TY - JOUR A1 - Zscherpel, Uwe A1 - Schumacher, David A1 - Redmer, Bernhard A1 - Ewert, Uwe A1 - Ullberg, C. A1 - Weber, N. A1 - Pantsar, T. T1 - Digital radiology with photon counting detectors N2 - The progress in X-ray detector electronics (sensitivity and speed) allows meanwhile fast single photon detection by a matrix detector. Combined photon counting and energy discrimination is implemented in the electronic circuit of each detector pixel. The company XCounter developed detectors based on CdTe single crystals, which can be tiled to larger areas and have a pixel size of 100ìm. The largest area available in beginning of 2014 is 50x75 mm². These detectors have very promising properties, which make them very suitable for NDT applications: 1. A CdTe attenuation layer of 750 µm thickness allows efficient X-ray detection up to ca. 300 keV. In counting mode only photon noise is important; no other detector noise sources need to be considered. There is no Offset signal without radiation. 2. Each of the detector pixels has two energy thresholds. These can be used for dual energy imaging for materials separation. Also the suppression of scattered radiation by energy thresholding will improve the image contrast sensitivity. First experiments will be presented which demonstrate the advantages of this new detector technology over the conventional charge integrating detectors. A challenge is the development of a modified detector calibration procedure, which becomes critical at longer exposure times. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - Materials characterization KW - Radiographic testing (RT) KW - Digital detector array KW - Photo counting KW - Image quality KW - Calibration KW - Dual-energy KW - Energy discrimination KW - Digital radiology KW - Detectors PY - 2014 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-323063 UR - https://www.ndt.net/?id=16709 SN - 1435-4934 N1 - Geburtsname von Schumacher, David: Walter, D. - Birth name of Schumacher, David: Walter, D. VL - 19 IS - 12 SP - 1 EP - 8 PB - NDT.net CY - Kirchwald AN - OPUS4-32306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -