TY - JOUR A1 - Reinholz, Uwe A1 - Bremser, Wolfram A1 - Brzezinka, Klaus-Werner A1 - Strub, Erik A1 - Weise, Hans-Peter A1 - Merchel, Silke T1 - A thin-layer reference material for hydrogen analysis N2 - In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials – depending on the deposition process – and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (1–2 µm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:H–Si) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison. KW - Hydrogen KW - Nuclear reaction analysis KW - Depth profiling KW - Reference material KW - Ion beam analysis PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.015 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2418 EP - 2423 PB - Elsevier CY - Amsterdam AN - OPUS4-17553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Peuker, Christel A1 - Bessau, Waltraud A1 - Brzezinka, Klaus-Werner A1 - Kohl, Anka A1 - Reinholz, Uwe A1 - Geißler, Heinz T1 - IR and Raman study of calcium aluminosilicate glasses of the composition xCaO.xAl2O3.(100-2x)SiO2 PY - 2002 SN - 0927-4472 VL - 75 IS - 6 SP - 313 EP - 322 PB - Elsevier CY - Amsterdam AN - OPUS4-2304 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Witke, Klaus A1 - Brzezinka, Klaus-Werner A1 - Reich, Peter T1 - Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy PY - 1998 SN - 0937-0633 VL - 361 SP - 619 EP - 620 PB - Springer CY - Berlin AN - OPUS4-2307 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Preiss, H. A1 - Schierhorn, Eike A1 - Brzezinka, Klaus-Werner T1 - Synthesis of polymeric titanium and zirconium precursors and preparation of carbide fibres and films PY - 1998 SN - 0022-2461 SN - 1573-4803 VL - 33 SP - 4697 EP - 4706 PB - Springer Science + Business Media B.V. CY - Norwell, Mass. AN - OPUS4-2310 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jentzsch, T. A1 - Juepner, H.J. A1 - Brzezinka, Klaus-Werner A1 - Lau, Angelika T1 - Efficiency of optical second harmonic generation from pentacene films of different morphology and structure KW - Second harmonic generation (424) KW - Organic substances (347) KW - PVD (370) KW - Surface morphology (462) PY - 1998 SN - 0040-6090 VL - 315 SP - 273 EP - 280 PB - Elsevier CY - Amsterdam AN - OPUS4-2311 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Peuker, Christel A1 - Brzezinka, Klaus-Werner A1 - Nofz, Marianne A1 - Geißler, Heinz T1 - IR and Raman spectroscopic study of some strontium aluminosilicate glasses PY - 2003 SN - 0927-4472 VL - 76 IS - 6 SP - 276 EP - 284 PB - Elsevier CY - Amsterdam AN - OPUS4-3028 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Brzezinka, Klaus-Werner A1 - Meixner, A.J. T1 - Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy N2 - The surface modification of single-crystalline silicon induced by single 130 femtosecond (fs) Ti:sapphire laser pulses (wavelength 800 nm) in air is investigated by means of micro Raman spectroscopy (?-RS), atomic force microscopy and scanning laser microscopy. Depending on the laser fluence, in some regions the studies indicate a thin amorphous top-layer as well as ablated and recrystallized zones. The single-pulse threshold fluences for melting, ablation and polycrystalline recrystallization are determined quantitatively. Several different topographical surface structures (rims and protrusions) are found. Their formation is discussed in the context of recent studies of the laser irradiation of silicon. In combination with a thin-film optical model, the thickness of the amorphous layer is determined by two independent and nondestructive optical methods to be in the order of several 10 nm. KW - Femtosecond laser ablation KW - Silicon KW - Raman spectroscopy KW - Atomic force microscopy KW - Laser scanning microscopy PY - 2004 DO - https://doi.org/10.1016/S0169-4332(03)00881-X SN - 0169-4332 SN - 1873-5584 VL - 221 IS - 1-4 SP - 215 EP - 230 PB - North-Holland CY - Amsterdam AN - OPUS4-3224 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Wrobel, J. M. A1 - Brzezinka, Klaus-Werner A1 - Esser, N. A1 - Kautek, Wolfgang T1 - Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations KW - Femtosecond laser ablation KW - Indium phosphide KW - Raman spectroscopy KW - Atomic force microscopy PY - 2002 SN - 0169-4332 SN - 1873-5584 VL - 202 SP - 272 EP - 282 PB - North-Holland CY - Amsterdam AN - OPUS4-2645 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Goering, Harald A1 - Maneck, Heinz-Eberhard A1 - Mach, Reinhard A1 - Knoll, Uta A1 - Oleszak, Franz A1 - Gajewski, Sven A1 - Brzezinka, Klaus-Werner T1 - Synthese von Nano-Materialien - Fullerene, Kohlenstoff-Nanoröhren, Nanopulver und Schichten T2 - Materialica 2002 ; 5. Internationale Fachmesse für Werkstoffanwendungen, Oberflächen und Product Engineering CY - München, Deutschland DA - 2002-09-30 PY - 2002 SP - 1 EP - 2 AN - OPUS4-2059 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schönhals, Andreas A1 - Goering, Harald A1 - Brzezinka, Klaus-Werner A1 - Schick, C. T1 - Molecular dynamics of polymers in random nanometer confinements investigated by relaxational scattering techniques N2 - Dielectric spectroscopy and temperature-modulated differential scanning calorimetry are employed to study the molecular dynamics of oligomeric poly(propylene glycol) (PPG) melts of different molecular weights confined to nanoporous glasses (pore sizes 2.5, 5.0, 7.5 and 20 nm). Moreover, the results obtained for the polymers are compared with those for the corresponding monomer. The experimental results are discussed in the framework of the interplay of confinement and adsorption effects. For large pore sizes (> 5 nm) a speeding up of the molecular dynamics is observed (the confinement effect), whereas for small pore sizes (< 5 nm) a slowing down of the segmental fluctuations is found (the adsorption effect). In addition, a minimal length scale for the glass transition of 1.6 nm is estimated for PPG confined in nanoporous glasses. This supports the idea that the molecular motions responsible for the glassy dynamics must be describable by a characteristic length scale. Polarized Raman scattering investigations are carried out to investigate the conformations of the macromolecules inside the pores. These experiments show that the confined polymer chains are locally stretched. This effect increases with decreasing pore size. T2 - 3rd Workshop on Non-Equilibrium Phenomena in Supercooled Fluids, Glasses and Amorphous Materials CY - Pisa, Italy DA - 2003-09-22 PY - 2003 DO - https://doi.org/10.1088/0953-8984/15/11/334 SN - 0953-8984 SN - 1361-648X VL - 15 IS - 11 SP - S1139 EP - S1148 PB - IOP Publ. Ltd. CY - Bristol AN - OPUS4-2041 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hoang, D. L. A1 - Dittmar, A. A1 - Schneider, M. A1 - Trunschke, A. A1 - Lieske, H. A1 - Brzezinka, Klaus-Werner A1 - Witke, Klaus T1 - Evidence of lanthanum-chromium mixed oxides formed in CrOx/La2O3 model catalysts N2 - CrOx/La2O3 mixed oxides, prepared by impregnating La2O3 with appropriate aqueous solutions of (NH4)2CrO4 and calcining at 600 °C for 4 h, have been investigated by means of XRD, TPR, XPS, DRIFTS, and Raman spectroscopy (RS). The formation of the compounds La2CrO6, La(OH)CrO4 and LaCrO4 under these conditions was evidenced. Strong peaks at 864, 884, 913, and 921 cm-1, as well as weak peaks at 136, 180, 354, 370, and 388 cm-1 in the RS spectrum of CrOx/La2O3 have been assigned to La2CrO6. KW - Lanthanum-chromium mixed oxides KW - La2CrO6 KW - LaCrO4 KW - TPR KW - XPS KW - XRD KW - DRIFTS KW - Raman spectroscopy PY - 2003 DO - https://doi.org/10.1016/S0040-6031(02)00491-4 SN - 0040-6031 SN - 1872-762X VL - 400 SP - 153 EP - 163 PB - Elsevier CY - Amsterdam AN - OPUS4-2397 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -