TY - CONF A1 - Berger, Achim T1 - BAMline meets Dürer and Van Eyck: Multidisciplinary investigations of Renaissance silver point drawings T2 - 21st BESSY Users' Meeting CY - Berlin, Germany DA - 2002-12-05 PY - 2002 AN - OPUS4-4899 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Reiche, I. A1 - Berger, Achim A1 - Bevers, H. A1 - Dupuis, G. A1 - Duval, A. A1 - Görner, Wolf A1 - Guicharnaud, H. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. T1 - Spatially resolved SR-XRF analyses of complex drawings by the Holbein family and silverpoint drawings by Rembrandt KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=491 SN - 0179-4159 SP - 491 EP - 493 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7380 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim T1 - Bestimmung von ionen-implantiertem Molybdän in Halbleitersilizium T2 - Tag der Chemie, Freie Universität Berlin CY - Berlin, Germany DA - 2005-06-08 PY - 2005 AN - OPUS4-7460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim T1 - Silberstiftzeichnungen - Zerstörungsfreie Spurenanalyse mit Synchrotronstrahlung T2 - Papier-Restaurierung / 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) CY - Göttingen, Germany DA - 2003-09-21 PY - 2003 AN - OPUS4-3080 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - Metallstiftzeichnungen Albrecht Dürers KW - Synchrotron KW - XRF analysis KW - Drawings KW - Archaeometry KW - Röntgenfluoreszenzanalyse (RFA) KW - Zeichnungen KW - Archäometrie KW - Albrecht Dürer PY - 2004 SN - 1563-2628 VL - 5 IS - 2 SP - 30 EP - 38 PB - Foto Text Verl. CY - Stuttgart AN - OPUS4-3570 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim T1 - Kunst- und Kulturgüter unter "Beschuss" T2 - Tag der Chemie, Universitätsstandort CY - Potsdam, Germany DA - 2004-07-07 PY - 2004 AN - OPUS4-3632 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Görner, Wolf A1 - Berger, Achim A1 - Merchel, Silke A1 - Pernicka, E. A1 - Radtke, Martin A1 - Reiche, I. A1 - Reinholz, Uwe A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Wunderlich, C. H. T1 - Kunst- und Kulturgüter unter "Beschuss" T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2004 CY - Salzburg, Österreich DA - 2004-05-17 KW - SY-RFA KW - PIXE KW - PIGE KW - PAA KW - Zerstörungsfreie Analyse KW - Silberstiftzeichnungen KW - Himmelsscheibe von Nebra KW - Indische Moghulmalereien PY - 2004 UR - http://www.ndt.net/article/dgzfp04/papers/p46/p46.htm SN - 3-931381-55-2 SP - 1(?) EP - 11(?) PB - DGZfP CY - Berlin AN - OPUS4-6897 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Radtke, Martin A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Riesemeier, Heinrich A1 - Bevers, H. T1 - Spatially resolved synchrotron radiation induced X-ray fluorescence analyses of rare Rembrandt silverpoint drawings N2 - New analyses of a series of very rare silverpoint drawings that were executed by Rembrandt Harmensz. van Rijn (1606–1669) which are kept today in the Kupferstichkabinett (Museum of Prints and Drawings) of the State Museums of Berlin are reported here. Analysis of these drawings requires particular attention because the study has to be fully non-destructive and extremely sensitive. The metal alloy on the paper does not exceed some hundreds of µg/cm². Therefore, synchrotron radiation induced X-ray fluorescence (SR-XRF) is – together with external micro-proton-induced X-ray emission – the only well-suited method for the analyses of metalpoint drawings. In some primary work, about 25 German and Flemish metalpoint drawings were investigated using spatially resolved SR-XRF analysis at the BAMline at BESSY. This study enlarges the existing French–German database of metalpoint drawings dating from the 15th and 16th centuries, as these Rembrandt drawings originate from the 17th century where this graphical technique was even rarer and already obsolete. It also illustrates how SR-XRF analysis can reinforce art historical assumptions on the dating of drawings and their connection. KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2006 DO - https://doi.org/10.1007/s00339-006-3505-4 SN - 0947-8396 VL - 83 IS - 2 SP - 169 EP - 173 PB - Springer CY - Berlin AN - OPUS4-12532 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Guicharnaud, H. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. ED - Denker, A. ED - Adriaens, A. ED - Dowsett, M. ED - Giumlia-Mair, A. T1 - Synchrotron radiation and protons on the traces of famous artists - Non-destructive analyses of silverpoint drawings by Albrecht Dürer KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2006 SN - 3-8167-7178-5 SP - 91 EP - 101 PB - Fraunhofer-IRB-Verl. CY - Stuttgart AN - OPUS4-14190 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kühn, Andreas A1 - Scharf, Oliver A1 - Ordavo, I. A1 - Riesemeier, Heinrich A1 - Reinholz, Uwe A1 - Radtke, Martin A1 - Berger, Achim A1 - Ostermann, Markus A1 - Panne, Ulrich T1 - Pushing the limits for fast spatially resolved elemental distribution patterns N2 - A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 µm² was obtained, while the required time for the investigation of a 10 × 10 mm² sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm². This area is divided into 264 × 264 pixels of 48 × 48 µm². A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz. PY - 2011 DO - https://doi.org/10.1039/c1ja10069f SN - 0267-9477 SN - 1364-5544 VL - 26 SP - 1986 EP - 1989 PB - Royal Society of Chemistry CY - London AN - OPUS4-24386 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Ecker, K. H. A1 - Wätjen, U. A1 - Berger, Achim A1 - Grötzschel, R. A1 - Persson, L. A1 - Pritzkow, W. A1 - Radtke, Martin A1 - Riebe, Gundel A1 - Riesemeier, Heinrich A1 - Vogl, Jochen T1 - Certification of antimony implanted in silicon wafer with a silicon dioxide diffusion barrier - IRMM-302 and BAM-L001 N2 - This Report describes the certification of the reference material antimony implanted in Si/SiO2 intended to be used for calibration of surface and near surface analytical methods. It describes the preparation, homogeneity measurements and the analytical work performed for the certification of both Areal density of antimony Atoms (retained dose) and the isotope amount Ratio as well as giving considerations on the stability of the material. KW - Isotope ratio KW - Areal density KW - Surface analysis PY - 2002 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-355752 SP - 1 EP - 40 PB - Institute for Reference Materials and Measurements CY - Geel, Belgium AN - OPUS4-35575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -