TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Ulm, Germany DA - 2001-07-16 PY - 2001 AN - OPUS4-7499 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Workshop "Restersondenmikroskopie in Forschung und Industrie" CY - Berlin, Germany DA - 2001-03-08 PY - 2001 AN - OPUS4-7500 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography Techniques with AFM T2 - - CY - Pisa, Italy DA - 2001-07-23 PY - 2001 AN - OPUS4-7501 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero T1 - Atomic force microscope as a tool for the modification and analysis of surfaces KW - AFM KW - Lithography KW - Surface forces PY - 2004 VL - 1 SP - 1 EP - 30 PB - Transworld Research Network CY - Trivandrum AN - OPUS4-4745 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography T2 - Seminar am MPI für Polymerforschung CY - Mainz, Germany DA - 2003-05-12 PY - 2003 AN - OPUS4-2919 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Lithography of Polymer Surfaces T2 - Fachbereich Chemie der Universität Siegen CY - Siegen, Germany DA - 2003-12-01 PY - 2003 AN - OPUS4-4082 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography - Punkt und Linie zu Fläche T2 - - CY - Munich, Germany DA - 2001-07-18 PY - 2001 AN - OPUS4-7854 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Butt, H.-J. A1 - Cappella, Brunero A1 - Kappl, M. T1 - Force measurements with the atomic force microscope - Technique, interpretation and applications N2 - The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force curves has become essential in different fields of research such as surface science, materials engineering, and biology. Another application is the analysis of surface forces per se. Some of the most fundamental questions in colloid and surface science can be addressed directly with the AFM: What are the interactions between particles in a liquid? How can a dispersion be stabilized? How do surfaces in general and particles in particular adhere to each other? Particles and surfaces interactions have major implications for friction and lubrication. Force measurements on single molecules involving the rupture of single chemical bonds and the stretching of polymer chains have almost become routine. The structure and properties of confined liquids can be addressed since force measurements provide information on the energy of a confined liquid film. After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1–104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and limitations are discussed. KW - AFM KW - Force curves KW - Surface forces KW - Atomic force microscope PY - 2005 DO - https://doi.org/10.1016/j.surfrep.2005.08.003 SN - 0167-5729 VL - 59 IS - 1-6 SP - 1 EP - 152 PB - North-Holland CY - Amsterdam AN - OPUS4-11181 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Stark, Wolfgang T1 - Adhesion of amorphous polymers as a function of temperature probed with AFM force-distance curves N2 - Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) and on two films of polystyrene with different molecular weight. In a previous publication [B. Cappella, S.K. Kaliappan, H. Sturm, Macromolecules 38 (2005)1874] the analysis of force–displacement curves has been focused on the stiffness and on the Young's modulus of the samples. In the present publication we consider the temperature dependence of the work of adhesion. We have obtained master curves of the work of adhesion at fixed maximum loads and, by comparing the results of the two analysis, we show that the work of adhesion follows the Williams–Landel–Ferry equation with the same coefficients previously found for the Young's modulus. Furthermore, we show that the temperature dependence of the work of adhesion of the polymers is a consequence of the temperature dependence of the tip–sample contact area and in the end of the temperature dependence of the stiffness and of the elastic–plastic properties of the samples. KW - Atomic force microscope KW - Force-distance curves KW - Indentation KW - Elastic-plastic properties KW - Adhesion KW - Time-temperature superposition principle KW - Glass transition temperature PY - 2005 DO - https://doi.org/10.1016/j.jcis.2005.09.043 SN - 0021-9797 SN - 1095-7103 SP - 1 EP - 8(?) PB - Elsevier CY - Orlando, Fla. AN - OPUS4-11187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hartelt, Manfred A1 - Cappella, Brunero A1 - Wäsche, Rolf T1 - Verschleißbestimmung im nm-Bereich N2 - Die Verschleißbeträge können im nm-Bereich quantifiziert werden durch die Berechnung eines Mittelwert-Profils. Grundlage dieser Berechnung ist die hochauflösende Erfassung der 3D-Topographiedaten, die tribologisch beanspruchte und nichtbeanspruchte Oberflächenbereiche gleichermaßen beinhalten. Ein bestimmtes Messverfahren (taktil oder optisch) wird nicht favorisiert. Die vertikale Auflösung des Messverfahrens sollte im nm-Bereich liegen. N2 - The wear rates can be quantified in the nm range by calculating a mean profile. Based on this calculation is the high-resolution recording of the 3D topography data containing tribologically worn and unworn surface areas alike. A specific measurement method (tactile or visual) is not favored. The vertical resolution of the measurement process should be in the nm range. T2 - 54. Tribologie-Fachtagung - Reibung, Schmierung und Verschleiß - Forschung und praktische Anwendungen CY - Göttingen, Germany DA - 30.09.2013 PY - 2013 SN - 978-3-00-022603-8 VL - I SP - 31/1 EP - 31/10 AN - OPUS4-29640 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -