TY - JOUR A1 - Ewert, Uwe A1 - Bavendiek, K. A1 - Robbins, J. A1 - Zscherpel, Uwe A1 - Bueno, C. A1 - Gordon, T. A1 - Mishra, D. T1 - New compensation principles for enhanced image quality in industrial radiology with digital detector arrays KW - Radiography KW - Film replacement KW - Digital detector arrays KW - Contrast sensitivity KW - SNR KW - CNR KW - Spatial resolution KW - Bad pixels KW - Standards KW - Compensation principles PY - 2010 SN - 0025-5327 VL - 68 IS - 2 SP - 163 EP - 168 PB - Society for Nondestructive Testing CY - Columbus, Ohio AN - OPUS4-22538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -