org/10.1351/PAC-REP-10-07-07 SN - 0033-4545 SN - 1365-3075 VL - 84 IS - 8 SP - 1815 EP - 1835 PB - Union CY - Research Triangle Park, NC AN - OPUS4-26283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Radnik, Jörg A1 - Knigge, Xenia A1 - Andresen, Elina A1 - Resch-Genger, Ute A1 - Cant, D.J.H. A1 - Shard, A.G. A1 - Clifford, C.A. T1 - Composition, thickness, and homogeneity of the coating of core–shell nanoparticles—possibilities, limits, and challenges of X-ray photoelectron spectroscopy N2 - Core–shell nanoparticles have attracted much attention in recent years due to their unique properties and their increasing importance in many technological and consumer products. However, the chemistry of nanoparticles is still rarely investigated in comparison to their size and morphology. In this review, the possibilities, limits, and challenges of X-ray photoelectron spectroscopy (XPS) for obtaining more insights into the composition, thickness, and homogeneity of nanoparticle coatings are discussed with four examples: CdSe/CdS quantum dots with a thick coating and a small core; NaYF4-based upconverting nanoparticles with a large Yb-doped core and a thin Er-doped coating; and two types of polymer nanoparticles with a poly(tetrafluoroethylene) core with either a poly(methyl methacrylate) or polystyrene coating. Different approaches for calculating the thickness of the coating are presented, like a simple numerical modelling or a more complex simulation of the photoelectron peaks. Additionally, modelling of the XPS background for the investigation of coating is discussed. Furthermore, the new possibilities to measure with varying excitation energies or with hard-energy X-ray sources (hard-energy X-ray photoelectron spectroscopy) are described. A discussion about the sources of uncertainty for the determination of the thickness of the coating completes this review. KW - X-ray spectroscopy KW - Nanoparticles KW - Spectroscopy / Instrumentation KW - Spectroscopy / Theory PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-548305 DO - https://doi.org/10.1007/s00216-022-04057-9 VL - 414 IS - 15 SP - 4331 EP - 4345 PB - SpringerNature AN - OPUS4-54830 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -