TY - GEN A1 - Ewers, Benjamin A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Hoehl, a. A1 - Müller, R. A1 - Ulm, G. T1 - Terahertz spectral computed tomography N2 - The novel technique of spectral THz computed tomography is demonstrated at an example of a small plastic figure. The data are reconstructed by conventional filtered back-projection. The reconstruction are discussed. T2 - IRMMW-THz 2009 - 34th International conference on infrared, millimeter, and terahertz waves CY - Busan, Korea DA - 2009-09-21 KW - THz KW - Computed tomography PY - 2009 SN - 978-1-4244-2120-6 SP - 1 EP - 2(?) AN - OPUS4-20546 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Schob, D. A1 - Léonard, Fabien A1 - Müller, Bernd R. A1 - Sagradov, I. A1 - Roszak, R. A1 - Sparr, H. A1 - Franke, R. A1 - Ziegenhorn, M. A1 - Bruno, Giovanni T1 - Bestimmung der Mikrostruktur und Simulation des Schädigungsverhaltens von lasergesintertem Polyamid 12 unter quasistatischer Zugbelastung N2 - Um das Material- und Schädigungsverhalten von additiv gefertigtem Polyamid 12 (PA12) unter quasistatischer Belastung zu charakterisieren, wurden mechanische Tests und Röntgenverfahren zur Bestimmung der Mikrostruktur eingesetzt. Die Proben wurden nach dem Prinzip des Selektiven Lasersinterns (SLS) hergestellt. Unter quasistatischer Belastung mit Haltezeiten ergab sich ein viskoplastisches Materialverhalten. Im Zugversuch wurde eine maximale Zugfestigkeit von 40.6 MPa und eine Bruchdehnung von 7.4% beobachtet. Mittels Röntgenrefraktion wurde eine Erhöhung von inneren Oberflächen beobachtet, die senkrecht zur Zugrichtung orientiert sind. Die Analyse der Gesamtporosität aus Computertomographie-Messungen ergab keine Änderung infolge der Zugbelastung. Jedoch wurde eine bimodale Porengrößenverteilung und eine steigende Sphärizität festgestellt. Das Materialverhalten wurde mit dem Chaboche-Modell simuliert und ergab eine sehr gute Übereinstimmung mit den experimentellen Ergebnissen. Allerdings gestattet dieses Modell nicht, das Schädigungsverhalten abzubilden. Daher wurde zur Simulation des Schädigungsverhaltens das Modell gemäß dem Ansatz von Gurson, Tvergaard und Needleman unter Berücksichtigung der mikrostrukturellen Parameter erweitert. Der Schwerpunkt des Beitrags liegt auf den Röntgenverfahren zur experimentellen Bestimmung der Mikrostruktur. T2 - DGZfP-Jahrestagung 2021 CY - Online meeting DA - 10.05.2021 KW - Additive Fertigung (AM) KW - Polyamid 12 KW - Röntgenrefraktion KW - Computertomographie KW - Numerische Simulation PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-526833 UR - https://jahrestagung.dgzfp.de/Portals/jt2021/bb/P16.pdf SP - 1 EP - 8 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-52683 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cabeza, Sandra A1 - Müller, Bernd R. A1 - Pereyra, R. A1 - Fernández, R. A1 - González-Doncel, G. A1 - Bruno, Giovanni T1 - Evidence of damage evolution during creep of Al–Mg alloy using synchrotron X-ray refraction N2 - In order to provide further evidence of damage mechanisms predicted by the recent solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction. X-ray refraction techniques detect the internal specific surface (i.e. surface per unit volume) on a length scale comparable to the specimen size, but with microscopic sensitivity. A significant rise in the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model. This substructure was also observed by scanning electron microscopy KW - Aluminium alloys KW - Creep KW - Damage KW - Synchrotron X-ray refraction KW - Electron microscopy KW - subgrain structure PY - 2018 DO - https://doi.org/10.1107/S1600576718001449 SN - 1600-5767 VL - 51 SP - 420 EP - 427 PB - Wiley AN - OPUS4-44619 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schob, D. A1 - Sagradov, I. A1 - Roszak, R. A1 - Sparr, H. A1 - Franke, R. A1 - Ziegenhorn, M. A1 - Kupsch, Andreas A1 - Léonard, Fabien A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Experimental determination and numerical simulation of material and damage behaviour of 3D printed polyamide 12 under cyclic loading N2 - The material and damage behaviour of additively manufactured polyamide 12 under cyclic loading was characterized by cyclic tests and microstructure analysis by using microscopy, X-ray refraction, and computed tomography. The results were used to determine parameters for the viscoplastic material model by Chaboche and a damage model by Gurson-Tvergaard-Needleman. The temperature was monitored during the experiments and the self-heating effect was observed. By including this effect, a higher accuracy could be achieved with the results of mechanical experiments. KW - 3D printing Polyamide 12 KW - Chaboche model KW - GTN model KW - Material and damage behaviour KW - X-ray refraction KW - Computed tomography PY - 2020 DO - https://doi.org/10.1016/j.engfracmech.2019.106841 SN - 0013-7944 VL - 229 SP - 106841-1 EP - 106841-13 PB - Elsevier Ltd. CY - Amsterdam AN - OPUS4-50557 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wipfler, B. A1 - Machida, R. A1 - Müller, Bernd R. A1 - Beutel, R.G. T1 - On the head morphology of Grylloblattodea (insecta) and the systematic position of the order, with a new nomenclature for the head muscles of Dicondylia N2 - External and internal head structures of adults of Galloisiana yuasai (Grylloblattodea) are described. The results are compared with conditions found in representatives of other lower neopteran lineages, notably in Austrophasma and Karoophasma (both Mantophasmatodea). Sutures and ridges of the head capsule are discussed. A new nomenclature for head muscles is presented for the entire Dicondylia (= Zygentoma + Pterygota). Galloisiana (like its sister taxon Grylloblatta) is mostly characterized by plesiomorphic features, such as the largely unspecialized orthopteroid mouthparts, the multisegmented filiform antennae, the presence of trabeculae tentorii, the absence of muscles associated with the antennal ampullae, the presence of musculus stipitalis transversalis (0mx11) and the presence of musculus tentoriofrontalis anterior (0te2). Autapomorphies of Grylloblattodea are: (i) compound eyes composed of only 60 ommatidia or less; (ii) a lacinia with a proximal tooth; (iii) a rounded submentum; (iv) loss of musculus craniohypopharyngealis (0hy3); and (v) loss of musculus labroepipharyngealis (0lb5). The phylogenetic evaluation of 104 characters of the head yields a branching pattern with Grylloblattodea as a sister group of Mantophasmatodea in clade Xenonomia. Putative synapomorphies of both taxa are: (i) a distinct angle (more than 60°) between the submentum and the mentum; (ii) posteriorly oriented labial palpi; (iii) a flat and lobe-like hypopharynx with a suspensorium far ventrad of the anatomical mouth opening; (iv) loss of musculus tentorioparaglossalis (0la6); and (v) a connection between the antennal ampulla and the supraoesophageal ganglion containing nuclei. Xenonomia is placed in a clade with the two dictyopteran terminals. Another monophyletic group is Embioptera + Phasmatodea. Most branches of the single tree obtained in our analysis are weakly supported. The results clearly show that more data and a much broader taxon sampling are required to clarify the phylogenetic interrelationships of the lower neopteran orders. However, our results narrow down the spectrum of possible solutions, and represent a starting point for future phylogenetic analyses, with an extensive concatenated dataset. KW - X-ray computed tomography KW - Grylloblattodea KW - Dicondylia PY - 2011 DO - https://doi.org/10.1111/j.1365-3113.2010.00556.x SN - 0307-6970 VL - 36 IS - 2 SP - 241 EP - 266 PB - Blackwell CY - Oxford [u.a.] AN - OPUS4-23190 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. A1 - Diete, W. A1 - Klein, U. A1 - Frahm, R. T1 - BAMlin - the first hard X-ray beamline at BESSY II N2 - The first hard X-ray beamline at BESSY II will be installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a Double-Multilayer-Monochromator and a Double-Crystal-Monochromator. The two devices can be used separately or in-line. Main applications of monochromatic radiation with photon energies up to 50 keV are X-ray fluorescence analysis, micro-computed tomography, X-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV will be available for radiometric applications. KW - Double-Multilayer-Monochromator with meridional bender KW - Double-Crystal-Monochromator with sagittal bender KW - X-ray fluorescence analysis KW - Micro-computed tomography KW - X-ray topography KW - Detector calibration KW - Reflectometry PY - 2001 DO - https://doi.org/10.1016/S0168-9002(01)00466-1 SN - 0168-9002 SN - 0167-5087 VL - 467-468 IS - 1 SP - 703 EP - 706 PB - North-Holland CY - Amsterdam AN - OPUS4-1171 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Alpern, P. A1 - Tilgner, R. T1 - Sichere Automobil Elektronik durch nanogenaues Synchrotron-Prüfverfahren T2 - DGZfP Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - Synchrotron Laue Contrast Radiography PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 8 PB - DGZfP CY - Berlin AN - OPUS4-15837 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rack, A. A1 - Riesemeier, Heinrich A1 - Zabler, S. A1 - Weitkamp, T. A1 - Müller, Bernd R. A1 - Weidemann, Gerd A1 - Modregger, P. A1 - Banhart, J. A1 - Helfen, L. A1 - Danilewsky, A.N. A1 - Gräber, H.G. A1 - Heldele, R. A1 - Mayzel, B. A1 - Goebbels, Jürgen A1 - Baumbach, T. ED - Stuart R. Stock, T1 - The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA) N2 - The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed. KW - Microtomography KW - Non-destructive evaluation KW - Coherent imaging KW - X-ray refraction KW - X-ray phase contrast KW - Synchrotron-CT KW - Synchrotron instrumentation KW - Scintillator KW - Bragg magnification KW - Holotomography KW - X-ray topography PY - 2008 DO - https://doi.org/10.1117/12.793721 SN - 0277-786X VL - 7078 SP - 70780X-1 - 70780X-9 AN - OPUS4-18296 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Tilgner, R. A1 - Alpern, P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. T1 - Package induced deformation of integrated circuits KW - Synchrotron Laue Contrast Radiography SLCR KW - Synchrotron Radiation KW - Electronic Power Device IC PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2006.pdf#page=26 SN - 1611-6127 SP - 24 EP - 25 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-15797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hartnig, C. A1 - Kuhn, R. A1 - Krüger, P. A1 - Manke, I. A1 - Kardjilov, N. A1 - Goebbels, Jürgen A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich T1 - Wassermanagement in Brennstoffzellen - die Bedeutung von hochauflösenden zerstörungsfreien Untersuchungsmethoden N2 - Ein effektives Wassermanagement ist ein wichtiger Aspekt in der Entwicklung von Brennstoffzellen hinsichtlich Langzeitstabilität und Optimierung der Leistungsfähigkeit. Eine zentrale Rolle spielt dabei die Gasdiffusionslage, die für die gleichmäßige Verteilung der Reaktionsgase auf die elektrochemisch aktive Schicht (Katalysator) sorgen soll. In diesem Beitrag werden gemeinsame Forschungsaktivitäten des Helmholtz-Zentrums Berlin für Materialien und Energie (Entwicklung bildgebender Verfahren) sowie des Zentrums für Sonnenenergie- und Wasserstoff-Forschung (ZSW, Entwicklung von Brennstoffzellen) vorgestellt. Im Rahmen dieser Kooperation werden die Entstehung, die Verteilung und der Transport von flüssigem Wasser, kurz das Wassermanagement, unter Betriebsbedingungen untersucht. Mittels Synchrotronradiografie und -tomografie werden kleinste Wassercluster in der Gasdiffusionslage detektiert. Die gewonnenen Erkenntnisse dienen der Modifikation und einer gezielten Auswahl der eingesetzten Materialien. KW - Synchrotronstrahlung KW - Brennstoffzellen KW - Materialcharakterisierung KW - Zerstörungsfrei PY - 2008 SN - 0025-5300 VL - 50 IS - 10 SP - 609 EP - 614 PB - Hanser CY - München AN - OPUS4-18656 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Mack, D. E. A1 - Laquai, René A1 - Kupsch, Andreas A1 - Helle, O. A1 - Sebold, D. A1 - Vaßen, R. A1 - Bruno, Giovanni T1 - Charakterisierung der Porositäts- und Rissdichteentwicklung in Wärmedämmschichten von Gasturbinenschaufeln mittels Synchrotron Refraktions Radiographie N2 - Die Degradation von Wärmedämmschichten(thermal barrier coatings - TBCs) in Gasturbinen durch glasartige Calcium-Magnesium-Aluminiumsilikat (CMAS)Ablagerungen aus verschiedenen Quellen istseit vielen Jahren ein anhaltendes Problem. In dieser Studie wurde mit Hilfe derSynchrotron-Röntgen-Refraktions-Radiographie (SXRR), und vergleichend mit der Elektronenmikroskopie, das Eindringen von CMAS in die poröse Struktur von atmosphärisch plasmagespritzten (APS)TBCs sowie die Bildung und das Wachstum von Rissen unter thermisch zyklischer Belastung untersucht. Die Ergebnisse deuten darauf hin, dass die Infiltration sowie deren Kinetik im Brenner-Teststand wesentlich vom Benetzungsverhalten des CMAS beeinflusst werden. Trotz desoffensichtlichen Angriffs von CMAS auf die Korngrenzen hat die Wechselwirkung von Yttriumdioxid-stabilisiertem Zirkoniumdioxid (YSZ) mit intrudiertem CMAS keinen unmittelbaren Einfluss auf die Struktur und Dichte der innen Oberflächen(Risse, Poren). In einem späteren Stadium wird die Bildung von Rissen senkrecht zur äußeren Oberfläche in einer breiteren Zone der TBC-Schicht beobachtet. T2 - DGZfP-Jahrestagung 2021 CY - Online meeting DA - 10.05.2021 KW - CMAS - Calcium-Magnesium-Aluminiumsilikat KW - SXRR - Synchrotron X-ray Refraction Radiography KW - TBC - Thermal barrier coatings PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-526732 UR - https://jahrestagung.dgzfp.de/Programm#P32 SP - 1 EP - 15 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-52673 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Markötter, H. A1 - Haußmann, J. A1 - Alink, R. A1 - Dittmann, K. A1 - Tötzke, C. A1 - Krüger, P. A1 - Klages, M. A1 - Arlt, Tobias A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Scholta, J. A1 - Gerteisen, D. A1 - Manke, I. A1 - Banhart, J. T1 - Investigation of fuel cell materials and liquid water transport by means of synchrotron imaging N2 - Synchrotron imaging allows addressing various important issues in fuel cell research, for example water distribution and transport. The water distribution in polymer electrolyte membrane fuel cells (PEMFCs) was observed quasi in-situ directly after operation by means of synchrotron tomography. The 3D data set was compared with the tomogram of a dry cell in order to separate the water distribution from cell materials. Engineered transport pathways realized by perforating holes through the gas diffusion layer (GDL) are a recent approach to optimize water transport and cell performance. For some parameter sets a cell performance increase and an improvement of stabilization have already been proven. We present high resolution investigations of the water distribution in perforated GDLs of operating PEMFCs by means of in-situ synchrotron radiography. The surrounding areas of the holes exhibited a distinct hydrophilic character. KW - Gas-diffusion layers KW - Resolution neutron-radiography KW - X-ray radiography KW - Visualization KW - PEMFC PY - 2013 DO - https://doi.org/10.1149/04529.0195ecst SN - 1938-6737 SN - 1938-5862 VL - 45 IS - 29 SP - 195 EP - 202 CY - Pennington, NJ, USA AN - OPUS4-30545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schob, D. A1 - Roszak, R. A1 - Sagradov, I. A1 - Sparr, H. A1 - Ziegenhorn, M. A1 - Kupsch, Andreas A1 - Léonard, Fabien A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Experimental determination and numerical simulation of material and damage behaviour of 3D printed polyamide 12 under quasi-static loading N2 - In order to characterise the material and damage behaviour of additively manufactured polyamide 12 (PA12) under quasi-static load and to implement it in a numerical model, experiments under quasi-static load as well as microstructural investigations were carried out. Selective laser sintering (SLS) was used as the manufacturing process. For the classification of the material behaviour, quasi-static cyclic tests with holding times as well as tensile tests were performed. X-ray refraction and computed tomography (CT) were used to investigate the damage behaviour. The Chaboche model, which has already been applied for metallic materials under thermomechanical loading, served as the basis for the selection of the numerical material model. The same procedure was used for the selection of the damage model, where the Gurson–Tvergaard–Needleman (GTN) model was chosen, which was already used for porous metallic materials. The Chaboche model shows very good agreement with experimental results. Furthermore, the coupling with the GTN model allows a very good modelling of the damage behaviour. Finally, it could be shown that the selected models are suitable to simulate the material and damage behaviour of 3D printed PA12. KW - Polyamide 12 KW - 3D printing KW - Viscoplastic KW - Chaboche model KW - Damage KW - GTN model KW - X-ray refraction KW - Computed tomography PY - 2019 DO - https://doi.org/10.24423/aom.3162 SN - 0373-2029 VL - 71 IS - 4-5 SP - 507 EP - 526 PB - IPPT PAN - Polish Academy of Sciences, Institute of Fundamental Technological Research CY - Warsaw AN - OPUS4-49409 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mack, D. E. A1 - Laquai, René A1 - Müller, Bernd R. A1 - Helle, O. A1 - Sebold, D. A1 - Vaßen, R. A1 - Bruno, Giovanni T1 - Evolution of porosity, crack density, and CMAS penetration in thermal barrier coatings subjected to burner rig testing N2 - Degradation of thermal barrier coatings (TBCs) in gas‐turbine engines due to calcium–magnesium–aluminosilicate (CMAS) glassy deposits from various sources has been a persistent issue since many years. In this study, state of the art electron microscopy was correlated with X‐ray refraction techniques to elucidate the intrusion of CMAS into the porous structure of atmospheric plasma sprayed (APS) TBCs and the formation and growth of cracks under thermal cycling in a burner rig. Results indicate that the sparse nature of the infiltration as well as kinetics in the burner rig are majorly influenced by the wetting behavior of the CMAS. Despite the obvious attack of CMAS on grain boundaries, the interaction of yttria‐stabilized zirconia (YSZ) with intruded CMAS has no immediate impact on structure and density of internal surfaces. At a later stage the formation of horizontal cracks is observed in a wider zone of the TBC layer. KW - Characterization KW - CMAS KW - Synchrotron X‐ray refraction radiography KW - Thermal barrier coatings PY - 2019 DO - https://doi.org/10.1111/jace.16465 SN - 0002-7820 SN - 1551-2916 VL - 102 IS - 10 SP - 6163 EP - 6175 PB - Wiley CY - Oxford AN - OPUS4-47804 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mouiya, M. A1 - Martynyuk, M. A1 - Kupsch, Andreas A1 - Laquai, R. A1 - Müller, Bernd R. A1 - Doyen, N.T. A1 - Tamraoui, Y. A1 - Serrano Munoz, Itziar A1 - Huger, M. A1 - Kachanov, M. A1 - Bruno, Giovanni T1 - The stress–strain behavior of refractory microcracked aluminum titanate: The effect of zigzag microcracks and its modeling N2 - The stress–strain behavior of ceramics, such as aluminum titanate, has certain features that are unusual for brittle materials—in particular, a substantial nonlinearity under uniaxial tension, and load–unload hysteresis caused by the sharp increase of the incremental stiffness at the beginning of unloading. These features are observed experimentally and are attributed to microcracking. Here we compare different degrees of stress–strain nonlinearity of aluminum titanate materials and quantitatively model them. We use advanced mechanical testing to observe the mechanical response at room and high temperature; electron microscopy, and X-ray refraction radiography to observe the microstructural changes. Experiments show that two types of microcracks can be distinguished: (i) microcracks induced by cooling from the sintering temperature (due to heterogeneity and anisotropy of thermal expansion), with typical sizes of the order of grain size, and (ii) much larger microcracks generated by the mechanical loading. The two microcrack types produce different effects on the stress–strain curves. Such microcracks and the features of the stress–strain behavior depend on the density of the cooling-induced microcracks and on the distribution of grain sizes. They are modeled analytically and numerically. KW - Hystersis KW - Nonlinear stress-strain curve KW - Refractory KW - Stiffness KW - X-ray refraction PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-580517 DO - https://doi.org/10.1111/jace.19325 SN - 1551-2916 VL - 106 SP - 6995 EP - 7008 PB - Wiley-Blackwell CY - Oxford [u.a.] AN - OPUS4-58051 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Brücher, M. A1 - von Bohlen, A. A1 - Jacob, P. A1 - Franzke, J. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Müller, Bernd R. A1 - Scharf, Oliver A1 - Hergenröder, R. T1 - The charge of solid-liquid interfaces measured by X-ray standing waves and streaming current N2 - Measurements of ion distributions at a charged solid–liquid interface using X-ray standing waves (XSW) are presented. High energy synchrotron radiation (17.48 keV) is used to produce an XSW pattern inside a thin water film on a silicon wafer. The liquid phase is an aqueous solution containing Br and Rb ions. The surface charge is adjusted by titration. Measurements are performed over a pH range from 2.2–9, using the native Si oxide layer and functional (amine) groups as surface charge. The Debye length, indicating the extension of the diffuse layer, could be measured with values varying between 1–4 nm. For functionalized wafers, the pH dependent change from attraction to repulsion of an ion species could be detected, indicating the isoelectric point. In combination with the measurement of the streaming current, the surface charge of the sample could be quantified. KW - Interfacial charge KW - Solid/liquid interfaces KW - Surface analysis KW - Surface functionalization KW - X-ray spectrometry KW - X-ray KW - Standing waves KW - XSW KW - Streaming current KW - Synchrotron radiation PY - 2010 DO - https://doi.org/10.1002/cphc.201000166 SN - 1439-4235 SN - 1439-7641 VL - 11 IS - 10 SP - 2118 EP - 2123 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-22057 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Cooper, R.C. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Wheeler, M. A1 - Hentschel, Manfred P. A1 - Staude, Andreas A1 - Pandey, A. A1 - Shyam, A. A1 - Bruno, Giovanni T1 - Stress-induced microcrack density evolution in β-eucryptite ceramics: Experimental observations and possible route to strain hardening N2 - In order to investigate their microcracking behaviour, the microstructures of several β-eucryptite ceramics, obtained from glass precursor and cerammed to yield different grain sizes and microcrack densities, were characterized by laboratory and synchrotron x-ray refraction and tomography. Results were compared with those obtained from scanning electron microscopy (SEM). In SEM images, the characterized materials appeared fully dense but computed tomography showed the presence of pore clusters. Uniaxial tensile testing was performed on specimens while strain maps were recorded and analyzed by Digital Image Correlation (DIC). X-ray refraction techniques were applied on specimens before and after tensile testing to measure the amount of the internal specific surface (i.e., area per unit volume). X-ray refraction revealed that (a) the small grain size (SGS) material contained a large specific surface, originating from the grain boundaries and the interfaces of TiO2 precipitates; (b) the medium (MGS) and large grain size (LGS) materials possessed higher amounts of specific surface compared to SGS material due to microcracks, which decreased after tensile loading; (c) the precursor glass had negligible internal surface. The unexpected decrease in the internal surface of MGS and LGS after tensile testing is explained by the presence of compressive regions in the DIC strain maps and further by theoretical arguments. It is suggested that while some microcracks merge via propagation, more close mechanically, thereby explaining the observed X-ray refraction results. The mechanisms proposed would allow the development of a strain hardening route in ceramics. KW - Beta-eucryptite KW - Microcracked ceramics KW - X-ray refraction KW - Tensile load KW - Strain hardening KW - Synchrotron KW - BAMline KW - Computed Tomography KW - CT PY - 2018 UR - http://www.sciencedirect.com/science/article/pii/S1359645417308881 DO - https://doi.org/10.1016/j.actamat.2017.10.030 SN - 1359-6454 SN - 1873-2453 VL - 144 IS - Supplement C SP - 627 EP - 641 PB - Elsevier B.V. AN - OPUS4-43024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - New Developments in X-ray-Topography of Advanced Non-Metallic Materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn258/idn258.htm SN - 1435-4934 VL - 5 IS - 11 PB - NDT.net CY - Kirchwald AN - OPUS4-928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - Charakterisierung von Mikroschäden in polymeren Faserkompositen mittels Röntgen-Refraktions-Topography T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2001 CY - Berlin, Deutschland DA - 2001-05-21 PY - 2001 UR - http://www.ndt.net/article/dgzfp01/papers/p49/p49.htm N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 75-CD PB - DGZfP CY - Berlin AN - OPUS4-1298 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Görner, Wolf A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Krumrey, M. A1 - Ulm, G. T1 - The first hard X-rays at the BAMline PY - 2001 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2000.pdf#page=329 SN - 0179-4159 SP - 329 EP - 331 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1299 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-destructive evaluation of advanced materials by synchrotron radiation refraction topography PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=233 SN - 0179-4159 SP - 233 EP - 234 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Ekenhorst, Derk A1 - Brzezinka, Klaus-Werner A1 - Hentschel, Manfred P. ED - Krenkel, W. T1 - Fiber Induced Failure of Carbon/Carbon Composites T2 - 4th International Conference on High Temperature Ceramic Matrix Composites ; 4th HT-CMC Conference CY - Munich, Germany DA - 2001-10-01 PY - 2001 SN - 3-527-30320-0 VL - 4 SP - 175 EP - 180 PB - Wiley-VCH CY - Weinheim AN - OPUS4-1289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - SYRTOPO - Materialcharakterisierung an der BAMline N2 - Einleitung Die Bundesanstalt für Materialforschung und -prüfung (BAM) hat im Synchrotronstrahlungslabor BESSY (im Wissenschafts- und Technologiezentrum Berlin-Adlershof) ein Röntgen-Strahlrohr (BAMline) sowie einen Messplatz für die zerstörungsfreie Materialcharakterisierung aufgebaut. Der Messplatz erlaubt die Untersuchung mit monochromatischer Röntgenstrahlung im Energiebereich von 5keV bis 60keV mit hohem Photonenfluß. Seit Anfang 2001 läuft der Probebetrieb zur Optimierung der Strahlungsquelle sowie des experimentellen Aufbaus. Die Besonderheiten der BAMline im Vergleich zu Laboröntgenquellen sind der hohe Photonenfluss bei freier Wahl der Photonenenergie sowie die Polarisationseigenschaften und die außerordentliche Parallelität der Strahlung bei großem Strahlungsquerschnitt. Dies ermöglicht Refraktionstopogramme für Metall-Matrix-Komposite (MMC) in relativ kurzer Zeit, mit einer lateralen Ortsauflösung von 10µm, zu messen. Das neuartige ZfP-Verfahren der Röntgen-Refraktions-Topograhy wurde an anderer Stelle ausführlich beschrieben [1,2]. Es nutzt die Messtechnik der traditionellen Kleinwinkelstreuung auf unkonventionelle Weise, und wurde in den letzten zehn Jahren in unserem Labor entwickelte und an die fortgeschrittenen Anforderungen für die zerstörungsfreie Charakterisierung von neuartigen Werkstoffen wie faserverstärkten Kompositen und Keramiken angepasst. Das Verfahren basiert auf dem Brechungseffekt von Röntgenstrahlen. Auf Grund der kurzen Wellenlänge der Röntgenstrahlen (l » 0.1nm) können innere Oberflächen sowie Grenzflächenkonzentrationen von Nanometer Große detektiert werden, so dass mit Hilfe dieser Technik sehr leicht Partikel, Risse und Porengrößen im Sub-Mikrometer-Bereich gemessen werden können, ohne dabei die Proben zu zerstören, wie es bei mikroskopischen Techniken notwendig ist. Anwendungsfelder dieser Untersuchungsmethode sind z.B. die Erkennung von Faser-Matrix-Enthaftung nach Schlageinwirkung sowie Rissbildung durch Alterung und Herstellung bei faserverstärkten Kompositen. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2002 CY - Weimar, Deutschland DA - 2002-05-06 PY - 2002 UR - http://www.ndt.net/article/dgzfp02/papers/v16/v16.htm SN - 3-931381-39-0 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 80-CD SP - 1(?) EP - 6(?) PB - DGZfP CY - Berlin AN - OPUS4-2793 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg A1 - Harbich, Karl-Wolfram T1 - Röntgen-Refraktions-Computer-Tomographie N2 - Für die Charakterisierung Neuer Werkstoffe, vornehmlich Nichtmetalle, hat sich das Verfahren der Röntgen-Refraktions-Topographie bewährt. Es handelt sich phänomenologisch um eine Technik der Röntgen-Kleinwinkel-Streuung mit Probekörper-Abtastung bei fest vorgewähltem Streuwinkel. Gegenüber der klassischen Beugungstheorie dominieren jedoch bei der Streuung an Strukturen oberhalb von 0.3 µm Größe röntgenoptische Brechungseffekte. Detektierbar sind damit innere Ober- und Grenzflächen, insbesondere Mikrorisse unterhalb der lichtmikroskopischen Erkennbarkeit. Da es sich hierbei um eine Durchstrahlungs-Technik handelt, überlagern jedoch die Strukturen zu einer Projektion, analog zu den radiographischen Verfahren. Um auch Informationen entlang der Durchstrahlungs-Richtung in der Tiefe des Probekörpers zu erhalten, wird unter kleinen Streuwinkeln die Computer-Tomographie durchgeführt, im ersten Ansatz mit nur zwei Meßkanälen, jeweils für die Messung der Absorptions- und der Refraktions-Intensität. Dazu werden nacheinander 360 Linear-Scans nach Drehung von jeweils 1° aufgenommen. Die Intensitätswerte werden nach den Regeln der fouriergefilterten Rückprojektion zu Computer-Tomogrammen verarbeitet. Die Ergebnisse visualisieren die Anordnung von Grenzflächen und innere Oberflächen, die sich für zahlreiche nichtmetallische Werkstoffe, vor alllem im Transportmittel-Leichtbau als relevante Mikrostrukturen für das Versagens-Verhalten und die Werkstoff-Optimierung eignen. Zum Vergleich entstehen aus den simultanen Absorptionsmessungen gleichzeitig die klassischen Computer-Tomogramme, die ausschließlich Dichteänderungen anzeigen. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 1999 CY - Celle, Deutschland DA - 1999-05-10 KW - Röntgentomographie KW - Röntgen-Refraktions-Computer-Tomographie PY - 1999 UR - http://www.ndt.net/abstract/dgzfp99/data/40.htm SN - 3-931381-27-7 VL - 1 IS - 68 SP - 361 EP - 369 PB - DGZfP CY - Berlin AN - OPUS4-715 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of fibre reinforced metals by X-ray refraction CT PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=336 SN - 0179-4159 SP - 336 EP - 337 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2493 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Goebbels, Jürgen A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd ED - Mazal, P. T1 - Special Solutions for CT-Investigations with Synchrotron Radiation T2 - 2nd International Workshop of NDT Experts CY - Prague, Czech Republic DA - 2003-10-06 KW - Computed Tomography KW - Synchrotron radiation KW - X-ray refraction KW - Metal matrix composites KW - Porosity PY - 2003 SN - 80-2142475-3 SP - 91 EP - 97 PB - Univ. of Technology CY - Brno AN - OPUS4-2876 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-ray refraction topography for non-destructive evaluation of advanced materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - X-ray refraction PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn257/idn257.htm SN - 1435-4934 VL - 5 IS - 11 SP - 1 EP - 7(?) PB - NDT.net CY - Kirchwald AN - OPUS4-871 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Müller, Bernd R. T1 - Röntgen-Topographie mit Klein- und Weitwinkel-Streuung N2 - Röntgen-Topographische Verfahren sind dadurch gekennzeichnet, daß die Streueigenschaften eines Probekörpers ortskorreliert erfaßt werden. Somit vereinigen sie die Vorzüge der bildgebenden Eigenschaft der Radiographie mit der Strukturselektivität der Röntgenanalyse. Sowohl die Röntgen-Weitwinkel-Streuung als auch die Röntgen-Kleinwinkel-Streuung (-Beugung und -Refraktion) werden topographisch für die Materialcharakterisierung eingesetzt. Die Topographie-Verfahren und Untersuchungsbeispiele an nichtmetallischen Werkstoffen werden dargestellt. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2002 CY - Weimar, Deutschland DA - 2002-05-06 KW - Röntgen-Streuung KW - Materialcharakterisierung KW - Komposite KW - Keramik PY - 2002 UR - http://www.ndt.net/article/dgzfp02/papers/v15/v15.htm SN - 3-931381-39-0 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 80-CD PB - DGZfP CY - Berlin AN - OPUS4-2027 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD PB - DGZfP CY - Berlin AN - OPUS4-2519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Non-Destructive Characterisation of High Performance Composites by use of X-Ray Refraction Topography T2 - SAMPE (Society for the Advancement of Material and Process Engineering) - Fachtagung CY - Long Beach, CA, USA DA - 2003-05-11 PY - 2003 AN - OPUS4-3075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - SYRTOPO: Materialcharakterisierung an der BAMline T2 - DGZfP-Jahrestagung 2002: ZfP in Anwendung, Entwicklung und Forschung CY - Weimar, Germany DA - 2002-05-06 PY - 2002 AN - OPUS4-3082 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites T2 - 35th International SAMPE Technical Conference-2003 CY - Dayton, OH, USA DA - 2003-09-28 PY - 2003 AN - OPUS4-3253 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Fensch-Kleemann, Elisabeth A1 - Müller, Bernd R. A1 - Harbich, Karl-Wolfram A1 - Hentschel, Manfred P. ED - Kriegesmann, J. T1 - Gefügeanalyse keramischer Werkstoffe mittels Röntgen-Refraktion PY - 2002 SN - 3-87156-091-X IS - Kap. 6.1.4.1 SP - 1 EP - 24 PB - Deutscher Wirtschaftsdienst CY - Köln AN - OPUS4-2066 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schors, Jörg A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Röntgen-Topographie mit Klein- und Weitwinkel-Streuung und Röntgenrefraktions-Computertomographie KW - Röntgen-Streuung KW - Materialcharakterisierung KW - Komposite KW - Keramik KW - Risse KW - Computertomographie PY - 2003 SN - 0948-5112 IS - 86 SP - 11 Seiten PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-2652 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Sub-micrometer computed tomography at BAMline PY - 2004 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2003.pdf#page=321 SN - 0179-4159 SP - 321 EP - 323 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-3509 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-Ray Refraction Topography for Non-Destructive Evaluation of Advanced Materials KW - X-Ray Refraction KW - Fibre Debonding KW - Topography KW - Crack Density KW - Pore Size KW - SAXS PY - 2001 SP - 1 EP - 7 PB - Society of Manufacturing Engineers CY - Dearborn, Mich. AN - OPUS4-1097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites N2 - For the first time Metal Matrix Composites (MMC) have been investigated by 3D Computed Tomography combined with enhanced interface contrast due to X-ray refraction. X-ray refraction is a relatively new approach for the characterization of advanced materials. The related techniques of Refraction Topography and Refraction Computed Tomography have been developed and applied at our laboratory during the last decade to meet the actual demand for improved nondestructive characterization of high performance composites, ceramics and other low density materials and components. X-ray refraction occurs, when X-rays crosses interfaces of spherical or cylindrical shape (e.g. pores or fibres) in the same way as visible light is refracted by lenses. These X-ray optical effects can be observed at small scattering angles of few minutes of arc as the refractive index n of X-rays is nearly unity (n = 1 – 10-6). Due to the short X-ray wavelength of about 0.1 nm the technique determines the amount of inner surfaces and interfaces of nanometer dimensions. The technique is expected to solve many problems in understanding the meaning of micro and sub micro structures in materials science. With the results of the CT investigation, some questions could be clarified for a better understanding of fatigue failure mechanisms under cyclic loading conditions. The specimens for the test programme have been provided by MTU Aero Engines. They consist of a titanium matrix (Ti6242) reinforced by SiC fibres (SCS6). The investigations have been performed at the materials research station of BAM (BAMline) at the Synchrotron Facility BESSY in Berlin, Germany. T2 - 35th International SAMPE technical conference CY - Dayton, OH, USA DA - 2003-09-28 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Titanium Metal Matrix Composites (Ti-MMC) KW - Ti6242 KW - SCS6 PY - 2003 SN - 0-938994-95-6 PB - SAMPE CY - Covina, Calif. AN - OPUS4-2780 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Synchrotron Radiation Refraction Topography PY - 2003 SN - 3-540-40154-7 SP - 167 EP - 176 PB - Springer CY - Berlin AN - OPUS4-2765 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing CY - Montreal, Canada DA - 2004-08-30 KW - NDE KW - X-ray refraction KW - Composites KW - MMC PY - 2004 SP - 9 pages PB - International Committee for Non-Destructive Testing CY - Montreal AN - OPUS4-5486 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Riesemeier, Heinrich A1 - Radtke, Martin A1 - Goebbels, Jürgen A1 - Görner, Wolf T1 - Materialforschung an der BAMline T2 - Lange Nacht der Wissenschaft bey BESSY CY - Berlin, Germany DA - 2003-06-14 PY - 2003 AN - OPUS4-5050 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - X-ray refraction topography and computer tomography for NDE of light weight materials T2 - ECNDT 2006 CY - Berlin, Germany DA - 2006-09-25 PY - 2006 AN - OPUS4-12138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Riesemeier, Heinrich A1 - Ecker, Klaus A1 - Görner, Wolf A1 - Müller, Bernd R. A1 - Radtke, Martin A1 - Krumrey, M. T1 - Layout and first XRF Applications of the BAMline at BESSY II+ N2 - The first hard x-ray beamline at BESSY II has been installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a double-multilayer monochromator and a double-crystal monochromator. Depending on the application, the two devices are used separately or in-line. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis, micro computed tomography, x-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV is available for radiometric applications. KW - BAMline KW - XRF PY - 2005 DO - https://doi.org/10.1002/xrs.750 SN - 0049-8246 VL - 34 IS - 2 SP - 160 EP - 163 PB - Wiley CY - Chichester AN - OPUS4-11929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Synchrotron radiation refraction topography for charcterization of lightweight materials N2 - The employment of synchrotron radiation for refraction topography of materials has considerable advantages over standard x-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro-structured materials. This effect of x-ray optics is additional to small-angle scattering by diffraction, when the scattering objects reach micrometre dimensions. We have developed x-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high-performance composites, ceramics and other low-density materials. Sub-micron particle dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer-generated interface topographs. For this purpose investigations are now being performed at the new hard x-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 to 60 keV from a double multilayer and/or a double-crystal monochromator. A separate instrument is dedicated to the further development and application of synchrotron radiation refraction (SRR) topography. Different from conventional small-angle scattering cameras with collimating slits and pinholes, scattering angles down to a few seconds of arc are selected by a single-crystal analyser, similar to a Bonse-Hart diffractometer. A 20 µm spatial resolution of the scattering micro-structures is achieved by a CCD camera with a fluorescent converter. First SRR topographs of aircraft composites [carbon fibre-reinforced plastics (CFRP), carbon fibre-reinforced ceramics (C/C), metal matrix ceramics (MMC)] will be reported. KW - BAMline KW - Refraction topography PY - 2004 DO - https://doi.org/10.1002/xrs.736 SN - 0049-8246 VL - 33 IS - 6 SP - 402 EP - 406 PB - Wiley CY - Chichester AN - OPUS4-11930 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. T1 - Materialforschung mit Synchrotron-Refraktions-Computer-Tomographie an der BAMline KW - Synchrotron Strahlung KW - Computer Tomographie KW - NDE KW - Ti-MMC KW - BAMline PY - 2005 SN - 1616-069X SN - 0948-5112 VL - 96 IS - Oktober SP - 36 EP - 39 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-11931 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - X-Ray Refraction Topography and Computed Tomography for NDE of Lightweight Materials T2 - 9th European Conference on NDT CY - Berlin, Germany DA - 2006-09-25 KW - Synchrotron Refraction CT KW - MMC KW - Bragg-Magnification PY - 2006 SN - 3-931381-86-2 SP - 1(?) EP - 9(?) PB - European Federation for Non-Destructive Testing CY - Berlin AN - OPUS4-13703 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-Ray Diffraction Tomography images Materials by Molecular Probe T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Röntgen-Refraktions-Topographie T2 - BAMline - 3.Seminar zur Nutzung des Wellenlängenschieber-Messplatzes bei BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5576 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - X-Ray Refraction Topography T2 - Seminar Methoden der Röntgen Fluoreszenz Analyse, TU Berlin CY - Berlin, Germany DA - 2004-02-03 PY - 2004 AN - OPUS4-5565 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Submikrometer-Computer-Tomografie an der BAMline T2 - DACH-Jahrestagung 2004: ZfP in Forschung, Entwicklung und Anwendung CY - Salzburg, Austria DA - 2004-05-17 PY - 2004 AN - OPUS4-5566 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-Ray Refraction Topography characterizes Internal Nano Interfaces T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Materialcharakterisierung mittels Synchronstrahlung / Refraktions Computer Tomographie T2 - Seminarvortrag im Institut für Gerätebau IFG, Adlershof CY - Berlin, Germany DA - 2005-11-10 PY - 2005 AN - OPUS4-11374 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Materialforschung mit Synchrotron-Refraktions-Computer-Tomografie an der BAMline T2 - Vortrag im DGZfP Arbeitskreis Saarbrücken CY - Saarbrücken, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11375 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Von der absorptiven zur refraktiven Synchroton-Computer-Tomographie T2 - BAM-Kolloquium CY - Berlin, Germany DA - 2005-02-23 PY - 2005 AN - OPUS4-11401 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Materialforschung mit Synchrotron-Refraktions-Computer-Tomographie an der BAMline T2 - Vortrag im Sonderkolloquium der DGZfP zu Ehren von Dr. Ing. Klaus Berner, DGZfP-Tagungszentrum, Adlershof CY - Berlin, Germany DA - 2005-02-01 PY - 2005 AN - OPUS4-11402 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - X-Ray Refraction Topography and Computed Tomography for NDE of lightweiht materials T2 - 10th SPIE Annual International Symposium "Nondestructive Evaluation for Helth Monitoring and Diagnostics" CY - San Diego, CA, USA DA - 2005-03-06 PY - 2005 AN - OPUS4-11978 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Röntgen-Interface-Radiographie im Dunkelfeld N2 - Es wird ein Verfahren zur Röntgenabbildung schwach absorbierender Objekte vorgestellt. Als kontrastgebender Effekt wird die Röntgenrefraktion an Ober- und Grenzflächen ausgenutzt. Zur Erzeugung eines sogenannten Dunkelfeldes wird ein schwach gekrümmter Transmissionskristall eingesetzt, der lokal, d.h. in einem kleinen Ausschnitt des Einstrahlquerschnitts, die Bragg-Bedingung erfüllt. Innerhalb dieser Zone erscheinen die durch Refraktion abgelenkten Strahlkomponenten als hell leuchtende Interface-Strukturen. Die Synthese mehrerer Dunkelfeldstreifen ergibt hochaufgelöste 2D Beispiel von biologischen und technischen Mikrostrukturen. T2 - DGZfP-Jahrestagung 2013 CY - Dresden, Germany DA - 06.05.2013 KW - Refraction enhanced imaging (REI) KW - Radiographie KW - Dunkelfeldabbildung KW - Röntgenrefraktion PY - 2013 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-286900 SN - 978-3-940283-49-8 IS - Di.3.C.1 SP - 1 EP - 7 PB - Deutsche Gesellschaft für zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-28690 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Refraktions-Interface-Radiographie T2 - DGZfP-Jahrestagung 2013 CY - Dresden, Germany DA - 2013-05-06 KW - Röntgenrefraktion KW - Kleinwinkelstreuung KW - Refraktionstopographie KW - Nanostrukturen PY - 2013 SN - 978-3-940283-49-8 IS - Mo.2.A.2 SP - 1 EP - 10 AN - OPUS4-28691 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Einfaches Korrigieren des Hinterleuchtens von Röntgendetektoren N2 - Hinterleuchten stellt eine oft unerkannte Fehlweisung in der radiographischen Abbildung mit Flächendetektoren dar, die durch diffuse Umverteilung der Intensität verursacht wird. Dieser Effekt kann die korrekte Transmissions-Intensität eines Probekörpers gemäß dem Lambert-Beer'schen Gesetz erheblich verfälschen. Hinterleuchten wird sowohl mit Bremsstrahlung von Röntgenröhren als auch mit monochromatischer Synchrotronstrahlung beobachtet. Die fehlerhaft reduzierten Schwächungskoeffizienten von einigen 10 % korrelieren mit der Strahlschwächung und dem direkt bestrahlten Detektorbereich. Für eine einfache numerische Korrektur des Hinterleuchtens werden lediglich integrale Intensitätswerte benötigt. KW - Hinterleuchten KW - Röntgendetektor KW - Fluoreszenzschirm KW - Radiographie PY - 2013 DO - https://doi.org/10.3139/120.110478 SN - 0025-5300 VL - 55 IS - 7-8 SP - 1 EP - 5 PB - Hanser CY - München AN - OPUS4-28692 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - A comfortable procedure for correcting X-ray detector backlight N2 - A novel approach is suggested to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals 'backlighting' of 2D X-ray detectors. Depending on the detector geometry the mechanism may be different. Either based on the optical scattering of the fluorescent screen materials into the optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer's law in single projections (radiographs) as a function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2013 DO - https://doi.org/10.1088/1742-6596/425/19/192015 SN - 1742-6588 SN - 1742-6596 VL - 425 IS - 19 SP - 192015-1 EP - 192015-4 PB - IOP Publ. CY - Bristol, UK AN - OPUS4-28262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Witt, Jens A1 - Schukar, Marcus A1 - Breithaupt, Mathias A1 - Müller, Bernd R. A1 - Krebber, Katerina T1 - MPOF LPGs as radiation sensors N2 - We investigated to our knowledge for the first time the capabilities of long period gratings (LPG) in single-mode microstructured polymer optical fibre (mPOF) as real-time gamma dosimeter. The fibre is made from polymethyl methacrylate (PMMA) with a polycarbonate jacket. We measured the radiation-induced wavelength shift of the mPOF LPG loss feature wavelength and the radiation-induced attenuation of a mPOF for different wavelength between 600 nm and 800 nm for gamma radiation with an energy distribution between 6 keV and 18 keV. T2 - POF 2011 - 20th International conference on plastic optical fibers CY - Bilbao, Spain DA - 14.09.2011 KW - Microstructured polymer optical fibre (mPOF) KW - Long period grating (LPG) KW - Radiation sensor PY - 2011 SP - 1 EP - 3 AN - OPUS4-24499 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Correction of diffuse X-ray detector based background N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (“backlight”) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the sample’s aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation. Moreover, the local intensity mismatch depends on the attenuation of the sample. We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism. T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography CY - Berlin, Germany DA - 20.06.2011 KW - Backlight KW - X-ray detector KW - Fluorescence screen KW - Synchrotron radiography KW - Computed tomography PY - 2011 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-243589 SN - 978-3-940283-34-4 IS - DGZfP-BB 128 (Poster 24) SP - 1 EP - 7 PB - Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-24358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Synchrotron based refraction enhanced micro-CT for non-destructive characterisation of biological materials T2 - EUROMAT 2011 European Congress and Exhibition on Advanced Materials and Processes CY - Montpellier, France DA - 2011-09-12 PY - 2011 AN - OPUS4-24903 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Tötzke, C. A1 - Manke, I. A1 - Arlt, Tobias A1 - Markötter, H. A1 - Hilger, A. A1 - Kardjilov, N. A1 - Krüger, P. A1 - Scholta, J. T1 - Non-Destructive Analysis of Water and Media Distribution in Fuel Cells by Means of Neutron and Synchrotron X-ray Imaging T2 - 220th ECS Meeting and Electrochemical Energy Summit CY - Boston, MA, USA DA - 2011-10-09 PY - 2011 AN - OPUS4-25381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - Korrektur des Hinterleuchtens an CT-Synchrotrondaten N2 - In den unterschiedlichsten Methoden der Computertomographie tritt häufig ein diffuses Untergrundsignal in den Einzelprojektionen auf: im Falle der Parallelstrahl-CT mit Synchrotronstrahlung handelt es sich um ein Hinterleuchten durch den Fluoreszenzschirm, der vor der CCD-Kamera angeordnet ist. Dieses Hinterleuchten unterscheidet sich von dem bekannten Nachleuchten (Phosphoreszenz) durch zeitliche Konstanz. Hier äußert sich das Hinterleuchten als Modulation der projizierten Masse und somit als Funktion der Phase (Projektionswinkel) und des Aspektverhältnisses des Objektes. Der Einfluss des Hinterleuchtens ist abhängig von der Größe des von der Probe abgeschatteten Detektorbereiches und des Objektumfangs (Dynamik). Dies hat u.a. zur Folge, dass Abweichungen vom Absorptionsgesetz auftreten, die umso stärker ausgeprägt sind, je weniger Detektorfläche das Objekt abdeckt und je stärker das Objekt schwächt. Dabei können Aufhärtungseffekte wegen der monochromatischen Strahlung ausgeschlossen werden. Mit Referenzmessungen und einem isotropen, homogenen Ansatz, der diese Abweichung als Hinterleuchten beschreibt, lassen sich die auftretenden Fehler deutlich verringern. T2 - DGZfP-Jahrestagung 2011 CY - Bremen, Germany DA - 30.05.2011 KW - Hinterleuchten KW - Detektor KW - Fluoreszenzschirm KW - Synchrotron-Radiographie KW - Computer-Tomographie PY - 2011 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-250038 SN - 978-3-940283-33-7 IS - DGZfP-BB 127 (P6) SP - 1 EP - 8 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) AN - OPUS4-25003 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. T1 - Werkstoffcharacterisierung mittels Röntgen-Refraktions- und Weitwinkel- Topographie T2 - Jubiläumssitzung 50 Jahre DGZfP-Arbeitskreis Berlin CY - Berlin, Germany DA - 2012-12-11 PY - 2012 AN - OPUS4-27474 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. ED - Czichos, Horst T1 - Micro-diagnostics: X-ray and synchrotron techniques N2 - Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution. KW - X-ray KW - X-ray refraction KW - X-ray refraction topography KW - X-ray refraction tomography KW - X-ray scattering KW - USAXS KW - Wide angle X-ray scattering KW - WAXS KW - Interfaces KW - Inner surface density KW - Diffraction enhanced imaging KW - DEI KW - Synchrotron radiation KW - Synchrotron refraction computed tomography KW - SRCT KW - Fibre orientation KW - X-ray diffraction microscopy PY - 2013 SN - 978-3-642-25849-7 SN - 978-3-642-25850-3 DO - https://doi.org/10.1007/978-3-642-25850-3_14 IS - Chapter 14 SP - 287 EP - 300 PB - Springer CY - Berlin Heidelberg AN - OPUS4-27746 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - Numerische Korrektur des Hinterleuchtens von Röntgendetektoren N2 - Eine neuartige Korrektur artefaktisch gemessener Intensitäten von Röntgenflachdetektoren wird vorgeschlagen. Die betrachteten Artefakte betreffen eine diffuse Umverteilung der Intensität und führen zu beträchtlichen Verfälschungen der wahren Schwächung und verletzen mithin das Lambert-Beer'sche Gesetz. Sie werden sowohl in Laborexperimenten mit Röntgenröhren (polychromatische Einstrahlung) als auch mit monochromatischer Synchrotronstrahlung bei Einsatz indirekt konvertierender Detektionssysteme (Fluoreszenzschirm, Optik, CCD-Chip) beobachtet. Dieser Effekt wird als Hinterleuchten bezeichnet. In der vorgestellten Studie werden mittels wohldefinierter Randbedingungen Gesetzmäßigkeiten des Hinterleuchtens untersucht: durch Einsatz monochromatischer Strahlung können Aufhärtungseffekte als Ursache ausgeschlossen werden. Das Hinterleuchten ist umso stärker ausgeprägt, je weniger Detektorfläche vom Objekt abdeckt wird und je stärker das Objekt schwächt. Mit Blick auf Tomographien ergibt sich eine Modulation der 'Dichte' als Funktion des Projektionswinkels, deren Amplitude mit dem Objektumfang steigt (Dynamik). Der isotrope und homogene Ansatz zur numerischen Korrektur macht lediglich Gebrauch von Intensitätsmittelwerten und stellt die Gültigkeit des Schwächungsgesetzes in modifizierter Form wieder her. T2 - DACH-Jahrestagung 2012 CY - Graz, Austria DA - 2012-09-17 KW - Röntgendetektor KW - Hinterleuchten PY - 2012 SN - 978-3-940283-44-3 IS - DGZfP-BB 136 SP - P 13 / Mo.4.B, 1 EP - 7 AN - OPUS4-27737 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Numerical correction of X-ray detector backlighting N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering by the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert–Beer's law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation phase and the sample’s aspect ratio (dynamics). The magnitude of the diffuse background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shadowed area and the stronger the total attenuation. This implies that the reconstruction suffers from additional anisotropic artifacts caused by elongated sample structures. This issue is studied simply by absorption of flat plates in a conventional laboratory radiography set-up and at a synchrotron radiation facility. In the latter case beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure requires simple integral intensity offsets as a constant (non-local) light scattering mechanism is assumed. KW - Detector backlighting KW - X-ray detector scattering KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 DO - https://doi.org/10.3139/146.110659 SN - 1862-5282 VL - 103 IS - 2 SP - 174 EP - 178 PB - Carl Hanser CY - München AN - OPUS4-25553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Markötter, H. A1 - Manke, I. A1 - Haußmann, J. A1 - Arlt, Tobias A1 - Klages, M. A1 - Krüger, P. A1 - Hartnig, C. A1 - Scholta, J. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Banhart, J. T1 - Combined synchrotron X-ray radiography and tomography study of water transport in gas diffusion layers N2 - Synchrotron X-ray radiography and tomography investigations of a custom-made polymer electrolyte membrane fuel cell optimised for visualisation purposes are presented. The 3D water distribution and transport pathways in the porous carbon fibre gas diffusion layers (GDLs) were investigated. The authors found that water is not only moving from the GDL into the channel, but can also take the opposite way, that is, from the channel into free pore space of the GDL. Such movement of water into the opposite direction has been subject of speculations but has so far not yet been reported and might bring new insights into the general water transport behaviour, which might give new aspects to the general description of water transport processes and influence modelling assumptions to describe the process taking place in the GDL. KW - Synchrotron radiography KW - Synchrotron tomography KW - Gas diffusion layers KW - Water transport PY - 2012 DO - https://doi.org/10.1049/mnl.2012.0410 SN - 1750-0443 VL - 7 IS - 7 SP - 689 EP - 692 PB - IET CY - London AN - OPUS4-26282 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - X-Ray refraction computed tomography for NDE of lightweight materials T2 - Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten 2006 (SNI2006) CY - Hamburg, Germany DA - 2006-10-04 PY - 2006 AN - OPUS4-15836 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE T2 - International Symposium on Digital industrial Radiology and Computed Tomography (DIR 2007) CY - Lyon, France DA - 2007-06-25 KW - X-ray Refraction KW - Diffraction Enhanced Imaging (DEI) KW - Bragg Magnification KW - Synchrotron Radiation KW - Computed Tomography (CT) KW - Metal Matrix Composites (MMC) KW - Lightweight Materials KW - Aerospace PY - 2007 IS - CD-ROM SP - 1 EP - 8 CY - Lyon, France AN - OPUS4-16366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Issever, A. A1 - Diederichs, G. A1 - Rogalla, P. A1 - Hamm, B. T1 - First synchrotron refraction CT of cartilage T2 - BESSY Users Meeting 2007 CY - Berlin, Germany DA - 2007-12-06 PY - 2007 AN - OPUS4-16367 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rack, A. A1 - Zabler, S. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd A1 - Müller, Bernd R. A1 - Helfen, L. A1 - Stiller, M. A1 - Knabe, C. A1 - Goebbels, Jürgen A1 - Banhart, J. T1 - Nondestructive 3D insights into foamy metals and bioregenerative ceramics KW - X-ray Computed Tomography KW - Metal foams KW - Bioregenerative ceramics PY - 2008 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2007.pdf#page=34 SN - 1611-6127 SP - 34 EP - 35 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Non-destructive characteriazation of high perfomance composites by use of X-ray refraction topography T2 - SAMPE 2003, "Advancing Materials in the Global Economy - Applications, Emerging Markets and Evolving Technologies" CY - Long Beach, CA, USA DA - 2003-05-11 PY - 2003 AN - OPUS4-4458 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography - application to metal matrix composites T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 AN - OPUS4-4459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Refraction computed tomography applied to metal matrix composites materials and processing: enabling flight ... our legacy and our future T2 - 35th International SAMPE Technical Conference-2003 CY - Dayton, OH, USA DA - 2003-09-28 PY - 2003 AN - OPUS4-4460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rack, A. A1 - Zabler, S. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd A1 - Lange, Axel A1 - Goebbels, Jürgen A1 - Hentschel, Manfred P. A1 - Görner, Wolf T1 - High resolution synchrotron-based radiography and tomography using hard X-rays at the BAMline (BESSY II) N2 - The use of high brilliance and partial coherent synchrotron light for radiography and computed tomography (CT) allows to image micro-structured, multi-component specimens with different contrast modes and resolutions up to submicrometer range. This is of high interest for materials research, life science and non-destructive evaluation applications. An imaging setup for microtomography and radiography installed at BESSY II (a third generation synchrotron light source located in Berlin, Germany) as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast — dedicated to inhouse research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. For imaging applications the synchrotron beam transmitted by the sample is converted with a scintillator into visible light. By use of microscope optics this luminescence image is then projected onto, e.g., a CCD chip. Several scintillating materials are used in order to optimise the performance of the detector system. Different optical systems are available for imaging ranging from a larger field of view and moderate resolutions (macroscope — up to 14 mm x 14 mm field of view) to high resolution (microscope — down to 0.35 μm pixel size), offering magnifications from 1.8× to 40×. Additionally asymmetric cut Bragg crystals in front of the scintillator can be used for a further magnification in one dimension by a factor of about 20. Slow and fast cameras are available, with up to 16 bit dynamic range. We show the suitability of the setup for numerous applications from materials research and life science. KW - Microtomography KW - Non-destructive evaluation KW - Synchrotron instrumentation KW - Coherent imaging KW - X-ray refraction KW - Phase contrast KW - Holotomography KW - Synchrotron-CT KW - Scintillator KW - Bragg magnification PY - 2008 DO - https://doi.org/10.1016/j.nima.2007.11.020 SN - 0168-9002 SN - 0167-5087 VL - 586 IS - 2 SP - 327 EP - 344 PB - North-Holland CY - Amsterdam AN - OPUS4-17738 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron based Micro-CT and Refraction Enhanced MicroCT for Non-Destructive Materials Characterization T2 - Materials Science and Engineering MES 08 CY - Fürth, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18154 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Refraction Enhanced MicroCT for Non-Destructive Materials Characterization T2 - Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms CY - Dresden, Germany DA - 2008-10-22 PY - 2008 AN - OPUS4-18151 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchroton based micro-CT and refraction enhanced micro-CT of MMC T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 PY - 2008 AN - OPUS4-18152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Excellence of refraction enhanced micro-CT for materials characterization T2 - 27. BESSY Users Meeting CY - Berlin, Germany DA - 2008-12-04 PY - 2008 AN - OPUS4-18388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver ED - Gerhard Busse, ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios T1 - NDE of micro structured materials by X-ray diffraction and refraction topography T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Nondestructive testing KW - X-ray scattering KW - X-ray topography KW - Computed topography KW - Synchrotron refraction computed tomography KW - Structure property relations KW - Composite damaging KW - Ceramics KW - Foams PY - 2007 SN - 978-0-415-46476-5 SP - 15 EP - 22 PB - Taylor & Francis CY - London, UK AN - OPUS4-17561 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE N2 - X-ray refraction topography techniques are based on ultra-small angle scattering by micro-structural elements causing phase-related effects such as refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The refraction contrast is several times higher than “true absorption” and results in images of cracks, pores and fibre debonding separations below the spatial resolution of the detector. In most cases the investigated inner surface and interface structures correlate to mechanical properties. For the exploration of micro structured materials the refraction technique has been improved by a 3D Synchrotron Refraction Computed Tomography test station. The specimen is placed in an X-ray beam between two single crystals, which suppresses all sample scattering. In addition, an asymmetric cut second crystal can magnify the image up to 50 times revealing nano meter resolution. The technique is an alternative to other attempts on raising the spatial resolution of CT machines. KW - X-ray refraction KW - Diffraction Enhanced Imaging (DEI) KW - Bragg magnification KW - Synchrotron radiation KW - Computed Tomography (CT) KW - Metal Matrix Composites (MMC) KW - Lightweight materials KW - Aerospace PY - 2008 DO - https://doi.org/10.1784/insi.2008.50.6.316 SN - 0007-1137 VL - 50 IS - 6 SP - 316 EP - 319 PB - British Institute of Non-Destructive Testing CY - Northampton AN - OPUS4-18001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchroton based Refraction Enhanced Micro CT for Non-Destructive Materials Characterization T2 - Materials Science and Engineering MES 08 CY - Nuremberg, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18526 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. ED - Czichos, Horst ED - Tetsuya Saito, ED - Leslie Smith, T1 - Computed tomography - Application to composites and microstructures KW - Microstructures KW - Computed tomography KW - X-ray refraction tomography KW - Composites PY - 2006 SN - 978-3-540-20785-6 SP - 870 EP - 875 PB - Springer CY - Berlin AN - OPUS4-14066 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Visualization of flexural loaded Integrated Circuits T2 - BESSY Users Meeting 2006 CY - Berlin, Germany DA - 2006-12-07 PY - 2006 AN - OPUS4-14199 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Harwardt, Michael A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron refraction CT and synchrotron bragg magnification CT for NDE T2 - International Symposium on Digital Industrial Radiology and Computed Tomography CY - Lyon, France DA - 2007-06-25 PY - 2007 AN - OPUS4-14323 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Sichere Automobil Elektronik durch nanogenaues Synchronotron-Prüfverfahren SyBrATo T2 - DGZfP Jahrestagung 2007 CY - Fürth, Germany DA - 2007-05-14 PY - 2007 AN - OPUS4-14324 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron-refraction-computed-tomography for NDT and characterisation of lightweight composite materials T2 - 4th International Conference: Emerging Technologies in Non-Destructive Testing CY - Stuttgart, Germany DA - 2007-04-02 PY - 2007 AN - OPUS4-14325 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - 3D synchrotron refraction and sub-micrometer computed tomography at BAMline T2 - Industrieforum "Bildgebende Röntgenverfahren neue Einblicke in kleinste Strukturen" CY - Karlsruhe, Germany DA - 2006-11-17 PY - 2006 AN - OPUS4-15467 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Visualisierung gebogener Ics - Wozu? T2 - Industrieforum "Bildgebende Röntgenverfahren, neue Einblicke in kleinste Strukturen" CY - Karlsruhe, Germany DA - 2006-11-17 PY - 2006 AN - OPUS4-15469 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg T1 - Das Anwendungspotential der Röntgen-Topographie vom Mikroriss bis zur Gepäckprüfung T2 - DGZfP-Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - CFK KW - Bildgebende Röntgenverfahren KW - Röntgen-Topographie und -Streuung KW - Keramik KW - Explosivstoffe KW - Ermüdungsrisse PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 9 PB - DGZfP CY - Berlin AN - OPUS4-15799 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Hamm, B. A1 - Rogalla, P. A1 - Diederichs, G. A1 - Issever, A.S. T1 - First Synchrotron Refraction CT of Cartilage KW - X-ray Refraction KW - Computed Tomography KW - DEI KW - Cartilage PY - 2008 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2007-v2.pdf#page=292 SN - 0179-4159 SP - 292 EP - 296 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17661 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Issever, A.S. A1 - Diederichs, G. A1 - Majumdar, S. A1 - Rogalla, P. A1 - Hamm, B.K. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Analyser-based tomography images of cartilage N2 - Analyser-based imaging expands the performance of X-ray imaging by utilizing not only the absorption properties of X-rays but also the refraction and scatter rejection (extinction) properties. In this study, analyser-based computed tomography has been implemented on imaging an articular cartilage sample, depicting substructural variations, without overlay, at a pixel resolution of 3.6 µm. KW - Cartilage KW - Analyser-based imaging KW - Computed tomography PY - 2008 DO - https://doi.org/10.1107/S0909049508014829 SN - 0909-0495 SN - 1600-5775 VL - 15 IS - Part 5 SP - 525 EP - 527 PB - Blackwell Publishing CY - Oxford AN - OPUS4-17852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Schors, Jörg A1 - Müller, Bernd R. A1 - Harwardt, Michael T1 - Vom Synchrotron ins Labor - Konversion von Einkristall-Techniken für Röntgenröhren KW - Einkristall KW - Röntgenbeugung KW - Synchrotron KW - Divergenz PY - 2008 SN - 0025-5300 VL - 50 IS - 10 SP - 580 EP - 587 PB - Hanser CY - München AN - OPUS4-18248 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Submikro-Computer-Tomographie an der BAMline T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2004 CY - Salzburg, Österreich DA - 2004-05-17 KW - Computer Tomographie KW - Vergrößerung mit asymmetrischen Kristallen PY - 2004 UR - http://www.ndt.net/article/dgzfp04/papers/v09/v09.htm SN - 3-931381-55-2 SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-5869 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Refraction computed tomography - Application to metal matrix composites N2 - Erstmals wurden MMCs mit Hilfe der Interface-Kontrast verstärkenden Röntgen-Refraktions-Technik in Kombination mit der 3D-CT-Technik untersucht. Die Methode der Röntgen-Refraktions-Topography sowie der Röntgen-Refraktions-Tomography wurden in den letzten Jahren speziell für die zerstörungsfreie Charakterisierung von Leichtbau-Hochleistungs-Werkstoffen wie Verbund-Werkstoffen und Keramiken entwickelt. Die Technik basiert auf der Refraktion von Röntgenlicht an Grenzflächen zwischen Bereichen unterschiedlicher Elektronendichte wie z.B. Faser- und Matrix-Werkstoff. Auf Grund der kurzen Röntgen-Wellenlänge hat der Brechungsindex einen Wert dicht bei eins, sodass der Streuwinkel nur wenige Bogenminuten beträgt. Der Vorteil der kurzen Wellenlänge besteht jedoch darin, dass Poren und Risse detektiert werden können, deren Größe im Nanometerbereich liegen. Damit kann die Refraktions-Technik zum besseren Verständnis von Mikro- und Submikro-Strukturen in der Materialwissenschaft eingesetzt werden. Mit der hier vorgestellten Refraktions-CT wurden Ermüdungsmechanismen an MMCs, bestehend aus SiC-Faser verstärktem Titan (Ti6242) untersucht. Die Messungen wurden am Röntgen-Messplatz der BAM (BAMline) am Synchrotron-Speicherring-BESSY in Berlin Adlershof durchgeführt. KW - X-ray refraction KW - Computed tomography PY - 2004 DO - https://doi.org/10.3139/120.100592 SN - 0025-5300 VL - 46 IS - 6 SP - 314 EP - 319 PB - Carl Hanser Verlag CY - München AN - OPUS4-5870 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of metal composites by synchrotron-refraction-CT KW - Synchrotron Refraction CT PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=483 SN - 0179-4159 SP - 483 EP - 485 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7381 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Lange, Axel T1 - Synchrotron-Refraktions-Computer Tomographie für die Materialforschung T2 - DGZfP Jahrestagung CY - Rostock, Deutschland DA - 2005-05-02 KW - Computer-Tomographie KW - Synchrotronstrahlung KW - Refraktionskontrast KW - Bragg-Vergrößerung PY - 2005 SN - 3-931381-64-1 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 94-CD SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-11698 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Wald, Oliver T1 - Quantitative X-ray Determination of CFRP Micro Structures T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - Neutronen-Radiographie KW - Neutronen-Tomographie KW - Tomographische Rekonstruktionsalgorithmen KW - Brennstoffzellen KW - In-Situ Radiologie PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (X-Ray/Lecture 13) SP - 89 EP - 98 PB - DGZfP CY - Berlin AN - OPUS4-18606 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron Based Micro-CT and Refraction Enhanced Micro-CT of MMC T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - X-ray Refraction KW - Synchrotron Radiation KW - Computed Tomography KW - Metal Matrix Composites KW - Lightweight Materials KW - Aerospace PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (Poster 10) SP - 295 EP - 305 PB - DGZfP CY - Berlin AN - OPUS4-18607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Synchrotron-Refraktions-Computertomografie - eine neue Methode zur Erkennung von Grenzflächen N2 - Röntgenstrahlung eignet sich besonders gut zur zerstörungsfreien Charakterisierung von Werkstoffen. Mit ihrer Hilfe lassen sich z. B. Risse und Poren in Werkstoffen erkennen. Die Risserkennbarkeit ist jedoch von der Rissgröße im Vergleich zum Auflösungsvermögen des Detektors abhängig. Risse, Poren oder Einschlüsse können in Radiogrammen nur dann erkannt werden, wenn sie größer sind als das Detektorelement, das die Röntgenstrahlen registriert. Das hier vorgestellte neuartige Synchrotron-Refraktions-Computertomografie-Verfahren ist jedoch in der Lage, auch Risse zu erkennen, deren Größe weit unterhalb des Auflösungsvermögens des Detektors liegt. Das Verfahren basiert auf dem bisher wenig genutzten Phänomen der Kleinwinkelstreuung durch Brechung von Röntgenstrahlen an den inneren Grenzflächen mikroskopisch strukturierter Objekte. Durch den Vergleich zwischen absorptionsbasierter und refraktionsbasierter Computertomografie-Untersuchungen mit Synchrotronstrahlung an einer geschädigten Faserverbundprobe wird das Potenzial der Synchrotron-Refraktions-Computertomografie demonstriert. KW - Synchrotronstrahlung KW - Refraktion KW - Diffraktion KW - Kleinwinkelstreuung KW - Materialcharakterisierung KW - Zerstörungsfrei PY - 2008 SN - 0025-5300 VL - 50 IS - 10 SP - 588 EP - 594 PB - Hanser CY - München AN - OPUS4-18657 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. ED - Paul Sellin, T1 - Refraction enhanced micro-CT for non-destructive materials characterization T2 - IEEE Nuclear Science Symposium CY - Dresden, Germany DA - 2008-10-19 KW - Synchrotron KW - Micro-CT KW - Refraction PY - 2008 SN - 978-1-4244-2715-4 SN - 1082-2654 SP - 541 EP - 546 AN - OPUS4-18662 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - de Andrade Silva, F. A1 - Williams, J. J. A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Portella, Pedro Dolabella A1 - Chawla, N. T1 - Three-dimensional microstructure visualization of porosity and Fe-rich inclusions in SiC particle-reinforced Al alloy matrix composites by X-ray synchrotron tomography N2 - Microstructural aspects of composites such as reinforcement particle size, shape, and distribution play important roles in deformation behavior. In addition, Fe-rich inclusions and porosity also influence the behavior of these composites, particularly under fatigue loading. Three-dimensional (3-D) visualization of porosity and Fe-rich inclusions in three dimensions is critical to a thorough understanding of fatigue resistance of metal matrix composites (MMCs), because cracks often initiate at these defects. In this article, we have used X-ray synchrotron tomography to visualize and quantify the morphology and size distribution of pores and Fe-rich inclusions in a SiC particle-reinforced 2080 Al alloy composite. The 3-D data sets were also used to predict and understand the influence of defects on the deformation behavior by 3-D finite element modeling. KW - Synchrotron radiation KW - X-ray tomography KW - X-ray refraction KW - Analyser based imaging KW - Metal matrix composite (MMC) KW - Fatigue PY - 2010 DO - https://doi.org/10.1007/s11661-010-0260-0 SN - 1073-5623 SN - 1543-1940 VL - 41 IS - 8 SP - 2121 EP - 2128 PB - The Minerals, Metals and Materials Society CY - Warrendale AN - OPUS4-21629 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Trappe, Volker A1 - Goebbels, Jürgen A1 - Hickmann, Stefan A1 - Grasse, Fabian T1 - Non-destructive characterization of composites: From small scale to complex component testing - a challenge T2 - International Symposium on NDT in Aerospace CY - Hamburg, Germany DA - 2010-11-22 PY - 2010 AN - OPUS4-22403 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Trappe, Volker A1 - Goebbels, Jürgen A1 - Hickmann, Stefan A1 - Grasse, Fabian T1 - Non-destructive characterization of composites: from small scale to complex component testing - a challenge T2 - International Symposium on NDT in Aerospace CY - Hamburg, Germany DA - 2010-11-22 KW - Aircraft KW - Wind turbine blades KW - Automotive KW - X-ray refraction KW - Fibre orientation KW - WAXS technique KW - X-ray computed tomography PY - 2010 SN - 978-3-940283-28-3 IS - DGZfP-BB 124 (Tu.2.B.1) SP - 1 EP - 6 AN - OPUS4-22724 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Characterization of Metal Matrix Composites by Synchrotron Refraction Computed Tomography T2 - THERMEC'2009, TU Berlin CY - Berlin, Germany DA - 2009-08-25 PY - 2009 AN - OPUS4-20659 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron-Refraktions-Computer-Tomographie - Eine neue Methode zur Erkennung von Grenzflächen T2 - DGZfP-Jahrestagung 2009 CY - Münster, Germany DA - 2009-05-18 PY - 2009 AN - OPUS4-20660 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron-Refraktions-Computer-Tomographie - EIne neue Methode zur Erkennung von Grenzflächen T2 - DGZfP-Jahrestagung 2009 CY - Münster, Deutschland DA - 2009-05-18 KW - Synchrotronstrahlung KW - Refraktion KW - Diffraktion KW - Kleinwinkelstreuung KW - Materialcharakterisierung KW - Zerstörungsfrei PY - 2009 SN - 978-3-940283-16-0 IS - DGZfP-BB 115 (Di.1.A.1) SP - 1 EP - 11 AN - OPUS4-20609 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Tilgner, R. A1 - Alpern, P. T1 - Visualization of package induced deformation of Integrated Circuits T2 - SNI2010, Deutsche Tagung für Forschung mit Sychrotronstrahlung, Neutronen und Ionenstrahlen CY - Berlin, Germany DA - 2010-02-24 PY - 2010 AN - OPUS4-20959 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Rekonstruktion unvollständiger computertomografischer Modelldatensätze mit Directt-Algorithmus N2 - Modellrechnungen zur Rekonstruktion unvollständiger computertomographischer Datensätze werden zur Ermittlung der Vorteile des neuen Directt-Algorithmus gegenüber der konventionellen gefilterten Rückprojektion durchgeführt, insbesondere auch zur Vermeidung experimentell begründeter Unwägbarkeiten. Ein entsprechender Bedarf entsteht seitens erweiterter Forschungsaktivitäten und industrieller Bedürfnisse, wo die Rekonstruktion limitierter Messdatensätze von Artefakten dominiert wird. Die bekanntesten Einschränkungen betreffen das Limited-View- und Few-Angles-Problem sowie die ROI-Situation, die jeweils unabhängig voneinander untersucht werden, in der Anwendung jedoch zumeist undefiniert vermischt sind, wie etwa in der Elektronen-Tomografie. Die hochauflösende Rekonstruktion von Einzelpixeln wird durch die Wahl eines kleinen Modells von nur 1012 Pixeln visualisiert und ist ohne Filterung möglich. Rekonstruktionen von 90°-Sektoren oder 50 % -ROI-Querschnitten sind fast ohne Auflösungseinschränkungen realisierbar. Die bisher nicht bekannte Möglichkeit, auch außerhalb der ROI präzise zu rekonstruieren, wurde als "Extended ROI"-Methode erfolgreich erprobt. KW - Computed tomography KW - Reconstruction algorithm KW - Filtering KW - Limited view KW - Region of interest PY - 2010 SN - 0025-5300 VL - 52 IS - 10 SP - 668 EP - 675 PB - Hanser CY - München AN - OPUS4-22068 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Visualization of Package Induced Deformation of Integrated Circuits T2 - 10th European Conference on Non-Destructive Testing (ECNDT) CY - Moscow, Russia DA - 2010-07-07 PY - 2010 AN - OPUS4-22865 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel T1 - Numerische Korrektur des Hinterleuchtens von Röntgendetektoren T2 - DACH-Jahrestagung 2012 CY - Graz, Austria DA - 2012-09-17 PY - 2012 AN - OPUS4-26636 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas ED - Kastner, J. T1 - A comfortable procedure for correcting X-ray detector backlight T2 - Conference on industrial computed tomography CY - Wels, Austria DA - 2012-09-19 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 SN - 978-3-8440-1281-1 SN - 1610-4773 SP - 151 EP - 157 PB - Shaker CY - Aachen AN - OPUS4-26768 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Straightforward correction of X-ray detector backlighting N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/205_wcndtfinal00205.pdf SN - 978-0-620-52872-6 SP - 1 EP - 8(?) AN - OPUS4-25835 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Edge artefacts of radiographic images by X-ray refraction N2 - The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of high intensity and may reach the level of the primary beam. We present monochromatic synchrotron measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the reliability of laboratory refraction scanners applying X-ray tubes. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray refraction KW - Small angle scattering KW - Phase contrast radiography KW - Refraction topography KW - Nanostructures KW - Nanocracks PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/274_wcndtfinal00274.pdf SN - 978-0-620-52872-6 SP - 1 EP - 11(?) AN - OPUS4-25836 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite diesel particulate filter materials, part 1 X-ray refraction N2 - Bi-continuous porous ceramics for filtration applications possess a particularly complicated microstructure, with porosity and solid matter being intermingled. Mechanical, thermal, and filtration properties can only be precisely estimated if the morphology of both solid matter and porosity can be quantitatively determined. Using x-ray absorption and refraction, we quantitatively evaluate porosity and pore orientation in cordierite diesel particulate filter ceramics. Porosity values turn out to agree with mercury intrusion measurements, while pore orientation factors agree with published crystallographic texture data. KW - Porous ceramics KW - Pore orientation KW - X-ray refraction KW - Synchrotron KW - Interface PY - 2013 DO - https://doi.org/10.4416/JCST2013-00021 SN - 2190-9385 VL - 4 IS - 4 SP - 169 EP - 176 PB - Göller CY - Baden-Baden AN - OPUS4-29939 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tötzke, C. A1 - Gaiselmann, G. A1 - Osenberg, M. A1 - Bohner, J. A1 - Arlt, Tobias A1 - Markötter, H. A1 - Hilger, A. A1 - Wieder, F. A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Banhart, J. A1 - Schmidt, V. A1 - Lehnert, W. A1 - Manke, I. T1 - Three-dimensional study of compressed gas diffusion layers using synchrotron X-ray imaging N2 - We present a synchrotron X-ray tomographic study on the morphology of carbon fiber-based gas diffusion layer (GDL) material under compression. A dedicated compression device is used to provide well-defined compression conditions. A flat compression punch is employed to study the fiber geometry at different degrees of compression. Transport relevant geometrical parameters such as porosity, pore size and tortuosity distributions are calculated. The geometric properties notably change upon compression which has direct impact on transport conditions for gas and fluid flow. The availability of broad 3D paths, which are most important for the transport of liquid water from the catalyst layer through the GDL, is markedly reduced after compression. In a second experiment, we study the influence of the channel-land-pattern of the flow-field on shape and microstructure of the GDL. A flow-field compression punch is employed to reproduce the inhomogeneous compression conditions found during fuel cell assembly. While homogenously compressed underneath the land the GDL is much less and inhomogeneously compressed under the channel. The GDL material extends far into the channel volume where it can considerably influence gas and fluid flow. Loose fiber endings penetrate deeply into the channel and form obstacles for the discharge of liquid water droplets. KW - Synchrotron X-ray tomography KW - Gas diffusion layer (GDL) KW - Microstructure KW - Water transport path KW - Pore size analysis KW - Geometrical tortuosity PY - 2014 DO - https://doi.org/10.1016/j.jpowsour.2013.12.062 SN - 0378-7753 VL - 253 SP - 123 EP - 131 PB - Elsevier CY - Amsterdam [u.a.] AN - OPUS4-29979 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Röntgenrefraktometrie: Prinzipien und Anwendungen T2 - PRORA 2013 - Fachtagung Prozessnahe Röntgenanalytik CY - Berlin, Germany DA - 2013-11-21 PY - 2013 AN - OPUS4-29174 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - (Fast) neue Charakterisierungsmethoden für (fast) neue Werkstoffe T2 - 7. Sitzung des wissenschaftlichen Beirats der BAM CY - Berlin, Germany DA - 2013-10-15 PY - 2013 AN - OPUS4-29175 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Röntgenrefraktion T2 - BAM Arbeitskreis Synchrotronstrahlung CY - Berlin, Germany DA - 2013-07-25 PY - 2013 AN - OPUS4-29176 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Soares, A.P. A1 - Kupsch, Andreas A1 - Baum, D. A1 - Hesse, B. A1 - Zaslansky, P. T1 - Untersuchung der Integrität von glasfaserverstärkten Zahnstiften mittels Synchrotron-Röntgenrefraktion N2 - Die Integrität der Verstärkungsfasern in Komposit-Zahnstiften ist entscheidend für die Biegefestigkeit und die langfristige Haftung am Zement in den Wurzelkanälen. Es wurde vermutet, dass die Integrität von glasfaserverstärkten Zahnstiften durch das Beschleifen während der zahnmedizinischen Behandlung beeinträchtigt wird. Eine Beschädigung der Fasern führt zu einer erheblichen strukturellen Schwächung über den gesamten Stiftdurchmesser. Glasfragmente, die durch den Kontakt mit dem Zahnbohrer entstehen, können sich vom Stift lösen und die Haftfähigkeit erheblich verringern. Mit Hilfe hochauflösender Synchrotron-Röntgen-Refraktions-Radiographie (SXRR) konnte das Ausmaß der Schäden zuverlässig identifiziert und charakterisiert werden. Dazu wurden die Glasfaserstifte sowohl im Herstellungszustand als auch nach der Bearbeitung mit einem Diamantbohrer untersucht. Die Datensätze wurden zur Visualisierung und Quantifizierung der morphologischen Charakteristika intakter und durch das Beschleifen beschädigter Regionen analysiert. Sie zeigen Schäden im bearbeiteten Bereich (z. B. Brüche, Splitter und Risse) sowie herstellungsbedingte Inhomogenitäten der Fasern mit einer signifikanten Zunahme der inneren Oberflächen in Probenregionen, die durch das Beschleifen beschädigt wurden. T2 - DGZfP Jahrestagung 2022 CY - Kassel, Germany DA - 23.05.2022 KW - Röntgen-Refraktion KW - Verbundwerkstoffe KW - Zahnstifte PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-549231 SP - 1 EP - 7 AN - OPUS4-54923 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Soares, A.P. A1 - Kupsch, Andreas A1 - Baum, D. A1 - Hesse, B. A1 - Zaslansky, P. T1 - Untersuchung der Integrität von glasfaserverstärkten Zahnstiften mittels Synchrotron-Röntgenrefraktion N2 - Die Integrität der Verstärkungsfasern in Komposit-Zahnstiften ist entscheidend für die Biegefestigkeit und die langfristige Haftung am Zement in den Wurzelkanälen. Es wurde vermutet, dass die Integrität von glasfaserverstärkten Zahnstiften durch das Beschleifen während der zahnmedizinischen Behandlung beeinträchtigt wird. Eine Beschädigung der Fasern führt zu einer erheblichen strukturellen Schwächung über den gesamten Stiftdurchmesser. Glasfragmente, die durch den Kontakt mit dem Zahnbohrer entstehen, können sich vom Stift lösen und die Haftfähigkeit erheblich verringern. Mit Hilfe hochauflösender Synchrotron-Röntgen-Refraktions-Radiographie (SXRR) konnte das Ausmaß der Schäden zuverlässig identifiziert und charakterisiert werden. Dazu wurden die Glasfaserstifte sowohl im Herstellungszustand als auch nach der Bearbeitung mit einem Diamantbohrer untersucht. Die Datensätze wurden zur Visualisierung und Quantifizierung der morphologischen Charakteristika intakter und durch das Beschleifen beschädigter Regionen analysiert. Sie zeigen Schäden im bearbeiteten Bereich (z. B. Brüche, Splitter und Risse) sowie herstellungsbedingte Inhomogenitäten der Fasern mit einer signifikanten Zunahme der inneren Oberflächen in Probenregionen, die durch das Beschleifen beschädigt wurden. T2 - DGZfP Jahrestagung 2022 CY - Kassel, Germany DA - 23.05.2022 KW - Röntgen-Refraktion KW - Verbundwerkstoffe KW - Zahnstifte PY - 2022 AN - OPUS4-54924 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Microstructure characterization of materials using X-ray refraction techniques N2 - X-ray refraction is an excellent tool for the characterization of the microstructure of materials. However, there are only a few (synchrotron) laboratories in the world that use this technique for material characterisation. Therefore, the seminar will first explain the basic principles of X-ray refraction and the measurement techniques installed at the hard X-ray beamline BAMline at BESSY II (Berlin, Germany). This is followed by examples of investigations on fibre-reinforced plastic composites (CFRP) as well as ceramic (Cordierite, ZrO2-SiO2) and metallic materials (Ti-6Al-4V, Inconel). Some of the investigations were carried out both ex-situ and in-situ under mechanical and thermal load. The results are correlated with the mechanical properties of the materials. T2 - LNLS Users Group Seminar Series CY - Campinas, Brasil DA - 25.10.2022 KW - X-ray refraction KW - Analyzer-Based Imaging KW - BAMline PY - 2022 AN - OPUS4-56117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Laquai, René A1 - Wieder, Frank A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - The combined use of X-ray refraction and transmission radiography and computed tomography N2 - Alternative to conventional transmission-based radiography and computed tomography, X-ray refraction techniques are being increasingly used to detect damage in light materials. In fact, their range of application has been recently extended even to metals. The big advantage of X-ray refraction techniques is that they are able to detect nanometric defects, whose size would lie below the resolution of even state-of-the-art synchrotron-based X-ray computed tomography (SXCT). The superiority of synchrotron X-ray refraction radiography and tomography (SXRR and SXRCT) has been shown in the case of light materials, in particular composites. X-ray refraction techniques also yield a quantitifaction of the amount of damage (the so-called relative internal specific surface) and can well be compared with damage models. At the same time, it is impossible for SXRR and SXRCT to image single defects. We show that the combination of refraction- and transmission-based imaging techniques yields an impressive amount of additional information about the type and amount of defects in microstructured materials such as additively manufactured metals or metal matrix composites. We also show that the use of data fusion techniques allows the classification of defects in statistically significant representative volume elements. T2 - 11th Conference on Industrial Computed Tomography CY - Online meeting DA - 08.02.2022 KW - X-ray refraction radiography KW - Computed Tomography KW - Synchrotron radiation KW - Additive manufacturing KW - Damage evolution PY - 2022 UR - https://www.ndt.net/article/ctc2022/papers/ICT2022_paper_id268.pdf SP - 1 EP - 7 AN - OPUS4-54324 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Schaupp, Thomas A1 - Griesche, Axel A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Hannemann, Andreas A1 - Kannengießer, Thomas A1 - Bruno, Giovanni T1 - Quantitative analysis of hydrogen-assisted microcracking in duplex stainless steel through X-ray refraction 3D imaging N2 - While the problem of the identification of mechanisms of hydrogen assisted damage has and is being thoroughly studied, the quantitative analysis of such damage still lacks suitable tools. In fact, while, for instance, electron microscopy yields excellent characterization, the quantitative analysis of damage requires at the same time large field-of-views and high spatial resolution. Synchrotron X-ray refraction techniques do possess both features. In this work, we show how synchrotron X-ray refraction computed tomography (SXRCT) can quantify damage induced by hydrogen embrittlement in a lean duplex steel, yielding results that overperform even those achievable by synchrotron X-ray absorption computed tomography. As already reported in literature, but this time using a non-destructive technique, we show that the hydrogen charge does not penetrate to the center of tensile specimens. By the comparison between virgin and hydrogen-charged specimens, we deduce that cracks in the specimen bulk are due to the rolling process rather than hydrogen-assisted. We show that (micro)cracks propagate from the surface of tensile specimens to the interior with increasing applied strain, and we deduce that a significant crack propagation can only be observed short before rupture. KW - 2101 duplex stainless steel KW - Hydrogen embrittlement KW - Synchrotron radiation KW - X-ray refraction KW - Computed tomography KW - Microcracking PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542811 DO - https://doi.org/10.1002/adem.202101287 SN - 1438-1656 SP - 1 EP - 10 PB - Wiley-VCH CY - Weinheim AN - OPUS4-54281 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Serrano Munoz, Itziar A1 - Roveda, Ilaria A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Synchrotron X-ray refraction detects microstructure and porosity evolution during in-situ heat treatments N2 - For the first time, synchrotron X-ray refraction radiography (SXRR) has been paired with in-situ heat treatment to monitor microstructure and porosity evolution as a function of temperature. The investigated material was a laser powder bed fusion (LPBF) manufactured AlSi10Mg, where the initial eutectic Si network is known to disintegrate and spherodize into larger particles with increasing temperature. Such alloy is also prone to thermally induced porosity (TIP). We show that SXRR allows detecting the changes in the Si-phase morphology upon heating, while this is currently possible only using scanning electron microscopy. SXRR also allows observing the growth of pores, usually studied via X-ray computed tomography, but on much smaller fields-of-view. Our results show the great potential of in-situ SXRR as a tool to gain in-depth knowledge of the susceptibility of any material to thermally induced damage and/or microstructure evolution over statistically relevant volumes. KW - Synchrotron X-ray refraction radiography KW - Si network disintegration KW - Thermally induced porosity (TIP) KW - Laser powder bed fusion (LPBF) KW - Statistically relevant volumes KW - AlSi10Mg alloy PY - 2022 DO - https://doi.org/10.1016/j.msea.2022.142732 SN - 0921-5093 VL - 838 SP - 1 EP - 11 PB - Elsevier CY - Amsterdam AN - OPUS4-54297 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Léonard, F. A1 - Lange, A. A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - On the Morphological and Crystallographic Anisotropy of Diesel Particulate Filter Materials N2 - The determination of the anisotropy of materials’ microstructure and morphology (pore space) in diesel particulate filter (DPF) materials is an important problem to solve, since such anisotropy determines the mechanical, thermal, and filtration properties of such materials. Through the use of a dedicated (and simple) segmentation algorithm, it is shown how to exploit the information yielded by 3D X-ray computed tomography data to quantify the morphological anisotropy. It is also correlated that such anisotropy of the pore space Such anisotropy of the pore space is also correlated with the microstructure and crystallographic anisotropy of the material in several showcases: a microstructurally isotropic material, such as SiC, and some morphologically and microstructurally anisotropic cordierite materials. In the later case, the finer the grain size, the more isotropic the microstructure. KW - Diesel Particulate Filter Materials PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-540705 DO - https://doi.org/10.1002/adem.202101380 VL - 24 IS - 2101380 SP - 1 EP - 12 PB - Wiley VCH GmbH CY - Weinheim AN - OPUS4-54070 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Laquai, René A1 - Müller, Bernd R. A1 - Paciornik, S. A1 - Horvath, J. A1 - Tushtev, K. A1 - Rezwan, K. A1 - Bruno, Giovanni T1 - Evolution of Damage in All-Oxide Ceramic Matrix Composite After Cyclic Loading N2 - While structural ceramics usually display a brittle mechanical behavior, their composites may show nonlinearities, mostly due to microcracking. Herein, the stiffness evolution of a sandwich-like laminate of an Al2O3 15%vol. ZrO2 matrix reinforced with Nextel 610 fibers is studied as a function of number of cycles N in tension. The stiffness of the composite degrades with increasing N, indicating microcracking. However, synchrotron X-ray refraction radiography shows that the internal specific surface of such cracks varies differently. A modeling strategy is developed for the calculation of the equivalent stiffness of mixtures (first the matrix and then the sandwich), based on the Voigt and Reuß schemes. The Bruno–Kachanov model is then used to estimate the initial microcrack density in the matrix (due to the thermal expansion mismatch) and the amount of microcracking increase upon cyclic loading. The stiffness in the composite degrades dramatically already after 20 000 cycles but then remains nearly constant. The combination of mechanical testing, quantitative imaging analysis, and modeling provides insights into the damage mechanisms acting: microcrack propagation is more active than microcrack initiation upon cyclic loading, but the second also occurs. This scenario is similar but not equal to previous results on porous and microcracked ceramics. KW - Ceramic matrix composites KW - Homogenization schemes KW - Microcracking KW - Nonlinear behavior KW - Synchrotron X-ray refraction radiography PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-534541 DO - https://doi.org/10.1002/adem.202100763 SN - 1527-2648 SN - 1438-1656 VL - 24 IS - 6 SP - 2100763 -1 EP - 2100763 -13 PB - VCH GmbH CY - Weinheim AN - OPUS4-53454 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Mack, D. E. A1 - Laquai, René A1 - Kupsch, Andreas A1 - Helle, O. A1 - Sebold, D. A1 - Vaßen, R. A1 - Bruno, Giovanni T1 - Charakterisierung der Porositäts- und Rissdichteentwicklung in Wärmedämmschichten von Gasturbinenschaufeln mittels Synchrotron Refraktions Radiographie N2 - Die Degradation von Wärmedämmschichten(thermal barrier coatings - TBCs) in Gasturbinen durch glasartige Calcium-Magnesium-Aluminiumsilikat (CMAS)Ablagerungen aus verschiedenen Quellen istseit vielen Jahren ein anhaltendes Problem. In dieser Studie wurde mit Hilfe derSynchrotron-Röntgen-Refraktions-Radiographie (SXRR), und vergleichend mit der Elektronenmikroskopie, das Eindringen von CMAS in die poröse Struktur von atmosphärisch plasmagespritzten (APS)TBCs sowie die Bildung und das Wachstum von Rissen unter thermisch zyklischer Belastung untersucht. Die Ergebnisse deuten darauf hin, dass die Infiltration sowie deren Kinetik im Brenner-Teststand wesentlich vom Benetzungsverhalten des CMAS beeinflusst werden. Trotz desoffensichtlichen Angriffs von CMAS auf die Korngrenzen hat die Wechselwirkung von Yttriumdioxid-stabilisiertem Zirkoniumdioxid (YSZ) mit intrudiertem CMAS keinen unmittelbaren Einfluss auf die Struktur und Dichte der innen Oberflächen(Risse, Poren). In einem späteren Stadium wird die Bildung von Rissen senkrecht zur äußeren Oberfläche in einer breiteren Zone der TBC-Schicht beobachtet. T2 - DGZfP-Jahrestagung 2021 CY - Online meeting DA - 10.05.2021 KW - Thermal barrier coatings KW - TBC KW - SXRR - Synchrotron X-ray Refraction Radiography KW - CMAS - Calcium-Magnesium-Aluminiumsilikat PY - 2021 UR - https://jahrestagung.dgzfp.de/Programm#P32 AN - OPUS4-52665 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wipfler, B. A1 - Bradler, S. A1 - Büsse, S. A1 - Hammel, J. A1 - Müller, Bernd R. A1 - Pass, G. T1 - Evolutionary morphology of the antennal heart in stick and leaf insects (Phasmatodea) and webspinners (Embioptera) (Insecta: Eukinolabia) N2 - The morphology of the antennal hearts in the head of Phasmatodea and Embioptera was investigated with particular reference to phylogenetically relevant key taxa. The antennal circulatory organs of all examined species have the same basic construction: they consist of antennal vessels that are connected to ampullae located in the head near the antenna base. The ampullae are pulsatile due to associated muscles, but the points of attachment differ between the species studied. All examined Phasmatodea species have a Musculus (M.) interampullaris which extends between the two ampullae plus a M. ampulloaorticus that runs from the ampullae to the anterior end of the aorta; upon contraction, all these muscles dilate the lumina of both ampullae at the same time. In Embioptera, only the australembiid Metoligotoma has an M. interampullaris. All other studied webspinners instead have a M. ampullofrontalis which extends between the ampullae and the frontal region of the head capsule; these species do not have M. ampulloaorticus. Outgroup comparison indicates that an antennal heart with a M. interampullaris is the plesiomorphic character state among Embioptera and the likely ground pattern of the taxon Eukinolabia. Antennal hearts with a M. ampullofrontalis represent a derived condition that occurs among insects only in some embiopterans. These findings help to further clarify the controversially discussed internal phylogeny of webspinners by supporting the view that Australembiidae are the sister group of the remaining Embioptera. KW - Phylogeny KW - Polyneoptera KW - Metoligotoma PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-527795 DO - https://doi.org/10.1007/s00435-021-00526-4 SN - 1432-234X VL - 140 IS - 3 SP - 331 EP - 340 PB - Springer AN - OPUS4-52779 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mani, Deepak A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Diffraction Enhanced Imaging Analysis with Pseudo-Voigt Fit Function N2 - Diffraction enhanced imaging (DEI) is an advanced digital radiographic imaging technique employing the refraction of X-rays to contrast internal interfaces. This study aims at qualitatively and quantitatively evaluating images acquired using this technique and to assess how different fitting functions to the typical rocking curves (RCs) influence the quality of images. RCs are obtained for every image pixel. This allows the separate determination of the absorption and the refraction properties of the material in a position-sensitive manner. Comparison of various types of fitting functions reveals that the Pseudo-Voigt (PsdV) function is best suited to fit typical RCs. A robust algorithm was developed in the Python programming language, which reliably extracts the physically meaningful information from each pixel of the image. We demonstrate the potential of the algorithm with two specimens: a silicone gel specimen that has well-defined interfaces, and an additively manufactured polycarbonate specimen. KW - Diffraction Enhanced Imaging KW - Analyzer-Based Imaging KW - X-ray refraction KW - Non-Destructive Evaluation KW - Pseudo-Voigt fit function KW - Python PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-553791 DO - https://doi.org/10.3390/jimaging8080206 SN - 2313-433X VL - 8 IS - 8 SP - 1 EP - 13 PB - MDPI CY - Basel, Switzerland AN - OPUS4-55379 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tötzke, C. A1 - Gaiselmann, G. A1 - Osenberg, M. A1 - Arlt, Tobias A1 - Markötter, H. A1 - Hilger, A. A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Schmidt, V. A1 - Lehnert, W. A1 - Manke, I. T1 - Influence of hydrophobic treatment on the structure of compressed gas diffusion layers N2 - Carbon fiber based felt materials are widely used as gas diffusion layer (GDL) in fuel cells. Their transport properties can be adjusted by adding hydrophobic agents such as polytetrafluoroethylene (PTFE). We present a synchrotron X-ray tomographic study on the felt material Freudenberg H2315 with different PTFE finishing. In this study, we analyze changes in microstructure and shape of GDLs at increasing degree of compression which are related to their specific PTFE load. A dedicated compression device mimicking the channel-land pattern of the flowfield is used to reproduce the inhomogeneous compression found in a fuel cell. Transport relevant geometrical parameters such as porosity, pore size distribution and geometric tortuosity are calculated and consequences for media transport discussed. PTFE finishing results in a marked change of shape of compressed GDLs: surface is smoothed and the invasion of GDL fibers into the flow field channel strongly mitigated. Furthermore, the PTFE impacts the microstructure of the compressed GDL. The number of available wide transport paths is significantly increased as compared to the untreated material. These changes improve the transport capacity liquid water through the GDL and promote the discharge of liquid water droplets from the cell. KW - Gas diffusion layer KW - Synchrotron Tomography KW - Compression KW - Hydrophobic treatment KW - Water transport PY - 2016 DO - https://doi.org/10.1016/j.jpowsour.2016.05.118 SN - 0378-7753 VL - 324 SP - 625 EP - 636 PB - Elsevier CY - Amsterdam AN - OPUS4-36918 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Onel, Yener A1 - Lange, Axel A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Wolk, Thomas A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite Diesel particulate filter materials, Part 2 statistical analysis of computed tomography data N2 - Complementary to Part 1 of this work, the bi-continuous microstructure of porous synthetic cordierite ceramics for filtration applications was investigated using 3D x-ray computed tomography at different resolutions. Applying both Fast Fourier Transform and a newly developed image analysis algorithm, we quantitatively evaluated porosity and pore orientation. The statistical approach allows extraction of spatially resolved or average values. Porosity values based on x-ray absorption agree with mercury intrusion measurements, while pore orientation factors agree with x-ray refraction data (Part 1 of this work), and with published crystallographic texture data. KW - Pore orientation KW - Porous ceramics KW - Computed tomography KW - 3D microstructure PY - 2013 DO - https://doi.org/10.4416/JCST2013-00022 SN - 2190-9385 VL - 05 IS - 01 SP - 13 EP - 22 PB - Göller CY - Baden-Baden AN - OPUS4-30379 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - DIRECTT-Rekonstruktionen im Vergleich zur gefilterten Rückprojektion N2 - Anhand von computertomografischen Messungen und Modellrechnungen werden DIRECTT-Rekonstruktionen im Vergleich mit gefilterten Rückprojektionen bewertet. Dazu wird die Rekonstruktionsqualität mittels einer zirkular erweiterten Modulations-Transfer-Funktion (MTF) und mit integralen Kenngrößen im Radon- und im Ortsraum verglichen. Zur Überprüfung der Rekonstruktionsgenauigkeit experimenteller Daten werden Mustermessungen einfacher Probengeometrien unter definierten physikalischen Bedingungen durchgeführt. Diese beinhalten die Monochromasie, die Unterdrückung von Kantenartefakten und die radiometrische Intensitätsbestimmung. Für die Qualität der Rekonstruktionen mittels DIRECTT erweisen sich sowohl unterschiedliche Rekonstruktionsfilter als auch der Verzicht auf jede Filterung als unerheblich, im Gegensatz zur gefilterten Rückprojektion. KW - Computertomografie KW - Gefilterte Rückprojektion KW - Rekonstruktionsalgorithmen KW - Iterative Rekonstruktion KW - DIRECTT KW - Konvergenz KW - Modulations-Transfer-Funktion (MTF) PY - 2014 UR - http://www.hanser-elibrary.com/doi/pdf/10.3139/120.110610 SN - 0025-5300 VL - 56 IS - 9 SP - 709 EP - 715 PB - Hanser CY - München AN - OPUS4-31378 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Ehrig, Karsten A1 - Haarring, Holger A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Meinel, Dietmar A1 - Müller, Bernd R. A1 - Onel, Yener A1 - Staude, Andreas A1 - Wolk, Thomas T1 - Industrial and synchrotron X-ray CT applications for materials characterisation N2 - The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces. T2 - iCT Conference 2014 - Conference on industrial computed tomography CY - Wels, Austria DA - 25.02.2014 KW - X-ray absorption and refraction CT KW - Quantitative image analysis KW - Statistical analysis KW - Complex microstructure PY - 2014 SN - 978-3-8440-2557-6 SP - 15 EP - 31 PB - Shaker CY - Aachen AN - OPUS4-30484 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Direkte Röntgenrefraktion an Mikrostrukturen N2 - Die durch Brechung an Mikrostrukturen abgelenkte Röntgenstrahlung wird direkt zweidimensional abgebildet. Dazu werden Modellproben einfacher Geometrie (Fasern, Kapillaren, monodisperse Nano- und Mikropartikel) mit einem auf 50 µm kollimierten Synchrotronstrahl (20 keV) gescannt. Die nach den Regeln der geometrischen Optik an prismatischen und linsenartigen Grenzflächen abgelenkte Strahlung wird in etwa 3 Metern Entfernung von einem Flächendetektor mit 7 µm Ortsauflösung zusätzlich zu der ungestörten Resttransmission des Primärstrahls registriert. In der Abfolge der Radiogramme werden die lokalen Orientierungsänderungen der Probekörper-Grenzflächen bei deren Abtastung mit wenigen Mikrometern Schrittweite bildhaft verfolgt. Mit der hier erreichten Winkelauflösung von etwa 3 Bogensekunden (Streuvektor-Inkremente Δk = 10-3nm-1) kann bei 50 µm Ortsauflösung das Materialvolumen bezüglich innerer Grenzflächen mit Nanometer-Separation auch bei hohen Abtastraten unterhalb einer Sekunde pro Bild charakterisiert werden. T2 - DGZfP-Jahrestagung 2014 CY - Potsdam, Germany DA - 26.05.2014 KW - Computertomographie (CT) KW - Rekonstruktionsalgorithmus KW - DIRECTT KW - Missing wedge KW - Statistische Bewertung PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-312931 UR - http://www.ndt.net/article/dgzfp2014/papers/di1b2.pdf SN - 978-3-940283-61-0 IS - DGZfP-BB 148 SP - Di.1.B.2, 1 EP - 9 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-31293 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Bewertung von Porositätsparametern in Cordierit-Diesel-Partikelfilter-Materialien mit fortgeschrittenen Röntgenverfahren und statistischer Analyse N2 - Bikontinuierliche poröse Keramiken für Filteranwendungen weisen eine komplizierte Mikrostruktur auf, in der Poren und Festkörperphase 'vermischt' sind. Mechanische, thermische sowie Filtereigenschaften können nur präzise bestimmt werden, wenn die Morphologie beider Phasen quantitativ angegeben werden kann. Hier werden unter Anwendung von 3D Computertomographie (CT) und verschiedenen Techniken, die auf der Röntgenrefraktion basieren, die Porosität und die Porenorientierung in keramischen Cordierit-Dieselpartikelfiltern bewertet. Dabei werden zur Auswertung der Tomogramme die Fouriertransformierten sowie eine neu entwickelte richtungssensitive Bildanalyse (DIVA, directional interface variance analysis) angewandt. Sowohl die genannten Messtechniken als auch der statistische Ansatz gestatten die Extraktion optional ortsaufgelöster oder gemittelter Werte. Es ergeben sich sehr gute Übereinstimmungen der experimentell ermittelten Porositätswerte mit Ergebnissen aus Quecksilberintrusionsversuchen als auch der ermittelten Porenorientierung im Vergleich zu publizierten Angaben zur kristallographischen Textur. Dies legt den Schluss nahe, dass die Kenntnis der Grenzflächen (zwischen Poren und Materie) genügt, die morphologischen Eigenschaften solcher Materialien hinreichend zu beschreiben. T2 - DGZfP-Jahrestagung 2014 CY - Potsdam, Germany DA - 26.05.2014 KW - Cordierit KW - Poröse Keramik KW - Porenorientierung KW - Röntgenrefraktion KW - Computer-Tomographie KW - 3D-Mikrostruktur PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-312946 SN - 978-3-940283-61-0 VL - 148 SP - 1 EP - 8 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-31294 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods N2 - Bi-continuous porous ceramics for filtration applications possess a particularly complicated microstructure, whereby porosity and solid matter are intermingled. Mechanical, thermal, and filtration properties can only be precisely estimated if the morphology of both solid matter and porosity can be quantitatively determined. Using 3D computed tomography (CT) at different resolutions, and several X-ray refraction-based techniques, we quantitatively evaluated porosity and pore orientation in cordierite diesel particulate filter ceramics.Moreover, applying both Fast Fourier Transform (FFT) and a newly developed image analysis algorithm (directional interface variance analysis, DIVA), we quantitatively evaluated porosity and pore orientation. Both the experimental techniques and the statistical approach allow extraction of spatially resolved or average values.Porosity values from synchrotron computed tomography used turn out to agree with mercury intrusion measurements, while pore orientation factors agree with published crystallographic texture data. This latter point also implies that the study of the pore/matter interface is sufficient to describe the morphological properties of these materials. KW - Diesel particulate filters KW - DIVA Algorithm KW - Pore Orientation KW - Porous Ceramics KW - X-Ray Computed Tomography KW - X-Ray Refraction PY - 2014 DO - https://doi.org/10.4028/www.scientific.net/AST.91.64 SN - 1662-0356 VL - 91 SP - 64 EP - 69 PB - Techna CY - Faenza AN - OPUS4-32069 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 2014-10-06 KW - Porous ceramics KW - Diesel particulate filters KW - Pore orientation KW - X-ray computed tomography KW - X-ray refraction KW - DIVA algorithm KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transform KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 8(?) AN - OPUS4-31973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Direct X-ray refraction of micro structures N2 - For the first time we present direct 2D imaging of refracted X-rays without any discrimination of the Primary radiation. X-refraction works in analogy to visible light optics: X-rays are entirely deflected at interfaces where discontinuities of (electron) density occur. This is demonstrated at the example of inner and outer surfaces of model samples of well-defined geometry (fibres, capillaries, and monodisperse micro particles). The samples are scanned through a 50 μm monochromatic (20 keV) pencil beam. In order to warrant a sufficient angular resolution a 2D detector (pixel size 7 μm) is placed 3 m downstream of the sample. Scanning the sample in micron steps allows for detecting local changes of interface / surface orientation directly in two dimensions. At the actual angular resolution of about 3 seconds of arc (scattering vector increments Δk = 10-3 nm-1) and 50 μm spatial resolution (scanning) the material’s inner surfaces (with nanometer separation) can be characterized even at sampling rates below 1 second per frame. Moreover, our technique is suited to directly determine particle diameters of up to 250 nm by means of diffraction fringes. Some potential applications to technical submicron structures are discussed. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transformation KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 9 AN - OPUS4-31970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - X-ray dark field imaging N2 - A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented. Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they yield enhanced contrast based on deflected X-rays. Here, we introduce a REI modification, which works with a slightly bent single crystal reflecting in Bragg geometry. The samples are placed upstream of the thin crystal within a parallel synchrotron beam. The crystal’s curvature creates a dark-field stripe in the transmission image, similar to the inverse of a Darwin-Prins rocking curve of plane crystals. The reflection condition is met better or worse as a steady function of incidence position. Refracted beam portions of sample interfaces appear bright on black stripes. The entire image is finally synthesized by multiple dark-field stripes. The technique is an alternative to the mentioned techniques. We demonstrate the technique’s advantage by examples of biological and technical microstructures. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Refraction enhanced imaging (REI) KW - Phase contrast KW - Radiology KW - Soft matter radiography PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 7 AN - OPUS4-31971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Schors, Jörg A1 - Hentschel, Manfred P. T1 - Werkstoffcharakterisierung mittels Röntgen-Refraktions- und Röntgen-Weitwinkel-Topographie T2 - DGZfP-Jahrestagung 2010 CY - Erfurt, Germany DA - 2010-05-10 PY - 2010 AN - OPUS4-22883 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Characterization of micro structured lightweight materials by X-Ray Refraction and X-Ray Diffraction Topography T2 - Far East NDT Forum CY - Kunshan, China DA - 2010-05-25 PY - 2010 AN - OPUS4-22884 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios ED - Gerhard Busse, T1 - Synchrotron-Refraction-Computed-Tomography for NDT and characterisation of lightweight composite materials T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Refraction KW - Computed Tomography KW - NDE KW - Ti-MMC PY - 2008 SN - 978-0-415-46476-5 SP - 217 EP - 221 PB - Taylor & Francis CY - London, UK AN - OPUS4-18680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Schors, Jörg T1 - Non Destructive Evaluation of Advanced Materials by X-ray Refraction Topography T2 - 15. Nationales Symposium SAMPE Deutschland e. V., FASERVERBUNDWERKSTOFFE INNOVATIV UND SICHER CY - Berlin, Germany DA - 2009-02-18 PY - 2009 AN - OPUS4-18903 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron based Refraction Enhanced Micro CT for Non-Destructive Materials Characterization T2 - 15. Nationales Symposium SAMPE Deutschland e.V., FASERVERBUNDWERKSTOFFE INNOVATIV UND SICHER CY - Berlin, Germany DA - 2009-02-18 PY - 2009 AN - OPUS4-18902 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Improved computed tomography by variable desmearing - Model reconstructions by iterative DIRECTT algorithm N2 - Die mitunter erhebliche Verschmierung von computertomograpischen Projektionen durch ausgedehnte Strahlenquellen wird durch eine neuartige Entschmierungsprozedur erheblich reduziert, um eine verbesserte Ortsauflösung der Rekonstruktion zu erreichen. Da die Breite der Verschmierungsfunktion der detektornahen und -fernen Objektelemente sich erheblich unterscheiden kann, muss die Entschmierung variabel sein. Im Gegensatz zu einer für alle Voxel-Positionen identischen Entfaltung, also einer grundsätzlich falschen Voraussetzung, wurde eine implizite Entschmierung entwickelt. Die vorab bekannte positionsabhängige Verschmierung wird auf die iterativ wiederholten Projektionen der Teilrekonstruktionen des DIRECTT-Algorithmus angewandt. Die variabel entschmierten Rekonstruktionen aus den Sinogrammen eines Pixelmodells mit Verschmierungen von 1 bis 5 Pixel erreichen eine Ortsauflösung von nahezu einem Pixel. KW - Computertomographie KW - Neutronen-Tomographie KW - Tomographische Rekonstruktionsalgorithmen PY - 2010 SN - 0025-5300 VL - 52 IS - 6 SP - 394 EP - 400 PB - Hanser CY - München AN - OPUS4-21464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Schors, Jörg T1 - Non Destructive Evaluation of Advanced Materials by X-ray Refraction Topography T2 - Materials Science and Engineering MES '08 CY - Nuremberg, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18540 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchroton based Micro-CT an Refraction Enhanced MicroCT for Non-Destructives Materials Characterization T2 - Materials Science and Engineering MES 08 CY - Nuremberg, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18541 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Characterization of metal matrix composites by synchrotron refraction computed topography KW - Metal matrix composites KW - Refraction KW - Synchrotron radiation KW - Computed tomography KW - Analyzer based imaging KW - Diffraction enhanced imaging PY - 2010 DO - https://doi.org/10.4028/www.scientific.net/MSF.638-642.967 SN - 0255-5476 VL - 638-642 SP - 967 EP - 972 PB - Trans Tech Publications CY - Aedermannsdorf, Switzerland AN - OPUS4-20563 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron-based micro-CT and refraction-enhanced micro-CT for non-destructive materials characterisation N2 - X-ray computed tomography is an important tool for non-destructively evaluating the 3-D microstructure of modern materials. To resolve material structures in the micrometer range and below, high brilliance synchrotron radiation has to be used. The Federal Institute for Materials Research and Testing (BAM) has built up an imaging setup for micro-tomography and -radiography (BAMline) at the Berliner storage ring for synchrotron radiation (BESSY). In computed tomography, the contrast at interfaces within heterogeneous materials can be strongly amplified by effects related to X-ray refraction. Such effects are especially useful for materials of low absorption or mixed phases showing similar X-ray absorption properties that produce low contrast. The technique is based on ultra-small-angle scattering by microstructural elements causing phase-related effects, such as refraction and total reflection. The extraordinary contrast of inner surfaces is far beyond absorption effects. Crack orientation and fibre/matrix debonding in plastics, polymers, ceramics and metal-matrix-composites after cyclic loading and hydro-thermal aging can be visualized. In most cases, the investigated inner surface and interface structures correlate to mechanical properties. The technique is an alternative to other attempts on raising the spatial resolution of CT machines. KW - Refraction KW - Computed tomography KW - NDE KW - Ti-MMC KW - Lightweight materials KW - Metal matrix composites KW - Synchrotron radiation KW - X-ray refraction PY - 2009 DO - https://doi.org/10.1002/adem.200800346 SN - 1438-1656 VL - 11 IS - 6 SP - 435 EP - 440 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-20564 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Bruno, Giovanni A1 - Kannengießer, Thomas T1 - 3D imaging of hydrogen assisted cracking using analyser-based imaging N2 - To better understand the mechanism of hydrogen assisted cracking (HAC), it is important to investigate the 3D structure of the cracks non-destructively. Since, cracks introduced by HAC are usually very small, conventional x-ray imaging methods often lack the required spatial resolution. However, the detection of those cracks can be enhanced by taking advantage of refraction at interfaces within the sample. To image this refractive deflection we employ analyser based imaging (ABI). In this work we aim at proving the enhanced crack detection of ABI by investigating an alluminum alloy weld. T2 - BESSY User Meeting 2015 CY - Berlin, Germany DA - 09.12.2015 KW - X-ray refraction KW - Synchrotron KW - Analyser-based imaging KW - Hydrogen assisted cracking KW - Welding PY - 2015 AN - OPUS4-38278 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Britzke, Ralf A1 - Bruno, Giovanni A1 - Müller, Bernd R. A1 - Hentschel, M. P. T1 - Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing N2 - Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect. At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems. We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes. Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries. T2 - 19th World Conference on Non-Destructive Testing 2016 CY - Munich, Germany DA - 13.06.2016 KW - Talbot- Lau interferometry KW - Phase grating KW - Non-destructive testing PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-383163 SP - Tu_3_G_2, 1 EP - 9 AN - OPUS4-38316 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Improving the visibility of phase gratings for Talbot-Lau X-ray imaging N2 - Talbot-Lau interferometry provides X-ray imaging techniques with significant enhancement of the radiographic contrast of weakly absorbing objects. The grating based technique allows separation of absorption, refraction and small angle scattering effects. The different efficiency of rectangular and triangular shaped phase gratings at varying detector distances is investigated. The interference patterns (Talbot carpets) are modeled for parallel monochromatic radiation and measured by synchrotron radiation. In comparison to rectangular shapes of phase gratings much higher visibility is obtained for triangular shapes which yield enhanced contrast of a glass capillary test specimen. KW - Visibility KW - Talbot-Lau interferometry KW - Phase grating KW - Synchrotron imaging KW - X-ray reefraction PY - 2016 DO - https://doi.org/10.3139/120.110948 SN - 0025-5300 VL - 58 IS - 11-12 SP - 970 EP - 974 PB - Carl Hanser Verlag CY - München AN - OPUS4-38422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Bruno, Giovanni A1 - Kannengießer, Thomas T1 - 3D imaging of hydrogen assisted cracking in metals using refraction enhanced synchrotron CT N2 - Hydrogen in metals can cause a degradation of the mechanical properties with possible subsequent hydrogen assisted cracking (HAC). Though, the mechanism of HAC is not completely understood yet and thus suitable methods for in situ investigations to characterise the crack formation are needed. X-ray computed tomography (CT) is a well-known tool for analysing these properties. However, the effective resolution of the detector system limits the detection of small defects by CT. Analyser based imaging (ABI) takes advantage of x-ray refraction at interfaces between volumes of different density, i.e. of cracks, pores, inclusions, etc., within the sample to detect defects smaller than the resolution of the detector system. In this study, measurements on an aluminium alloy weld showed that ABI allows us to resolve the 3D structure of cracks undetected by absorption based CT. Prospective investigations will analyse HAC in steels. T2 - NDT-CE 2015 - International symposium non-destructive testing in civil engineering CY - Berlin, Germany DA - 2015-09-15 KW - Wasserstoffversprödung KW - Wasserstoffunterstützte Rissbildung KW - Röntgenrefraktion KW - CT KW - Hydrogen embrittlement (HE) KW - Hydrogen assisted cracking (HAC) KW - Aluminium alloy KW - X-ray refraction KW - Analyser based imaging KW - Computed tomography (CT) KW - Synchrotron radiation PY - 2015 SN - 1435-4934 SP - 1217 EP - 1224 AN - OPUS4-34287 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tötzke, C. A1 - Manke, I. A1 - Gaiselmann, G. A1 - Bohner, J. A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Schmidt, V. A1 - Banhart, J. A1 - Lehnert, W. T1 - A dedicated compression device for high resolution X-ray tomography of compressed gas diffusion layers N2 - We present an experimental approach to study the three-dimensional microstructure of gas diffusion layer (GDL) materials under realistic compression conditions. A dedicated compression device was designed that allows for synchrotron-tomographic investigation of circular samples under well-defined compression conditions. The tomographic data provide the experimental basis for stochastic modeling of nonwoven GDL materials. A plain compression tool is used to study the fiber courses in the material at different compression stages. Transport relevant geometrical parameters, such as porosity, pore size, and tortuosity distributions, are exemplarily evaluated for a GDL sample in the uncompressed state and for a compression of 30 vol.%. To mimic the geometry of the flow-field, we employed a compression punch with an integrated channel-rib-profile. It turned out that the GDL material is homogeneously compressed under the ribs, however, much less compressed underneath the channel. GDL fibers extend far into the channel volume where they might interfere with the convective gas transport and the removal of liquid water from the cell. KW - PEM fuel cell KW - Gas diffusion layer (GDL) KW - Compression device KW - X-ray tomography KW - Synchrotron KW - Tortuosity PY - 2015 DO - https://doi.org/10.1063/1.4918291 SN - 0034-6748 SN - 1089-7623 VL - 86 IS - 4 SP - 043702-1 EP - 043702-6 PB - American Institute of Physics CY - Melville, NY, USA AN - OPUS4-33081 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. T1 - Synchrotronstrahlung: verbesserte Refraktions- und Absorptions-Mikro-CT für die zerstörungsfreie Materialcharakterisierung N2 - Röntgenstrahlung eignet sich besonders gut zur zerstörungsfreien Charakterisierung von Werkstoffen. Mit ihrer Hilfe lassen sich z.B. Risse und Poren in Werkstoffen erkennen. Die Risserkennbarkeit ist jedoch von der Rissgröße relativ zum Auflösungsvermögen des Detektors abhängig. Risse, Poren oder Einschlüsse können in Radiogrammen nur dann erkannt werden, wenn sie größer sind als das Detektorelement, das die Röntgenstrahlen registriert. Das hier vorgestellte neuartige Synchrotron-Refraktions-Computer-Tomographie-Verfahren ist jedoch in der Lage, auch Risse zu erkennen, deren Größe weit unterhalb des Auflösungsvermögens des Detektors liegt. Das Verfahren basiert auf dem bisher wenig genutzten Phänomen der Brechung von Röntgenstrahlen an den inneren Grenzflächen mikroskopisch strukturierter Objekte. Durch den Vergleich zwischen absorptionsbasierter und refraktionsbasierter Computer Tomographie Untersuchungen mit Synchrotronstrahlung an einer geschädigten Faserverbundprobe wird das Potenzial der Synchrotron-Refraktions-Computer-Tomographie demonstriert. KW - Synchrotronstrahlung KW - Refraktion KW - Diffraktion KW - Kleinwinkelstreuung KW - Materialcharakterisierung KW - Zerstörungsfrei KW - Synchrotron radiation KW - X-ray diffraction KW - Small angle scattering KW - Materials characterization KW - Non-destructive PY - 2015 SN - 1616-069X SN - 0948-5112 VL - 146 SP - 46 EP - 51 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-34305 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Léonard, Fabien A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Trappe, Volker A1 - Bruno, Giovanni T1 - Röntgen-Refraktions-Technik für eine schnelle, hochauflösende Mikrostrukturcharakterisierung von Leichtbaukompositen T2 - Verbundwerkstoffe und Werkstoffverbunde 2015 CY - Wien, Austria DA - 2015-07-01 PY - 2015 AN - OPUS4-33684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Bruno, Giovanni A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Wolk, Thomas A1 - Britzke, Ralf T1 - Synchrotronstrahlung: verbesserte Refraktions- und Absorptions Mikro-CT für die zerstörungsfreie Materialcharakterisierung T2 - DACH Jahrestagung 2015 CY - Salzburg, Austria DA - 2015-05-11 PY - 2015 AN - OPUS4-33685 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Léonard, Fabien A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - X-ray refraction techniques for fast, high-resolution microstructure characterization and non-destructive testing of lightweight composites N2 - X-ray refraction is based on optical deflection of X-rays, similar to the well-known small angle X-ray scattering, but hundreds of times more intense, thus enabling shorter measurement time. We show that X-ray refraction techniques are suitable for the detection of pores, cracks, and in general defects. Indeed, the deflected X-ray intensity is directly proportional to the internal specific surface (i.e., surface per unit volume) of the objects. Although single defects cannot be imaged, the presence of populations of those defects can be detected even if the defects have sizes in the nanometer range.We present several applications of X-ray refraction techniques to composite materials:- To visualize macro and microcracks in Ti-SiC metal matrix composites (MMC);- To correlate fatigue damage (fibre de-bonding) of carbon fibre reinforced plastics (CFRP) to X-ray refraction intensity;- To quantify the impact damage by spatially resolved single fibre de-bonding fraction as a function of impact energy in CFRP laminates.An example of classic high-resolution computer tomography of an impact-damaged CFRP will also be presented, as a benchmark to the present state-of-the-art imaging capabilities. It will be shown that while (absorption) tomography can well visualize and quantify delamination, X-ray refraction techniques directly yield (spatially resolved) quantitative information about fibre de-bonding, inaccessible to absorption tomography. KW - X-ray KW - Synchrotron radiation KW - Refraction KW - Metal matrix composites KW - Delamination KW - Fiber de-bonding PY - 2015 DO - https://doi.org/10.4028/www.scientific.net/MSF.825-826.814 SN - 0255-5476 VL - 825-826 SP - 814 EP - 821 PB - Trans Tech Publications CY - Aedermannsdorf, Switzerland AN - OPUS4-33265 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Staude, Andreas A1 - Meinel, Dietmar A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. ED - Grellmann, W. ED - Frenz, H. T1 - Moderne bildgebende hochauflösende Röntgenverfahren für die Materialcharakterisierung N2 - Die Computertomographie (CT) ist in der Medizin als Standardtechnik etabliert, in der zerstörungsfreien Prüfung wird sie zunehmend angewendet, in einzelnen Fällen sogar als Referenzverfahren eingesetzt. Gegenwärtig ist eine starke Zunahme von Anwendungen der CT in der Materialcharakterisierung zu verzeichnen. Zudem werden weitere moderne 3D-Techniken für werkstoffwissenschaftliche Fragestellungen genutzt, um die Mikrostruktur - auch in situ (z.B. Druck, Temperatur) - aufzuklären. Hier werden neben der konventionellen Absorptions-CT auch die Potenziale der Refraktions-CT zur Beantwortung prozesstechnischer sowie werkstofflicher Fragestellungen aufgezeigt, die ein „ganzheitliches Bild“ des jeweiligen Werkstoffs zum Ziel haben. T2 - Tagung Werkstoffprüfung 2014 - Fortschritte in der Werkstoffprüfung für Forschung und Praxis - Werkstoffeinsatz, Qualitätssicherung und Schadensanalyse CY - Berlin, Germany DA - 04.12.2014 KW - Computer tomography KW - X-ray refraction KW - Ceramics KW - Concrete KW - Inhomogeneous materials KW - Computertomographie KW - Röntgenrefraktion KW - Keramik KW - Beton KW - Mehrphasige Materialien PY - 2014 SN - 978-3-9814516-8-9 SN - 1861-8154 SP - 1 EP - 12 AN - OPUS4-32565 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, M. P. A1 - Lange, A. A1 - Trappe, Volker A1 - Laquai, René A1 - Shashev, Yury A1 - Evsevleev, Sergei A1 - Bruno, Giovanni T1 - Progress survey of X-Ray refraction imaging techniques N2 - The most substantial innovations in radiographic imaging techniques of the last two decades aim at enhanced image contrast of weakly absorbing micro and nano structures by taking advantage of X-ray refraction effects occurring at outer and inner surfaces. The applications range from fibre reinforced plastics to biological tissues. These techniques comprise, among others, X-ray refraction topography, diffraction enhanced imaging, phase contrast imaging, Talbot-Lau grating interferometry, and refraction enhanced imaging. They all make use of selective beam deflections up to a few minutes of arc: the X-ray refraction effect. In contrast to diffraction, this type of interaction has a 100 % scattering cross section, as shown experimentally. Since X-ray refraction is very sensitive to the orientation of interfaces, it is additionally a tool to detect, e.g., fibre or pore orientation. If the detector resolution exceeds the size of (small) individual features, one detects the integral information (of inner surfaces) within the gauge volume. We describe the above-mentioned techniques, and show their experimental implementation in the lab and at a synchrotron source. We also show strategies for data processing and quantitative analysis. T2 - 19th World Conference on Non-Destructive Testing CY - Munich, Germany DA - 13.06.2016 KW - grating KW - topography KW - refraction KW - X-ray PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-366194 SN - 978-3-940283-78-8 VL - 2016/158 SP - We.3.B.2, 1 EP - 9 AN - OPUS4-36619 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Kannengießer, Thomas A1 - Bruno, Giovanni T1 - 3D Crack analysis in hydrogen charged lean duplex stainless steel with synchrotron refraction CT N2 - Hydrogen in metals can cause a degradation of the mechanical properties, the so-called hydrogen embrittlement. In combination with internal stresses, hydrogen assisted cracking (HAC) can occur. This phenomenon is not completely understood yet. To better characterise the cracking behaviour, it is important to gain information about the evolution of the 3D crack network. For this purpose samples of lean duplex stainless steel were loaded with hydrogen by means of electrochemical charging and investigated by means of synchrotron refraction CT and SEM fractography after uniaxial tensile loading. Synchrotron refraction CT is an analyser-based imaging (ABI) technique. It uses a Si (111) single crystal as analyser, which is placed into the beam path between sample and detector. According to Bragg’s law only incident x-rays within a narrow range around the Bragg-angle are diffracted from the analyser into the detector. Hence, the analyser acts as an angular filter for the transmitted beam. This filtering allows to turn the refraction and scattering of x-rays into image contrast. Refraction occurs at all interfaces, where the density of the material changes and is more sensitive to density changes than the attenuation. Therefore, it is possible to detect smaller cracks than with classical x-ray imaging techniques, like CT, with comparable spacial resolution. It also visualises the 3D structure of the cracks and gains quantitative information about their morphology and distribution. Since cracks introduced by HAC are usually very small and have a small opening displacement, synchrotron refraction CT is expected to be well suited for imaging this cracking mechanism and can be a valuable tool to characterise the formation and the evolution of a 3D crack network. T2 - WCNDT 2016 CY - München, Germany DA - 13.06.2016 KW - X-ray refraction KW - Computed tomography KW - Hydrogen assisted cracking KW - Duplex stainless steel PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-366481 SN - 978-3-940283-78-8 VL - BB 158 SP - Tu.4.B.3, 1 EP - 9 AN - OPUS4-36648 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Bruno, Giovanni T1 - Microstructure Characterization of Ceramics via 2D and 3D X-Ray Refraction Techniques N2 - 3D imaging techniques are very fashionable nowadays, and allow enormous progress in understanding ceramic microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this feature article, we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. While the techniques are limited by the X-ray absorption of the material under investigation, we demonstrate showcases of ceramics and composite materials, where understanding of process parameter influence or simply of microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. KW - X-ray refraction KW - Porosity KW - Specific surface KW - Crack detection KW - Composites PY - 2017 DO - https://doi.org/10.1016/j.jeurceramsoc.2016.12.031 SN - 0955-2219 SN - 1873-619X VL - 37 IS - 5 SP - 1879 EP - 1889 PB - Elsevier CY - Amsterdam AN - OPUS4-39094 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Nellesen, J. A1 - Tillmann, W. T1 - Characterizing damage evolution in metal matrix composites with X-ray refraction topography and in situ tensile loading N2 - In this study a metal-matrix-composite with aluminum matrix and Al2O3 particles was investigated with x-ray refraction topography and in-situ tensile loading. It could be observed that after reaching a certain load the specific surface increased steadily. However, the classical radiographs taken for comparison show no damage in the sample. T2 - 8th Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 07.12.2016 KW - X-ray refraction KW - Metal matrix composites KW - In-situ loading KW - Synchrotron PY - 2016 AN - OPUS4-39113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nellesen, J. A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Hentschel, M. P. A1 - Anar, N. B. A1 - Soppa, E. A1 - Tillmann, W. A1 - Bruno, Giovanni T1 - In situ analysis of damage evolution in an Al/Al2O3 MMC under tensile load by synchrotron X-ray refraction imaging N2 - The in situ analysis of the damage evolution in a metal Matrix composite (MMC) using synchrotron X-ray refraction radiography (SXRR) is presented. The investigated material is an Al alloy (6061)/10 vol% Al2O3 MMC after T6 heat treatment. In an interrupted tensile test the gauge section of dog bone-shaped specimens is imaged in different states of tensile loading. On the basis of the SXRR images, the relative change of the specific surface (proportional to the amount of damage) in the course of tensile loading was analyzed. It could be shown that the damage can be detected by SXRR already at a stage of tensile loading, in which no Observation of damage is possible with radiographic absorption-based imaging methods. Moreover, the quantitative analysis of the SXRR images reveals that the amount of damage increases homogeneously by an average of 25% with respect to the Initial state. To corroborate the experimental findings, the damage distribution was imaged in 3D after the final tensile loading by synchrotron X-ray refraction computed tomography (SXRCT) and absorption-based synchrotron X-ray computed tomography (SXCT). It could be evidenced that defects and damages cause pronounced indications in the SXRCT images. KW - Composite materials KW - Defects KW - Micro analysis PY - 2018 DO - https://doi.org/10.1007/s10853-017-1957-x SN - 0022-2461 SN - 1573-4803 VL - 53 IS - 8 SP - 6021 EP - 6032 PB - Springer US AN - OPUS4-44241 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Unterscheidung verschiedener charakteristischer Defekte in mittels selektivem Laserschmelzen hergestelltem Ti-6Al-4V durch Röntgen-Refraktionsradiographie N2 - Das selektive Laserschmelzen (SLM) ist eine pulverbasierte, additive Fertigungsmethode, welche die Herstellung von komplex und individuell geformten Bauteilen ermöglicht. Im Laufe der vergangenen Jahre haben verschiedene Branchen, unter anderem die Luft- und Raumfahrt Industrie, begonnen diese Technologie intensiv zu erforschen. Insbesondere die Titanlegierung Ti-6Al-V4, welche aufgrund ihrer Kombination von mechanischen Eigenschaften, geringer Dichte und Korrosionsbeständigkeit häufig in der Luft- und Raumfahrt eingesetzt wird, eignet sich für die Herstellung mittels SLM. Allerdings können durch nicht optimal gewählte Prozessparameter, welche für gewöhnlich in einer Energiedichte zusammengefasst werden, Defekte in den Bauteilen entstehen. In dieser Studie wurde untersucht, in wie weit Röntgen-Refraktionsradiographie geeignet ist diese Defekte zu detektieren und zu charakterisieren. Bei der Röntgen-Refraktionsradiographie wird die Röntgenstrahlung, nachdem sie die Probe transmittiert hat, über einen Analysatorkristall gemäß der Bragg-Bedingung in den 2D-Detektor reflektiert und dabei nach ihrer Ausbreitungsrichtung gefiltert. Dadurch wird neben der Schwächung auch die Ablenkung der Röntgenstrahlung durch Refraktion im inneren der Probe zur Bildgebung ausgenutzt. Aus den aufgenommen Refraktionsradiogrammen kann der Refraktionswert berechnet werden. Dieser ist ein Maß für die Menge an inneren Oberflächen in der Probe. Zum einen konnte gezeigt werden, dass die Röntgen-Refraktionsradiographie Defekte detektieren kann, die kleiner sind als die Ortsauflösung des verwendeten 2D-Detektors. Zum anderen können zwei verschiedene Typen von Defekten unterschieden werden. Bei dem ersten Typ handelt es sich um runde Poren mit geringer innerer Oberfläche. Diese, sogenannten „keyhole pores“ sind charakteristisch für eine zu hohe Energiedichte während des SLM Prozesses. Bei dem zweiten Typ handelt es sich um nicht komplett aufgeschmolzenes Pulver. Diese Defekte zeichnen sich durch eine hohe innere Oberfläche aus und sind charakteristisch für eine zu geringe Energiedichte. Vergleichende Messungen mit hochauflösender Synchrotron CT und optischer Mikroskopie bestätigen die charakteristischen Formen der verschiedenen Defekte. T2 - DGZfP-Jahrestagung 2018 CY - Leipzig, Germany DA - 07.05.2018 KW - Röntgen-Refraktion KW - Additive Fertigung KW - Porosität PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-449524 SN - 978-3-940283-92-4 VL - DGZfP BB166 SP - Mo.2.A.2., 1 EP - 7 AN - OPUS4-44952 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kasperovich, G. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Microstructure characterisation of advanced materials via 2D and 3D X-ray refraction techniques N2 - 3D imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this conference paper we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution in an Al/Al2O3 metal matrix composite during tensile load and the identification of void formation (different kinds of defects, particularly unsintered powder hidden in pores, and small inhomogeneity’s like cracks) in Ti64 parts produced by selective laser melting using synchrotron X-ray refraction radiography and tomography. T2 - THERMEC'2018 CY - Paris, France DA - 09.07.2018 KW - X-ray-refraction KW - Damage evolution KW - Additive manufacturing KW - Composites KW - Creep PY - 2018 AN - OPUS4-45572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Erdmann, Maren A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Niebergall, Ute A1 - Böhning, Martin A1 - Bruno, Giovanni ED - Erdmann, Maren T1 - Diesel-induced transparency of plastically deformed high-density polyethylene N2 - High-density polyethylene becomes optically transparent during tensile drawing when previously saturated with diesel fuel. This unusual phenomenon is investigated as it might allow conclusions with respect to the material behavior. Microscopy, differential scanning calorimetry, density measurements are applied together with two scanning X-ray scattering techniques: wide angle X-ray scattering (WAXS) and X-ray refraction, able to extract the spatially resolved crystal orientation and internal surface, respectively. The sorbed diesel softens the material and significantly alters the yielding characteristics. Although the crystallinity among stretched regions is similar, a virgin reference sample exhibits strain whitening during stretching, while the diesel-saturated sample becomes transparent. The WAXS results reveal a pronounced fiber texture in the tensile direction in the stretched region and an isotropic orientation in the unstretched region. This texture implies the formation of fibrils in the stretched region, while spherulites remain intact in the unstretched parts of the specimens. X-ray refraction reveals a preferred orientation of internal surfaces along the tensile direction in the stretched region of virgin samples, while the sample stretched in the diesel-saturated state shows no internal surfaces at all. Besides from stretching saturated samples, optical transparency is also obtained from sorbing samples in diesel after stretching. KW - PE-HD Sorption KW - Cavitation KW - Diesel Fuel KW - X-ray refraction KW - WAXS KW - Internal Surfaces KW - Crystal Texture PY - 2019 DO - https://doi.org/10.1007/s10853-019-03700-8 SN - 1573-4803 SN - 0022-2461 VL - 54 IS - 17 SP - 11739 EP - 11755 PB - Springer US CY - US AN - OPUS4-48226 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Schneider, J. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Using SXRR to Probe the Nature of Discontinuities in SLM Additive Manufactured Inconel 718 Specimens N2 - The utilization of additive manufacturing (AM) to fabricate robust structural components relies on understanding the nature of internal anomalies or discontinuities, which can compromise the structural integrity. While some discontinuities in AM microstructures stem from similar mechanisms as observed in more traditional processes such as casting, others are unique to the AM process. Discontinuities in AM are challenging to detect, due to their submicron size and orientation dependency. Toward the goal of improving structural integrity, minimizing discontinuities in an AM build requires an understanding of the mechanisms of formation to mitigate their occurrence. This study utilizes various techniques to evaluate the shape, size, nature and distribution of discontinuities in AM Inconel 718, in a non-hot isostatic pressed (HIPed) as-built, non-HIPed and direct age, and HIPed with two step age samples. Non-destructive synchrotron radiation refraction and transmission radiography (SXRR) provides additional information beyond that obtained with destructive optical microscopy. SXRR was able to distinguish between voids, cracks and lack of melt in, due to its sensitivity to the orientation of the discontinuity. KW - Additive manufacturing KW - X-ray refraction radiography KW - INCONEL 718 KW - Selective laser melting PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509836 DO - https://doi.org/10.1007/s11661-020-05847-5 SN - 1543-1940 VL - 51 IS - 8 SP - 4146 EP - 4157 PB - Springer AN - OPUS4-50983 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Hochauflösende, schnelle Materialcharakterisierung - Zerstörungsfeie Prüfung mittels Röntgenrefraktion N2 - Materialcharakterisierung von CFK-Werkstoffen mittels Röntgen-Refraktion T2 - CCeV-Veranstaltung 3er-AG CY - Augsburg DA - 04.03.2016 KW - CFK KW - Röntgen-Refraktion KW - Faser-Matrix Enthaftung PY - 2016 AN - OPUS4-35666 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Laquai, René A1 - Schaupp, Thomas A1 - Griesche, Axel A1 - Bruno, Giovanni A1 - Kannengießer, Thomas T1 - Characterization of hydrogen assisted cracking using synchrotron computed tomography T2 - IMAGING WORKSHOP BESSY II CY - Berlin-Adlershon, Germany DA - 2015-10-05 PY - 2015 AN - OPUS4-34388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Requena, G. A1 - Haubrich, J. A1 - Bruno, Giovanni T1 - Classification of defect types in SLM Ti-6Al-V4 by X-ray refraction topography N2 - Porosity in additively manufactured materials, such as laser powder bed fusion Ti-Al6-V4, can play an important role in their mechanical performance. Not only the total porosity but also the shape/morphology of the individual pores need to be considered. Therefore, it is necessary to determine the distributions of different defect types (especially fusing defects and keyhole pores) and their dependence on process parameters. We show that synchrotron X-ray refraction radiography allows analysis of large samples (up to several millimeters) without compromising the detectability of submicrometer defects. Correspondingly, a classification tool is introduced that is able to quantitatively distinguish defects such as keyhole pores and binding defects with a confidence level of 94 %, even when the shape cannot be discerned because of limited spatial resolution. KW - Additive manufacturing KW - Selective laser melting KW - X-ray refraction KW - Microscopy KW - Porosity KW - X-ray computed tomography KW - BAMline KW - Synchrotron Radiation PY - 2020 DO - https://doi.org/10.1520/MPC20190080 SN - 2379-1365 VL - 9 IS - 1 SP - 82 EP - 93 PB - ASTM International CY - West Conshohocken, PA AN - OPUS4-50470 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Cabeza, S. A1 - Pereyra, R. A1 - Fernández, R. A1 - González-Doncelc, G. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Nachweis der Schädigungsentwicklung mittels Synchrotron-Röntgenrefraktionstechnik während des Kriechversuchs einer Al-Mg-Legierung N2 - Um die Gültigkeit der Vorhersagen des aktuellen Solid-State-Transformation-Creep (SSTC)-Modells zu verifizieren, wurde die Schadensakkumulation während eines Kriecheversuchs an einer Al-3,85Mg Legierung mittels Synchrotron Röntgenrefraktionstechnik untersucht. Das Röntgenrefraktionsverfahren erfasst die innere spezifische Oberfläche (d.h. Oberfläche pro Volumeneinheit) im durchstrahlten Volumen. Dabei liegt die Detektierbarkeit von Rissen und Poren in der Größenordnung von wenigen Nano- bis Mikrometern. Im Vergleich zu CT-Messungen mit vergleichbarer Sensitivität ist das untersuchte Probenvolumen jedoch um den Faktor 10 größer. Ein signifikanter Anstieg der inneren spezifischen Oberfläche mit zunehmender Kriechzeit wurde beobachtet, was den Nachweis für die Entstehung einer feinkörnigen Substruktur liefert, wie sie im SSTC-Modell vorhergesagt wird. Diese feinkörnige Substruktur wurde auch mittels Rasterelektronenmikroskopie beobachtet. T2 - DACH-Tagung 2019 CY - Friedrichshafen, Germany DA - 26.05.2019 KW - Aluminiumlegierungen KW - Kriechverhalten KW - Schädigungsverhalten KW - Synchrotron Röntgen Refraktion PY - 2019 AN - OPUS4-48492 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Trappe, Volker A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evolution of CFRP stress cracks observed by in situ X-ray refractive imaging N2 - Modern air-liners and wind turbine rotor blades are made up primarily of fiber reinforced plastics. Failure of these materials heavily impairs the serviceability and the operational safety. Consequently, knowledge of the failure behavior under static and cyclic loads is of great interest to estimate the operational strength and to compare the performance of different materials. Ideally, the damage evolution under operational load is determined with in situ non-destructive testing techniques. Here, we report in-situ synchrotron X-ray imaging of tensile stress induced cracks in carbon fiber reinforced plastics due to inter-fiber failure. An inhouse designed compact tensile testing machine with a load range up to 15 kN was integrated into the beamline. Since conventional radiographs do not reveal sufficient contrast to distinguish cracks due to inter-fiber failure and micro cracking from fiber bundles, the Diffraction Enhanced Imaging (DEI) technique is applied in order to separate primary and scattered (refracted) radiation by means of an analyzer crystal. This technique allows fast measurements over large fields-of-view and is ideal for in-situ investigations. Imaging and the tensile test are run at the highest possible frame rate (0.7 s-1 ) and the lowest possible strain rate (5.5∙10-4 s -1 ). For 0°/90° non-crimp fabrics, the first inter-fiber cracks occur at 380 MPa (strain 0.8 %). Prior to failure at about 760 MPa (strain 2.0 %), we observe the evolution of nearly equidistant (1 mm distance) cracks running across the entire sample in the fully damaged state. KW - X-ray refraction KW - Diffraction Enhanced Imaging KW - Carbon Fiber Reinforced Plastics KW - In situ tensile test KW - Crack evolution PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-515060 DO - https://doi.org/10.1088/1757-899X/942/1/012035 SN - 1757-8981 SN - 1757-899X VL - 942 SP - 012035-1 EP - 012035-9 PB - IOP publishing CY - Bristol, UK AN - OPUS4-51506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Soares, A.P. A1 - Baum, D. A1 - Hesse, B. A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Zaslansky, P. T1 - Scattering and phase-contrast X-ray methods reveal damage to glass fibers in endodontic posts following dental bur trimming N2 - Objectives. There is concern that the integrity of fiberglass dental posts may be affected by chairside trimming during treatment. We hypothesize that hard X-ray methods of phase contrast-enhanced micro-CT (PCE-CT) and synchrotron based X-ray refraction (SXRR) can reliably identify and help characterize the extent of damage. Methods. Fiberglass posts were imaged both as manufactured and following trimming with a diamond bur. Each of the posts was imaged by SXRR and by PCE-CT. Datasets from PCE-CT were used to visualize and quantify 2D and 3D morphological characteristics of intact and of damage-affected regions caused by trimming. Results. The SXRR images revealed fiber inhomogeneities from manufacturing with a significant increase in internal surfaces in sample regions corresponding to damage from trimming. PCE-CT volumes unveiled the micromorphology of single fibers in the posts and some damage in the trimmed area (e.g. fractures, splinters and cracks). Area, perimeter, circularity, roundness, volume and thickness of the glass fibers in the trimmed area were statistically different from the control (p < 0.01). Significance. The integrity of single fibers in the post is critical for bending resistance and for long-term adhesion to the cement in the root canals. Damage to the fibers causes substantial structural weakening across the post diameter. Glass fragments produced due to contact with the dental bur may separate from the post and may significantly reduce bond capacity. The above mentioned synchrotron-based imaging techniques can further facilitate assessment of the structural integrity and the appearance of defects in posts (e.g. after mechanical load). KW - Fiberglass composite KW - Fiber reinforced dental post KW - X-ray refraction KW - Phase contrast-enhanced micro-CT KW - Non-destructive testing PY - 2021 DO - https://doi.org/10.1016/j.dental.2020.10.018 SN - 0109-5641 VL - 37 IS - 2 SP - 201 EP - 211 PB - Elsevier Inc. AN - OPUS4-52071 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Mack, D.E. A1 - Laquai, René A1 - Helle, O. A1 - Sebold, D. A1 - Vaßen, R. A1 - Bruno, Giovanni T1 - Evolution of porosity, crack density, and CMAS penetration in thermal barrier coatings subjected to burner rig testing N2 - Degradation of thermal barrier coatings (TBCs) in gas‐turbine engines due to calcium–magnesium–aluminosilicate (CMAS) glassy deposits from various sources has been a persistent issue since many years. In this study, state of the art electron microscopy was correlated with X‐ray refraction techniques to elucidate the intrusion of CMAS into the porous structure of atmospheric plasma sprayed (APS) TBCs and the formation and growth of cracks under thermal cycling in a burner rig. Results indicate that the sparse nature of the infiltration as well as kinetics in the burner rig are majorly influenced by the wetting behavior of the CMAS. Despite the obvious attack of CMAS on grain boundaries, the interaction of yttria‐stabilized zirconia (YSZ) with intruded CMAS has no immediate impact on structure and density of internal surfaces. At a later stage the formation of horizontal cracks is observed in a wider zone of the TBC layer. T2 - Eleventh Joint BER II and BESSY II User Meeting CY - Wilhelm-Conrad-Roentgen-Campus, Berlin-Adlershof, Germany DA - 04.12.2019 KW - Characterization KW - CMAS KW - Synchrotron X-ray refraction radiography KW - Thermal arrier coatings PY - 2019 AN - OPUS4-49857 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Liens, A. A1 - Reveron, H. A1 - Douillard, T. A1 - Blanchard, N. A1 - Lughi, V. A1 - Sergo, V. A1 - Laquai, René A1 - Müller, Bernd R. A1 - Bruno, Giovanni A1 - Schomer, S. A1 - Fürderer, T. A1 - Adolfsson, E. A1 - Courtois, N. A1 - Swain, M. A1 - Chevalier, J. T1 - Phase transformation induces plasticity with negligible damage in ceria-stabilized zirconia-based ceramics N2 - Ceramics and their composites are in general brittle materials because they are predominantly made up of ionic and covalent bonds that avoid dislocation motion at room temperature. However, a remarkable ductile behavior has been observed on newly developed 11 mol.% ceria-stabilized zirconia (11Ce-TZP) composite containing fine alumina (8 vol.% Al2O3) and elongated strontium hexa-aluminate (8 vol.% SrAl12O19) grains. The as-synthesized composite also has shown full resistance to Low Temperature Degradation (LTD), relatively high strength and exceptionally high Weibull modulus, allowing its use in a broader range of biomedical applications. In this study, to deepen the understanding of plastic deformation in Ce-TZP based composites that could soon be used for manufacturing dental implants, different mechanical tests were applied on the material, followed by complete microstructural characterization. Distinct from pure Ce-TZP material or other zirconia-based ceramics developed in the past, the material here studied can be permanently strained without affecting the Young modulus, indicating that the ductile response of tested samples cannot be associated to damage occurrence. This ductility is related to the stress-induced tetragonal to monoclinic (t-m) zirconia phase transformation, analogue to Transformation-Induced Plasticity (TRIP) steels, where retained austenite is transformed to martensite. The aim of this study is to corroborate if the observed plasticity can be associated exclusively to the zirconia t-m phase transformation, or also to microcraking induced by the transformation. The t-m transformed-zones produced after bending and biaxial tests were examined by X-ray refraction and SEM/TEM coupled with Raman. The results revealed that the observed elastic-plastic behavior occurs without extensive microcracking, confirming a purely elastic-plastic behavior driven by the phase transformation (absence of damage). KW - Zirconia KW - Ceria KW - Ceramic matrix composite KW - Plasticity KW - Phase transformation KW - X-Ray Refraction PY - 2020 UR - http://www.sciencedirect.com/science/article/pii/S1359645419307177 DO - https://doi.org/10.1016/j.actamat.2019.10.046 SN - 1359-6454 VL - 183 SP - 261 EP - 273 PB - Elsevier Ltd. AN - OPUS4-49740 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chen, Cong A1 - Müller, Bernd R. A1 - Prinz, Carsten A1 - Stroh, Julia A1 - Feldmann, Ines A1 - Bruno, Giovanni T1 - The correlation between porosity characteristics and the crystallographic texture in extruded stabilized aluminium titanate for diesel particulate filter applications N2 - Porous ceramic diesel particulate filters (DPFs) are extruded products that possess macroscopic anisotropic mechanical and thermal properties. This anisotropy is caused by both morphological features (mostly the orientation of porosity) and crystallographic texture. We systematically studied those two aspects in two aluminum titanate ceramic materials of different porosity using mercury porosimetry, gas adsorption, electron microscopy, X-ray diffraction, and X-ray refraction radiography. We found that a lower porosity content implies a larger isotropy of both the crystal texture and the porosity orientation. We also found that, analogous to cordierite, crystallites do align with their axis of negative thermal expansion along the extrusion direction. However, unlike what found for cordierite, the aluminium titanate crystallite form is such that a more pronounced (0 0 2) texture along the extrusion direction implies porosity aligned perpendicular to it. KW - Preferred orientation KW - X-ray refraction KW - Pore orientation KW - Crystal structure KW - Extrusion KW - Microstructure-property relations PY - 2020 DO - https://doi.org/10.1016/j.jeurceramsoc.2019.11.076 SN - 0955-2219 VL - 40 IS - 4 SP - 1592 EP - 1601 PB - Elsevier Ltd. AN - OPUS4-50325 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ulbricht, Alexander A1 - Gollwitzer, Christian A1 - Kupsch, Andreas A1 - Léonard, Fabien A1 - Müller, Bernd R. A1 - Oesch, Tyler A1 - Onel, Yener A1 - Thiede, Tobias A1 - Zscherpel, Uwe ED - Puente León, F. ED - Zagar, B. T1 - Moderne Methoden der CT-gestützten Strukturanalyse T1 - Modern techniques of CT based structure analysis N2 - Durch den großflächigen Einsatz der Computertomographie (CT) in unterschiedlichen Industriebereichen steigen auch die Anforderungen an die quantitative Bildanalyse. Subjektive Bildwahrnehmung muss durch objektive Algorithmen ersetzt werden. In diesem Artikel stellt die Bundesanstalt für Materialforschung und -prüfung (BAM), die seit den 1980er Jahren an der Entwicklung der industriellen CT beteiligt ist, anhand ausgewählter Beispiele den aktuellen Stand ihrer Analysemethoden an verschiedenen Anwendungsbeispielen der CT vor. N2 - The increasing use of computed tomography (CT) in various industrial sectors requires more sophisticated techniques of quantitative image analysis. Subjective image perception needs to be replaced by objective algorithms. The German Federal Institute for Materials Research and Testing (BAM) has been involved in the development of industrial CT since the 1980s. This paper summarizes the current status of quantitative 3D image analysis techniques based on selected examples. KW - Computed tomography KW - Computertomographie KW - Röntgen-Refraktion KW - X-Ray refraction KW - Schadensanalyse KW - Damage analysis KW - Normung KW - standardization PY - 2020 DO - https://doi.org/10.1515/teme-2019-0125 SN - 0171-8096 SN - 2196-7113 VL - 87 IS - 2 SP - 81 EP - 91 PB - de Gruyter CY - Berlin AN - OPUS4-50337 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Evsevleev, Sergei A1 - Müller, Bernd R. A1 - Osenberg, Markus A1 - Manke, Ingo A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni T1 - Optimizing the visibility of X-ray phase grating interferometry N2 - The performance of grating interferometers coming up now for Imaging interfaces within materials depends on the efficiency (visibility) of their main component, namely the phase grating. Therefore, experiments with monochromatic synchrotron radiation and corresponding simulations are carried out. The visibility of a Phase grating is optimized by different photon energies, varying detector to grating distances and continuous rotation of the phase grating about the grid lines. Such kind of rotation changes the projected grating shapes, and thereby the distribution profiles of phase shifts. This yields higher visibilities than derived from ideal rectangular shapes. By continuous grating rotation and variation of the propagation distance, we achieve 2D visibility maps. Such maps provide the visibility for a certain combination of grating orientation and detector position. Optimum visibilities occur at considerably smaller distances than in the standard setup. KW - Synchrotron, BAMline KW - Talbot-Lau interferometer KW - X-ray imaging KW - X-ray refraction KW - Grating interferometry KW - X-ray phase contrast PY - 2017 DO - https://doi.org/10.3139/120.111097 SN - 0025-5300 VL - 59 IS - 11-12 SP - 974 EP - 980 PB - Hanser Verlag AN - OPUS4-42955 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Haubrich, J. A1 - Requena, G. A1 - Bruno, Giovanni T1 - X-ray refraction distinguishes unprocessed powder from empty pores in selective laser melting Ti-6Al-4V N2 - For the first time, X-ray refraction techniques are proven for the identification of void formation in Ti-6Al-4V parts produced by selective laser melting. The topology and volume fraction of pores are measured in samples produced with different laser energy density. Unique X-ray refraction methods identify different kinds of defects, characteristic to the regions below and above the Optimum laser energy density, namely unprocessed powder (unmolten powder particles, balling effect, and Fusion defects) from empty keyhole pores. Furthermore, it is possible to detect small inhomogeneities (voids or cracks) with sizes below the spatial resolution of optical microscopy and X-ray computed tomography. KW - Additive manufacturing KW - X-ray refraction KW - Microscopy KW - X-ray computed tomography KW - Porosity PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-434041 DO - https://doi.org/10.1080/21663831.2017.1409288 SN - 2166-3831 VL - 6 IS - 2 SP - 130 EP - 135 PB - Taylor & Francis Group CY - London, UK AN - OPUS4-43404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Trappe, Volker A1 - Hickmann, Stefan A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Laquai, René A1 - De Monte, M. T1 - Risse an gekerbten kurzglasfaserverstärkten Thermoplasten zerstörungsfrei charakterisiert mit Röntgenverfahren N2 - Proben mit einer Mittelkerbe aus Polyamid 66 mit 35% Gewichtsan-teil an Kurzglasfaser (PA-GF35) wurden im Spritzgießverfahren hergestellt und in einem ungeschädigten und durch Schwingbeanspruch geschädigten Zustand mittels Röntgenverfahren charakterisiert. Sowohl die Faserorientierungsverteilung als auch die Riss-/Mikrorissbildung wurden mit der Röntgenrefraktionstopographie in einem SAXS-Aufbau und dem Diffraction-Enhanced-Imaging am Synchrotron (BESSY II) analysiert. Beide Verfahren spiegeln in guter Übereinstimmung die Charakteristiken dieser Werkstoffklasse in Bezug auf die Fertigungsqualität und die Schädigungsme-chanismen wider. T2 - DGZfP-Jahrestagung 2017 CY - Koblenz, Germany DA - 22.05.2017 KW - Kurzfaserverstärktes Polyamid KW - Röntgenverfahren KW - Rissfortschritt PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-435659 UR - https://www.dgzfp.de/Dienste/Publikationen?kategorie=Berichtsb%C3%A4nde SN - 978-3-940283-85-6 VL - 2017 SP - 1 EP - 11 PB - DGZfP CY - Berlin AN - OPUS4-43565 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Alrwashdeh, S. S. A1 - Markötter, H. A1 - Haußmann, J. A1 - Hilger, A. A1 - Klages, M. A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Riesemeier, Heinrich A1 - Scholta, J. A1 - Manke, I. T1 - Investigation of water transport in newly developed micro porous layers for polymer electrolyte membrane fuel cells N2 - In this investigation, synchrotron X-ray imaging was used to investigate the water distribution inside newly developed gas diffusion media in polymer electrolyte membrane fuel cells. In-situ radiography was used to reveal the relationship between the structure of the microporous layer (MPL) and the water flow in a newly developed MPL equipped with randomly arranged holes. A strong influence of these holes on the overall water transport was found. This contribution provides a brief overview to some of our recent activities on this research field. KW - Polymer electrolyte membrane fuel cell KW - Microporous layer KW - Water distribution KW - Radiography KW - Synchrotron X-ray imaging PY - 2017 DO - https://doi.org/10.9729/AM.2017.47.3.101 SN - 2287-4445 SN - 2287-5123 VL - 47 IS - 3 SP - 101 EP - 104 AN - OPUS4-43356 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Absorption and refraction techniques: Characterization and Non-Destructivetesting of materials N2 - X-ray techniques developed and used in BAM FB 8.5 (Micro NDE) for characterization of ceramic materials. T2 - Sitzung der Technischen Kommission des Verbands der Keramischen Industrie CY - Berlin, Gremany DA - 10.3.2017 KW - X-ray KW - X-ray refraction KW - Computed Tomography PY - 2017 AN - OPUS4-39322 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Evsevleev, Sergei A1 - Britzke, Ralf A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Talbot-Lau Röntgen-Interferometrie für die zerstörungsfreie Prüfung N2 - Im vergangenen Jahrzehnt sind gitterinterferometrische Röntgenabbildungen zunehmend in den Fokus des Interesses gerückt. Sie sind insbesondere dann Vorteil, wenn der in der Standardradiographie erreichbare Kontrast nicht genügt, schwach absorbierende Mikro- und Nanostrukturen abzubilden. Auf Kosten mehrerer Aufnahmen gestattet die Talbot-Lau Gitterinterferometrie, die Beiträge aus Absorption, Refraktion und (refraktiver) Streuung zu trennen. Dazu werden die Störungen der Interferenzmuster von Phasengittern ausgewertet. Im Gegensatz zu einer Vielzahl anderer refraktionsbasierter Abbildungsmethoden kann diese Technik mit konventionellen Röntgenröhren (mit divergenter, polychromatischer Strahlung) angewendet werden. Damit ist die Technik geeignet, typische ZfP-Fragestellungen zu lösen. Hier stellen wir Untersuchungen zur Effizienz von Phasengittern vor. Die Visibilität (d.h. die Höhe der Oszillation im Interferenzmuster) wird als Funktion verschiedener geometrischer Parameter verfolgt. Eine Rotation um die Achse parallel zu den Gitterstegen ändert die Form des Gitterprofils (d.h. die Verteilung der Phasenschiebungen). Die kontinuierliche Variation des Winkels und des Detektionsabstandes führt zur Identifikation von ausgezeichneten Kombinationen mit maximaler Visibilität, wobei die Abstände deutlich geringer sind als im Standardaufbau mit senkrechter Gitterbestrahlung. Unsere Studie umfasst Simulationen für monochromatische Quelle und den Vergleich zu experimentellen Ergebnissen mit der Synchrotronstrahlung. In der Literatur wurden die Vorteile der Talbot-Lau Interferometrie für die zerstörungsfreie Prüfung von Faserkompositen und Verbundwerkstoffen demonstriert. Hier werden als Beispiele Messungen an Aluminiumtitanat (Al2TiO5) Pulver gezeigt. T2 - DGZfP 2017 CY - Koblenz, Germany DA - 22.05.2017 KW - Gitterinterferometrische Röntgenabbildung KW - Phasengitter KW - Talbot-Lau Interferometrie KW - Zerstörungsfreie Prüfung PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-404691 SP - 1 EP - 10 PB - DGZfP AN - OPUS4-40469 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Müller, Bernd R. A1 - Nellesen, J. A1 - Hentschel, M.P. A1 - Kupsch, Andreas A1 - Tillmann, W. T1 - Synchrotron-Refraktion mit in-situ Zugbelastung zur Charakterisierung der Schadensentwicklung in Metall-Matrix- Kompositen N2 - Die Synchrotron-Refraktions-Topographie basiert auf der Brechung von Röntgenstrahlung an den Grenzflächen zwischen Materialien mit unterschiedlichem Brechungsindex. Refraktionseffekte verändern die Ausbreitungsrichtung der Röntgenstrahlung, welche mit Hilfe der Methode des Analyser-Based Imaging analysiert wird. Dabei wird ein Silizium-Einkristall im Strahlengang zwischen Probe und Detektor platziert. Dieser Analysator-Kristall filtert, innerhalb seiner Streuebene, die Röntgenstrahlung gemäß ihrer Ausbreitungsrichtung. Durch das Rastern verschiedener Winkelpositionen des Analysator-Kristalls erhält man das Winkelspektrum der von der Probe gebrochenen Strahlung. Aus dieser Rocking Curve lässt sich die spezifische innere Oberfläche der Probe bestimmen. Diese Information wird über einen 2D-Detektor mit einer nominellen Pixelgröße von 3,6 μm gewonnen. Die Installation einer Zugprüfmaschine ermöglicht es die Proben in verschiedenen Lastzuständen insitu zu untersuchen. Damit ist es möglich die spezifische innere Oberfläche in Abhängigkeit der Last darzustellen und so Schädigungsmechanismen abzuleiten. Der Vorteil bei der Ausnutzung des Refraktionseffekts gegenüber der einfachen Durchstrahlung ist die höhere Sensitivität gegenüber Defekten mit geringem Volumen aber großer Oberfläche. Somit werden auch Mikrorisse und, speziell bei Kompositen, die Enthaftung zwischen Matrix und Verstärkung (Partikel, Fasern) erfasst. In dieser Studie wurden Metall-Matrix-Komposite bestehend aus einer Aluminium-Matrix verstärkt mit Aluminiumoxid-Partikeln untersucht. Hierzu wurden knochenförmige Zugproben präpariert, deren Messlänge einen rechteckigen Querschnitt von 1,7 mm × 1,3 mm aufwies. Die Proben wurden einem Zugversuch unterzogen, welcher in Intervallen unterbrochen wurde. Bei jeder Unterbrechung wurde unter quasi-statischer Last die Rocking Curve gemessen und ein Radiogramm der spezifischen inneren Oberflächen berechnet. Dabei konnte ab dem Erreichen einer Last von ca. 600 N ein Anstieg der spezifischen inneren Oberfläche beobachtet werden. Demgegenüber zeigen die zum Vergleich durchgeführten Durchstrahlungsaufnahmen keinerlei Defekte. Daher belegt diese Untersuchung das Potential der Refraktion-Topographie zur frühzeitigen Erkennung von Schädigungen mit hoher Empfindlichkeit. T2 - DGZfP Jahrestagung 2017 CY - Koblenz, Germany DA - 22.05.2017 KW - Metall-Matrix-Komposite KW - Schadensentwicklung KW - Röntgen-Refraktions-Radiographie KW - In-situ Zugbelastung PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-405794 SN - 978-3-940283-85-6 SP - 1 EP - 7 PB - DGZfP AN - OPUS4-40579 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hakim, I. A1 - Laquai, René A1 - Schumacher, David A1 - Müller, Bernd R. A1 - Graja, P. A1 - Meyendorf, N. A1 - Donaldson, S. T1 - The Effect of Manufacturing Conditions on Discontinuity Population and Fatigue Fracture Behavior in Carbon/Epoxy Composites N2 - Carbon fiber composites have been increasingly used in aerospace, military, sports, automotive and other fields due to their excellent properties, including high specific strength, high specific modulus, corrosion resistance, fatigue resistance, and low thermal expansion coefficient. Interlaminar fracture is a serious failure mode leading to a loss in composite stiffness and strength. Iscontinuities formed during manufacturing process degrade the fatigue life and interlaminar fracture resistance of the composite. In his study, three approaches were implemented and their results were correlated to quantify discontinuities effecting static and fatigue interlaminar fracture behavior of carbon fiber composites. Samples were fabricated by hand layup vacuum bagging manufacturing process under three different vacuum levels, indicated High (-686 mmHg), Moderate (-330 mmHg) and Poor (0 mmHg). Discontinuity content was quantified throughthickness by destructive and nondestructive techniques. Eight different NDE methods were conducted including imaging NDE methods: X-Ray laminography, ultrasonic, high frequency eddy current, pulse thermography, pulse phase thermography and lock-in-thermography, and averaging NDE techniques: X-Ray refraction and thermal conductivity measurements. Samples were subsequently destructively serial sectioned through-thickness into several layers. Both static and fatigue interlaminar fracture behavior under Mode I were conducted. The results of several imaging NDE methods revealed the trend in percentages of discontinuity. However, the results of averaging NDE methods showed a clear correlation since they gave specific values of discontinuity through-thickness. Serial sectioning exposed the composite’s internal structure and provided a very clear idea about the type, shape, size, distribution and location of most discontinuities included. The results of mechanical testing showed that discontinuities lead to a decrease in Mode I static interlaminar fracture toughness and a decrease in Mode I cyclic strain energy release rates fatigue life. Finally, all approaches were correlated: the resulted NDE percentages and parameters were correlated with the features revealed by the destructive test of serial sectioning and static and fatigue values in order to quantify discontinuities such as delamination and voids. T2 - QNDE 2016 CY - Atlanta, GA, USA DA - 17.07.2016 KW - Carbon Fber Reinforced Polymers KW - Nondestructive Testing KW - X-ray Imaging KW - Ultrasound KW - Thermography PY - 2017 SN - 978-0-7354-1474-7 DO - https://doi.org/10.1063/1.4974661 SN - 0094-243X N1 - Geburtsname von Schumacher, David: Walter, D. - Birth name of Schumacher, David: Walter, D. VL - 1806 SP - UNSP 090017, 1 EP - 11 PB - AIP Publishing CY - Melville, NY, USA AN - OPUS4-39716 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kasperovich, G. A1 - Bruno, Giovanni T1 - Microstructure characterisation of advanced materials via 2D and 3D X-ray refraction techniques N2 - 3D imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this conference paper we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution in an Al/Al2O3 metal matrix composite during tensile load and the identification of void formation (different kinds of defects, particularly unsintered powder hidden in pores, and small inhomogeneity’s like cracks) in Ti64 parts produced by selective laser melting using synchrotron X-ray refraction radiography and tomography. T2 - THERMEC 2018: 10TH international conference on processing and manufacturing of advanced materials CY - Paris, France DA - 08.07.2018 KW - Additive manufacturing (AM) KW - Creep KW - Damage evolution KW - Synchrotron X-ray refraction radiography KW - Metal matrix composites PY - 2018 UR - https://www.scientific.net/MSF.941.2401 SN - 978-3-0357-1208-7 DO - https://doi.org/10.4028/www.scientific.net/MSF.941.2401 SN - 1662-9752 SN - 0255-5476 VL - 941 SP - 2401 EP - 2406 PB - Trans Tech Publications CY - Switzerland AN - OPUS4-47148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chen, Cong A1 - Müller, Bernd R. A1 - Lebedev, O. A1 - Giovannelli, F. A1 - Bruno, Giovanni A1 - Delorme, F. T1 - Effects of impurities on the stability of the low thermal conductivity in Fe2TiO5 ceramics N2 - The stability of the low thermal conductivity in Fe2TiO5 pseudobrookite ceramics has been studied. An increase in thermal diffusivity is observed after only three cycles of measurement. X-ray refraction shows an increase in the mean value of specific surface after the thermal diffusivity measurements. By using scanning electron microscopy and high‐angle annular dark‐field scanning transmission electron microscope equipped with energy dispersive X-ray spectroscopy, we observe a segregation of Ca- and F-rich nanocrystals at grain boundaries after three cycles of thermal diffusivity measurement. Therefore, impurities seem to be more efficient to scatter phonons as point defects in the pseudobrookite lattice rather than as nanocrystals at pseudobrookite grain boundaries. This emphasizes the importance of precursor purity and the influence of redistribution of impurities on thermoelectric properties: stability of micro-/nano-structures is a key point, and repeated thermoelectric measurements may allow detecting such metastable micro- /nano-structures and producing stable and reliable data. KW - Fe2TiO5 KW - Impurity segregation KW - Thermoelectrics KW - X-ray refraction KW - Scanning transmission electron microscopy PY - 2019 UR - http://www.sciencedirect.com/science/article/pii/S1044580318329309 DO - https://doi.org/10.1016/j.matchar.2019.01.021 SN - 1044-5803 SN - 1873-4189 VL - 149 SP - 111 EP - 117 PB - Elsevier Inc. AN - OPUS4-47255 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Göbel, M. A1 - Kirsch, S. A1 - Schwarze, L: A1 - Schmidt, L. A1 - Scholz, H. A1 - Haußmann, J. A1 - Klages, M. A1 - Scholta, J. A1 - Markötter, H. A1 - Alrwashdeh, S. A1 - Manke, I. A1 - Müller, Bernd R. T1 - Transient limiting current measurements for characterization of gas diffusion layers N2 - The water management in proton exchange membrane fuel cells (PEMFC) is strongly influenced by the design of the gas diffusion layers (GDL). Limiting current measurements in small-scale cells operating at high stoichiometries are useful to determine the oxygen transport resistance. The oxygen transport resistance increases, once water condenses inside the GDL. In this study a new electrochemical method for voltage loss estimation of GDL induced oxygen transport losses are presented. This new method, referred to as “transient limiting current” (TLC), is compared with the literature method. TLC allows a direct estimation of oxygen transport resistance at an arbitrarily conditioned state. This study also presents a case study of liquid water visualization of a PEM fuel cell with varying GDLs types. With the help of quasi in-situ synchrotron X-ray computed tomography and time resolved radiography measurements we investigate appearance and distribution of liquid water inside the GDLs under limiting current conditions. KW - In-situ characterization of GDLs KW - In-situ synchrotron X-ray computed tomography KW - In-situ synchrotron X-ray radiography KW - BAMline PY - 2018 DO - https://doi.org/10.1016/j.jpowsour.2018.09.003 SN - 0378-7753 SN - 1873-2755 VL - 402 SP - 237 EP - 245 PB - Elsevier B.V. AN - OPUS4-46552 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Cabeza, Sandra A1 - Pereyra, R. A1 - Fernández, R. A1 - González-Doncel, G. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Evidence of damage evolution during creep of Al–Mg alloy using synchrotron X-ray refraction N2 - In order to provide further evidence of damage mechanisms predicted by the solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction (SXRR). X-ray refraction techniques capture the specific surface (i.e. surface per unit volume) with a field of view comparable to the specimen size but with microscopic sensitivity. A significant rise of the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model. T2 - Tenth Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 05.12.2018 KW - Aluminium alloys KW - Creep KW - Damage KW - Synchrotron X-ray refraction KW - Electron microscopy KW - Subgrain structure PY - 2018 AN - OPUS4-46861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Evsevleev, Sergei A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Kupsch, Andreas T1 - Refraction driven X-ray caustics at curved interfaces N2 - X-ray refraction related interaction has received rising interest since about two decades in the field of imaging, beam shaping and analysis although being discovered a century ago. Due to refraction at interfaces in inhomogeneous media X-rays undergo natural focusing (or defocusing) of waves, revealing caustics. Such Kind of intensity patterns are well-known for visible light, but have been sparsely discussed for X-rays. The Variation of irradiation density may be predicted in case of known shapes. Analogously to light optics, the intensity distributions cover several orders of magnitude including complete extinction. The partly convergent (and divergent) caustic stripes originate from narrow zones of typical size of some 10−6 of the boundary curvature radius. For the deflection of plane wave synchrotron radiation (energy in the range of some keV to some ten keV) at rods and tubes of several μm diameter, we find good Agreement between experiments and modeling by ray tracing according to Snell’s law without additional diffraction contributions. Apart from Basic Research implications, caustics may influence the performance of irradiation technologies such as sterilization or molecular cross-linking. KW - X-ray caustics KW - X-ray refraction KW - Irradiation KW - Radiation shielding KW - Synchrotron Radiation PY - 2019 UR - http://www.sciencedirect.com/science/article/pii/S0168900218314591 DO - https://doi.org/10.1016/j.nima.2018.10.152 SN - 0168-9002 SN - 1872-9576 VL - 916 SP - 275 EP - 282 PB - Elsevier AN - OPUS4-46924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - In situ analysis of damage evolution in an Al/Al2O3 MMC under tensile load by synchrotron x-ray refraction imaging N2 - 3D imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this conference paper we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution in a carbon fibre reinforced polymer and a Al/Al2O3metal matrix composite during tensile load, the direct observation of damage accumulation during creep of Al-3.85Mg and the identification of void formation (different kinds of defects, particularly unsintered powder hidden in pores, and small inhomogeneity’s like cracks) in Ti64 parts produced by selective laser melting using synchrotron X-ray refraction radiography tomography. T2 - Materials Science and Engineering 2018 (MSE2018) CY - Darmstadt, Germany DA - 26.09.2018 KW - Synchrotron X-ray refraction radiography KW - In-situ tensile test KW - Damage evolution KW - Metal matrix composite PY - 2018 AN - OPUS4-46149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kasperovich, G. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Microstructure characterization of materials using X-ray refraction techniques N2 - X-ray imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this lecture we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining the internal specific surface of materials (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution during tensile load and the identification of void formation in parts produced by selective laser melting. T2 - MIMENIMA Summerschool CY - TU-Bremen, Germany DA - 22.8.2018 KW - X-ray refraction KW - Cracks KW - Pores PY - 2018 AN - OPUS4-45790 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Gouraud, F. A1 - Müller, Bernd R. A1 - Huger, M. A1 - Chotard, T. A1 - Antou, G. A1 - Bruno, Giovanni T1 - Evolution of Thermal Microcracking in Refractory ZrO2-SiO2 after Application of External Loads at High Temperatures N2 - Zirconia-based cast refractories are widely used for glass furnace applications. Since they have to withstand harsh chemical as well as thermo-mechanical environments, internal stresses and microcracking are often present in such materials under operating conditions (sometimes in excess of 1700 °C). We studied the evolution of thermal (CTE) and mechanical (Young’s modulus) properties as a function of temperature in a fused-cast refractory containing 94 wt.% of monoclinic ZrO2 and 6 wt.% of a silicate glassy phase. With the aid of X-ray refraction techniques (yielding the internal specific surface in materials), we also monitored the evolution of microcracking as a function of thermal cycles (crossing the martensitic phase transformation around 1000 °C) under externally applied stress. We found that external compressive stress leads to a strong decrease of the internal surface per unit volume, but a tensile load has a similar (though not so strong) effect. In agreement with existing literature on -eucryptite microcracked ceramics, we could explain These phenomena by microcrack closure in the load direction in the compression case, and by microcrack propagation (rather than microcrack nucleation) under tensile conditions. KW - Electro-fused zirconia KW - Microcracking KW - Synchrotron x-ray refraction radiography (SXRR) KW - Thermal expansion PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-477431 DO - https://doi.org/10.3390/ma12071017 VL - 12 IS - 7 SP - 1 EP - 15 PB - MDPI AN - OPUS4-47743 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Division 8.5 - Micro NDE - Key Competence Areas N2 - Der Vortrag gibt einen Überblick über die Kernkompetenzen des Fachbereichs 8.5 Mikro-ZfP (CT Apparaturen, Röntgen-Refraktion, WAXS - Texturanalyse, Datenkorrektur, Rekonstruktionsalgorithmen, Bildanalyse, dimensionelle Kontrolle, Multi-Source Datenfusion und Kombination, micromechanische Eigenschaften mittels Neutronen Diffraktion), im Hinblick auf die Charakterisierung von Leichtbauwerkstoffen (Faserverbunde, Aluminium und Titan MMCs), die in der Luftfahrt verwendet werden. Der Schwerpunkt liegt dabei auf der Charakterisierung mittels Synchrotron und Röntgen Refraktionstechniken sowie Computertomographie. N2 - The lecture gives an overview of the core competencies of the department 8.5 Micro NDT (CT equipment, X-Ray Refraction, WAXS - Texture analysis, Data correction, Reconstruction algorithms, Image analysis, Dimensional control, Multi-Source Data Fusion and Combination, Micromechanical Properties by Neutron Diffraction) with regard to the characterization of lightweight materials (fibre composites, aluminum and titanium MMCs) used in aviation. The focus is on characterization by synchrotron and X-ray refraction techniques as well as computed tomography. T2 - DGZfP Fachausschuss Luftfahrt CY - BAM - Berlin, Germany DA - 18.04.2019 KW - Synchrotron KW - Refraction KW - Microstructure Characterization PY - 2019 AN - OPUS4-47856 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Serrano Munoz, Itziar A1 - Laquai, René A1 - Bruno, Giovanni T1 - Röntgenrefraktionstechnik - Charakterisierung von Keramiken und Verbundwerkstoffen N2 - Die Brechung von Röntgenstrahlen (Röntgenrefraktion) an Grenzflächen zwischen Materialien unterschiedlicher Dichte ist analog zur Ablenkung von sichtbarem Licht an z.B. Glasoberflächen. Es gibt jedoch zwei wesentliche Unterschiede: a) konvexe Grenzflächen verursachen Divergenz (d.h. der Brechungsindex n ist kleiner als 1), und b) die Ablenkungswinkel sind sehr klein, und reichen von einigen Bogensekunden bis zu einigen Bogenminuten (d.h. n ist nahe bei 1); Wie auch bei sichtbarem Licht ist die Ablenkungsrichtung der Röntgenstrahlen abhängig von der Orientierung der durchstrahlten Grenzfläche. Aufgrund dieser Eigenschaften eignen sich Röntgenrefraktionsmethoden hervorragend für: a) die Erkennung und Quantifizierung von Defekten wie Poren und Mikrorissen und b) die Bewertung von Porosität und Partikeleigenschaften wie Orientierung, Größe und räumliche Verteilung. Wir zeigen die Anwendung der Röntgenrefraktionsradiographie (2,5D Technik) und der -tomographie (3D Technik) für die Untersuchung verschiedener Probleme in der Werkstoffwissenschaft und -technologie: a) Sintern von SiC-Grünkörpern b) Porositätsanalyse in Dieselpartikelfiltersilikaten c) Faser-Matrix-Haftung in Metall- und Polymermatrixverbundwerkstoffen d) Mikrorissbildung in Glaskeramik. Wir zeigen, dass der Einsatz von Röntgenrefraktionsmethoden quantitative Ergebnisse liefert, die direkt als Parameter in Werkstoffmodellen verwendet werden können. T2 - DACH-Jahrestagung 2023 CY - Friedrichshafen, Germany DA - 15.05.2023 KW - Röntgen-Refraktion KW - Verbundwerkstoffe KW - Keramik PY - 2023 AN - OPUS4-57615 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Serrano Munoz, Itziar A1 - Laquai, René A1 - Bruno, Giovanni T1 - Anwendungen der Röntgenrefraktionstechnik zur zerstörungsfreien Charakterisierung von Keramiken und Verbundwerkstoffen N2 - Die Brechung von Röntgenstrahlen (Röntgenrefraktion) an Grenzflächen zwischen Materialien unterschiedlicher Dichte ist analog zur Ablenk-ung von sichtbarem Licht an z.B. Glasoberflächen. Es gibt jedoch zwei wesentliche Unterschiede: a) konvexe Grenzflächen verursachen Divergenz (d.h. der Brechungsindex n ist kleiner als 1), und b) die Ablenkungswinkel sind sehr klein, und reichen von einigen Bogensekunden bis zu einigen Bogenminuten (d.h. n ist nahe bei 1); Wie auch bei sichtbarem Licht ist die Ablenkungsrichtung der Röntgenstrahlen abhängig von der Orientierung der durchstrahlten Grenzfläche. Aufgrund dieser Eigenschaften eignen sich Röntgenrefraktionsmethoden hervorragend für: a) die Erkennung und Quantifizierung von Defekten wie Poren und Mikrorissen und b) die Bewertung von Porosität und Partikeleigenschaften wie Orientierung, Größe und räumliche Verteilung. Wir zeigen die Anwendung der Röntgenrefraktionsradiographie (2,5D Technik) und der -tomographie (3D Technik) für die Untersuchung verschiedener Probleme in der Werkstoffwissenschaft und -technologie: a) Sintern von SiC-Grünkörpern b) Porositätsanalyse in Dieselpartikelfiltersilikaten c) Faser-Matrix-Haftung in Metall- und Polymermatrixverbundwerkstoffen d) Mikrorissbildung in Glaskeramik. Wir zeigen, dass der Einsatz von Röntgenrefraktionsmethoden quantitative Ergebnisse liefert, die direkt als Parameter in Werkstoffmodellen verwendet werden können. T2 - DACH-Jahrestagung 2023 CY - Friedrichshafen, Germany DA - 15.05.2023 KW - Röntgen-Refraktion KW - Verbundwerkstoffe KW - Keramik PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-576171 UR - https://jahrestagung.dgzfp.de/Portals/jt2023/BB180/Inhalt/p9.pdf UR - https://jahrestagung.dgzfp.de/Portals/jt2023/BB180/Inhalt/default.htm SN - 978-3-947971-29-9 SP - 1 EP - 16 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-57617 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wang, Y. A1 - Ulbricht, Alexander A1 - Schmidt, F. A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Schwitalla, A.D. T1 - Micro-CT analysis and mechanical properties of low dimensional CFR-PEEK specimens additively manufactured by material extrusion N2 - Material extrusion of thermoplastic polymers enables the realization of complex specific designs with high performance composites. The present study aims at evaluating the mechanical properties of carbon fiberreinforced semi-crystalline thermoplastic polymer polyether ether ketone (CFR-PEEK) manufactured by material extrusion and correlating them with results obtained by micro-CT. Samples in the shape of small bars were provided by Kumovis (Munich, Germany). The determination of surface roughness and density was followed by three-point bending tests. To reveal the pore distribution as well as the fusion quality of CFR PEEK when applied with external forces, micro-CT scans were performed with an X-ray microscope before and after the mechanical test to localize the sites where the fracture is generated. The density of CFR-PEEK bars indicated that they had superior mechanical properties compared with our previous study on unfilled 3D printed PEEK (bending modulus: (5.4 ± 0.5) GPa vs. (1.05 ± 0.05) GPa to (1.48 ± 0.10) GPa; bending strength: (167 ± 11) MPa vs. (51 ± 15) to (193 ± 7) MPa). Micro-CT analyses revealed the local 3D-distribution of voids. Voids of 30 μm diameter are nearly spherical and make up the main part of the total porosity. The larger the voids, the more they deviate from a spherical shape. Significant lack-of-fusion voids are located between the deposited filaments. By growing and merging, they act as seeds for the forming fracture line in the region of the flexural specimens where the maximum local tensile stresses occurred under bending load. Our work provides a detailed analysis of printed PEEK with fiber additive and relates this with mechanical properties. KW - CFR-PEEK KW - Material extrusion (MEX) KW - FFF KW - Surface topography KW - Bending property KW - Micro-CT PY - 2023 DO - https://doi.org/10.1016/j.jmbbm.2023.106085 SN - 1751-6161 VL - 146 SP - 1 EP - 9 PB - Elsevier Ltd. AN - OPUS4-58112 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Trappe, Volker A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Rissentwicklung in CFK-Laminaten nachgewiesen durch in situ Röntgen-Refraktion N2 - In Leichtbauanwendungen sind Materialien mit geringen Dichten und hohen Festigkeiten gefragt. Insbesondere Faser-Kunststoff-Verbunde (FKV) erfüllen diese Anforderungen und werden zunehmend für Strukturbauteile eingesetzt. Die Oberflächen moderner Rotorblätter von Windkraftanlagen werden aus FKV gefertigt. Das Versagen dieser Materialien hat massiven Einfluss auf die Einsatzfähigkeit der gesamten Windkraftanlage. Daher ist die Kenntnis des Versagensverhaltens dieser Komponenten unter statischer und zyklischer Belastung von großem Interesse, um die Betriebsbeanspruchung abzuschätzen. Im Idealfall wird die Schadensentwicklung unter Betriebslast mit zerstörungsfreien in-situ-Prüfverfahren ermittelt. Hier berichten wir über die Beobachtung der Rissentwicklung in Carbon-Faserverstärkten Kunststoffen (CFK) unter kontinuierlicher Zugbelastung durch in-situ Synchrotron-Röntgenrefraktionsradiographie. Eine selbst entwickelte elektromechanische Zugprüfmaschine mit einem Kraftbereich bis zu 15 kN wurde in den Strahlengang an der BAMline (BESSY II) integriert. Da in herkömmlichen (Absorptions-) Radiographien Defekte wie Zwischenfaserbrüche oder Faser-Matrix-Enthaftung keinen ausreichenden Kontrast verursachen, wird zur Kontrastanhebung die Röntgenrefraktion benutzt. Hier wird das sogenannte Diffraction Enhanced Imaging (DEI) angewandt, um Primär- und gebrochene Strahlung mit Hilfe eines Analysatorkristalls zu trennen. Diese Technik ermöglicht schnelle Messungen mit einem Gesichtsfeld von einigen Quadratmillimetern (hier: 14 mm × 7.2 mm) und ist ideal für in-situ Untersuchungen. Die Bildgebung und der Zugversuch erfolgen mit einer Bildfrequenz von 0.7 / s und einer Dehnrate von 0.00055 / s . Bei 0°/90° Fasergelegen treten die ersten Zwischenfaserrisse bei 380 MPa (Dehnung 0.8 %) auf. Vor dem Versagen bei ca. 760 MPa (Dehnung 2.0 %) beobachten wir die Ausbildung eines nahezu äquidistanten Rissmusters (Risse in ca. 1 mm Abstand), das sich im geschädigten Zustand über die gesamte Probe erstreckt. T2 - DACH-Jahrestagung 2023 CY - Friedrichshafen, Germany DA - 15.05.2023 KW - Röntgen-Refraktion KW - Synchrotronstrahlung KW - CFK KW - Rissentwicklung PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-576230 SN - 978-3-947971-29-9 VL - BB 180 SP - 1 EP - 8 AN - OPUS4-57623 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Zocca, Andrea A1 - Müller, Bernd R. A1 - Laquai, René A1 - Kupsch, Andreas A1 - Wieder, Frank A1 - Benemann, Sigrid A1 - Wilbig, Janka A1 - Günster, Jens A1 - Bruno, Giovanni T1 - Microstructural characterization of AP40 apatite-wollastonite glass-ceramic N2 - The microstructure of an apatite-wollastonite (code name AP40) glass-ceramic is analyzed in this study by combining 2D microscopy, phase analysis, X-ray absorption and synchrotron X-ray refraction computed tomography (XCT and SXRCT, respectively). It is shown that this combination provides a useful toolbox to characterize the global microstructure in a wide scale range, from sub-micrometer to millimeter. The material displays a complex microstructure comprising a glassy matrix with embedded fluorapatite and wollastonite small crystals. In this matrix, large (up to 200 μm) spike-shaped structures are distributed. Such microstructural features are oriented around a central sphere, thereby forming a structure resembling a sea urchin. A unique feature of SXRCT, in contrast to XCT, is that internal interfaces are visualized; this allows one to show the 3D distribution of these urchins with exceptionally good contrast. Furthermore, it is revealed that the spike-shaped structures are not single crystals, but rather composed of sub-micrometric crystals, which are identified as fluorapatite and diopside phases by SEM-EDX analysis. KW - Glass-ceramic KW - X-ray refraction KW - Computed tomography KW - Microstructure PY - 2023 DO - https://doi.org/10.1016/j.ceramint.2022.12.130 SN - 0272-8842 VL - 49 IS - 8 SP - 12672 EP - 12679 PB - Elsevier Science CY - Amsterdam AN - OPUS4-57452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Serrano Munoz, Itziar A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - X-Ray-Refraction-Imaging-Techniques high-resolution microstructural characterization N2 - X-ray refraction is analogous to visible light deflection by matter; it occurs at boundaries between different media. The main difference between visible light and X-rays is that in the latter case deflection angles are very small, from a few seconds to a few minutes of arc (i.e., the refraction index n is near to 1). Trivially but importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks and quantify their densities in bulk (not too heavy) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, their detectability is simply limited by the wavelength of the radiation. We thereby show the application of X-ray refraction 2D mapping (topography) and tomography to different sorts of problems in materials science and technology: 1) Sintering of SiC green bodies; 2) Porosity analysis in additively manufactured alloys; 3) Fiber de-bonding in metal and polymer matrix composites. Such techniques, especially at the Synchrotron BESSY II, Berlin, Germany, can be used in-situ, i.e. when the specimen is subjected to temperatures or external loads. Applications of in-situ X-ray refraction radiography on aluminum alloys and composites are also shown. The use of X-ray refraction analysis yields quantitative information, which can be directly input in kinetics, mechanical and damage models. T2 - ICT 2023 CY - Fürth, Germany DA - 27.02.2023 KW - X-ray refraction KW - Composites KW - In-situ KW - Additive Manufacturing KW - Sintering KW - Ceramics PY - 2023 AN - OPUS4-57200 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Markötter, Henning A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Evsevleev, Sergei A1 - Arlt, T. A1 - Ulbricht, Alexander A1 - Dayani, Shahabeddin A1 - Bruno, Giovanni T1 - A Review of X-Ray Imaging at the BAMline (BESSY II) N2 - The hard X-ray beamline BAMline at BESSY II (Berlin, Germany) has now been in service for 20 years. Several improvements have been implemented in this time, and this review provides an overview of the imaging methods available at the BAMline. Besides classic full-field synchrotron X-ray computed tomography (SXCT), also absorption edge CT, synchrotron X-ray refraction radiography (SXRR), and synchrotron X-ray refraction tomography (SXRCT) are used for imaging. Moreover, virtually any of those techniques are currently coupled in situ or operando with ancillary equipment such as load rigs, furnaces, or potentiostats. Each of the available techniques is explained and both the current and the potential usage are described with corresponding examples. The potential use is manifold, the examples cover organic materials, composite materials, energy-related materials, biological samples, and materials related to additive manufacturing. The article includes published examples as well as some unpublished applications. KW - Material science KW - Radiography KW - Refraction KW - Tomography KW - X-ray imaging PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-572417 DO - https://doi.org/10.1002/adem.202201034 SN - 1438-1656 SP - 1 EP - 22 PB - Wiley VHC-Verlag AN - OPUS4-57241 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -